Measuring arrangements characterised by the use of wave or particle radiation

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Patents Grantslast 30 patents

Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 12,281,893
- Issue date Apr 22, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining the geometrical dimensions of...
- Patent number 12,276,571
- Issue date Apr 15, 2025
- Snap-on Equipment SRL a Unico Socio
- Paolo Sotgiu
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method of enhancing contrast while imaging high aspect ratio struct...
- Patent number 12,272,607
- Issue date Apr 8, 2025
- Applied Materials, Inc.
- Geetika Bajaj
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Curing oven and method of controlling curing oven
- Patent number 12,264,098
- Issue date Apr 1, 2025
- ROCKWOOL A/S
- Ole Andreasen
- D04 - BRAIDING LACE-MAKING KNITTING TRIMMINGS NON-WOVEN FABRICS
Information Patent Grant
Radio frequency identification based three-dimensional metrology
- Patent number 12,253,354
- Issue date Mar 18, 2025
- International Business Machines Corporation
- Olawunmi Akinlemibola
- G01 - MEASURING TESTING
Information Patent Grant
Method of estimating target height by detection device
- Patent number 12,247,832
- Issue date Mar 11, 2025
- Aptiv Technologies AG
- Honghui Yan
- G01 - MEASURING TESTING
Information Patent Grant
Wall shape measurement device
- Patent number 12,247,833
- Issue date Mar 11, 2025
- Denso Corporation
- Naotsugu Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Axial deviation estimating device
- Patent number 12,235,099
- Issue date Feb 25, 2025
- Denso Corporation
- Katsuhiko Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-precision timing clock method
- Patent number 12,226,246
- Issue date Feb 18, 2025
- Weng-Dah Ken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for calibrating a THz measuring apparatus, THz measuring met...
- Patent number 12,216,050
- Issue date Feb 4, 2025
- CiTEX Holding GmbH
- Roland Böhm
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for cooperative usage of multiple distance meters
- Patent number 12,215,969
- Issue date Feb 4, 2025
- May Patents Ltd.
- Yehuda Binder
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for the additive manufacture of a workpiece
- Patent number 12,202,205
- Issue date Jan 21, 2025
- Intom GmbH
- Martin Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Methods for growing crystals on QCM sensors
- Patent number 12,195,840
- Issue date Jan 14, 2025
- Saudi Arabian Oil Company
- Ayrat Gizzatov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of perceiving position and pose of hydraulic support group b...
- Patent number 12,196,837
- Issue date Jan 14, 2025
- Shandong University of Science and Technology
- Wenhong Li
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 12,188,883
- Issue date Jan 7, 2025
- Industrial Technology Research Institute
- Bo-Ching He
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 12,174,551
- Issue date Dec 24, 2024
- Hitachi High-Technologies Corporation
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scatterometry with high harmonic generation (HHG) sources
- Patent number 12,174,009
- Issue date Dec 24, 2024
- B.G. Negev Technologies and Applications Ltd., at Ben-Gurion University
- Evgeny Frumker
- G01 - MEASURING TESTING
Information Patent Grant
Sealing arrangement for detecting thickness of a sealing element of...
- Patent number 12,173,798
- Issue date Dec 24, 2024
- Andritz Oy
- Simo Karjalainen
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Row closing assemblies
- Patent number 12,144,276
- Issue date Nov 19, 2024
- Precision Planting LLC
- Dale M. Koch
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Metrology measurement method and apparatus
- Patent number 12,140,875
- Issue date Nov 12, 2024
- ASML Netherlands B.V.
- Ilse Van Weperen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Enhanced cross sectional features measurement methodology
- Patent number 12,123,708
- Issue date Oct 22, 2024
- Applied Materials, Inc.
- Manoj Kumar Dayyala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Component imaging systems, apparatus, and methods
- Patent number 12,111,148
- Issue date Oct 8, 2024
- General Electric Company
- Andrew Frank Ferro
- G01 - MEASURING TESTING
Information Patent Grant
Device feature specific edge placement error (EPE)
- Patent number 12,092,966
- Issue date Sep 17, 2024
- KLA Corporation
- Amnon Manassen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Design-assisted large field of view metrology
- Patent number 12,085,385
- Issue date Sep 10, 2024
- KLA Corporation
- Stefan Eyring
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for utilizing radio-opaque fillers in multiple la...
- Patent number 12,083,390
- Issue date Sep 10, 2024
- Topgolf Callaway Brands Corp.
- David M. Melanson
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
System and method for evaluating a status of a material in metallur...
- Patent number 12,085,384
- Issue date Sep 10, 2024
- PANERATECH, INC.
- Yakup Bayram
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wavelet system and method for ameliorating misregistration and asym...
- Patent number 12,080,610
- Issue date Sep 3, 2024
- KLA Corporation
- Lilach Saltoun
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection apparatus and method
- Patent number 12,072,181
- Issue date Aug 27, 2024
- ASML Netherlands B.V.
- Yan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Cooperative Usage of Multiple Distance Meters
- Publication number 20250137776
