Measuring arrangements characterised by the use of wave or particle radiation

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for the additive manufacture of a workpiece
- Patent number 12,202,205
- Issue date Jan 21, 2025
- Intom GmbH
- Martin Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Methods for growing crystals on QCM sensors
- Patent number 12,195,840
- Issue date Jan 14, 2025
- Saudi Arabian Oil Company
- Ayrat Gizzatov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of perceiving position and pose of hydraulic support group b...
- Patent number 12,196,837
- Issue date Jan 14, 2025
- Shandong University of Science and Technology
- Wenhong Li
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 12,188,883
- Issue date Jan 7, 2025
- Industrial Technology Research Institute
- Bo-Ching He
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 12,174,551
- Issue date Dec 24, 2024
- Hitachi High-Technologies Corporation
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scatterometry with high harmonic generation (HHG) sources
- Patent number 12,174,009
- Issue date Dec 24, 2024
- B.G. Negev Technologies and Applications Ltd., at Ben-Gurion University
- Evgeny Frumker
- G01 - MEASURING TESTING
Information Patent Grant
Sealing arrangement for detecting thickness of a sealing element of...
- Patent number 12,173,798
- Issue date Dec 24, 2024
- Andritz Oy
- Simo Karjalainen
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Row closing assemblies
- Patent number 12,144,276
- Issue date Nov 19, 2024
- Precision Planting LLC
- Dale M. Koch
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Metrology measurement method and apparatus
- Patent number 12,140,875
- Issue date Nov 12, 2024
- ASML Netherlands B.V.
- Ilse Van Weperen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Enhanced cross sectional features measurement methodology
- Patent number 12,123,708
- Issue date Oct 22, 2024
- Applied Materials, Inc.
- Manoj Kumar Dayyala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Component imaging systems, apparatus, and methods
- Patent number 12,111,148
- Issue date Oct 8, 2024
- General Electric Company
- Andrew Frank Ferro
- G01 - MEASURING TESTING
Information Patent Grant
Device feature specific edge placement error (EPE)
- Patent number 12,092,966
- Issue date Sep 17, 2024
- KLA Corporation
- Amnon Manassen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Design-assisted large field of view metrology
- Patent number 12,085,385
- Issue date Sep 10, 2024
- KLA Corporation
- Stefan Eyring
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for utilizing radio-opaque fillers in multiple la...
- Patent number 12,083,390
- Issue date Sep 10, 2024
- Topgolf Callaway Brands Corp.
- David M. Melanson
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
System and method for evaluating a status of a material in metallur...
- Patent number 12,085,384
- Issue date Sep 10, 2024
- PANERATECH, INC.
- Yakup Bayram
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wavelet system and method for ameliorating misregistration and asym...
- Patent number 12,080,610
- Issue date Sep 3, 2024
- KLA Corporation
- Lilach Saltoun
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection apparatus and method
- Patent number 12,072,181
- Issue date Aug 27, 2024
- ASML Netherlands B.V.
- Yan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for measuring a tubular strand
- Patent number 12,064,911
- Issue date Aug 20, 2024
- Sikora AG
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for evaluation of a status of a material in me...
- Patent number 12,061,155
- Issue date Aug 13, 2024
- PANERATECH, INC.
- Yakup Bayram
- G01 - MEASURING TESTING
Information Patent Grant
Depth map generation
- Patent number 12,061,253
- Issue date Aug 13, 2024
- Ford Global Technologies, LLC
- Yunfei Long
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring a tubular strand
- Patent number 12,055,386
- Issue date Aug 6, 2024
- Sikora AG
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Grant
Strength evaluation device and strength evaluation method
- Patent number 12,050,188
- Issue date Jul 30, 2024
- IHI Corporation
- Sayo Yamaha
- B32 - LAYERED PRODUCTS
Information Patent Grant
Multi-mode microwave waveguide blade sensing system
- Patent number 12,050,152
- Issue date Jul 30, 2024
- RTX Corporation
- Jonathan Gilson
- G01 - MEASURING TESTING
Information Patent Grant
Airfoil tip cleaning and assessment systems and methods
- Patent number 12,044,632
- Issue date Jul 23, 2024
- RTX Corporation
- Christopher James Pelliccione
- G08 - SIGNALLING
Information Patent Grant
Blade portioner calibration
- Patent number RE50028
- Issue date Jul 2, 2024
- John Bean Technologies Corporation
- Jon A. Hocker
Information Patent Grant
Systems, apparatuses, and methods for measuring submerged surfaces
- Patent number 12,025,573
- Issue date Jul 2, 2024
- DELTA SUBSEA LLC
- Scott P. Dingman
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Ice thickness estimation for mobile object operation
- Patent number 12,007,248
- Issue date Jun 11, 2024
- Ford Global Technologies, LLC
- Arun Dutta
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Measurement of thickness of scale or corrosion
- Patent number 12,007,226
- Issue date Jun 11, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...
- Publication number 20250003898
- Publication date Jan 2, 2025
- HITACHI HIGH-TECH CORPORATION
- Wei SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED CROSS SECTIONAL FEATURES MEASUREMENT METHODOLOGY
- Publication number 20250003742
- Publication date Jan 2, 2025
- Applied Materials, Inc.
