by shearing interferometric methods

Industry

CPC
G01J9/0215

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J9/00Measuring optical phase difference Determining degree of coherence Measuring optical wavelength

Current Industry

G01J9/0215by shearing interferometric methods

Industries

Patents Grantslast 30 patents

Information Patent Grant
Wavefront sensor and method of reconstructing distorted wavefronts
- Patent number 11,874,178
- Issue date Jan 16, 2024
- King Abdullah University of Science and Technology
- Congli Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement technique for refractive index inhomogeneity between pl...
- Patent number 11,454,590
- Issue date Sep 27, 2022
- LUMUS LTD.
- Jonathan Gelberg
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring complex degree of coherence of random optical...
- Patent number 11,366,017
- Issue date Jun 21, 2022
- Soochow University
- Yahong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method for high-accuracy wavefront measurement base on grating shea...
- Patent number 11,340,118
- Issue date May 24, 2022
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Yunjun Lu
- G01 - MEASURING TESTING
Information Patent Grant
Sensor apparatus and method for lithographic measurements
- Patent number 11,300,892
- Issue date Apr 12, 2022
- ASML Netherlands B.V.
- Simon Reinald Huisman
- G01 - MEASURING TESTING
Information Patent Grant
Regularized shearograms for phase resolved shearography
- Patent number 11,287,244
- Issue date Mar 29, 2022
- BAE Systems Information and Electronic Systems Integration Inc.
- Andrew N. Acker
- G01 - MEASURING TESTING
Information Patent Grant
Light intensity fluctuation-insensitive projection objective wave a...
- Patent number 11,215,512
- Issue date Jan 4, 2022
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Feng Tang
- G01 - MEASURING TESTING
Information Patent Grant
Wavefront sensor and method of reconstructing distorted wavefronts
- Patent number 11,073,427
- Issue date Jul 27, 2021
- King Abdullah University of Science and Technology
- Congli Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating the quality of the measurement of a wavefront...
- Patent number 11,047,741
- Issue date Jun 29, 2021
- Imagine Optic
- Xavier Levecq
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for analysing an electromagnetic wave in high def...
- Patent number 11,029,214
- Issue date Jun 8, 2021
- PHASICS
- Benoît Wattellier
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for detecting projection objective wave-front abe...
- Patent number 11,029,611
- Issue date Jun 8, 2021
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Feng Tang
- G01 - MEASURING TESTING
Information Patent Grant
Wavefront detector
- Patent number 11,015,982
- Issue date May 25, 2021
- Wisconsin Alumni Research Foundation
- Zongfu Yu
- G01 - MEASURING TESTING
Information Patent Grant
Method for wavefront measurement of optical imaging system based on...
- Patent number 11,009,336
- Issue date May 18, 2021
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Yunjun Lu
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a tire by interferometry
- Patent number 10,962,419
- Issue date Mar 30, 2021
- CARL ZEISS OPTOTECHNIK GMBH
- Junli Sun
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method and measuring system for interferometrically measu...
- Patent number 10,697,852
- Issue date Jun 30, 2020
- Carl Zeiss SMT GmbH
- Ulrich Wegmann
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Holographic wavefront sensing
- Patent number 10,634,562
- Issue date Apr 28, 2020
- Imec VZW
- Abdulkadir Yurt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wavefront detector
- Patent number 10,620,054
- Issue date Apr 14, 2020
- Wisconsin Alumni Research Foundation
- Zongfu Yu
- G01 - MEASURING TESTING
Information Patent Grant
Gas visualizing methods and systems with birefringent polarization...
- Patent number 10,612,975
- Issue date Apr 7, 2020
- FLIR Systems AB
- Jonas Sandsten
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring wavefront using diffraction grating...
- Patent number 10,571,340
- Issue date Feb 25, 2020
- Nikon Corporation
- Katsura Otaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Shearing interferometer using two opposing shearing plates for laser
