by semiconductor devices comprising at least one PN junction

Industry

CPC
G01P15/124

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Parent Industries

GPHYSICS G01Measuring instruments G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT G01P15/00Measuring acceleration Measuring deceleration Measuring shock

Current Industry

G01P15/124by semiconductor devices comprising at least one PN junction

Industries

Patents Grantslast 30 patents

Information Patent Grant
FET based sensory systems
- Patent number 11,254,559
- Issue date Feb 22, 2022
- Kris Vossough
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Sensor device and method
- Patent number 9,728,652
- Issue date Aug 8, 2017
- Infineon Technologies AG
- Klaus Elian
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Analysis circuit for field effect transistors having a displaceable...
- Patent number 9,470,744
- Issue date Oct 18, 2016
- Robert Bosch GmbH
- Alexander Buhmann
- G01 - MEASURING TESTING
Information Patent Grant
Vibration sensor
- Patent number 9,453,854
- Issue date Sep 27, 2016
- KCF Technologies, Inc.
- David R. Kraige
- G01 - MEASURING TESTING
Information Patent Grant
Packaging system and process for inertial sensor modules using movi...
- Patent number 9,400,288
- Issue date Jul 26, 2016
- Robert Bosch GmbH
- Ando Feyh
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Micro electro mechanical device, method for manufacturing the same,...
- Patent number 9,359,189
- Issue date Jun 7, 2016
- Seiko Epson Corporation
- Hiroyuki Shimada
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Micromechanical sensor apparatus having a movable gate and correspo...
- Patent number 9,166,066
- Issue date Oct 20, 2015
- Robert Bosch GmbH
- Ando Feyh
- G01 - MEASURING TESTING
Information Patent Grant
Microelectronic component and corresponding production process
- Patent number 9,082,882
- Issue date Jul 14, 2015
- Robert Bosch GmbH
- Christoph Schelling
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Sensor and method of manufacturing the same
- Patent number 8,336,381
- Issue date Dec 25, 2012
- Canon Kabushiki Kaisha
- Atsushi Kandori
- G01 - MEASURING TESTING
Information Patent Grant
Device sensitive to a movement comprising at least one transistor
- Patent number 8,030,690
- Issue date Oct 4, 2011
- Commissariat a l'Energie Atomique
- Eric Ollier
- G01 - MEASURING TESTING
Information Patent Grant
Method for MEMS threshold sensor packaging
- Patent number 7,927,906
- Issue date Apr 19, 2011
- Honeywell International Inc.
- Cornel P. Cobianu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Piezo-TFT cantilever MEMS fabrication
- Patent number 7,785,912
- Issue date Aug 31, 2010
- Sharp Laboratories of America, Inc.
- Changqing Zhan
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Sensor having switch function, manufacturing method thereof and ele...
- Patent number 7,649,150
- Issue date Jan 19, 2010
- Nittei Musen Co., Ltd.
- Takashi Masuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
MOS transistor with a deformable gate
- Patent number 7,304,358
- Issue date Dec 4, 2007
- STMicroelectronics S.A.
- Pascal Ancey
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Piezo-TFT cantilever MEMS
- Patent number 7,253,488
- Issue date Aug 7, 2007
- Sharp Laboratories of America, Inc.
- Changqing Zhan
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Contactless acceleration switch
- Patent number 6,858,458
- Issue date Feb 22, 2005
- Honeywell International Inc.
- Joon-Won Kang
- G01 - MEASURING TESTING
Information Patent Grant
Vertical transistor comprising a mobile gate and a method for the p...
- Patent number 6,849,912
- Issue date Feb 1, 2005
- Fraunhofer-Gesellschaft Zur Forderung der Angewandten Forschung, E.V.
- Andreas Bertz
- G01 - MEASURING TESTING
Information Patent Grant
Field effect transistor, especially for use as a sensor element or...
- Patent number 6,724,023
- Issue date Apr 20, 2004
- Robert Bosch GmbH
- Klaus Heyers
- G01 - MEASURING TESTING
Information Patent Grant
Contactless acceleration switch
- Patent number 6,720,634
- Issue date Apr 13, 2004
- Honeywell International Inc.
- Joon-Won Kang
- G01 - MEASURING TESTING
Information Patent Grant
Method for the production of a field-effect structure
- Patent number 6,645,800
- Issue date Nov 11, 2003
- Robert Bosch GmbH
- Wilhelm Frey
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device including eutectic bonding portion and method...
- Patent number 6,555,901
- Issue date Apr 29, 2003
- Denso Corporation
- Shinji Yoshihara
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Differential wideband vibration
- Patent number 6,220,096
- Issue date Apr 24, 2001
- InterScience, Inc.
- Adolfo O. Gutierrez
- G01 - MEASURING TESTING
Information Patent Grant
Laterally movable gate field effect transistors for microsensors an...
- Patent number 6,204,544
- Issue date Mar 20, 2001
- Board of Supervisors of Louisiana State University and Agricultural and Mecha...
- Xiaodong Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabrication of a semiconductor sensor
- Patent number 6,143,584
- Issue date Nov 7, 2000
- Denso Corporation
- Tsuyoshi Fukada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor physical-quantity sensor having a locos oxide film, f...
- Patent number 6,137,150
