by measuring photoelectric effect

Industry

CPC
G01N23/227

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/227by measuring photoelectric effect

Industries

Patents Grantslast 30 patents

Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,132,026
- Issue date Oct 29, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detection for spectroscopic techniques
- Patent number 12,117,406
- Issue date Oct 15, 2024
- VG Systems Limited
- Bryan Barnard
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductive ceramic member
- Patent number 12,027,405
- Issue date Jul 2, 2024
- Kyocera Corporation
- Yasuharu Tateyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Catalyst for solid polymer fuel cell and method for selecting catal...
- Patent number 12,015,161
- Issue date Jun 18, 2024
- Tanaka Kikinzoku Kogyo K.K.
- Minoru Ishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for positioning and transferring a sample
- Patent number 12,000,789
- Issue date Jun 4, 2024
- FEI Company
- Libor Novak
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 11,988,502
- Issue date May 21, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 11,935,963
- Issue date Mar 19, 2024
- Semiconductor Energy Laboratory Co., Ltd.
- Junichi Koezuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,906,451
- Issue date Feb 20, 2024
- Nova Ltd.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas sensors and methods of sensing a gas-phase analyte
- Patent number 11,906,493
- Issue date Feb 20, 2024
- Rohm and Haas Electronic Materials LLC
- Catherine Mulzer
- G01 - MEASURING TESTING
Information Patent Grant
Method of calculating thickness of graphene layer and method of mea...
- Patent number 11,906,291
- Issue date Feb 20, 2024
- Samsung Electronics Co., Ltd.
- Eunkyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting or quantifying detection target in specimen, co...
- Patent number 11,899,013
- Issue date Feb 13, 2024
- Canon Medical Systems Corporation
- Satoru Sugita
- G01 - MEASURING TESTING
Information Patent Grant
Gallium arsenide single crystal substrate and method for producing...
- Patent number 11,891,720
- Issue date Feb 6, 2024
- Sumitomo Electric Industries, Ltd.
- Koji Uematsu
- G01 - MEASURING TESTING
Information Patent Grant
Copper-clad laminate, wiring board, and copper foil provided with r...
- Patent number 11,895,770
- Issue date Feb 6, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yuki Inoue
- B32 - LAYERED PRODUCTS
Information Patent Grant
Method and system for monitoring deposition process
- Patent number 11,852,467
- Issue date Dec 26, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Grant
Methods of inspecting samples with multiple beams of charged particles
- Patent number 11,815,473
- Issue date Nov 14, 2023
- ASML Netherlands B.V.
- Kuo-Feng Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Feed-forward of multi-layer and multi-process information using XPS...
- Patent number 11,733,035
- Issue date Aug 22, 2023
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Positive electrode active material including impurity elements in a...
- Patent number 11,728,478
- Issue date Aug 15, 2023
- Semiconductor Energy Laboratory Co., Ltd.
- Yohei Momma
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
XPS metrology for process control in selective deposition
- Patent number 11,680,915
- Issue date Jun 20, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Charles Larson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analysis apparatus and method
- Patent number 11,674,913
- Issue date Jun 13, 2023
- Jeol Ltd.
- Takaomi Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,668,663
- Issue date Jun 6, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for non-ionizing non-destructive detection of str...
- Patent number 11,656,191
- Issue date May 23, 2023
- Oleksandr Hryhorovych Kalenychenko
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for virtually executing an operation of an energy...
- Patent number 11,639,906
- Issue date May 2, 2023
- Samsung Electronics Co., Ltd.
- Shashank Shrikant Agashe
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopy and imaging system
- Patent number 11,609,193
- Issue date Mar 21, 2023
- VG Systems Limited
- Oliver Greenwood
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,579,099
- Issue date Feb 14, 2023
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
System and method using x-rays for depth-resolving metrology and an...
- Patent number 11,549,895
- Issue date Jan 10, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for combined reflectometry and photoelectron sp...
- Patent number 11,536,674
- Issue date Dec 27, 2022
- KLA Corporation
- Andrei V. Shchegrov
- G01 - MEASURING TESTING
Information Patent Grant
Ultrahigh surface area materials and methods of making same
- Patent number 11,480,696
- Issue date Oct 25, 2022
- University of South Florida
- Jay A. Bieber
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray analyzer
- Patent number 11,467,103
- Issue date Oct 11, 2022
- APPLIED SCIENCE LABORATORY CO., LTD.
- Hiroyoshi Soejima
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Composite and pneumatic tire
- Patent number 11,433,706
- Issue date Sep 6, 2022
- Sumitomo Rubber Industries, Ltd.
- Natsuki Maekawa
- B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
SiC CRYSTAL SUBSTRATE, METHOD OF MANUFACTURING SiC CRYSTAL SUBSTRAT...