- Patent number 10,557,756
- Issue date Feb 11, 2020
- Samsung Display Co., Ltd.
- Emil Aslanov
- G01 - MEASURING TESTING
Information Patent Grant
Motion compensation system for a shearography apparatus
- Patent number 10,466,038
- Issue date Nov 5, 2019
- BAE Systems Information and Electronic Systems Integration Inc.
- Daniel N. Kokubun
- G02 - OPTICS
Information Patent Grant
Process and apparatus for a wavelength tuning source
- Patent number RE47675
- Issue date Oct 29, 2019
- The General Hospital Corporation
- Brett Eugene Bouma
Information Patent Grant
Method and apparatus for wavefront sensing
- Patent number 10,371,580
- Issue date Aug 6, 2019
- Ram Photonics, LLC
- Seung-Whan Bahk
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Collimation evaluation device and collimation evaluation method
- Patent number 10,309,836
- Issue date Jun 4, 2019
- Hamamatsu Photonics K.K.
- Junji Okuma
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring wavefront using light-exit section...
- Patent number 10,288,489
- Issue date May 14, 2019
- Nikon Corporation
- Katsura Otaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Collimation evaluation device and collimation evaluation method
- Patent number 10,260,987
- Issue date Apr 16, 2019
- Hamamatsu Photonics K.K.
- Junji Okuma
- G01 - MEASURING TESTING
Information Patent Grant
Two-axis interferometric tracking utilizing pairs of shearing inter...
- Patent number 10,215,833
- Issue date Feb 26, 2019
- Optical Physics Company
- Richard A. Hutchin
- G01 - MEASURING TESTING
Information Patent Grant
Wavefront sensor and method for determining differences in piston a...
- Patent number 10,175,115
- Issue date Jan 8, 2019
- ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)
- Cindy Bellanger
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for characterization of a light beam to determine...
- Patent number 10,151,639
- Issue date Dec 11, 2018
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Fabien Quere
- G01 - MEASURING TESTING
Information Patent Grant
Broadband, common-path, interferometric wavefront sensor
- Patent number 9,976,912
- Issue date May 22, 2018
- California Institute of Technology
- James Kent Wallace
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RECONSTRUCTION OF A WAVEFRONT OF A LIGHT BEAM CONTAINING OPTICAL VO...
- Publication number 20230296444
- Publication date Sep 21, 2023
- UNIVERSITÉ PARIS CITÉ
- Marc GUILLON
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR HIGH-ACCURACY WAVEFRONT MEASUREMENT BASE ON GRATING SHEA...
- Publication number 20220074793
- Publication date Mar 10, 2022
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Yunjun LU
- G01 - MEASURING TESTING
Information Patent Application
WAVEFRONT SENSOR AND METHOD OF RECONSTRUCTING DISTORTED WAVEFRONTS
- Publication number 20210310872
- Publication date Oct 7, 2021
- King Abdullah University of Science and Technology
- Congli WANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING COMPLEX DEGREE OF COHERENCE OF RANDOM OPTICAL...
- Publication number 20210278283
- Publication date Sep 9, 2021
- SOOCHOW UNIVERSITY
- Yahong CHEN
- G01 - MEASURING TESTING
Information Patent Application
Sensor Apparatus and Method for Lithographic Measurements
- Publication number 20210271178
- Publication date Sep 2, 2021
- ASML NETHERLANDS B.V.
- Simon Reinald HUISMAN
- G01 - MEASURING TESTING
Information Patent Application
LIGHT INTENSITY FLUCTUATION-INSENSITIVE PROJECTION OBJECTIVE WAVE A...
- Publication number 20210208005
- Publication date Jul 8, 2021
- Shanghai Instittute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Feng TANG
- G01 - MEASURING TESTING
Information Patent Application
Measurement Technique for Refractive Index Inhomogeneity Between Pl...
- Publication number 20210116367
- Publication date Apr 22, 2021
- LUMUS LTD.
- Jonathan GELBERG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETECTING PROJECTION OBJECTIVE WAVE-FRONT ABE...
- Publication number 20210026250
- Publication date Jan 28, 2021
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Feng Tang
- G01 - MEASURING TESTING
Information Patent Application
Wavefront Detector
- Publication number 20200355558
- Publication date Nov 12, 2020
- Wisconsin Alumni Research Foundation
- Zongfu Yu
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A TIRE BY INTERFEROMETRY