- Issue date Oct 24, 2000
- Nippondenso Co., Ltd.
- Yukihiro Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Micro-electro-mechanics systems (MEMS)
- Patent number 6,128,961
- Issue date Oct 10, 2000
- Dan Haronian
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Transducer and interface circuit
- Patent number 6,043,524
- Issue date Mar 28, 2000
- Motorola, Inc.
- Eric D. Joseph
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensor having multi-layer movable beam structure film
- Patent number 5,936,159
- Issue date Aug 10, 1999
- Nippondenso Co., Ltd.
- Kazuhiko Kano
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensing device and method for fabricating the same
- Patent number 5,903,038
- Issue date May 11, 1999
- Motorola, Inc.
- Zuoying Lisa Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor yaw rate sensor with a vibrating movable section with...
- Patent number 5,895,851
- Issue date Apr 20, 1999
- Nippondenso Co., Ltd.
- Kazuhiko Kano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FET BASED SENSORY SYSTEMS
- Publication number 20220153572
- Publication date May 19, 2022
- Kris Vossough
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
VIBRATION SENSOR
- Publication number 20150241463
- Publication date Aug 27, 2015
- KCF TECHNOLOGIES, INC.
- David R. Kraige
- G01 - MEASURING TESTING
Information Patent Application
Micromechanical Sensor Apparatus having a Movable Gate and Correspo...
- Publication number 20140374804
- Publication date Dec 25, 2014
- ROBERT BOSCH GmbH
- Ando Feyh
- G01 - MEASURING TESTING
Information Patent Application
Analysis Circuit for Field Effect Transistors Having a Displaceable...
- Publication number 20140165725
- Publication date Jun 19, 2014
- ROBERT BOSCH GmbH
- Alexander Buhmann
- G01 - MEASURING TESTING
Information Patent Application
PACKAGING SYSTEM AND PROCESS FOR INERTIAL SENSOR MODULES USING MOVI...
- Publication number 20140150553
- Publication date Jun 5, 2014
- ROBERT BOSCH GmbH
- Ando Feyh
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Microelectronic Component and Corresponding Production Process
- Publication number 20140084349
- Publication date Mar 27, 2014
- ROBERT BOSCH GmbH
- Christoph Schelling
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Sensor Device and Method
- Publication number 20130187201
- Publication date Jul 25, 2013
- INFINEON TECHNOLOGIES AG
- Klaus Elian
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Inertial sensor having a field effect transistor
- Publication number 20110057236
- Publication date Mar 10, 2011
- Ando Feyh
- G01 - MEASURING TESTING
Information Patent Application
SENSOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20100043546
- Publication date Feb 25, 2010
- Canon Kabushiki Kaisha
- Atsushi Kandori
- G01 - MEASURING TESTING
Information Patent Application
DEVICE SENSITIVE TO A MOVEMENT COMPRISING AT LEAST ONE TRANSISTOR
- Publication number 20090321793
- Publication date Dec 31, 2009
- COMMISSARIAT A L'ENERGIE ATOMIQUE
- Eric Ollier
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEMS THRESHOLD SENSOR PACKAGING
- Publication number 20090194828
- Publication date Aug 6, 2009
- Honeywell International Inc.
- Cornel P. Cobianu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICRO ELECTRO MECHANICAL DEVICE, METHOD FOR MANUFACTURING THE SAME,...
- Publication number 20090127590
- Publication date May 21, 2009
- SEIKO EPSON CORPORATION
- Hiroyuki SHIMADA
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Sensor Having Switch Function, Manufacturing Method Thereof and Ele...
- Publication number 20080037075
- Publication date Feb 14, 2008
- NITTEI MUSEN CO., LTD.
- Takashi Masuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Piezo-TFT cantilever MEMS fabrication
- Publication number 20070287233
- Publication date Dec 13, 2007
- Sharp Laboratories of America, Inc.
- Changqing Zhan
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MOS transistor with a deformable gate
- Publication number 20060054984
- Publication date Mar 16, 2006
- STMicroelectronics
- Pascal Ancey
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Piezo-TFT cantilever MEMS
- Publication number 20050130360
- Publication date Jun 16, 2005
- Sharp Laboratories of America, Inc.
- Changqing Zhan
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Contactless acceleration switch
- Publication number 20040161869
- Publication date Aug 19, 2004
- Honeywell International Inc.
- Joon-Won Kang
- G01 - MEASURING TESTING
Information Patent Application
Vertical transistor comprising a mobile gate and a method for the p...
- Publication number 20030173611
- Publication date Sep 18, 2003
- Andreas Bertz
- G01 - MEASURING TESTING
Information Patent Application
Contactless acceleration switch
- Publication number 20030127670
- Publication date Jul 10, 2003
- Honeywell International Inc.
- Joon-Won Kang
- G01 - MEASURING TESTING
Information Patent Application
Method for the production of a field-effect structure and field-eff...
- Publication number 20030045040
- Publication date Mar 6, 2003
- Wilhelm Frey
- G01 - MEASURING TESTING
Information Patent Application
Field effect transistor, especially for use as a sensor element or...
- Publication number 20020005530
- Publication date Jan 17, 2002
- Klaus Heyers
- G01 - MEASURING TESTING

