by measuring the energy-dispersion spectrum of diffracted radiation

Industry

CPC
G01N23/20091

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/20091by measuring the energy-dispersion spectrum of diffracted radiation

Industries

Patents Grantslast 30 patents

Information Patent Grant
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- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
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Information Patent Grant
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- Anthony Dicken
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Information Patent Grant
Controlling process parameters by means of radiographic online dete...
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- Issue date Feb 13, 2024
- SMS group GMBH
- Christian Klinkenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for correcting a spectral image
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- Issue date Jan 16, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Odran Pivot
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Determining ore characteristics
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- Issue date Jan 9, 2024
- X Development LLC
- Thomas Peter Hunt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for identifying molecular structure
- Patent number 11,815,475
- Issue date Nov 14, 2023
- The University of Tokyo
- Makoto Fujita
- C30 - CRYSTAL GROWTH
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,796,490
- Issue date Oct 24, 2023
- University of Washington
- Gerald Todd Seidler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Radiation imaging apparatus, radiation imaging method, and non-tran...
- Patent number 11,635,392
- Issue date Apr 25, 2023
- Canon Kabushiki Kaisha
- Takeshi Noda
- G01 - MEASURING TESTING
Information Patent Grant
Energy-dispersive X-ray diffraction analyser comprising a substanti...
- Patent number 11,614,414
- Issue date Mar 28, 2023
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
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- G01 - MEASURING TESTING
Information Patent Grant
System and method for diagnosing a condition of an engine
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- Issue date Mar 28, 2023
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- Maurice Jean
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Information Patent Grant
Estimating wear for BHA components using borehole hardness
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- Issue date Feb 14, 2023
- Halliburton Energy Services, Inc.
- Ian David Campbell Mitchell
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Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
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- Issue date Nov 1, 2022
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Managing wellbore cement compositions based on material characteris...
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- Halliburton Energy Services, Inc.
- Thomas Jason Pisklak
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Information Patent Grant
X-ray analysis device and peak search method
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- Issue date Sep 6, 2022
- Shimadzu Corporation
- Hiroshi Sakamae
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining a sample using a charged particle microscope, w...
- Patent number 11,417,497
- Issue date Aug 16, 2022
- FEI Company
- Remco Schoenmakers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating a signal filter and radiation detection system
- Patent number 11,397,270
- Issue date Jul 26, 2022
- Ketek GmbH
- Florian Rettenmeier
- G01 - MEASURING TESTING
Information Patent Grant
Determining ore characteristics
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- Issue date Jun 7, 2022
- X Development LLC
- Thomas Peter Hunt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of crystallographic properties in aerospace components
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- Issue date Nov 23, 2021
- Raytheon Technologies Corporation
- Iuliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Grant
Graphene-based electro-microfluidic devices and methods for protein...
- Patent number 11,175,244
- Issue date Nov 16, 2021
- University of Massachusetts
- Sarah L. Perry
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Packaging of radiation detectors in an image sensor
- Patent number 11,114,425
- Issue date Sep 7, 2021
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray diffraction and X-ray spectroscopy method and related apparatus
- Patent number 11,105,756
- Issue date Aug 31, 2021
- NINGBO GALAXY MATERIALS TECHNOLOGY CO. LTD.
- Xiao-dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method and evaluation apparatus for electronic device
- Patent number 11,062,876
- Issue date Jul 13, 2021
- TOHOKU UNIVERSITY
- Masaaki Niwa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,054,375
- Issue date Jul 6, 2021
- University of Washington
- Gerald Todd Seidler
- G02 - OPTICS
Information Patent Grant
X-ray source optics for small-angle X-ray scatterometry
- Patent number 10,976,268
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detection optics for small-angle X-ray scatterometry
- Patent number 10,976,270
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
Wafer alignment for small-angle x-ray scatterometry
- Patent number 10,976,269
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Yuri Vinshtein
- G01 - MEASURING TESTING
Information Patent Grant
Methods for aligning a spectrometer
- Patent number 10,962,490
- Issue date Mar 30, 2021
- University of Washington
- Devon R. Mortensen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for enhanced photo-thermal imaging and spectro...
- Patent number 10,942,116
- Issue date Mar 9, 2021
- Photothermal Spectroscopy Corp.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Set-up and method for spatially resolved measurement with a wavelen...
- Patent number 10,794,845
