by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement

Industry

CPC
G01N23/20083

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/20083by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Backscatter imaging system
- Patent number 12,360,065
- Issue date Jul 15, 2025
- Varex Imaging Corporation
- Daniel Shedlock
- G01 - MEASURING TESTING
Information Patent Grant
Backscatter X-ray system
- Patent number 12,306,118
- Issue date May 20, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Parameterizing x-ray scattering measurement using slice-and-image t...
- Patent number 12,288,706
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined scatter and transmission multi-view imaging system
- Patent number 12,235,226
- Issue date Feb 25, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray system
- Patent number 12,181,427
- Issue date Dec 31, 2024
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection system comprising a beam former to project a poly...
- Patent number 11,971,371
- Issue date Apr 30, 2024
- The Nottingham Trent University
- Paul Evans
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Process monitoring of deep structures with X-ray scatterometry
- Patent number 11,955,391
- Issue date Apr 9, 2024
- KLA-Tencor Corporation
- Antonio Arion Gellineau
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
System and method for identifying nuclear threats
- Patent number 11,835,477
- Issue date Dec 5, 2023
- CAEN TECHNOLOGIES, INC.
- Massimo Morichi
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining sample composition from spectral...
- Patent number 11,703,468
- Issue date Jul 18, 2023
- FEI Company
- Oleksii Kaplenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined scanning x-ray generator, composite inspection apparatus,...
- Patent number 11,467,105
- Issue date Oct 11, 2022
- Nuctech Company Limited
- Zhiqiang Chen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multi-view imaging system
- Patent number 11,371,948
- Issue date Jun 28, 2022
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray imaging system and method of x-ray imaging
- Patent number 11,226,298
- Issue date Jan 18, 2022
- Siemens Healthcare GmbH
- Steffen Kappler
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Detection of crystallographic properties in aerospace components
- Patent number 11,181,491
- Issue date Nov 23, 2021
- Raytheon Technologies Corporation
- Iuliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Grant
Graphene-based electro-microfluidic devices and methods for protein...
- Patent number 11,175,244
- Issue date Nov 16, 2021
- University of Massachusetts
- Sarah L. Perry
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Toner
- Patent number 11,169,458
- Issue date Nov 9, 2021
- Canon Kabushiki Kaisha
- Noritaka Toyoizumi
- G01 - MEASURING TESTING
Information Patent Grant
Process monitoring of deep structures with X-ray scatterometry
- Patent number 11,145,559
- Issue date Oct 12, 2021
- KLA-Tencor Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Grant
Stationary tomographic X-ray imaging systems for automatically sort...
- Patent number 10,976,271
- Issue date Apr 13, 2021
- Rapiscan Systems, Inc.
- Edward James Morton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for aligning a spectrometer
- Patent number 10,962,490
- Issue date Mar 30, 2021
- University of Washington
- Devon R. Mortensen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and system for determining molecular structure
- Patent number 10,935,506
- Issue date Mar 2, 2021
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Grant
Combined scatter and transmission multi-view imaging system
- Patent number 10,746,674
- Issue date Aug 18, 2020
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Process monitoring of deep structures with X-ray scatterometry
- Patent number 10,727,142
- Issue date Jul 28, 2020
- KLA-Tencor Corporation
- Antonio Arion Gellineau
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
X-ray inspection device
- Patent number 10,705,032
- Issue date Jul 7, 2020
- SHARP KABUSHIKI KAISHA
- Hiroaki Miyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing an object in two stages using a transmission sp...
- Patent number 10,605,749
- Issue date Mar 31, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Caroline Paulus
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection system for pipes
- Patent number 10,578,565
- Issue date Mar 3, 2020
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of a small angle X-ray scatterometry based metrology sy...
- Patent number 10,481,111
- Issue date Nov 19, 2019
- KLA-Tencor Corporation
- John Hench
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and system for liquid detection
- Patent number 10,379,067
- Issue date Aug 13, 2019
- Tsinghua University
- Zhiqiang Chen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and system for analyzing an object by diffractometry using a...
- Patent number 10,352,882
- Issue date Jul 16, 2019
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Caroline Paulus
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Combined Scatter and Transmission Multi-View Imaging System
- Publication number 20250180494
- Publication date Jun 5, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...
- Publication number 20250003895
- Publication date Jan 2, 2025
- Canon Kabushiki Kaisha
- Atsushi IWASHITA
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY SYSTEM
- Publication number 20240418658
- Publication date Dec 19, 2024
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
Rotational X-ray Inspection System and Method
- Publication number 20240044812
- Publication date Feb 8, 2024
