Measuring arrangements characterised by the use of wave or particle radiation

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Patents Grantslast 30 patents

Information Patent Grant
Method of calculating thickness of graphene layer and method of mea...
- Patent number 12,359,911
- Issue date Jul 15, 2025
- Samsung Electronics Co., Ltd.
- Eunkyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement system, pattern measurement method, and program...
- Patent number 12,347,074
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshimasa Kameda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for measuring thickness and optical properties of multi-laye...
- Patent number 12,345,518
- Issue date Jul 1, 2025
- Huaqiao University
- Changcai Cui
- G01 - MEASURING TESTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,337,215
- Issue date Jun 24, 2025
- Topgolf Callaway Brands Corp.
- Megan Ilnicky
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Scale-aware self-supervised monocular depth with sparse radar super...
- Patent number 12,333,744
- Issue date Jun 17, 2025
- Toyota Research Institute, Inc.
- Vitor Guizilini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for determining vehicle parameters
- Patent number 12,326,493
- Issue date Jun 10, 2025
- Continental Automotive Technologies GmbH
- Andreas Weinlich
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Harvesting head for length determination of a tree trunk and an ass...
- Patent number 12,310,297
- Issue date May 27, 2025
- Log Max AB
- Mikael Eliasson
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Wellhead landing base inspection utilizing x-rays
- Patent number 12,313,571
- Issue date May 27, 2025
- Saudi Arabian Oil Company
- Hamzah A. Al-Khalifah
- E21 - EARTH DRILLING MINING
Information Patent Grant
Radar fill level measurement device with a radar system-on-chip
- Patent number 12,313,438
- Issue date May 27, 2025
- Vega Grieshaber KG
- Roland Welle
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 12,281,893
- Issue date Apr 22, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining the geometrical dimensions of...
- Patent number 12,276,571
- Issue date Apr 15, 2025
- Snap-on Equipment SRL a Unico Socio
- Paolo Sotgiu
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method of enhancing contrast while imaging high aspect ratio struct...
- Patent number 12,272,607
- Issue date Apr 8, 2025
- Applied Materials, Inc.
- Geetika Bajaj
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Curing oven and method of controlling curing oven
- Patent number 12,264,098
- Issue date Apr 1, 2025
- ROCKWOOL A/S
- Ole Andreasen
- D04 - BRAIDING LACE-MAKING KNITTING TRIMMINGS NON-WOVEN FABRICS
Information Patent Grant
Radio frequency identification based three-dimensional metrology
- Patent number 12,253,354
- Issue date Mar 18, 2025
- International Business Machines Corporation
- Olawunmi Akinlemibola
- G01 - MEASURING TESTING
Information Patent Grant
Method of estimating target height by detection device
- Patent number 12,247,832
- Issue date Mar 11, 2025
- Aptiv Technologies AG
- Honghui Yan
- G01 - MEASURING TESTING
Information Patent Grant
Wall shape measurement device
- Patent number 12,247,833
- Issue date Mar 11, 2025
- Denso Corporation
- Naotsugu Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Axial deviation estimating device
- Patent number 12,235,099
- Issue date Feb 25, 2025
- Denso Corporation
- Katsuhiko Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-precision timing clock method
- Patent number 12,226,246
- Issue date Feb 18, 2025
- Weng-Dah Ken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for calibrating a THz measuring apparatus, THz measuring met...
- Patent number 12,216,050
- Issue date Feb 4, 2025
- CiTEX Holding GmbH
- Roland Böhm
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for cooperative usage of multiple distance meters
- Patent number 12,215,969
- Issue date Feb 4, 2025
- May Patents Ltd.
- Yehuda Binder
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for the additive manufacture of a workpiece
- Patent number 12,202,205
- Issue date Jan 21, 2025
- Intom GmbH
- Martin Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Methods for growing crystals on QCM sensors
- Patent number 12,195,840
- Issue date Jan 14, 2025
- Saudi Arabian Oil Company
- Ayrat Gizzatov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of perceiving position and pose of hydraulic support group b...
- Patent number 12,196,837
- Issue date Jan 14, 2025
- Shandong University of Science and Technology
- Wenhong Li
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 12,188,883
- Issue date Jan 7, 2025
- Industrial Technology Research Institute
- Bo-Ching He
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 12,174,551
- Issue date Dec 24, 2024
- Hitachi High-Technologies Corporation
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scatterometry with high harmonic generation (HHG) sources
- Patent number 12,174,009
- Issue date Dec 24, 2024
- B.G. Negev Technologies and Applications Ltd., at Ben-Gurion University
- Evgeny Frumker
- G01 - MEASURING TESTING
Information Patent Grant
Sealing arrangement for detecting thickness of a sealing element of...
- Patent number 12,173,798
- Issue date Dec 24, 2024
- Andritz Oy
- Simo Karjalainen
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Row closing assemblies
- Patent number 12,144,276
- Issue date Nov 19, 2024
- Precision Planting LLC
- Dale M. Koch
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Metrology measurement method and apparatus
- Patent number 12,140,875
- Issue date Nov 12, 2024
- ASML Netherlands B.V.
- Ilse Van Weperen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Enhanced cross sectional features measurement methodology
- Patent number 12,123,708