- Issue date Oct 6, 2020
- Frank Filsinger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High resolution X-ray diffraction method and apparatus
- Patent number 10,753,890
- Issue date Aug 25, 2020
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ENERGY DISPERSIVE X-RAY SPECTROSCOPY SENSING UNIT BACKGROUND
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- APPLIED MATERIALS ISRAEL LTD.
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- G01 - MEASURING TESTING
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CONSTRUCTION METHOD FOR PHOTOCATHODE INDIRECT COMPETITION SENSOR AN...
- Publication number 20230341346
- Publication date Oct 26, 2023
- Oil Crops Research Institute of Chinese Academy of Agricultural Sciences
- Zhaowei Zhang
- G01 - MEASURING TESTING
Information Patent Application
Monitoring Scale Inhibitor Treatment
- Publication number 20230313644
- Publication date Oct 5, 2023
- Saudi Arabian Oil Company
- Qiwei Wang
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
INTERFERENCE SCANNING TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20230207258
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- Hitachi, Ltd
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- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR TESTING PEROVSKITE PRECURSOR SOLUTION
- Publication number 20230079784
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- Industrial Technology Research Institute
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- C07 - ORGANIC CHEMISTRY
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DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...
- Publication number 20230035267
- Publication date Feb 2, 2023
- FEI Company
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- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...
- Publication number 20220310353
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- FEI Company
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- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN ENERGY DISPERSIVE X-RAY DIFFRACTION ANALYSER HAVING AN IMPROVED...
- Publication number 20220057343
- Publication date Feb 24, 2022
- Commonwealth Scientific and Industrial Research Organisation
- James Richard TICKNER
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
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- Publication date Jan 13, 2022
- Japan Display Inc.
- Tatsuya TODA
- H01 - BASIC ELECTRIC ELEMENTS
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X-RAY SPECTROMETER AND METHODS FOR USE
- Publication number 20220003694
- Publication date Jan 6, 2022
- University of Washington
- Gerald Todd SEIDLER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CORRECTING A SPECTRAL IMAGE
- Publication number 20210364663
- Publication date Nov 25, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Odran PIVOT
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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METHOD FOR PRODUCING A MAGNETIC POWDER
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- B22 - CASTING POWDER METALLURGY
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METHOD AND LABORATORY SYSTEM TO PROCESS A LABORATORY CARRIER BASED...
- Publication number 20210213450
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- Roche Diagnostics Operations, Inc.
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MANAGING WELLBORE CEMENT COMPOSITIONS BASED ON MATERIAL CHARACTERIS...
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CELL ANALYSIS APPARATUS AND CELL ANALYSIS METHOD
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- HITACHI HIGH-TECH CORPORATION
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OXIDE DISPERSION-STRENGTHENED IRON-BASED ALLOY POWDER AND CHARACTER...
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- CENTRAL SOUTH UNIVERSITY
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RADIATION IMAGING APPARATUS, RADIATION IMAGING METHOD, AND NON-TRAN...
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SYSTEM AND METHOD FOR DIAGNOSING A CONDITION OF AN ENGINE
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DETERMINING ORE CHARACTERISTICS
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METHOD FOR QUANTIFYING AMINE COMPOUND CONSTITUTING SEPARATOR ACTIVE...
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Analysis Device and Spectrum Generation Method
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Method for Operating a Signal Filter and Radiation Detection System
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Wafer alignment for small-angle X-ray scatterometry
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NANOSTRUCTURED CARBON MATERIALS AND METHODS OF MAKING AND USE THEREOF
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- Vanderbilt University
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EVALUATION METHOD AND EVALUATION APPARATUS FOR ELECTRONIC DEVICE
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Collimator Assembly for an X-ray Spectrometer Device
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- Hitachi High-Tech Analytical Science Finland Oy
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X-RAY SPECTROMETER AND METHODS FOR USE
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- Publication date Aug 22, 2019
- University of Washington
- Gerald Todd SEIDLER
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SET-UP AND METHOD FOR SPATIALLY RESOLVED MEASUREMENT WITH A WAVELEN...
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METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...
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- Photothermal Spectroscopy Corp.
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- G01 - MEASURING TESTING

by measuring the energy-dispersion spectrum of diffracted radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for improving an EBSD/TKD map

Screening system

Controlling process parameters by means of radiographic online dete...

