by measuring diffraction of electrons

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G01N23/20058

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/20058by measuring diffraction of electrons

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Patents Grantslast 30 patents

Information Patent Grant
Method for the detection and correction of lens distortions in an e...
- Patent number 12,078,603
- Issue date Sep 3, 2024
- Joerg Kaercher
- G01 - MEASURING TESTING
Information Patent Grant
Methods for determining crystal structure and apparatus for carryin...
- Patent number 12,072,305
- Issue date Aug 27, 2024
- FYZIKALNI USTAV AV CR. V.V.I
- Lukas Palatinus
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for performing serial electron diffraction nano...
- Patent number 12,072,304
- Issue date Aug 27, 2024
- R. J. Dwayne Miller
- G01 - MEASURING TESTING
Information Patent Grant
Crystal defect observation method for compound semiconductor
- Patent number 12,038,396
- Issue date Jul 16, 2024
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass spectrometer
- Patent number 11,906,449
- Issue date Feb 20, 2024
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hyperdimensional scanning transmission electron microscopy and exam...
- Patent number 11,852,598
- Issue date Dec 26, 2023
- Battelle Energy Alliance, LLC
- Jeffery A. Aguiar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
- Patent number 11,815,476
- Issue date Nov 14, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscopy analysis method
- Patent number 11,686,693
- Issue date Jun 27, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Nicolas Bernier
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method, and recording medium storing command for control...
- Patent number 11,597,997
- Issue date Mar 7, 2023
- IVWorks Co., Ltd.
- Young Kyun Noh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Laser welding method between different kinds of metals for optimizi...
- Patent number 11,383,324
- Issue date Jul 12, 2022
- LG Chem, Ltd.
- Jin Soo Lee
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Methods and compositions for micro-electron diffraction
- Patent number 11,293,883
- Issue date Apr 5, 2022
- Howard Hughes Medical Institute
- Tamir Gonen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for automatic zone axis alignment
- Patent number 11,211,222
- Issue date Dec 28, 2021
- FEI Company
- John J. Flanagan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring electron backscatter diffraction...
- Patent number 11,114,275
- Issue date Sep 7, 2021
- FEI Company
- Pavel Stejskal
- G01 - MEASURING TESTING
Information Patent Grant
Crystal structure analysis system and crystal structure analysis me...
- Patent number 10,955,366
- Issue date Mar 23, 2021
- Jeol Ltd.
- Koji Yonekura
- G01 - MEASURING TESTING
Information Patent Grant
Method for automatically aligning a scanning transmission electron...
- Patent number 10,811,216
- Issue date Oct 20, 2020
- TESCAN BRNO s.r.o
- Stanislav Petras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photocathode emitter system that generates multiple electron beams
- Patent number 10,741,354
- Issue date Aug 11, 2020
- KLA-Tencor Corporation
- Gildardo R. Delgado
- G01 - MEASURING TESTING
Information Patent Grant
System and method of analyzing a crystal defect
- Patent number 10,727,025
- Issue date Jul 28, 2020
- Samsung Electronics Co., Ltd.
- Sung-Bo Shim
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing electron diffraction pattern analysis upon a s...
- Patent number 10,663,414
- Issue date May 26, 2020
- Oxford Instruments Nanotechnology Tools Limited
- Frank Willi Bauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for performing nano beam diffraction analysis
- Patent number 10,658,154
- Issue date May 19, 2020
- International Business Machines Corporation
- Marc Adam Bergendahl
- G01 - MEASURING TESTING
Information Patent Grant
Scanning transmission electron microscope
- Patent number 10,636,622
- Issue date Apr 28, 2020
- Tescan Orsay Holding, A.S.
- Petras Stanislav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining the deflection of an electron beam resulting...
- Patent number 10,593,511
- Issue date Mar 17, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Benedikt Haas
- G01 - MEASURING TESTING
Information Patent Grant
Scanning transmission electron microscope with an objective electro...
- Patent number 10,381,193
- Issue date Aug 13, 2019
- TESCAN Brno, s.r.o.
- Petras Stanislav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and method of image gener...
- Patent number 10,340,118
- Issue date Jul 2, 2019
- Jeol Ltd.
- Ryusuke Sagawa
- G01 - MEASURING TESTING
Information Patent Grant
Detector for X-rays with high spatial and high spectral resolution
- Patent number 10,295,486
- Issue date May 21, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Devices and systems for spatial aggregation of spectral analysis fr...
- Patent number 10,139,356
- Issue date Nov 27, 2018
- EDAX, Incorporated
- Divyesh I. Patel
- G01 - MEASURING TESTING
Information Patent Grant
Transmission electron microscope sample alignment system and method
- Patent number 10,067,078
- Issue date Sep 4, 2018
- King Abdullah University of Science and Technology
- Daliang Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Devices and systems for spatial averaging of electron backscatter d...
- Patent number 9,791,390
- Issue date Oct 17, 2017
- EDAX, Incorporated
- Stuart Ian Wright
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 9,679,738
- Issue date Jun 13, 2017
- Hitachi High-Technologies Corporation
- Hiroaki Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strain mapping in TEM using precession electron diffraction
