by measuring small-angle scattering

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CPC
G01N23/201

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/201by measuring small-angle scattering

Industries

Patents Grantslast 30 patents

Information Patent Grant
Scattering measurement analysis method, scattering measurement anal...
- Patent number 12,175,173
- Issue date Dec 24, 2024
- Rigaku Corporation
- Tomoyuki Iwata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diffractometer-based global in situ diagnostic system for animals
- Patent number 12,094,609
- Issue date Sep 17, 2024
- Arion Diagnostics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diffraction-based global in vitro diagnostic system
- Patent number 12,094,610
- Issue date Sep 17, 2024
- Bragg Analytics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Small-angle X-ray scatterometry
- Patent number 12,085,521
- Issue date Sep 10, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Grant
Soft x-ray optics with improved filtering
- Patent number 12,025,575
- Issue date Jul 2, 2024
- KLA Corporation
- Alexander Kuznetsov
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,019,036
- Issue date Jun 25, 2024
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for compact, small spot size soft x-ray scatter...
- Patent number 12,013,355
- Issue date Jun 18, 2024
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam experiment data analysis device
- Patent number 11,994,454
- Issue date May 28, 2024
- Hitachi, Ltd.
- Akinori Asahara
- G01 - MEASURING TESTING
Information Patent Grant
System and method to adjust a kinetics model of surface reactions d...
- Patent number 11,966,203
- Issue date Apr 23, 2024
- KLA Corporation
- Ankur Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical metrology in machine learning to characterize features
- Patent number 11,921,433
- Issue date Mar 5, 2024
- Lam Research Corporation
- Ye Feng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for correcting a spectral image
- Patent number 11,872,071
- Issue date Jan 16, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Odran Pivot
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System and method for measuring a sample by x-ray reflectance scatt...
- Patent number 11,874,237
- Issue date Jan 16, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray scattering apparatus
- Patent number 11,835,474
- Issue date Dec 5, 2023
- XENOCS SAS
- Karsten Joensen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Fluidic carbon nanotube device
- Patent number 11,826,754
- Issue date Nov 28, 2023
- Lawrence Livermore National Security, LLC
- Eric R. Meshot
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray examination device
- Patent number 11,821,856
- Issue date Nov 21, 2023
- Anton Paar GmbH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Grant
X-ray scattering apparatus
- Patent number 11,796,485
- Issue date Oct 24, 2023
- XENOCS SAS
- Peter Hoghoj
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Characterization method of closed pores and connectivity of coal me...
- Patent number 11,781,962
- Issue date Oct 10, 2023
- China University of Mining and Technology
- Yang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Spot-size control in reflection-based and scatterometry-based X-ray...
- Patent number 11,781,999
- Issue date Oct 10, 2023
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Transmission X-ray critical dimension (T-XCD) characterization of s...
- Patent number 11,761,913
- Issue date Sep 19, 2023
- BRUKER TECHNOLOGIES LTD.
- Adam Ginsburg
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 11,754,515
- Issue date Sep 12, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Small angle x-ray scattering methods for characterizing the iron co...
- Patent number 11,726,049
- Issue date Aug 15, 2023
- Amphastar Pharmaceuticals, Inc.
- Jack Yongfeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor metrology and inspection based on an x-ray source wit...
- Patent number 11,719,652
- Issue date Aug 8, 2023
- KLA Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Small-angle x-ray scatterometry
- Patent number 11,703,464
- Issue date Jul 18, 2023
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 11,692,953
- Issue date Jul 4, 2023
- Nova Ltd.
- Gilad Barak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quantum dot material and method for producing quantum dot material
- Patent number 11,667,838
- Issue date Jun 6, 2023
- Shoei Chemical, Inc.
- Takafumi Moriyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Metrology method
- Patent number 11,652,007
- Issue date May 16, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Su-Horng Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single piece droplet generation and injection device for serial cry...
- Patent number 11,624,718
- Issue date Apr 11, 2023
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- G01 - MEASURING TESTING
Information Patent Grant
Substance identification device and method for extracting statistic...
- Patent number 11,619,599
- Issue date Apr 4, 2023
- Tsinghua University
- Zhi Zeng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection scheme for x-ray small angle scattering
- Patent number 11,592,406
- Issue date Feb 28, 2023
- Rensselaer Polytechnic Institute
- Ge Wang
- G01 - MEASURING TESTING
Information Patent Grant
