Membership
Tour
Register
Log in
by speckle- or shearing interferometry
Follow
Industry
CPC
G01B11/162
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B11/00
Measuring arrangements characterised by the use of optical means
Current Industry
G01B11/162
by speckle- or shearing interferometry
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Geometric phase based motion compensation for shearography
Patent number
12,078,817
Issue date
Sep 3, 2024
BAE Systems Information and Electronic Systems Integration Inc.
Jacob D. Garan
G01 - MEASURING TESTING
Information
Patent Grant
Shearography testing method and system using shaped excitation ligh...
Patent number
12,038,270
Issue date
Jul 16, 2024
Agency for Science, Technology and Research
Lei Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Method for fabricating speckle for high temperature deformation mea...
Patent number
11,835,331
Issue date
Dec 5, 2023
Wuhan University of Science and Technology
Ao Huang
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Common lens transmitter for motion compensated illumination
Patent number
11,650,042
Issue date
May 16, 2023
BAE Systems Information and Electronic Systems Integration Inc.
Christopher E. Saxer
G02 - OPTICS
Information
Patent Grant
Composite laminate damage detection method using an in-situ thermal...
Patent number
11,618,591
Issue date
Apr 4, 2023
The Boeing Company
Samuel R. Goertz
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Electronic speckle pattern interferometer (ESPI) for long-range mea...
Patent number
11,525,667
Issue date
Dec 13, 2022
United States of America as represented by the Secretary of the Air Force
Jennie Burns
G01 - MEASURING TESTING
Information
Patent Grant
Single wavelength reflection for leadframe brightness measurement
Patent number
11,421,981
Issue date
Aug 23, 2022
Texas Instruments Incorporated
Hung-Yu Chou
G01 - MEASURING TESTING
Information
Patent Grant
Defect detection device
Patent number
11,391,700
Issue date
Jul 19, 2022
Samsung Electronics Co., Ltd.
Takahide Hatahori
G01 - MEASURING TESTING
Information
Patent Grant
Optical detection of vibrations
Patent number
11,371,878
Issue date
Jun 28, 2022
Elbit Systems Land and C4I Ltd.
Ilya Leizerson
G01 - MEASURING TESTING
Information
Patent Grant
Regularized shearograms for phase resolved shearography
Patent number
11,287,244
Issue date
Mar 29, 2022
BAE Systems Information and Electronic Systems Integration Inc.
Andrew N. Acker
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for machine learning using optical data
Patent number
11,137,289
Issue date
Oct 5, 2021
LightOn
Iacopo Poli
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for facilitating a vacuum bagging operation du...
Patent number
11,110,668
Issue date
Sep 7, 2021
The Boeing Company
Kenneth H. Griess
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Method for testing a tire by interferometry
Patent number
10,962,419
Issue date
Mar 30, 2021
CARL ZEISS OPTOTECHNIK GMBH
Junli Sun
G01 - MEASURING TESTING
Information
Patent Grant
Shearography detection and classification
Patent number
10,914,573
Issue date
Feb 9, 2021
BAE Systems Information Electronic Systems Integration Inc.
Andrew N. Acker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
High speed vacuum cycling excitation system for optical inspection...
Patent number
10,876,943
Issue date
Dec 29, 2020
The Boeing Company
Morteza Safai
G01 - MEASURING TESTING
Information
Patent Grant
Multiscale deformation measurements leveraging tailorable and multi...
Patent number
10,845,187
Issue date
Nov 24, 2020
Drexel University
Antonios Kontsos
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Component heating sub-systems and methods for laser shearography te...
Patent number
10,837,761
Issue date
Nov 17, 2020
The Boeing Company
Mahdi Ashrafi
G01 - MEASURING TESTING
Information
Patent Grant
System and method for use in depth characterization of objects
Patent number
10,724,846
Issue date
Jul 28, 2020
CONTINUSE BIOMETRICS LTD.
Zeev Zalevsky
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and system for object reconstruction
Patent number
10,608,002
Issue date
Mar 31, 2020
Apple Inc.
Zeev Zalevsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical interferometry
Patent number
10,466,032
Issue date
Nov 5, 2019
Optonor AS
Eiolf Vikhagen
G01 - MEASURING TESTING
Information
Patent Grant
Motion compensation system for a shearography apparatus
Patent number
10,466,038
Issue date
Nov 5, 2019
BAE Systems Information and Electronic Systems Integration Inc.