- Publication date May 1, 2025
- Yehuda BINDER
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...
- Publication number 20250130185
- Publication date Apr 24, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Uri Hadar
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR DIVERTING RADIATION EMITTED FROM SOURCE
- Publication number 20250122810
- Publication date Apr 17, 2025
- GE Infrastructure Technology, LLC
- Kurt Kramer Schleif
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PARTS AT TARGET TEMPERATURES
- Publication number 20250116618
- Publication date Apr 10, 2025
- WEST PHARMACEUTICAL SERVICES, INC.
- Md Abu HASAN
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Cooperative Usage of Multiple Distance Meters
- Publication number 20250102295
- Publication date Mar 27, 2025
- Yehuda BINDER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD
- Publication number 20250102296
- Publication date Mar 27, 2025
- NXP B.V.
- Matteo Ridolfi
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Cooperative Usage of Multiple Distance Meters
- Publication number 20250085104
- Publication date Mar 13, 2025
- Yehuda BINDER
- G01 - MEASURING TESTING
Information Patent Application
PDMS (POLY(DIMETHYL SILOXANE))-BASED ANALYSIS METHOD OF COSMETIC FI...
- Publication number 20250076223
- Publication date Mar 6, 2025
- AMOREPACIFIC CORPORATION
- Chaeyeon SONG
- G01 - MEASURING TESTING
Information Patent Application
FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION
- Publication number 20250076038
- Publication date Mar 6, 2025
- FEI Company
- Stefano Vespucci
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Measurement Device and Pattern Measurement Method
- Publication number 20250060678
- Publication date Feb 20, 2025
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLOSED LOOP CLOSING SYSTEM CONTROL
- Publication number 20250040467
- Publication date Feb 6, 2025
- PRECISION PLANTING LLC
- Dale M. Koch
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
DEEP STRUCTURE SIGNAL DETECTION AND ENHANCEMENT BY SEPARATION TO UP...
- Publication number 20250035438
- Publication date Jan 30, 2025
- ETROLOGY, LLC
- Vladislav Kaplan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NLS Using a Bounded Linear Initial Search Space and a Fixed Grid wi...
- Publication number 20250035436
- Publication date Jan 30, 2025
- Aptiv Technologies Limited
- Xin Zhang
- G01 - MEASURING TESTING
Information Patent Application
THZ MEASURING METHOD AND THZ MEASURING DEVICE FOR MEASURING A JOINT...
- Publication number 20250035437
- Publication date Jan 30, 2025
- CiTEX Holding GmbH
- Jan Hendrik BECKMANN
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...
- Publication number 20250003898
- Publication date Jan 2, 2025
- HITACHI HIGH-TECH CORPORATION
- Wei SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED CROSS SECTIONAL FEATURES MEASUREMENT METHODOLOGY
- Publication number 20250003742
- Publication date Jan 2, 2025
- Applied Materials, Inc.
- Manoj Kumar Dayyala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And System For Utilizing Radio-Opaque Fillers In Multiple La...
- Publication number 20240424351
- Publication date Dec 26, 2024
- Topgolf Callaway Brands Corp.
- David M. Melanson
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Application
Method to Control Gap for Sheet Manufacturing Measurement Processes
- Publication number 20240426604
- Publication date Dec 26, 2024
- Honeywell International Inc.
- Greg Reynen
- G01 - MEASURING TESTING
Information Patent Application
PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT APPARAT...
- Publication number 20240426605
- Publication date Dec 26, 2024
- KIOXIA Corporation
- Taiki ITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SINKAGE PREDICTION DEVICE AND SINKAGE PREDICTION METHOD
- Publication number 20240427012
- Publication date Dec 26, 2024
- Synspective Inc.
- Tomoyuki IMAIZUMI
- G01 - MEASURING TESTING
Information Patent Application
Electromagnetic Response Simulation for Arbitrary Road Surface Prof...
- Publication number 20240411011
- Publication date Dec 12, 2024
- Aptiv Technologies Limited
- Fang Chen
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROVISION DEVICE, INFORMATION PROVISION METHOD, RECORDI...
- Publication number 20240402333
- Publication date Dec 5, 2024
- NEC Corporation
- Nana JUMONJI
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GENERATING SYNTHETIC MICROSPY IMAGES OF SUBSTRATES
- Publication number 20240394509
- Publication date Nov 28, 2024
- Applied Materials, Inc.
- Sejune Cheon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A DEVICE OPERATING METHOD, SYSTEM, AND DEVICE
- Publication number 20240385704
- Publication date Nov 21, 2024
- Goertek Inc.
- Li TIAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME
- Publication number 20240385126
- Publication date Nov 21, 2024
- VIEWORKS CO., LTD.
- Jungmin CHOI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PERCEIVING POSITION AND POSE OF HYDRAULIC SUPPORT GROUP B...
- Publication number 20240369695
- Publication date Nov 7, 2024
- SHANDONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Wenhong LI
- F15 - FLUID-PRESSURE ACTUATORS HYDRAULICS OR PNEUMATICS IN GENERAL
Information Patent Application
INSPECTION APPARATUS AND METHOD
- Publication number 20240369356
- Publication date Nov 7, 2024
- ASML NETHERLANDS B.V.
- Yan WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A SYSTEM AND METHOD FOR SENSING TOPOLOGY OF A PLANET
- Publication number 20240337482
- Publication date Oct 10, 2024
- Suyash Singh
- G01 - MEASURING TESTING