- Manoj Kumar Dayyala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And System For Utilizing Radio-Opaque Fillers In Multiple La...
- Publication number 20240424351
- Publication date Dec 26, 2024
- Topgolf Callaway Brands Corp.
- David M. Melanson
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Application
Method to Control Gap for Sheet Manufacturing Measurement Processes
- Publication number 20240426604
- Publication date Dec 26, 2024
- Honeywell International Inc.
- Greg Reynen
- G01 - MEASURING TESTING
Information Patent Application
PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT APPARAT...
- Publication number 20240426605
- Publication date Dec 26, 2024
- KIOXIA Corporation
- Taiki ITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SINKAGE PREDICTION DEVICE AND SINKAGE PREDICTION METHOD
- Publication number 20240427012
- Publication date Dec 26, 2024
- Synspective Inc.
- Tomoyuki IMAIZUMI
- G01 - MEASURING TESTING
Information Patent Application
Electromagnetic Response Simulation for Arbitrary Road Surface Prof...
- Publication number 20240411011
- Publication date Dec 12, 2024
- Aptiv Technologies Limited
- Fang Chen
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROVISION DEVICE, INFORMATION PROVISION METHOD, RECORDI...
- Publication number 20240402333
- Publication date Dec 5, 2024
- NEC Corporation
- Nana JUMONJI
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GENERATING SYNTHETIC MICROSPY IMAGES OF SUBSTRATES
- Publication number 20240394509
- Publication date Nov 28, 2024
- Applied Materials, Inc.
- Sejune Cheon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME
- Publication number 20240385126
- Publication date Nov 21, 2024
- VIEWORKS CO., LTD.
- Jungmin CHOI
- G01 - MEASURING TESTING
Information Patent Application
A DEVICE OPERATING METHOD, SYSTEM, AND DEVICE
- Publication number 20240385704
- Publication date Nov 21, 2024
- Goertek Inc.
- Li TIAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PERCEIVING POSITION AND POSE OF HYDRAULIC SUPPORT GROUP B...
- Publication number 20240369695
- Publication date Nov 7, 2024
- SHANDONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Wenhong LI
- F15 - FLUID-PRESSURE ACTUATORS HYDRAULICS OR PNEUMATICS IN GENERAL
Information Patent Application
INSPECTION APPARATUS AND METHOD
- Publication number 20240369356
- Publication date Nov 7, 2024
- ASML NETHERLANDS B.V.
- Yan WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A SYSTEM AND METHOD FOR SENSING TOPOLOGY OF A PLANET
- Publication number 20240337482
- Publication date Oct 10, 2024
- Suyash Singh
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHECKING A BATTERY ELEMENT STACK WITH REGARD TO THE POSI...
- Publication number 20240318955
- Publication date Sep 26, 2024
- Volkswagen Aktiengesellschaft
- Steffen MASUCH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT DEVICE,...
- Publication number 20240310167
- Publication date Sep 19, 2024
- KIOXIA Corporation
- Kazuki HAGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURE METHOD
- Publication number 20240304562
- Publication date Sep 12, 2024
- NANYA TECHNOLOGY CORPORATION
- Ding Lun LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POSITION DETECTION APPARATUS, POSITION DETECTION METHOD, AND NON-TR...
- Publication number 20240292511
- Publication date Aug 29, 2024
- Lasertec Corporation
- Keitaro HAYASHIDA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY
- Publication number 20240280360
- Publication date Aug 22, 2024
- Honeywell International Inc.
- Gertjan Job Hofman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING DEVICE AND IMAGING METHOD
- Publication number 20240280361
- Publication date Aug 22, 2024
- Integral Geometry Science Inc.
- Kenjiro KIMURA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSP...
- Publication number 20240255445
- Publication date Aug 1, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi MATSUBARA
- G01 - MEASURING TESTING
Information Patent Application
COMPLEX SENSING DEVICE AND SENSING METHOD INCLUDING THE SAME
- Publication number 20240255274
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Changi Jeon
- G01 - MEASURING TESTING
Information Patent Application
Depth Measurement Device, Depth Measurement System, and Depth Index...
- Publication number 20240240937
- Publication date Jul 18, 2024
- Hitachi High-Tech Corporation
- Aoi YAMAUCHI
- G01 - MEASURING TESTING
Information Patent Application
GAP INSPECTION APPARATUS AND GAP INSPECTION METHOD
- Publication number 20240230324
- Publication date Jul 11, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Fenglin ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETERMINING A POSITION OF A TREATMENT INSTRUMENT TO PERFORM A TREAT...
- Publication number 20240210169
- Publication date Jun 27, 2024
- Siemens Healthcare GmbH
- Alois Regensburger
- G01 - MEASURING TESTING
Information Patent Application
CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...
- Publication number 20240210332
- Publication date Jun 27, 2024
- TROXLER ELECTRONIC LABORATORIES, INC.
- Wewage Hiran Linus Dep
- G01 - MEASURING TESTING
Information Patent Application
CONTOUR LINE ANALYSIS APPARATUS, PROCESSING DIMENSION EXTRACTION SY...
- Publication number 20240200938
- Publication date Jun 20, 2024
- Hitachi High-Tech Corporation
- Naoto TAKANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING A CONTOUR OF AN OBJECT
- Publication number 20240191987
- Publication date Jun 13, 2024
- Aptiv Technologies AG
- Mateusz SNIEGUCKI
- G01 - MEASURING TESTING
Information Patent Application
Resonance-Based Imaging in Grain Bins
- Publication number 20240183799
- Publication date Jun 6, 2024
- Mohammad Asefi
- G06 - COMPUTING CALCULATING COUNTING