Daniel N. Kokubun
G02 - OPTICS
Information
Patent Grant
Single wavelength reflection for leadframe brightness measurement
Patent number
10,429,174
Issue date
Oct 1, 2019
Texas Instruments Incorporated
Hung-Yu Chou
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for object reconstruction
Patent number
10,340,280
Issue date
Jul 2, 2019
Apple Inc.
Zeev Zalevsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
High speed vacuum cycling excitation system for optical inspection...
Patent number
10,337,969
Issue date
Jul 2, 2019
The Boeing Company
Morteza Safai
G01 - MEASURING TESTING
Information
Patent Grant
Spatial phase-shift shearography system for non-destructive testing...
Patent number
10,330,463
Issue date
Jun 25, 2019
Oakland University
Lianxiang Yang
G01 - MEASURING TESTING
Information
Patent Grant
Spectral shearing ladar
Patent number
10,274,377
Issue date
Apr 30, 2019
The United States of America as represented by the Secretary of the Air Force
David J. Rabb
G01 - MEASURING TESTING
Information
Patent Grant
Determining a propagation velocity for a surface wave
Patent number
10,240,912
Issue date
Mar 26, 2019
Koninklijke Philips N.V.
Remco Theodorus Johannes Muijs
G01 - MEASURING TESTING
Information
Patent Grant
Method of analyzing deformations in a laminated object and accordin...
Patent number
9,816,807
Issue date
Nov 14, 2017
Vestas Wind Systems A/S
Georg Herborg Enevoldsen
F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information
Patent Grant
Method and system for object reconstruction
Patent number
9,704,249
Issue date
Jul 11, 2017
Apple Inc.
Zeev Zalevsky
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and apparatus for determining residual stresses of a component
Patent number
9,696,142
Issue date
Jul 4, 2017
MTU Aero Engines AG
Joachim Bamberg
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
DETERMINATION OF A CHANGE OF OBJECT'S SHAPE
Publication number
20240401928
Publication date
Dec 5, 2024
Nikon Corporation
Eric Peter Goodwin
G01 - MEASURING TESTING
Information
Patent Application
CYLINDRIC DECOMPOSITION FOR EFFICIENT MITIGATION OF SUBSTRATE DEFOR...
Publication number
20240266231
Publication date
Aug 8, 2024
Applied Materials, Inc.
Wonjae Lee
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
AIRBORNE OPTICAL CHARACTERIZATION OF UNDERWATER SOUND SOURCES
Publication number
20240230900
Publication date
Jul 11, 2024
BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
Michael J. DeWeert
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR AI INSPECTING FASTENER LOOSENING STATUS AND SURVEILLANCE...
Publication number
20240227879
Publication date
Jul 11, 2024
BEIJING JIAOTONG UNIVERSITY
Zhan GAO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Digital speckle based online water wall stress monitoring method an...
Publication number
20240035809
Publication date
Feb 1, 2024
Huaneng (Zhejiang) Energy Development Co., Ltd. Yuhuan Branch
Feng Chen
G01 - MEASURING TESTING
Information
Patent Application
COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE
Publication number
20230296368
Publication date
Sep 21, 2023
Nikon Corporation
Eric Peter Goodwin
G01 - MEASURING TESTING
Information
Patent Application
GEOMETRIC PHASE BASED MOTION COMPENSATION FOR SHEAROGRAPHY
Publication number
20230204970
Publication date
Jun 29, 2023
BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
Jacob D. Garan
G01 - MEASURING TESTING
Information
Patent Application
Non-Contact Non-Destructive Testing Method and System
Publication number
20220146252
Publication date
May 12, 2022
Agency for Science, Technology and Research
Lei Zhang
G01 - MEASURING TESTING
Information
Patent Application
Structural Health Monitoring Method and System
Publication number
20220128353
Publication date
Apr 28, 2022
Agency for Science, Technology and Research
Huajun Liu
G01 - MEASURING TESTING
Information
Patent Application
DETERMINATION OF A CHANGE OF OBJECT'S SHAPE
Publication number
20220065617
Publication date
Mar 3, 2022
Nikon Corporation
Eric Peter Goodwin
G01 - MEASURING TESTING
Information
Patent Application
COMPUTATIONAL SHEAR BY PHASE STEPPED SPECKLE HOLOGRAPHY
Publication number
20220011091
Publication date
Jan 13, 2022
BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
Andrew N. Acker
G01 - MEASURING TESTING
Information
Patent Application
GEOMETRIC PHASE SHEAROGRAPHY SYSTEM AND METHOD THEREOF
Publication number
20210293526
Publication date
Sep 23, 2021
BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
Jacob D. Garan
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MACHINE LEARNING USING OPTICAL DATA
Publication number
20210285819
Publication date
Sep 16, 2021
LightOn
Iacopo Poli
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT DETECTION DEVICE
Publication number
20210270777
Publication date
Sep 2, 2021
Shimadzu Corporation
Takahide HATAHORI
G01 - MEASURING TESTING
Information
Patent Application
Composite Laminate Damage Detection Method Using an In-Situ Thermal...