Measuring arrangements characterised by the use of wave or particle radiation

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Characterizing and measuring in small boxes using XPS with multiple...

Method and apparatus for determining the geometrical dimensions of...

Method of enhancing contrast while imaging high aspect ratio struct...

Curing oven and method of controlling curing oven

Radio frequency identification based three-dimensional metrology

Method of estimating target height by detection device

Wall shape measurement device

Axial deviation estimating device

Ultra-precision timing clock method

Method for calibrating a THz measuring apparatus, THz measuring met...

Method and apparatus for cooperative usage of multiple distance meters

Device and method for the additive manufacture of a workpiece

Methods for growing crystals on QCM sensors

Method of perceiving position and pose of hydraulic support group b...

X-ray reflectometry apparatus and method thereof for measuring thre...

Pattern measurement device and pattern measurement method

Scatterometry with high harmonic generation (HHG) sources

Sealing arrangement for detecting thickness of a sealing element of...

Row closing assemblies

Metrology measurement method and apparatus

Enhanced cross sectional features measurement methodology

Component imaging systems, apparatus, and methods

Device feature specific edge placement error (EPE)

Measurement of metal or alloy coating

Design-assisted large field of view metrology

Method and system for utilizing radio-opaque fillers in multiple la...

System and method for evaluating a status of a material in metallur...

Wavelet system and method for ameliorating misregistration and asym...

Inspection apparatus and method

Method and system for non-destructive metrology of thin layers

Patents Applicationslast 30 patents

Method and Apparatus for Cooperative Usage of Multiple Distance Meters

NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...

APPARATUS FOR DIVERTING RADIATION EMITTED FROM SOURCE

SCANNING PARTS AT TARGET TEMPERATURES

Method and Apparatus for Cooperative Usage of Multiple Distance Meters

SYSTEM AND METHOD

Method and Apparatus for Cooperative Usage of Multiple Distance Meters

PDMS (POLY(DIMETHYL SILOXANE))-BASED ANALYSIS METHOD OF COSMETIC FI...

FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION

Pattern Measurement Device and Pattern Measurement Method

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

CLOSED LOOP CLOSING SYSTEM CONTROL

DEEP STRUCTURE SIGNAL DETECTION AND ENHANCEMENT BY SEPARATION TO UP...

NLS Using a Bounded Linear Initial Search Space and a Fixed Grid wi...

THZ MEASURING METHOD AND THZ MEASURING DEVICE FOR MEASURING A JOINT...

FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...

ENHANCED CROSS SECTIONAL FEATURES MEASUREMENT METHODOLOGY

Method And System For Utilizing Radio-Opaque Fillers In Multiple La...

Method to Control Gap for Sheet Manufacturing Measurement Processes

PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT APPARAT...

SINKAGE PREDICTION DEVICE AND SINKAGE PREDICTION METHOD

Electromagnetic Response Simulation for Arbitrary Road Surface Prof...

INFORMATION PROVISION DEVICE, INFORMATION PROVISION METHOD, RECORDI...

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

GENERATING SYNTHETIC MICROSPY IMAGES OF SUBSTRATES

A DEVICE OPERATING METHOD, SYSTEM, AND DEVICE

VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME

METHOD OF PERCEIVING POSITION AND POSE OF HYDRAULIC SUPPORT GROUP B...

INSPECTION APPARATUS AND METHOD

A SYSTEM AND METHOD FOR SENSING TOPOLOGY OF A PLANET