by measuring the energy-dispersion spectrum of diffracted radiation

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G01N23/20091

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/20091by measuring the energy-dispersion spectrum of diffracted radiation

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Patents Grantslast 30 patents

Information Patent Grant
Cell analysis apparatus and cell analysis method
- Patent number 12,146,846
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Akiko Hisada
- G01 - MEASURING TESTING
Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 12,136,532
- Issue date Nov 5, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a magnetic powder
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- Issue date Oct 15, 2024
- ABB Schweiz AG
- Reinhard Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Construction method for photocathode indirect competition sensor an...
- Patent number 12,092,601
- Issue date Sep 17, 2024
- Oil Crops Research Institute of Chinese Academy of Agricultural Sciences
- Zhaowei Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 12,094,980
- Issue date Sep 17, 2024
- Japan Display Inc.
- Tatsuya Toda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantum-limited extreme ultraviolet coherent diffraction imaging
- Patent number 12,085,520
- Issue date Sep 10, 2024
- Regents of the Univ of Colorado
- Henry C. Kapteyn
- G01 - MEASURING TESTING
Information Patent Grant
Method and laboratory system to process a laboratory carrier based...
- Patent number 12,017,216
- Issue date Jun 25, 2024
- Roche Diagnostics Operations, Inc.
- Andreas Drechsler
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving an EBSD/TKD map
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- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Screening system
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- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
Controlling process parameters by means of radiographic online dete...
- Patent number 11,898,971
- Issue date Feb 13, 2024
- SMS group GMBH
- Christian Klinkenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for correcting a spectral image
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- Issue date Jan 16, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
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- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Determining ore characteristics
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- Issue date Jan 9, 2024
- X Development LLC
- Thomas Peter Hunt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for identifying molecular structure
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- Issue date Nov 14, 2023
- The University of Tokyo
- Makoto Fujita
- C30 - CRYSTAL GROWTH
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,796,490
- Issue date Oct 24, 2023
- University of Washington
- Gerald Todd Seidler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Radiation imaging apparatus, radiation imaging method, and non-tran...
- Patent number 11,635,392
- Issue date Apr 25, 2023
- Canon Kabushiki Kaisha
- Takeshi Noda
- G01 - MEASURING TESTING
Information Patent Grant
Energy-dispersive X-ray diffraction analyser comprising a substanti...
- Patent number 11,614,414
- Issue date Mar 28, 2023
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
- James Richard Tickner
- G01 - MEASURING TESTING
Information Patent Grant
System and method for diagnosing a condition of an engine
- Patent number 11,614,436
- Issue date Mar 28, 2023
- Pratt & Whitney Canada Corp.
- Maurice Jean
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Estimating wear for BHA components using borehole hardness
- Patent number 11,579,329
- Issue date Feb 14, 2023
- Halliburton Energy Services, Inc.
- Ian David Campbell Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 11,488,800
- Issue date Nov 1, 2022
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Managing wellbore cement compositions based on material characteris...
- Patent number 11,441,415
- Issue date Sep 13, 2022
- Halliburton Energy Services, Inc.
- Thomas Jason Pisklak
- E21 - EARTH DRILLING MINING
Information Patent Grant
X-ray analysis device and peak search method
- Patent number 11,435,303
- Issue date Sep 6, 2022
- Shimadzu Corporation
- Hiroshi Sakamae
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining a sample using a charged particle microscope, w...
- Patent number 11,417,497
- Issue date Aug 16, 2022
- FEI Company
- Remco Schoenmakers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating a signal filter and radiation detection system
- Patent number 11,397,270
- Issue date Jul 26, 2022
- Ketek GmbH
- Florian Rettenmeier
- G01 - MEASURING TESTING
Information Patent Grant
Determining ore characteristics
- Patent number 11,351,576
- Issue date Jun 7, 2022
- X Development LLC
- Thomas Peter Hunt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of crystallographic properties in aerospace components
- Patent number 11,181,491
- Issue date Nov 23, 2021
- Raytheon Technologies Corporation
- Iuliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Grant
Graphene-based electro-microfluidic devices and methods for protein...
- Patent number 11,175,244
- Issue date Nov 16, 2021
- University of Massachusetts
- Sarah L. Perry
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Packaging of radiation detectors in an image sensor
- Patent number 11,114,425
- Issue date Sep 7, 2021
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray diffraction and X-ray spectroscopy method and related apparatus
- Patent number 11,105,756
- Issue date Aug 31, 2021
- NINGBO GALAXY MATERIALS TECHNOLOGY CO. LTD.
- Xiao-dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method and evaluation apparatus for electronic device
- Patent number 11,062,876
- Issue date Jul 13, 2021
- TOHOKU UNIVERSITY
- Masaaki Niwa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ARRAY SUBSTRATE
- Publication number 20240429320
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- Japan Display Inc.
- Tatsuya TODA
- H01 - BASIC ELECTRIC ELEMENTS
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X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
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- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Laboratory crystallographic x-ray diffraction analysis system