Publication number
20210245897
Publication date
Aug 12, 2021
The Boeing Company
Samuel R. Goertz
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR FABRICATING SPECKLE FOR HIGH TEMPERATURE DEFORMATION MEA...
Publication number
20210172730
Publication date
Jun 10, 2021
WUHAN UNIVERSITY OF SCIENCE AND TECHNOLOGY
Ao HUANG
G01 - MEASURING TESTING
Information
Patent Application
SHEAROGRAPHY DETECTION AND CLASSIFICATION
Publication number
20200378751
Publication date
Dec 3, 2020
BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
Andrew N. Acker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMPONENT HEATING SUB-SYSTEMS AND METHODS FOR LASER SHEAROGRAPHY TE...
Publication number
20200348126
Publication date
Nov 5, 2020
The Boeing Company
Mahdi Ashrafi
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR TESTING A TIRE BY INTERFEROMETRY
Publication number
20200326239
Publication date
Oct 15, 2020
CARL ZEISS OPTOTECHNIK GMBH
Junli Sun
G01 - MEASURING TESTING
Information
Patent Application
SINGLE WAVELENGTH REFLECTION FOR LEADFRAME BRIGHTNESS MEASUREMENT
Publication number
20200003548
Publication date
Jan 2, 2020
TEXAS INSTRUMENTS INCORPORATED
Hung-Yu CHOU
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR FACILITATING A VACUUM BAGGING OPERATION DU...
Publication number
20190389152
Publication date
Dec 26, 2019
The Boeing Company
Kenneth H. Griess
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
Method and system for object reconstruction
Publication number
20190319036
Publication date
Oct 17, 2019
Apple Inc.
Zeev Zalevsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Multiscale Deformation Measurements Leveraging Tailorable and Multi...
Publication number
20190271537
Publication date
Sep 5, 2019
Antonios Kontsos
G01 - MEASURING TESTING
Information
Patent Application
HIGH SPEED VACUUM CYCLING EXCITATION SYSTEM FOR OPTICAL INSPECTION...
Publication number
20190265140
Publication date
Aug 29, 2019
The Boeing Company
Morteza SAFAI
G01 - MEASURING TESTING
Information
Patent Application
SINGLE WAVELENGTH REFLECTION FOR LEADFRAME BRIGHTNESS MEASUREMENT
Publication number
20190186897
Publication date
Jun 20, 2019
TEXAS INSTRUMENTS INCORPORATED
Hung-Yu CHOU
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFEROMETRY
Publication number
20180328713
Publication date
Nov 15, 2018
OPTONOR AS
Eiolf VIKHAGEN
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL SHEAROGRAPHY NDT SYSTEM FOR SPECKLESS OBJECTS
Publication number
20160320176
Publication date
Nov 3, 2016
Oakland University
Lianxiang Yang
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ANALYZING DEFORMATIONS IN A LAMINATED OBJECT AND ACCORDIN...
Publication number
20160209205
Publication date
Jul 21, 2016
VESTAS WIND SYSTEMS A/S
Georg Herborg Enevoldsen
G01 - MEASURING TESTING
Information
Patent Application
PHASE RESOLVED SHEAROGRAPHY FOR REMOTE SENSING
Publication number
20150338208
Publication date
Nov 26, 2015
BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
Michael J. DeWeert
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING A PROPAGATION VELOCITY FOR A SURFACE WAVE
Publication number
20150323311
Publication date
Nov 12, 2015
Koninklijke Philips N.V.
REMCO THEODORUS JOHANNES MUIJS
G01 - MEASURING TESTING