- Patent number 9,568,442
- Issue date Feb 14, 2017
- Drexel University
- Mitra Lenore Taheri
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...
- Publication number 20240361260
- Publication date Oct 31, 2024
- TOHOKU UNIVERSITY
- Hiroshi JINNAI
- G01 - MEASURING TESTING
Information Patent Application
TEM Orientation Mapping via Dark-Field Vector Images
- Publication number 20240272097
- Publication date Aug 15, 2024
- Virginia Commonwealth University
- Carl R. Mayer
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...
- Publication number 20240272099
- Publication date Aug 15, 2024
- Carl Zeiss SMT GMBH
- Daniel Schwarz
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DIFFRACTION SYSTEM FOR CHARACTERIZING NANOCRYSTALLINE STRU...
- Publication number 20240255447
- Publication date Aug 1, 2024
- Eldico Scientific AG
- Francesco Garbuglia
- G01 - MEASURING TESTING
Information Patent Application
PROXIMITY SENSOR FOR ELECTRON BACKSCATTER DIFFRACTION SYSTEMS
- Publication number 20240241066
- Publication date Jul 18, 2024
- BRUKER NANO GMBH
- Daniel Radu Goran
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF OPERATING AN ELECTRON ENERGY LOSS SPECTROMETER
- Publication number 20240201112
- Publication date Jun 20, 2024
- GATAN, INC.
- Colin Geoffrey TREVOR
- G01 - MEASURING TESTING
Information Patent Application
LAMINATE FOR WIRING BOARD
- Publication number 20240179849
- Publication date May 30, 2024
- Namics Corporation
- Naoki OBATA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE
- Publication number 20240125718
- Publication date Apr 18, 2024
- Silanna UV Technologies Pte Ltd
- Petar Atanackovic
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING THE ABSOLUTE STRUCTURE OF CRYSTAL
- Publication number 20240077436
- Publication date Mar 7, 2024
- FEI Company
- Stefano VESPUCCI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS
- Publication number 20230393083
- Publication date Dec 7, 2023
- Oxford Instruments Nanotechnology Tools Limited
- Patrick Trimby
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION
- Publication number 20230314348
- Publication date Oct 5, 2023
- UNIVERSITY OF HOUSTON SYSTEM
- Byron Freelon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS, METHOD, AND RECORDING MEDIUM STORING COMMAND FOR CONTROL...
- Publication number 20230279538
- Publication date Sep 7, 2023
- IVWorks Co., Ltd.
- Young Kyun NOH
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE ANALYSIS SYSTEM
- Publication number 20230223232
- Publication date Jul 13, 2023
- Riken
- Daisuke SHINDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH THROUGHPUT MICROCRYSTAL SOAKING FOR STRUCTURAL ANALYSIS OF PRO...
- Publication number 20230213463
- Publication date Jul 6, 2023
- California Institute of Technology
- Jessica Burch
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED CAMERA FOR ELECTRON DIFFRACTION PATTERN ANALYSIS
- Publication number 20230175991
- Publication date Jun 8, 2023
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Robert MASTERS
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR COLLECTING ELECTRON DIFFRACTION PATTERNS
- Publication number 20230145297
- Publication date May 11, 2023
- The Regents of the University of California
- Tamir Gonen
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED MAPPING METHOD OF CRYSTALLINE STRUCTURE AND ORIENTATION O...
- Publication number 20230122101
- Publication date Apr 20, 2023
- Samsung Electronics Co., Ltd.
- Young-Min KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods for determining crystal structure and apparatus for carryin...
- Publication number 20230065841
- Publication date Mar 2, 2023
- Fyzikální ústav AV CR, v.v.i.
- Lukas Palatinus
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...
- Publication number 20220317066
- Publication date Oct 6, 2022
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...
- Publication number 20220317068
- Publication date Oct 6, 2022
- Bruker AXS, LLC
- Joerg KAERCHER
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL DEFECT OBSERVATION METHOD FOR COMPOUND SEMICONDUCTOR
- Publication number 20220268715
- Publication date Aug 25, 2022
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20220236200
- Publication date Jul 28, 2022
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMPROVING AN EBSD/TKD MAP
- Publication number 20220221412
- Publication date Jul 14, 2022
- BRUKER NANO GMBH
- Daniel Radu GORAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR PERFORMING SERIAL ELECTRON DIFFRACTION NANO...
- Publication number 20220128493
- Publication date Apr 28, 2022
- R. J. Dwayne MILLER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT
- Publication number 20220076917
- Publication date Mar 10, 2022
- FEI Company
- John J. FLANAGAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYPERDIMENSIONAL SCANNING TRANSMISSION ELECTRON MICROSCOPY AND EXAM...
- Publication number 20210381992
- Publication date Dec 9, 2021
- Battelle Energy Alliance, LLC
- Jeffrey A. Aguiar
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT
- Publication number 20210202205
- Publication date Jul 1, 2021
- FEI Company
- John J. FLANAGAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPY ANALYSIS METHOD
- Publication number 20210010956
- Publication date Jan 14, 2021
- Commissariat a I'Energie Atomique et aux Energies Alternatives
- Nicolas BERNIER
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING ELECTRON BACKSCATTER DIFFRACTION...
- Publication number 20210005420
- Publication date Jan 7, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTOCATHODE EMITTER SYSTEM THAT GENERATES MULTIPLE ELECTRON BEAMS
- Publication number 20200279713
- Publication date Sep 3, 2020
- KLA-Tencor Corporation
- Gildardo R. Delgado
- H01 - BASIC ELECTRIC ELEMENTS

by measuring diffraction of electrons

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for the detection and correction of lens distortions in an e...

Methods for determining crystal structure and apparatus for carryin...

Systems and methods for performing serial electron diffraction nano...

Crystal defect observation method for compound semiconductor

Method for improving an EBSD/TKD map

Mass spectrometer

Hyperdimensional scanning transmission electron microscopy and exam...

Methods and systems for acquiring three-dimensional electron diffra...

Electron microscopy analysis method

Apparatus, method, and recording medium storing command for control...

Laser welding method between different kinds of metals for optimizi...

Methods and compositions for micro-electron diffraction

Method and system for automatic zone axis alignment

Methods and systems for acquiring electron backscatter diffraction...

Crystal structure analysis system and crystal structure analysis me...

Method for automatically aligning a scanning transmission electron...

Photocathode emitter system that generates multiple electron beams

System and method of analyzing a crystal defect

Method of performing electron diffraction pattern analysis upon a s...

System and method for performing nano beam diffraction analysis

Scanning transmission electron microscope

Method of determining the deflection of an electron beam resulting...

Scanning transmission electron microscope with an objective electro...

Scanning transmission electron microscope and method of image gener...

Detector for X-rays with high spatial and high spectral resolution

Devices and systems for spatial aggregation of spectral analysis fr...

Transmission electron microscope sample alignment system and method

Devices and systems for spatial averaging of electron backscatter d...

Electron microscope

Strain mapping in TEM using precession electron diffraction

Patents Applicationslast 30 patents

METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...

TEM Orientation Mapping via Dark-Field Vector Images

HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...

ELECTRON DIFFRACTION SYSTEM FOR CHARACTERIZING NANOCRYSTALLINE STRU...

PROXIMITY SENSOR FOR ELECTRON BACKSCATTER DIFFRACTION SYSTEMS

SYSTEM AND METHOD OF OPERATING AN ELECTRON ENERGY LOSS SPECTROMETER

LAMINATE FOR WIRING BOARD

SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE

METHODS AND SYSTEMS FOR DETERMINING THE ABSOLUTE STRUCTURE OF CRYSTAL

METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS

SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION

APPARATUS, METHOD, AND RECORDING MEDIUM STORING COMMAND FOR CONTROL...

ELECTRON MICROSCOPE ANALYSIS SYSTEM

HIGH THROUGHPUT MICROCRYSTAL SOAKING FOR STRUCTURAL ANALYSIS OF PRO...

IMPROVED CAMERA FOR ELECTRON DIFFRACTION PATTERN ANALYSIS

METHODS FOR COLLECTING ELECTRON DIFFRACTION PATTERNS

AUTOMATED MAPPING METHOD OF CRYSTALLINE STRUCTURE AND ORIENTATION O...

Methods for determining crystal structure and apparatus for carryin...

METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...

METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...

CRYSTAL DEFECT OBSERVATION METHOD FOR COMPOUND SEMICONDUCTOR

MASS SPECTROMETER

METHOD FOR IMPROVING AN EBSD/TKD MAP

SYSTEMS AND METHODS FOR PERFORMING SERIAL ELECTRON DIFFRACTION NANO...

METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT

HYPERDIMENSIONAL SCANNING TRANSMISSION ELECTRON MICROSCOPY AND EXAM...

METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT

ELECTRON MICROSCOPY ANALYSIS METHOD

METHODS AND SYSTEMS FOR ACQUIRING ELECTRON BACKSCATTER DIFFRACTION...

PHOTOCATHODE EMITTER SYSTEM THAT GENERATES MULTIPLE ELECTRON BEAMS