- Publication number 20240219328
- Publication date Jul 4, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Christian HOLZNER
- G01 - MEASURING TESTING
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LAMINATE FOR WIRING BOARD
- Publication number 20240179849
- Publication date May 30, 2024
- Namics Corporation
- Naoki OBATA
- G01 - MEASURING TESTING
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ENERGY DISPERSIVE X-RAY SPECTROSCOPY SENSING UNIT BACKGROUND
- Publication number 20240060912
- Publication date Feb 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Martin Chauvin
- G01 - MEASURING TESTING
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CONSTRUCTION METHOD FOR PHOTOCATHODE INDIRECT COMPETITION SENSOR AN...
- Publication number 20230341346
- Publication date Oct 26, 2023
- Oil Crops Research Institute of Chinese Academy of Agricultural Sciences
- Zhaowei Zhang
- G01 - MEASURING TESTING
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Monitoring Scale Inhibitor Treatment
- Publication number 20230313644
- Publication date Oct 5, 2023
- Saudi Arabian Oil Company
- Qiwei Wang
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
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INTERFERENCE SCANNING TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20230207258
- Publication date Jun 29, 2023
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR TESTING PEROVSKITE PRECURSOR SOLUTION
- Publication number 20230079784
- Publication date Mar 16, 2023
- Industrial Technology Research Institute
- Kuo-Wei Huang
- C07 - ORGANIC CHEMISTRY
Information Patent Application
DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...
- Publication number 20230035267
- Publication date Feb 2, 2023
- FEI Company
- Pavel POTOCEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...
- Publication number 20220310353
- Publication date Sep 29, 2022
- FEI Company
- Pavel POTOCEK
- H01 - BASIC ELECTRIC ELEMENTS
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AN ENERGY DISPERSIVE X-RAY DIFFRACTION ANALYSER HAVING AN IMPROVED...
- Publication number 20220057343
- Publication date Feb 24, 2022
- Commonwealth Scientific and Industrial Research Organisation
- James Richard TICKNER
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
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- Publication date Jan 13, 2022
- Japan Display Inc.
- Tatsuya TODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY SPECTROMETER AND METHODS FOR USE
- Publication number 20220003694
- Publication date Jan 6, 2022
- University of Washington
- Gerald Todd SEIDLER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CORRECTING A SPECTRAL IMAGE
- Publication number 20210364663
- Publication date Nov 25, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Odran PIVOT
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR PRODUCING A MAGNETIC POWDER
- Publication number 20210316365
- Publication date Oct 14, 2021
- ABB Schweiz AG
- Reinhard Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Application
METHOD AND LABORATORY SYSTEM TO PROCESS A LABORATORY CARRIER BASED...
- Publication number 20210213450
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- Roche Diagnostics Operations, Inc.
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- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MANAGING WELLBORE CEMENT COMPOSITIONS BASED ON MATERIAL CHARACTERIS...
- Publication number 20210207470
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- Halliburton Energy Services, Inc.
- Thomas Jason Pisklak
- E21 - EARTH DRILLING MINING
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CELL ANALYSIS APPARATUS AND CELL ANALYSIS METHOD
- Publication number 20210181127
- Publication date Jun 17, 2021
- HITACHI HIGH-TECH CORPORATION
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- G01 - MEASURING TESTING
Information Patent Application
OXIDE DISPERSION-STRENGTHENED IRON-BASED ALLOY POWDER AND CHARACTER...
- Publication number 20210147965
- Publication date May 20, 2021
- CENTRAL SOUTH UNIVERSITY
- Zuming LIU
- B22 - CASTING POWDER METALLURGY
Information Patent Application
RADIATION IMAGING APPARATUS, RADIATION IMAGING METHOD, AND NON-TRAN...
- Publication number 20210055233
- Publication date Feb 25, 2021
- Canon Kabushiki Kaisha
- Takeshi Noda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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SYSTEM AND METHOD FOR DIAGNOSING A CONDITION OF AN ENGINE
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- Pratt & Whitney Canada Corp.
- Maurice JEAN
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DETERMINING ORE CHARACTERISTICS
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- X Development LLC
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METHOD FOR QUANTIFYING AMINE COMPOUND CONSTITUTING SEPARATOR ACTIVE...
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- Bo Ri LEE
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Analysis Device and Spectrum Generation Method
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- Publication date Sep 10, 2020
- JEOL Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
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Method for Operating a Signal Filter and Radiation Detection System
- Publication number 20200271599
- Publication date Aug 27, 2020
- KETEK GMBH
- Florian Rettenmeier
- G01 - MEASURING TESTING
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Wafer alignment for small-angle X-ray scatterometry
- Publication number 20190323976
- Publication date Oct 24, 2019
- BRUKER JV ISRAEL LTD.
- Yuri Vinshtein
- G01 - MEASURING TESTING
Information Patent Application
NANOSTRUCTURED CARBON MATERIALS AND METHODS OF MAKING AND USE THEREOF
- Publication number 20190315624
- Publication date Oct 17, 2019
- Vanderbilt University
- Anna Douglas
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
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EVALUATION METHOD AND EVALUATION APPARATUS FOR ELECTRONIC DEVICE
- Publication number 20190304741
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- Tohoku University
- Masaaki Niwa
- G01 - MEASURING TESTING
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Collimator Assembly for an X-ray Spectrometer Device
- Publication number 20190272928
- Publication date Sep 5, 2019
- Hitachi High-Tech Analytical Science Finland Oy
- Reinhard SINGER
- G01 - MEASURING TESTING

by measuring the energy-dispersion spectrum of diffracted radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Cell analysis apparatus and cell analysis method

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Method for producing a magnetic powder

Device and method for measuring short-wavelength characteristic X-r...

Construction method for photocathode indirect competition sensor an...

Semiconductor device

Quantum-limited extreme ultraviolet coherent diffraction imaging

Method and laboratory system to process a laboratory carrier based...

Method for improving an EBSD/TKD map

Screening system

Controlling process parameters by means of radiographic online dete...

Method for correcting a spectral image

Determining ore characteristics

Method for identifying molecular structure

X-ray spectrometer and methods for use

Radiation imaging apparatus, radiation imaging method, and non-tran...

Energy-dispersive X-ray diffraction analyser comprising a substanti...

System and method for diagnosing a condition of an engine

Estimating wear for BHA components using borehole hardness

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Managing wellbore cement compositions based on material characteris...

X-ray analysis device and peak search method

Method of examining a sample using a charged particle microscope, w...

Method for operating a signal filter and radiation detection system

Determining ore characteristics

Detection of crystallographic properties in aerospace components

Graphene-based electro-microfluidic devices and methods for protein...

Packaging of radiation detectors in an image sensor

X-ray diffraction and X-ray spectroscopy method and related apparatus

Evaluation method and evaluation apparatus for electronic device

Patents Applicationslast 30 patents

ARRAY SUBSTRATE

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

Laboratory crystallographic x-ray diffraction analysis system

LAMINATE FOR WIRING BOARD

ENERGY DISPERSIVE X-RAY SPECTROSCOPY SENSING UNIT BACKGROUND

CONSTRUCTION METHOD FOR PHOTOCATHODE INDIRECT COMPETITION SENSOR AN...

Monitoring Scale Inhibitor Treatment

INTERFERENCE SCANNING TRANSMISSION ELECTRON MICROSCOPE

METHOD FOR TESTING PEROVSKITE PRECURSOR SOLUTION

DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...

DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...

AN ENERGY DISPERSIVE X-RAY DIFFRACTION ANALYSER HAVING AN IMPROVED...

SEMICONDUCTOR DEVICE

X-RAY SPECTROMETER AND METHODS FOR USE

METHOD FOR CORRECTING A SPECTRAL IMAGE

METHOD FOR PRODUCING A MAGNETIC POWDER

METHOD AND LABORATORY SYSTEM TO PROCESS A LABORATORY CARRIER BASED...

MANAGING WELLBORE CEMENT COMPOSITIONS BASED ON MATERIAL CHARACTERIS...

CELL ANALYSIS APPARATUS AND CELL ANALYSIS METHOD

OXIDE DISPERSION-STRENGTHENED IRON-BASED ALLOY POWDER AND CHARACTER...

RADIATION IMAGING APPARATUS, RADIATION IMAGING METHOD, AND NON-TRAN...

SYSTEM AND METHOD FOR DIAGNOSING A CONDITION OF AN ENGINE

DETERMINING ORE CHARACTERISTICS

METHOD FOR QUANTIFYING AMINE COMPOUND CONSTITUTING SEPARATOR ACTIVE...

Analysis Device and Spectrum Generation Method

Method for Operating a Signal Filter and Radiation Detection System

Wafer alignment for small-angle X-ray scatterometry

NANOSTRUCTURED CARBON MATERIALS AND METHODS OF MAKING AND USE THEREOF

EVALUATION METHOD AND EVALUATION APPARATUS FOR ELECTRONIC DEVICE

Collimator Assembly for an X-ray Spectrometer Device