- Publication number 20200326239
- Publication date Oct 15, 2020
- CARL ZEISS OPTOTECHNIK GMBH
- Junli Sun
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR WAVEFRONT MEASUREMENT OF OPTICAL IMAGING SYSTEM BASED ON...
- Publication number 20200292296
- Publication date Sep 17, 2020
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Yunjun LU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURE OF COHERENCE OF LIGHT SOURCE FOR HOLOGRAPHIC...
- Publication number 20200182701
- Publication date Jun 11, 2020
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Jeho NAM
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING THE QUALITY OF THE MEASUREMENT OF A WAVEFRONT...
- Publication number 20190391020
- Publication date Dec 26, 2019
- IMAGINE OPTIC
- Xavier LEVECQ
- G01 - MEASURING TESTING
Information Patent Application
Wavefront Detector
- Publication number 20190346311
- Publication date Nov 14, 2019
- Wisconsin Alumni Research Foundation
- Zongfu Yu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...
- Publication number 20190219451
- Publication date Jul 18, 2019
- Nikon Corporation
- Katsura Otaki
- G01 - MEASURING TESTING
Information Patent Application
MEASURING METHOD AND MEASURING SYSTEM FOR INTERFEROMETRICALLY MEASU...
- Publication number 20190212226
- Publication date Jul 11, 2019
- Carl Zeiss SMT GMBH
- Ulrich WEGMANN
- G01 - MEASURING TESTING
Information Patent Application
SHEARING INTERFEROMETER FOR LASER
- Publication number 20190154514
- Publication date May 23, 2019
- SAMSUNG DISPLAY CO., LTD.
- Emil ASLANOV
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR WAVEFRONT SENSING
- Publication number 20180292268
- Publication date Oct 11, 2018
- RAM Photonics, LLC
- Seung-Whan Bahk
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR CHARACTERIZATION OF A LIGHT BEAM
- Publication number 20170234736
- Publication date Aug 17, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Fabien QUERE
- G01 - MEASURING TESTING
Information Patent Application
COLLIMATION EVALUATION DEVICE AND COLLIMATION EVALUATION METHOD
- Publication number 20170199083
- Publication date Jul 13, 2017
- HAMAMATSU PHOTONICS K. K.
- Junji OKUMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR WAVEFRONT SENSING
- Publication number 20170038261
- Publication date Feb 9, 2017
- RAM Photonics, LLC
- Seung-Whan Bahk
- G01 - MEASURING TESTING
Information Patent Application
BROADBAND, COMMON-PATH, INTERFEROMETRIC WAVEFRONT SENSOR
- Publication number 20150219501
- Publication date Aug 6, 2015
- California Incapacitated of Technology
- James Kent Wallace
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...
- Publication number 20150160073
- Publication date Jun 11, 2015
- Nikon Corporation
- Katsura Otaki
- G01 - MEASURING TESTING
Information Patent Application
OPERATING METHOD OF FIRST DERIVATIVE MEASURING APPARATUS
- Publication number 20150146213
- Publication date May 28, 2015
- Korea Research Institute of Standards and Science
- Hyug-Gyo RHEE
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS AND IMAGE PROCESSING METHOD
- Publication number 20140241632
- Publication date Aug 28, 2014
- Kentaro Nagai
- G01 - MEASURING TESTING
Information Patent Application
SPECKLE REDUCTION IN OPTICAL COHERENCE TOMOGRAPHY BY PATH LENGTH EN...
- Publication number 20130314716
- Publication date Nov 28, 2013
- The General Hospital Corporation
- Guillermo J. Tearney
- G02 - OPTICS
Information Patent Application
BROADBAND, COMMON-PATH, INTERFEROMETRIC WAVEFRONT SENSOR
- Publication number 20130188194
- Publication date Jul 25, 2013
- California Institute of Technology
- James Kent Wallace
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PERFORMING OPTICAL IMAGING USING FREQUENCY...
- Publication number 20130128274
- Publication date May 23, 2013
- The General Hospital Corporation
- Seok-Hyun Yun
- G02 - OPTICS
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20130034209
- Publication date Feb 7, 2013
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G02 - OPTICS
Information Patent Application
SPECKLE REDUCTION IN OPTICAL COHERENCE TOMOGRAPHY BY PATH LENGTH EN...
- Publication number 20120281237
- Publication date Nov 8, 2012
- The General Hospital Corporation
- Guillermo J. Tearney
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

