CPC
G01N29/46
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Sota Kamo
G01 - MEASURING TESTING
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Chevron U.S.A. Inc.
Alp Tugrul Findikoglu
G01 - MEASURING TESTING
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Phillip D. Rudolph
G01 - MEASURING TESTING
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Patent Grant
X-Wave Innovations, Inc.
Lang Xia
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
King Fahd University of Petroleum & Minerals
Djamel Ouis
G01 - MEASURING TESTING
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Accenture Global Solutions Limited
Jesus Gabaldon
G08 - SIGNALLING
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Harbin Institute of Technology
Jiaxin Li
G01 - MEASURING TESTING
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Patent Grant
ABB Schweiz AG
Christof Bernhard
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Mayo Foundation for Medical Education and Research
Ping Gong
G01 - MEASURING TESTING
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HTC Corporation
Lun-Kang Lin
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Nippon Telegraph and Telephone Corporation
Yuki Kubo
G01 - MEASURING TESTING
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Patent Grant
Mayo Foundation for Medical Education and Research
Piotr Kijanka
G01 - MEASURING TESTING
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Amazon Technologies, Inc.
Spencer Russell
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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MSA Technology, LLC
Robert Kevin Sexton
G01 - MEASURING TESTING
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VERIFI TECHNOLOGIES, LLC
David A. Jack
G01 - MEASURING TESTING
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Harbin Institute of Technology
Bo Zhao
G01 - MEASURING TESTING
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Commissariat a l'Energie Atomique et Aux Energies Alternatives
Lucas Merabet
G01 - MEASURING TESTING
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Evident Canada, Inc.
Chi-Hang Kwan
G01 - MEASURING TESTING
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Patent Grant
Mohammadreza Amjadian
G02 - OPTICS
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Mitsubishi Heavy Industries, Ltd.
Kiyoka Takagi
G01 - MEASURING TESTING
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Rockwell Automation Technologies, Inc.
Suresh R. Nair
G01 - MEASURING TESTING
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AWE Technologies, LLC
Dipen N. Sinha
G01 - MEASURING TESTING
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Patent Grant
Soitec
François Rieutord
H01 - BASIC ELECTRIC ELEMENTS
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Solinas Technologies Inc.
Marc Bracken
G01 - MEASURING TESTING
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Tata Steel Limited
Sanjay Chandra
G01 - MEASURING TESTING
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Patent Grant
Lisa Dräxlmaier GmbH
Felix Klimas
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Evident Scientific, Inc.
Jinchi Zhang
G01 - MEASURING TESTING
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Nantong University
Liang Hua
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Computational Systems, Inc.
Anthony J. Hayzen
G01 - MEASURING TESTING
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Patent Grant
National Tsing Hua University
Yang Chih Feng
A63 - SPORTS GAMES AMUSEMENTS
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Patent Application
Drager Safety AG & Co. KGaA
Sebastian DRAACK
G01 - MEASURING TESTING
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Patent Application
Industrial Technology Research Institute
Hung-Chih CHANG
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Solinas Technologies Inc.
Marc Bracken
G01 - MEASURING TESTING
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Patent Application
Arizona Board of Regents on behalf of Arizona State University
Leila Jannesari Ladani
G01 - MEASURING TESTING
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Patent Application
SAINT-GOBAIN CENTRE DE RECHERCHES ET D'ETUDES EUROPEEN
Sébastien PINSON
G01 - MEASURING TESTING
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Patent Application
Verifi Technologies, LLC
David A. JACK
G01 - MEASURING TESTING
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Patent Application
JFE STEEL CORPORATION
Misao NAMIKAWA
G01 - MEASURING TESTING
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Patent Application
Byeong Il KIM
G01 - MEASURING TESTING
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Patent Application
Zhejiang University
Peng Zhao
G01 - MEASURING TESTING
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Patent Application
Baylor University
Luke W. Battershell
G01 - MEASURING TESTING
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Patent Application
Aeva, Inc.
Kumar Bhargav Viswanatha
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Indian Institute of Technology Madras (IIT Madras)
Krishnan BALASUBRAMANIAN
G01 - MEASURING TESTING
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Patent Application
Benoit Lepage
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
HTC CORPORATION
Lun-Kang Lin
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent Application
Shibaura Machine CO., LTD.
Masatoshi OHARA
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
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Patent Application
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Tomasz CIESLA
G01 - MEASURING TESTING
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Patent Application
ATLAS COPCO AIRPOWER, naamloze vennootschap
Jan VANSWEEVELT
G01 - MEASURING TESTING
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Patent Application
Research & Business Foundation Sungkyunkwan University
Geun Young YEOM
G01 - MEASURING TESTING
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Patent Application
Sartorius Stedim Biotech GmbH
Samin Akbari
G01 - MEASURING TESTING
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Patent Application
SAFRAN
Dany ABBOUD
G01 - MEASURING TESTING
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Patent Application
The Research Foundation for The State University of New York
Scott N. Schiffres
B22 - CASTING POWDER METALLURGY
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Patent Application
Innerspec Technologies, Inc.
Borja Lopez Jauregui
G01 - MEASURING TESTING
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Patent Application
SOUTHWEST PETROLEUM UNIVERSITY
Jiaye WU
G01 - MEASURING TESTING
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Patent Application
ADVANCED WAVE SENSORS, S.L.
Román FERNÁNDEZ DÍAZ
G01 - MEASURING TESTING
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Patent Application
SUPERSONIC IMAGINE
William LAMBERT
G01 - MEASURING TESTING
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Patent Application
NISSAN MOTOR CO., LTD.
Takehito Teraguchi
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS
Zhenghua QIAN
G01 - MEASURING TESTING
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Patent Application
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Arnaud RECOQUILLAY
G01 - MEASURING TESTING
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Patent Application
Washington University
Song Hu
G01 - MEASURING TESTING
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Patent Application
Nanjing University of Aeronautics and Astronautics
Chao Zhang
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