by semiconductor devices comprising at least one PN junction

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

FET based sensory systems

Sensor device and method

Analysis circuit for field effect transistors having a displaceable...

Vibration sensor

Packaging system and process for inertial sensor modules using movi...

Micro electro mechanical device, method for manufacturing the same,...

Micromechanical sensor apparatus having a movable gate and correspo...

Microelectronic component and corresponding production process

Sensor and method of manufacturing the same

Device sensitive to a movement comprising at least one transistor

Method for MEMS threshold sensor packaging

Piezo-TFT cantilever MEMS fabrication

Sensor having switch function, manufacturing method thereof and ele...

MOS transistor with a deformable gate

Piezo-TFT cantilever MEMS

Contactless acceleration switch

Vertical transistor comprising a mobile gate and a method for the p...

Field effect transistor, especially for use as a sensor element or...

Contactless acceleration switch

Method for the production of a field-effect structure

Semiconductor device including eutectic bonding portion and method...

Differential wideband vibration

Laterally movable gate field effect transistors for microsensors an...

Method for fabrication of a semiconductor sensor

Semiconductor physical-quantity sensor having a locos oxide film, f...

Micro-electro-mechanics systems (MEMS)

Transducer and interface circuit

Semiconductor sensor having multi-layer movable beam structure film

Semiconductor sensing device and method for fabricating the same

Semiconductor yaw rate sensor with a vibrating movable section with...

Patents Applicationslast 30 patents

FET BASED SENSORY SYSTEMS

VIBRATION SENSOR

Micromechanical Sensor Apparatus having a Movable Gate and Correspo...

Analysis Circuit for Field Effect Transistors Having a Displaceable...

PACKAGING SYSTEM AND PROCESS FOR INERTIAL SENSOR MODULES USING MOVI...

Microelectronic Component and Corresponding Production Process

Sensor Device and Method

Inertial sensor having a field effect transistor

SENSOR AND METHOD OF MANUFACTURING THE SAME

DEVICE SENSITIVE TO A MOVEMENT COMPRISING AT LEAST ONE TRANSISTOR

METHOD FOR MEMS THRESHOLD SENSOR PACKAGING

MICRO ELECTRO MECHANICAL DEVICE, METHOD FOR MANUFACTURING THE SAME,...

Sensor Having Switch Function, Manufacturing Method Thereof and Ele...

Piezo-TFT cantilever MEMS fabrication

MOS transistor with a deformable gate

Piezo-TFT cantilever MEMS

Contactless acceleration switch

Vertical transistor comprising a mobile gate and a method for the p...

Contactless acceleration switch

Method for the production of a field-effect structure and field-eff...

Field effect transistor, especially for use as a sensor element or...