Method for correcting a spectral image

Determining ore characteristics

Method for identifying molecular structure

X-ray spectrometer and methods for use

Radiation imaging apparatus, radiation imaging method, and non-tran...

Energy-dispersive X-ray diffraction analyser comprising a substanti...

System and method for diagnosing a condition of an engine

Estimating wear for BHA components using borehole hardness

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Managing wellbore cement compositions based on material characteris...

X-ray analysis device and peak search method

Method of examining a sample using a charged particle microscope, w...

Method for operating a signal filter and radiation detection system

Determining ore characteristics

Detection of crystallographic properties in aerospace components

Graphene-based electro-microfluidic devices and methods for protein...

Packaging of radiation detectors in an image sensor

X-ray diffraction and X-ray spectroscopy method and related apparatus

Evaluation method and evaluation apparatus for electronic device

X-ray spectrometer and methods for use

X-ray source optics for small-angle X-ray scatterometry

X-ray detection optics for small-angle X-ray scatterometry

Wafer alignment for small-angle x-ray scatterometry

Methods for aligning a spectrometer

Method and apparatus for enhanced photo-thermal imaging and spectro...

Set-up and method for spatially resolved measurement with a wavelen...

High resolution X-ray diffraction method and apparatus

Patents Applicationslast 30 patents

ENERGY DISPERSIVE X-RAY SPECTROSCOPY SENSING UNIT BACKGROUND

CONSTRUCTION METHOD FOR PHOTOCATHODE INDIRECT COMPETITION SENSOR AN...

Monitoring Scale Inhibitor Treatment

INTERFERENCE SCANNING TRANSMISSION ELECTRON MICROSCOPE

METHOD FOR TESTING PEROVSKITE PRECURSOR SOLUTION

DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...

DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...

AN ENERGY DISPERSIVE X-RAY DIFFRACTION ANALYSER HAVING AN IMPROVED...

SEMICONDUCTOR DEVICE

X-RAY SPECTROMETER AND METHODS FOR USE

METHOD FOR CORRECTING A SPECTRAL IMAGE

METHOD FOR PRODUCING A MAGNETIC POWDER

METHOD AND LABORATORY SYSTEM TO PROCESS A LABORATORY CARRIER BASED...

MANAGING WELLBORE CEMENT COMPOSITIONS BASED ON MATERIAL CHARACTERIS...

CELL ANALYSIS APPARATUS AND CELL ANALYSIS METHOD

OXIDE DISPERSION-STRENGTHENED IRON-BASED ALLOY POWDER AND CHARACTER...

RADIATION IMAGING APPARATUS, RADIATION IMAGING METHOD, AND NON-TRAN...

SYSTEM AND METHOD FOR DIAGNOSING A CONDITION OF AN ENGINE

DETERMINING ORE CHARACTERISTICS

METHOD FOR QUANTIFYING AMINE COMPOUND CONSTITUTING SEPARATOR ACTIVE...

Analysis Device and Spectrum Generation Method

Method for Operating a Signal Filter and Radiation Detection System

Wafer alignment for small-angle X-ray scatterometry

NANOSTRUCTURED CARBON MATERIALS AND METHODS OF MAKING AND USE THEREOF

EVALUATION METHOD AND EVALUATION APPARATUS FOR ELECTRONIC DEVICE

Collimator Assembly for an X-ray Spectrometer Device

X-RAY SPECTROMETER AND METHODS FOR USE

SET-UP AND METHOD FOR SPATIALLY RESOLVED MEASUREMENT WITH A WAVELEN...

Compact, Low Cost Apparatus for Testing of Production and Counterfe...

METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...