- Issue date Oct 22, 2024
- Applied Materials, Inc.
- Manoj Kumar Dayyala
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY APODIZATION FILTER
- Publication number 20250237500
- Publication date Jul 24, 2025
- Thermo EGS Gauging LLC
- Carter Watson
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20250224348
- Publication date Jul 10, 2025
- TORAY INDUSTRIES, INC.
- Takahiro MURAI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THICKNESS OF PIPE BASED ON IMAGE...
- Publication number 20250225672
- Publication date Jul 10, 2025
- DOOSAN ENERBILITY CO., LTD.
- Eun KWON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM
- Publication number 20250216346
- Publication date Jul 3, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ron MEIRY
- G01 - MEASURING TESTING
Information Patent Application
NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD
- Publication number 20250176925
- Publication date Jun 5, 2025
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON TUBE AND SPECTROSCOPE
- Publication number 20250172389
- Publication date May 29, 2025
- HAMAMATSU PHOTONICS K. K.
- Makoto SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...
- Publication number 20250164422
- Publication date May 22, 2025
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Koji SASAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING A TRAILER DIMENSION OF A MOTOR...
- Publication number 20250164242
- Publication date May 22, 2025
- Hyundai Motor Company
- Mario Liebeck
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Cooperative Usage of Multiple Distance Meters
- Publication number 20250137776
- Publication date May 1, 2025
- Yehuda BINDER
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...
- Publication number 20250130185
- Publication date Apr 24, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Uri Hadar
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR DIVERTING RADIATION EMITTED FROM SOURCE
- Publication number 20250122810
- Publication date Apr 17, 2025
- GE Infrastructure Technology, LLC
- Kurt Kramer Schleif
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PARTS AT TARGET TEMPERATURES
- Publication number 20250116618
- Publication date Apr 10, 2025
- WEST PHARMACEUTICAL SERVICES, INC.
- Md Abu HASAN
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Cooperative Usage of Multiple Distance Meters
- Publication number 20250102295
- Publication date Mar 27, 2025
- Yehuda BINDER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD
- Publication number 20250102296
- Publication date Mar 27, 2025
- NXP B.V.
- Matteo Ridolfi
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Cooperative Usage of Multiple Distance Meters
- Publication number 20250085104
- Publication date Mar 13, 2025
- Yehuda BINDER
- G01 - MEASURING TESTING
Information Patent Application
PDMS (POLY(DIMETHYL SILOXANE))-BASED ANALYSIS METHOD OF COSMETIC FI...
- Publication number 20250076223
- Publication date Mar 6, 2025
- AMOREPACIFIC CORPORATION
- Chaeyeon SONG
- G01 - MEASURING TESTING
Information Patent Application
FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION
- Publication number 20250076038
- Publication date Mar 6, 2025
- FEI Company
- Stefano Vespucci
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Measurement Device and Pattern Measurement Method
- Publication number 20250060678
- Publication date Feb 20, 2025
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLOSED LOOP CLOSING SYSTEM CONTROL
- Publication number 20250040467
- Publication date Feb 6, 2025
- PRECISION PLANTING LLC
- Dale M. Koch
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
DEEP STRUCTURE SIGNAL DETECTION AND ENHANCEMENT BY SEPARATION TO UP...
- Publication number 20250035438
- Publication date Jan 30, 2025
- ETROLOGY, LLC
- Vladislav Kaplan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NLS Using a Bounded Linear Initial Search Space and a Fixed Grid wi...
- Publication number 20250035436
- Publication date Jan 30, 2025
- Aptiv Technologies Limited
- Xin Zhang
- G01 - MEASURING TESTING
Information Patent Application
THZ MEASURING METHOD AND THZ MEASURING DEVICE FOR MEASURING A JOINT...
- Publication number 20250035437
- Publication date Jan 30, 2025
- CiTEX Holding GmbH
- Jan Hendrik BECKMANN
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...
- Publication number 20250003898
- Publication date Jan 2, 2025
- HITACHI HIGH-TECH CORPORATION
- Wei SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED CROSS SECTIONAL FEATURES MEASUREMENT METHODOLOGY
- Publication number 20250003742
- Publication date Jan 2, 2025
- Applied Materials, Inc.
- Manoj Kumar Dayyala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And System For Utilizing Radio-Opaque Fillers In Multiple La...
- Publication number 20240424351
- Publication date Dec 26, 2024
- Topgolf Callaway Brands Corp.
- David M. Melanson
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Application
Method to Control Gap for Sheet Manufacturing Measurement Processes
- Publication number 20240426604
- Publication date Dec 26, 2024
- Honeywell International Inc.
- Greg Reynen
- G01 - MEASURING TESTING
Information Patent Application
PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT APPARAT...
- Publication number 20240426605
- Publication date Dec 26, 2024
- KIOXIA Corporation
- Taiki ITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SINKAGE PREDICTION DEVICE AND SINKAGE PREDICTION METHOD
- Publication number 20240427012
- Publication date Dec 26, 2024
- Synspective Inc.
- Tomoyuki IMAIZUMI
- G01 - MEASURING TESTING
Information Patent Application
Electromagnetic Response Simulation for Arbitrary Road Surface Prof...
- Publication number 20240411011
- Publication date Dec 12, 2024
- Aptiv Technologies Limited
- Fang Chen
- G01 - MEASURING TESTING