by shearing interferometric methods

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Wavefront sensor and method of reconstructing distorted wavefronts

Measurement technique for refractive index inhomogeneity between pl...

Method for measuring complex degree of coherence of random optical...

Method for high-accuracy wavefront measurement base on grating shea...

Sensor apparatus and method for lithographic measurements

Regularized shearograms for phase resolved shearography

Light intensity fluctuation-insensitive projection objective wave a...

Wavefront sensor and method of reconstructing distorted wavefronts

Method for evaluating the quality of the measurement of a wavefront...

Method and device for analysing an electromagnetic wave in high def...

Device and method for detecting projection objective wave-front abe...

Wavefront detector

Method for wavefront measurement of optical imaging system based on...

Method for testing a tire by interferometry

Measuring method and measuring system for interferometrically measu...

Holographic wavefront sensing

Wavefront detector

Gas visualizing methods and systems with birefringent polarization...

Method and device for measuring wavefront using diffraction grating...

Shearing interferometer using two opposing shearing plates for laser

Motion compensation system for a shearography apparatus

Process and apparatus for a wavelength tuning source

Method and apparatus for wavefront sensing

Collimation evaluation device and collimation evaluation method

Method and device for measuring wavefront using light-exit section...

Collimation evaluation device and collimation evaluation method

Two-axis interferometric tracking utilizing pairs of shearing inter...

Wavefront sensor and method for determining differences in piston a...

Device and method for characterization of a light beam to determine...

Broadband, common-path, interferometric wavefront sensor

Patents Applicationslast 30 patents

RECONSTRUCTION OF A WAVEFRONT OF A LIGHT BEAM CONTAINING OPTICAL VO...

METHOD FOR HIGH-ACCURACY WAVEFRONT MEASUREMENT BASE ON GRATING SHEA...

WAVEFRONT SENSOR AND METHOD OF RECONSTRUCTING DISTORTED WAVEFRONTS

METHOD FOR MEASURING COMPLEX DEGREE OF COHERENCE OF RANDOM OPTICAL...

Sensor Apparatus and Method for Lithographic Measurements

LIGHT INTENSITY FLUCTUATION-INSENSITIVE PROJECTION OBJECTIVE WAVE A...

Measurement Technique for Refractive Index Inhomogeneity Between Pl...

DEVICE AND METHOD FOR DETECTING PROJECTION OBJECTIVE WAVE-FRONT ABE...

Wavefront Detector

METHOD FOR TESTING A TIRE BY INTERFEROMETRY

METHOD FOR WAVEFRONT MEASUREMENT OF OPTICAL IMAGING SYSTEM BASED ON...

APPARATUS FOR MEASURE OF COHERENCE OF LIGHT SOURCE FOR HOLOGRAPHIC...

METHOD FOR EVALUATING THE QUALITY OF THE MEASUREMENT OF A WAVEFRONT...

Wavefront Detector

METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...

MEASURING METHOD AND MEASURING SYSTEM FOR INTERFEROMETRICALLY MEASU...

SHEARING INTERFEROMETER FOR LASER

METHOD AND APPARATUS FOR WAVEFRONT SENSING

DEVICE AND METHOD FOR CHARACTERIZATION OF A LIGHT BEAM

COLLIMATION EVALUATION DEVICE AND COLLIMATION EVALUATION METHOD

METHOD AND APPARATUS FOR WAVEFRONT SENSING

BROADBAND, COMMON-PATH, INTERFEROMETRIC WAVEFRONT SENSOR

METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...

OPERATING METHOD OF FIRST DERIVATIVE MEASURING APPARATUS

IMAGING APPARATUS AND IMAGE PROCESSING METHOD

SPECKLE REDUCTION IN OPTICAL COHERENCE TOMOGRAPHY BY PATH LENGTH EN...

BROADBAND, COMMON-PATH, INTERFEROMETRIC WAVEFRONT SENSOR

METHOD AND APPARATUS FOR PERFORMING OPTICAL IMAGING USING FREQUENCY...

X-RAY IMAGING APPARATUS

SPECKLE REDUCTION IN OPTICAL COHERENCE TOMOGRAPHY BY PATH LENGTH EN...