Measuring arrangements characterised by the use of wave or particle radiation

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Device and method for the additive manufacture of a workpiece

Methods for growing crystals on QCM sensors

Method of perceiving position and pose of hydraulic support group b...

X-ray reflectometry apparatus and method thereof for measuring thre...

Pattern measurement device and pattern measurement method

Scatterometry with high harmonic generation (HHG) sources

Sealing arrangement for detecting thickness of a sealing element of...

Row closing assemblies

Metrology measurement method and apparatus

Enhanced cross sectional features measurement methodology

Component imaging systems, apparatus, and methods

Device feature specific edge placement error (EPE)

Measurement of metal or alloy coating

Design-assisted large field of view metrology

Method and system for utilizing radio-opaque fillers in multiple la...

System and method for evaluating a status of a material in metallur...

Wavelet system and method for ameliorating misregistration and asym...

Inspection apparatus and method

Method and device for measuring a tubular strand

Method and system for non-destructive metrology of thin layers

Method and apparatus for evaluation of a status of a material in me...

Depth map generation

Method and device for measuring a tubular strand

Strength evaluation device and strength evaluation method

Multi-mode microwave waveguide blade sensing system

Airfoil tip cleaning and assessment systems and methods

Blade portioner calibration

Systems, apparatuses, and methods for measuring submerged surfaces

Ice thickness estimation for mobile object operation

Measurement of thickness of scale or corrosion

Patents Applicationslast 30 patents

FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...

ENHANCED CROSS SECTIONAL FEATURES MEASUREMENT METHODOLOGY

Method And System For Utilizing Radio-Opaque Fillers In Multiple La...

Method to Control Gap for Sheet Manufacturing Measurement Processes

PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT APPARAT...

SINKAGE PREDICTION DEVICE AND SINKAGE PREDICTION METHOD

Electromagnetic Response Simulation for Arbitrary Road Surface Prof...

INFORMATION PROVISION DEVICE, INFORMATION PROVISION METHOD, RECORDI...

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

GENERATING SYNTHETIC MICROSPY IMAGES OF SUBSTRATES

VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME

A DEVICE OPERATING METHOD, SYSTEM, AND DEVICE

METHOD OF PERCEIVING POSITION AND POSE OF HYDRAULIC SUPPORT GROUP B...

INSPECTION APPARATUS AND METHOD

A SYSTEM AND METHOD FOR SENSING TOPOLOGY OF A PLANET

METHOD FOR CHECKING A BATTERY ELEMENT STACK WITH REGARD TO THE POSI...

PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT DEVICE,...

SEMICONDUCTOR DEVICE AND MANUFACTURE METHOD

POSITION DETECTION APPARATUS, POSITION DETECTION METHOD, AND NON-TR...

LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY

IMAGING DEVICE AND IMAGING METHOD

X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSP...

COMPLEX SENSING DEVICE AND SENSING METHOD INCLUDING THE SAME

Depth Measurement Device, Depth Measurement System, and Depth Index...

GAP INSPECTION APPARATUS AND GAP INSPECTION METHOD

DETERMINING A POSITION OF A TREATMENT INSTRUMENT TO PERFORM A TREAT...

CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...

CONTOUR LINE ANALYSIS APPARATUS, PROCESSING DIMENSION EXTRACTION SY...

METHOD FOR DETERMINING A CONTOUR OF AN OBJECT

Resonance-Based Imaging in Grain Bins