Measuring arrangements characterised by the use of wave or particle radiation

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Method of calculating thickness of graphene layer and method of mea...

Pattern measurement system, pattern measurement method, and program...

Method for measuring thickness and optical properties of multi-laye...

Method and system utilizing imaging analysis for golf balls

Scale-aware self-supervised monocular depth with sparse radar super...

Method and device for determining vehicle parameters

Harvesting head for length determination of a tree trunk and an ass...

Wellhead landing base inspection utilizing x-rays

Radar fill level measurement device with a radar system-on-chip

Characterizing and measuring in small boxes using XPS with multiple...

Method and apparatus for determining the geometrical dimensions of...

Method of enhancing contrast while imaging high aspect ratio struct...

Curing oven and method of controlling curing oven

Radio frequency identification based three-dimensional metrology

Method of estimating target height by detection device

Wall shape measurement device

Axial deviation estimating device

Ultra-precision timing clock method

Method for calibrating a THz measuring apparatus, THz measuring met...

Method and apparatus for cooperative usage of multiple distance meters

Device and method for the additive manufacture of a workpiece

Methods for growing crystals on QCM sensors

Method of perceiving position and pose of hydraulic support group b...

X-ray reflectometry apparatus and method thereof for measuring thre...

Pattern measurement device and pattern measurement method

Scatterometry with high harmonic generation (HHG) sources

Sealing arrangement for detecting thickness of a sealing element of...

Row closing assemblies

Metrology measurement method and apparatus

Enhanced cross sectional features measurement methodology

Patents Applicationslast 30 patents

X-RAY APODIZATION FILTER

INSPECTION DEVICE AND INSPECTION METHOD

APPARATUS AND METHOD FOR MEASURING THICKNESS OF PIPE BASED ON IMAGE...

DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM

NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD

ELECTRON TUBE AND SPECTROSCOPE

METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...

METHOD AND APPARATUS FOR DETERMINING A TRAILER DIMENSION OF A MOTOR...

Method and Apparatus for Cooperative Usage of Multiple Distance Meters

NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...

APPARATUS FOR DIVERTING RADIATION EMITTED FROM SOURCE

SCANNING PARTS AT TARGET TEMPERATURES

Method and Apparatus for Cooperative Usage of Multiple Distance Meters

SYSTEM AND METHOD

Method and Apparatus for Cooperative Usage of Multiple Distance Meters

PDMS (POLY(DIMETHYL SILOXANE))-BASED ANALYSIS METHOD OF COSMETIC FI...

FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION

Pattern Measurement Device and Pattern Measurement Method

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

CLOSED LOOP CLOSING SYSTEM CONTROL

DEEP STRUCTURE SIGNAL DETECTION AND ENHANCEMENT BY SEPARATION TO UP...

NLS Using a Bounded Linear Initial Search Space and a Fixed Grid wi...

THZ MEASURING METHOD AND THZ MEASURING DEVICE FOR MEASURING A JOINT...

FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...

ENHANCED CROSS SECTIONAL FEATURES MEASUREMENT METHODOLOGY

Method And System For Utilizing Radio-Opaque Fillers In Multiple La...

Method to Control Gap for Sheet Manufacturing Measurement Processes

PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT APPARAT...

SINKAGE PREDICTION DEVICE AND SINKAGE PREDICTION METHOD

Electromagnetic Response Simulation for Arbitrary Road Surface Prof...