- Publication number 20240387640
- Publication date Nov 21, 2024
- Sumitomo Electric Industries, Ltd.
- Issei SATOH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process and device for the spatially resolved localization of defec...
- Publication number 20240328973
- Publication date Oct 3, 2024
- Sri Ranjini ARUMUGAM
- B82 - NANO-TECHNOLOGY
Information Patent Application
AN ILLUMINATION CONTROL DEVICE FOR A CHARGED PARTICLE ANALYSER
- Publication number 20240310309
- Publication date Sep 19, 2024
- SCIENTA OMICRON AB
- Mikael OLOFSSON
- G01 - MEASURING TESTING
Information Patent Application
DATA ANALYSIS DEVICE, DATA ANALYIS METHOD, PROGRAM, AND RECORDING M...
- Publication number 20240302305
- Publication date Sep 12, 2024
- Sumitomo Electric Industries, Ltd.
- Yutaka HOSHINA
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240297142
- Publication date Sep 5, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240290743
- Publication date Aug 29, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240290745
- Publication date Aug 29, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240266313
- Publication date Aug 8, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro UNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MONITORING DEPOSITION PROCESS
- Publication number 20240167814
- Publication date May 23, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Heath A. POIS
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEA...
- Publication number 20240151522
- Publication date May 9, 2024
- Samsung Electronics Co., Ltd.
- Eunkyu LEE
- G01 - MEASURING TESTING
Information Patent Application
XPS SAMPLE HOLDER, APPARATUS FOR X-RAY PHOTOELECTRON SPECTROSCOPY I...
- Publication number 20240125716
- Publication date Apr 18, 2024
- Korea Institute of Science and Technology
- Soohyung PARK
- G01 - MEASURING TESTING
Information Patent Application
ANGLE-RESOLVING PHOTOELECTRON SPECTROMETER AND METHOD
- Publication number 20240110882
- Publication date Apr 4, 2024
- SCIENTA OMICRON AB
- Mikael OLOFSSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...
- Publication number 20240102950
- Publication date Mar 28, 2024
- Industrial Technology Research Institute
- Chun-Ting LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
- Publication number 20240085174
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION
- Publication number 20240044825
- Publication date Feb 8, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Charles LARSON
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20230408430
- Publication date Dec 21, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN SITU AND TUNABLE DEPOSITION OF A FILM
- Publication number 20230374654
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Hsi Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Positive Electrode Active Material, Method for Manufacturing Positi...
- Publication number 20230327095
- Publication date Oct 12, 2023
- SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Yohei MOMMA
- C01 - INORGANIC CHEMISTRY
Information Patent Application
COMPUTER-IMPLEMENTED METHOD FOR GENERATING EVENT-AVERAGED AND TIME-...
- Publication number 20230314351
- Publication date Oct 5, 2023
- SCIENTA OMICRON AB
- Jan KNUDSEN
- G01 - MEASURING TESTING
Information Patent Application
Positive Electrode Active Material, Method for Manufacturing Positi...
- Publication number 20230307622
- Publication date Sep 28, 2023
- Semiconductor Energy Laboratory Co., Ltd.
- Yohei MOMMA
- C01 - INORGANIC CHEMISTRY
Information Patent Application
SMALL SPOT
- Publication number 20230288196
- Publication date Sep 14, 2023
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...
- Publication number 20230288355
- Publication date Sep 14, 2023
- COZAI LTD
- Hagai COHEN
- G01 - MEASURING TESTING
Information Patent Application
LIGHT GUIDE PLATE FOR IMAGE DISPLAY
- Publication number 20230258857
- Publication date Aug 17, 2023
- MITSUBISHI CHEMICAL CORPORATION
- Shinichiro KANAI
- G02 - OPTICS
Information Patent Application
CHARGED PARTICLE DETECTOR
- Publication number 20230238227
- Publication date Jul 27, 2023
- HAMAMATSU PHOTONICS K. K.
- Masahiro HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR POSITIONING AND TRANSFERRING A SAMPLE
- Publication number 20230204525
- Publication date Jun 29, 2023
- FEI Company
- Libor NOVAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CARBON-BASED OPTICAL SENSOR ELEMENT FOR MEASURING GREENHOUSE GAS CO...
- Publication number 20230168213
- Publication date Jun 1, 2023
- National Institute of Meteorological Sciences
- Young Suk OH
- G01 - MEASURING TESTING
Information Patent Application
COPPER BONDING WIRE
- Publication number 20230105851
- Publication date Apr 6, 2023
- NIPPON MICROMETAL CORPORATION
- Tomohiro UNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN SITU AND TUNABLE DEPOSITION OF A FILM
- Publication number 20230032857
- Publication date Feb 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Hsi Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION
- Publication number 20230021209
- Publication date Jan 19, 2023
- NOVA MEASURING INSTRUMENTS INC.
- Charles LARSON
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
GALLIUM ARSENIDE SINGLE CRYSTAL SUBSTRATE AND METHOD FOR PRODUCING...
- Publication number 20230002931
- Publication date Jan 5, 2023
- Sumitomo Electric Industries, Ltd.
- Koji UEMATSU
- C30 - CRYSTAL GROWTH

by measuring photoelectric effect

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Bonding wire for semiconductor devices

Charged particle detection for spectroscopic techniques

Method and system for non-destructive metrology of thin layers

Semiconductive ceramic member

Catalyst for solid polymer fuel cell and method for selecting catal...

Method and system for positioning and transferring a sample

Characterizing and measuring in small boxes using XPS with multiple...

Semiconductor device

Method and system for non-destructive metrology of thin layers

Gas sensors and methods of sensing a gas-phase analyte

Method of calculating thickness of graphene layer and method of mea...

Method of detecting or quantifying detection target in specimen, co...

Gallium arsenide single crystal substrate and method for producing...

Copper-clad laminate, wiring board, and copper foil provided with r...

Method and system for monitoring deposition process

Methods of inspecting samples with multiple beams of charged particles

Feed-forward of multi-layer and multi-process information using XPS...

Positive electrode active material including impurity elements in a...

XPS metrology for process control in selective deposition

Sample analysis apparatus and method

Method and system for non-destructive metrology of thin layers

System and method for non-ionizing non-destructive detection of str...

Method and system for virtually executing an operation of an energy...

Spectroscopy and imaging system

X-ray reflectometry apparatus and method thereof for measuring thre...

System and method using x-rays for depth-resolving metrology and an...

Systems and methods for combined reflectometry and photoelectron sp...

Ultrahigh surface area materials and methods of making same

X-ray analyzer

Composite and pneumatic tire

Patents Applicationslast 30 patents

SiC CRYSTAL SUBSTRATE, METHOD OF MANUFACTURING SiC CRYSTAL SUBSTRAT...

Process and device for the spatially resolved localization of defec...

AN ILLUMINATION CONTROL DEVICE FOR A CHARGED PARTICLE ANALYSER

DATA ANALYSIS DEVICE, DATA ANALYIS METHOD, PROGRAM, AND RECORDING M...

BONDING WIRE FOR SEMICONDUCTOR DEVICES

BONDING WIRE FOR SEMICONDUCTOR DEVICES

BONDING WIRE FOR SEMICONDUCTOR DEVICES

BONDING WIRE FOR SEMICONDUCTOR DEVICES

METHOD AND SYSTEM FOR MONITORING DEPOSITION PROCESS

METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEA...

XPS SAMPLE HOLDER, APPARATUS FOR X-RAY PHOTOELECTRON SPECTROSCOPY I...

ANGLE-RESOLVING PHOTOELECTRON SPECTROMETER AND METHOD

METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...

FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...

XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

IN SITU AND TUNABLE DEPOSITION OF A FILM

Positive Electrode Active Material, Method for Manufacturing Positi...

COMPUTER-IMPLEMENTED METHOD FOR GENERATING EVENT-AVERAGED AND TIME-...

Positive Electrode Active Material, Method for Manufacturing Positi...

SMALL SPOT

ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...

LIGHT GUIDE PLATE FOR IMAGE DISPLAY

CHARGED PARTICLE DETECTOR

METHOD AND SYSTEM FOR POSITIONING AND TRANSFERRING A SAMPLE

CARBON-BASED OPTICAL SENSOR ELEMENT FOR MEASURING GREENHOUSE GAS CO...

COPPER BONDING WIRE

IN SITU AND TUNABLE DEPOSITION OF A FILM

XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION

GALLIUM ARSENIDE SINGLE CRYSTAL SUBSTRATE AND METHOD FOR PRODUCING...