Loosely-coupled inspection and metrology system for high-volume pro...
- Patent number 11,562,289
- Issue date Jan 24, 2023
- KLA Corporation
- Song Wu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Small-Angle X-Ray Scatterometry
- Publication number 20240377342
- Publication date Nov 14, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATT...
- Publication number 20240345006
- Publication date Oct 17, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM
- Publication number 20240319121
- Publication date Sep 26, 2024
- Rigaku Corporation
- Yoshiyasu ITO
- G01 - MEASURING TESTING
Information Patent Application
Soft X-Ray Optics With Improved Filtering
- Publication number 20240288388
- Publication date Aug 29, 2024
- KLA Corporation
- Alexander Kuznetsov
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR ANALYSING SURFACES USING FAST ATOM DIFFRACTION IN A HIGH...
- Publication number 20240272098
- Publication date Aug 15, 2024
- Centre National de la Recherche Scientifique
- Hocine KHEMLICHE
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
POLYURETHANE-CONTAINING NON-FOAMED MOLDED BODY
- Publication number 20240255403
- Publication date Aug 1, 2024
- Canon Kabushiki Kaisha
- RYO OGAWA
- B08 - CLEANING
Information Patent Application
X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD
- Publication number 20240248050
- Publication date Jul 25, 2024
- XENOCS SAS
- Peter HOGHOJ
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD
- Publication number 20240210334
- Publication date Jun 27, 2024
- KIOXIA Corporation
- Yuki ABE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...
- Publication number 20240102945
- Publication date Mar 28, 2024
- Shimadzu Corporation
- Kana KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...
- Publication number 20240102950
- Publication date Mar 28, 2024
- Industrial Technology Research Institute
- Chun-Ting LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Small-angle x-ray scatterometry
- Publication number 20240077435
- Publication date Mar 7, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE
- Publication number 20240044819
- Publication date Feb 8, 2024
- NOVA LTD
- Gilad Barak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENCODING AN ASSEMBLY OF THREE-DIMENSIONAL HIERARCHICALLY ORGANIZED...
- Publication number 20240013852
- Publication date Jan 11, 2024
- THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
- Oleg GANG
- B82 - NANO-TECHNOLOGY
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230384248
- Publication date Nov 30, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230375485
- Publication date Nov 23, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20230324317
- Publication date Oct 12, 2023
- KIOXIA Corporation
- Takahiro IKEDA
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION METHOD
- Publication number 20230280248
- Publication date Sep 7, 2023
- Sumitomo Rubber Industries, Ltd.
- Tomomi SHIOZAWA
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION METHOD OF CLOSED PORES AND CONNECTIVITY OF COAL ME...
- Publication number 20230258550
- Publication date Aug 17, 2023
- China University of Mining and Technology
- Yang WANG
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Measurements With Robust In-Line Tool Matching
- Publication number 20230258585
- Publication date Aug 17, 2023
- KLA Corporation
- Stilian Ivanov Pandev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY METHOD
- Publication number 20230253268
- Publication date Aug 10, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Su-Horng LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...
- Publication number 20230243765
- Publication date Aug 3, 2023
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SMALL ANGLE X-RAY SCATTERING METHODS FOR CHARACTERIZING THE IRON CO...
- Publication number 20230124114
- Publication date Apr 20, 2023
- Amphastar Pharmaceuticals, Inc.
- Jack Yongfeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Profile Measurement Based On A Scanning Conditional M...
- Publication number 20230092729
- Publication date Mar 23, 2023
- KLA Corporation
- Stilian Ivanov Pandev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Spot-size control in reflection-based and scatterometry-based X-ray...
- Publication number 20230075421
- Publication date Mar 9, 2023
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCATTERING APPARATUS
- Publication number 20230012833
- Publication date Jan 19, 2023
- XENOCS SAS
- Karsten JOENSEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCATTERING APPARATUS
- Publication number 20220326166
- Publication date Oct 13, 2022
- XENOCS SAS
- Peter HOGHOJ
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SCHEME FOR X-RAY SMALL ANGLE SCATTERING
- Publication number 20220221413
- Publication date Jul 14, 2022
- Rensselaer Polytechnic Institute
- Ge Wang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Methods And Systems For Compact, Small Spot Size Soft X-Ray Scatter...
- Publication number 20220196576
- Publication date Jun 23, 2022
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE BEAM EXPERIMENT DATA ANALYSIS DEVICE
- Publication number 20220187180
- Publication date Jun 16, 2022
- Hitachi, Ltd
- Akinori ASAHARA
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20220170869
- Publication date Jun 2, 2022
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING

by measuring small-angle scattering

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Scattering measurement analysis method, scattering measurement anal...

Diffractometer-based global in situ diagnostic system for animals

Diffraction-based global in vitro diagnostic system

Small-angle X-ray scatterometry

Soft x-ray optics with improved filtering

Transmissive small-angle scattering device

Methods and systems for compact, small spot size soft x-ray scatter...

Particle beam experiment data analysis device

System and method to adjust a kinetics model of surface reactions d...

Optical metrology in machine learning to characterize features

Method for correcting a spectral image

System and method for measuring a sample by x-ray reflectance scatt...

X-ray scattering apparatus

Fluidic carbon nanotube device

X-ray examination device

X-ray scattering apparatus

Characterization method of closed pores and connectivity of coal me...

Spot-size control in reflection-based and scatterometry-based X-ray...

Transmission X-ray critical dimension (T-XCD) characterization of s...

Transmissive small-angle scattering device

Small angle x-ray scattering methods for characterizing the iron co...

Semiconductor metrology and inspection based on an x-ray source wit...

Small-angle x-ray scatterometry

X-ray based measurements in patterned structure

Quantum dot material and method for producing quantum dot material

Metrology method

Single piece droplet generation and injection device for serial cry...

Substance identification device and method for extracting statistic...

Detection scheme for x-ray small angle scattering

Loosely-coupled inspection and metrology system for high-volume pro...

Patents Applicationslast 30 patents

Small-Angle X-Ray Scatterometry

SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATT...

ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM

Soft X-Ray Optics With Improved Filtering

DEVICE FOR ANALYSING SURFACES USING FAST ATOM DIFFRACTION IN A HIGH...

POLYURETHANE-CONTAINING NON-FOAMED MOLDED BODY

X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD

MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD

X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...

METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...

Small-angle x-ray scatterometry

X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE

ENCODING AN ASSEMBLY OF THREE-DIMENSIONAL HIERARCHICALLY ORGANIZED...

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

INSPECTION DEVICE AND INSPECTION METHOD

EVALUATION METHOD

CHARACTERIZATION METHOD OF CLOSED PORES AND CONNECTIVITY OF COAL ME...

Semiconductor Measurements With Robust In-Line Tool Matching

METROLOGY METHOD

SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...

SMALL ANGLE X-RAY SCATTERING METHODS FOR CHARACTERIZING THE IRON CO...

Semiconductor Profile Measurement Based On A Scanning Conditional M...

Spot-size control in reflection-based and scatterometry-based X-ray...

X-RAY SCATTERING APPARATUS

X-RAY SCATTERING APPARATUS

DETECTION SCHEME FOR X-RAY SMALL ANGLE SCATTERING

Methods And Systems For Compact, Small Spot Size Soft X-Ray Scatter...

PARTICLE BEAM EXPERIMENT DATA ANALYSIS DEVICE

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE