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G01P15/0894
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PHYSICS
G01
Measuring instruments
G01P
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
G01P15/00
Measuring acceleration Measuring deceleration Measuring shock
Current Industry
G01P15/0894
by non-contact electron transfer
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Patents Grants
last 30 patents
Information
Patent Grant
Vibrating device, vibrating device module, electronic apparatus, an...
Patent number
11,137,415
Issue date
Oct 5, 2021
Seiko Epson Corporation
Yoshiyuki Matsuura
G01 - MEASURING TESTING
Information
Patent Grant
High aspect-ratio low noise multi-axis accelerometers
Patent number
10,495,663
Issue date
Dec 3, 2019
The Regents of the University of Michigan
Khalil Najafi
G01 - MEASURING TESTING
Information
Patent Grant
MEMS tunneling micro seismic sensor
Patent number
9,547,019
Issue date
Jan 17, 2017
Farrokh Mohamadi
G01 - MEASURING TESTING
Information
Patent Grant
MEMS tunneling accelerometer
Patent number
8,746,067
Issue date
Jun 10, 2014
Tialinx, Inc.
Hector J. De Los Santos
G01 - MEASURING TESTING
Information
Patent Grant
Quantum tunnelling sensor device and method
Patent number
8,544,324
Issue date
Oct 1, 2013
Pilsne Research Co., L.L.C.
Marek Michalewicz
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Sub-threshold forced plate FET sensor for sensing inertial displace...
Patent number
8,434,374
Issue date
May 7, 2013
Indian Institute of Science
Navakanta Bhat
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method and apparatus for sensing applied forces
Patent number
8,408,077
Issue date
Apr 2, 2013
Brother International Corporation
Mark Anthony Darty
B82 - NANO-TECHNOLOGY
Information
Patent Grant
MEMS tunneling accelerometer
Patent number
8,347,720
Issue date
Jan 8, 2013
Tialinx, Inc.
Hector J. De Los Santos
G01 - MEASURING TESTING
Information
Patent Grant
Quantum tunnelling transducer device
Patent number
8,033,091
Issue date
Oct 11, 2011
Quantum Precision Instruments Asia PTE LTD
Marek Michalewicz
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Measurement of micromovements
Patent number
7,877,893
Issue date
Feb 1, 2011
A-Metrics, LLC
Bonifatijs Lubgins
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Measurement of micromovements
Patent number
7,774,952
Issue date
Aug 17, 2010
A-Metrics, LLC
Bonifatijs Lubgins
G01 - MEASURING TESTING
Information
Patent Grant
Tunneling effect element and physical quantity to electrical quanti...
Patent number
7,743,666
Issue date
Jun 29, 2010
TDK Corporation
Tetsuya Kuwashima
G01 - MEASURING TESTING
Information
Patent Grant
Micro structure, cantilever, scanning probe microscope and a method...
Patent number
7,520,165
Issue date
Apr 21, 2009
TDK Corporation
Naoki Ohta
G01 - MEASURING TESTING
Information
Patent Grant
Diamond triode devices with a diamond microtip emitter
Patent number
7,256,535
Issue date
Aug 14, 2007
Vanderbilt University
Jimmy L. Davidson
G01 - MEASURING TESTING
Information
Patent Grant
Polymer based tunneling sensor
Patent number
7,094,622
Issue date
Aug 22, 2006
Louisiana Tech University Foundation, Inc.
Tianhong Cui
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Single crystal, dual wafer, tunneling sensor or switch with silicon...
Patent number
6,982,185
Issue date
Jan 3, 2006
HRL Laboratories, LLC
Randall L. Kubena
G01 - MEASURING TESTING
Information
Patent Grant
Dual-wafer tunneling gyroscope and an assembly for making same
Patent number
6,975,009
Issue date
Dec 13, 2005
HRL Laboratories, LLC
Randall L. Kubena
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Differential in-plane tunneling current sensor
Patent number
6,901,800
Issue date
Jun 7, 2005
Robert Bosch GmbH
Andreas Niendorf
G01 - MEASURING TESTING
Information
Patent Grant
Differential in-plane tunneling current sensor
Patent number
6,895,818
Issue date
May 24, 2005
Robert Bosch GmbH
Andreas Niendorf
G01 - MEASURING TESTING
Information
Patent Grant
Microelectromechanical tunneling gyroscope and an assembly for maki...
Patent number
6,841,838
Issue date
Jan 11, 2005
HRL Laboratories, LLC
Randall L. Kubena
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Single crystal, tunneling and capacitive, three-axes sensor using e...
Patent number
6,835,587
Issue date
Dec 28, 2004
HRL Laboratories, LLC
Randall L. Kubena
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Diamond diode devices with a diamond microtip emitter
Patent number
6,762,543
Issue date
Jul 13, 2004
Vanderbilt University
Weng Poo Kang
G01 - MEASURING TESTING
Information
Patent Grant
Single crystal, tunneling and capacitive, three-axes sensor using e...
Patent number
6,674,141
Issue date
Jan 6, 2004
HRL Laboratories, LLC
Randall L. Kubena
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Ultrananocrystalline diamond cantilever wide dynamic range accelera...
Patent number
6,613,601
Issue date
Sep 2, 2003
The University of Chicago
Alan R. Krauss
G01 - MEASURING TESTING
Information
Patent Grant
Single crystal, dual wafer, tunneling sensor or switch with silicon...
Patent number
6,580,138
Issue date
Jun 17, 2003
HRL Laboratories, LLC
Randall L. Kubena
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing a dual wafer tunneling gyroscope
Patent number
6,555,404
Issue date
Apr 29, 2003
HRL Laboratories, LLC
Randall L. Kubena
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Ultrananocrystalline diamond cantilever wide dynamic range accelera...
Patent number
6,422,077
Issue date
Jul 23, 2002
The University of Chicago
Alan R. Krauss
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Motion amplification based sensors
Patent number
6,309,077
Issue date
Oct 30, 2001
Cornell Research Foundation Inc.
Mohammed T. A. Saif
G01 - MEASURING TESTING
Information
Patent Grant
Electron tunneling infrared sensor module with integrated control c...
Patent number
6,268,604
Issue date
Jul 31, 2001
California Institute of Technology
Vardkes V. Boyadzhyan-Sevak
G01 - MEASURING TESTING
Information
Patent Grant
Motion amplification based sensors
Patent number
6,183,097
Issue date
Feb 6, 2001
Cornell Research Foundation Inc.
Mohammed T. A. Saif
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Vibrating Device, Vibrating Device Module, Electronic Apparatus, An...
Publication number
20180372773
Publication date
Dec 27, 2018
SEIKO EPSON CORPORATION
Yoshiyuki MATSUURA
G01 - MEASURING TESTING
Information
Patent Application
MEMS TUNNELING MICRO SEISMIC SENSOR
Publication number
20140190259
Publication date
Jul 10, 2014
Farrokh Mohamadi
G01 - MEASURING TESTING
Information
Patent Application
MEMS TUNNELING ACCELEROMETER
Publication number
20130118257
Publication date
May 16, 2013
TiaLinx, Inc.
Hector J. De Los Santos
G01 - MEASURING TESTING
Information
Patent Application
MEMS Tunneling Accelerometer
Publication number
20110314913
Publication date
Dec 29, 2011
Tialinx, Inc.
Hector J. De Los Santos
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for sensing applied forces
Publication number
20110094315
Publication date
Apr 28, 2011
Mark Anthony Darty
G01 - MEASURING TESTING
Information
Patent Application
Sub-Threshold Forced Plate FET Sensor for Sensing Inertial Displace...
Publication number
20110050201
Publication date
Mar 3, 2011
INDIAN INSTITUTE OF SCIENCE
Navakanta Bhat
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Device for Positioning a Moveable Object of Submicron Scale
Publication number
20110055981
Publication date
Mar 3, 2011
UNIVERSITE JOSEPH FOURIER
Alina Voda
G01 - MEASURING TESTING
Information
Patent Application
QUANTUM TUNNELLING SENSOR DEVICE AND METHOD
Publication number
20110043229
Publication date
Feb 24, 2011
Quantum Precision Instruments Asia Private Limited
Marek Michalewicz
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT OF MICROMOVEMENTS
Publication number
20100299949
Publication date
Dec 2, 2010
A-METRICS, LLC
Bonifatijs Lubgins
G01 - MEASURING TESTING
Information
Patent Application
Nanoscale Force Transducer
Publication number
20100050788
Publication date
Mar 4, 2010
Seoul National University Industry Foundation
Youngtack Shim
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT OF MICROMOVEMENTS
Publication number
20090293299
Publication date
Dec 3, 2009
Bonifatijs Lubgins
G01 - MEASURING TESTING
Information
Patent Application
Nanoparticle Vibration and Acceleration Sensors
Publication number
20070138583
Publication date
Jun 21, 2007
Physical Logic AG
Eran Ofek
G01 - MEASURING TESTING
Information
Patent Application
Polymer Nanosensor Device
Publication number
20070125181
Publication date
Jun 7, 2007
Physical Logic AG
Eran Ofek
G01 - MEASURING TESTING
Information
Patent Application
Nanoscale Sensor
Publication number
20070127164
Publication date
Jun 7, 2007
Physical Logic AG
Eran Ofek
G01 - MEASURING TESTING
Information
Patent Application
Quatum tunnelling transducer device
Publication number
20060285789
Publication date
Dec 21, 2006
Marek Michalewicz
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICRO STRUCTURE, CANTILEVER, SCANNING PROBE MICROSCOPE AND A METHOD...
Publication number
20060277981
Publication date
Dec 14, 2006
TDK Corporation
Naoki Ohta
G01 - MEASURING TESTING
Information
Patent Application
Tunneling effect element and physical quantity to electrical quanti...
Publication number
20060220781
Publication date
Oct 5, 2006
TDK Corporation
Tetsuya Kuwashima
G01 - MEASURING TESTING
Information
Patent Application
Diamond triode devices with a diamond microtip emitter
Publication number
20050062389
Publication date
Mar 24, 2005
Jimmy L. Davidson
G01 - MEASURING TESTING
Information
Patent Application
Differential in-plane tunneling current sensor
Publication number
20050035289
Publication date
Feb 17, 2005
Andreas Niendorf
G01 - MEASURING TESTING
Information
Patent Application
A DUAL-WAFER TUNNELING GYROSCOPE AND AN ASSEMBLY FOR MAKING SAME
Publication number
20040217388
Publication date
Nov 4, 2004
HRL Laboratories, LLC
Randall L. Kubena
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Differential in-plane tunneling current sensor
Publication number
20040118207
Publication date
Jun 24, 2004
Andreas Niendorf
G01 - MEASURING TESTING
Information
Patent Application
Single crystal, tunneling and capacitive, three-axes sensor using e...
Publication number
20040048403
Publication date
Mar 11, 2004
HRL Laboratories, LLC
Randall L. Kubena
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Single crystal, dual wafer, tunneling sensor or switch with silicon...
Publication number
20030141562
Publication date
Jul 31, 2003
HRL Laboratories, LLC
Randall L. Kubena
G01 - MEASURING TESTING
Information
Patent Application
Method of manufacturing a dual wafer tunneling gyroscope
Publication number
20030013246
Publication date
Jan 16, 2003
HRL Laboratories, LLC
Randall L. Kubena
B81 - MICRO-STRUCTURAL TECHNOLOGY