- Viken Detection Corporation
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
PARAMETERIZING X-RAY SCATTERING MEASUREMENT USING SLICE-AND-IMAGE T...
- Publication number 20230343619
- Publication date Oct 26, 2023
- Carl Zeiss SMT GMBH
- Hans-Michael Stiepan
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD INSPECTION DEVICE AND METHOD OF INSPECTING AN INFRASTRUCTU...
- Publication number 20230184700
- Publication date Jun 15, 2023
- INVERSA SYSTEMS LTD.
- Peter Marc CABOT
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL...
- Publication number 20230003675
- Publication date Jan 5, 2023
- FEI Company
- Oleksii KAPLENKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A SAMPLE INSPECTION SYSTEM
- Publication number 20220381710
- Publication date Dec 1, 2022
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
BACKSCATTER IMAGING SYSTEM
- Publication number 20220357289
- Publication date Nov 10, 2022
- VAREX IMAGING CORPORATION
- Daniel Shedlock
- G01 - MEASURING TESTING
Information Patent Application
Combined Scatter and Transmission Multi-View Imaging System
- Publication number 20220334069
- Publication date Oct 20, 2022
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING NUCLEAR THREATS
- Publication number 20220074876
- Publication date Mar 10, 2022
- CAEN TECHNOLOGIES, INC.
- Massimo Morichi
- G01 - MEASURING TESTING
Information Patent Application
Process Monitoring Of Deep Structures With X-Ray Scatterometry
- Publication number 20210407864
- Publication date Dec 30, 2021
- KLA Corporation
- Antonio Arion Gellineau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINED SCANNING X-RAY GENERATOR, COMPOSITE INSPECTION APPARATUS,...
- Publication number 20210302335
- Publication date Sep 30, 2021
- Nuctech Company Limited
- Zhiqiang CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Backscatter X-ray System
- Publication number 20210239628
- Publication date Aug 5, 2021
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan CAO
- G01 - MEASURING TESTING
Information Patent Application
TONER
- Publication number 20210026266
- Publication date Jan 28, 2021
- Canon Kabushiki Kaisha
- Noritaka Toyoizumi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING MOLECULAR STRUCTURE
- Publication number 20200400594
- Publication date Dec 24, 2020
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Application
Stationary Tomographic X-Ray Imaging Systems for Identifying Threat...
- Publication number 20200378906
- Publication date Dec 3, 2020
- Rapiscan Systems, Inc.
- Edward James Morton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Stationary Tomographic X-Ray Imaging Systems for Automatically Sort...
- Publication number 20200378907
- Publication date Dec 3, 2020
- Rapiscan Systems, Inc.
- Edward James Morton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Combined Scatter and Transmission Multi-View Imaging System
- Publication number 20200355632
- Publication date Nov 12, 2020
- Rapiscan Systems, Inc.
- Edward James Morton
- G01 - MEASURING TESTING
Information Patent Application
Process Monitoring Of Deep Structures With X-Ray Scatterometry
- Publication number 20200303265
- Publication date Sep 24, 2020
- KLA Corporation
- Antonio Arion Gellineau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Data Collection, Processing and Storage Systems for X-Ray Tomograph...
- Publication number 20200103357
- Publication date Apr 2, 2020
- Rapiscan Systems, Inc.
- Edward James Morton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATION OF DIFFRACTION SIGNATURE OF ITEM WITHIN OBJECT
- Publication number 20190265383
- Publication date Aug 29, 2019
- Analogic Corporation
- David Schafer
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20190145914
- Publication date May 16, 2019
- Sharp Kabushiki Kaisha
- Hiroaki Miyoshi
- G01 - MEASURING TESTING
Information Patent Application
Process Monitoring Of Deep Structures With X-Ray Scatterometry
- Publication number 20180350699
- Publication date Dec 6, 2018
- KLA-Tencor Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Application
Combined Scatter and Transmission Multi-View Imaging System
- Publication number 20180313770
- Publication date Nov 1, 2018
- Rapiscan Systems, Inc.
- Edward James Morton
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
A Method And System For Analyzing An Object By Diffractometry Using...
- Publication number 20170153189
- Publication date Jun 1, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Caroline PAULUS
- G01 - MEASURING TESTING
Information Patent Application
A Method Of Analyzing An Object In Two Stages Using A Transmission...
- Publication number 20170131224
- Publication date May 11, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Caroline PAULUS
- G01 - MEASURING TESTING
Information Patent Application
GENERATION OF DIFFRACTION SIGNATURE OF ITEM WITHIN OBJECT
- Publication number 20160170075
- Publication date Jun 16, 2016
- David Schafer
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL DISCRIMINATION USING SCATTERING AND STOPPING OF MUONS AND...
- Publication number 20160041297
- Publication date Feb 11, 2016
- DECISION SCIENCES INTERNATIONAL CORPORATION
- Gary Blanpied
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for the Rapid Detection of Concealed Objects
- Publication number 20160025888
- Publication date Jan 28, 2016
- Rapiscan Systems, Inc.
- Kristian R. Peschmann
- G01 - MEASURING TESTING

by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Backscatter imaging system

Backscatter X-ray system

Parameterizing x-ray scattering measurement using slice-and-image t...

Combined scatter and transmission multi-view imaging system

X-ray system

Rotational X-ray inspection system and method

Sample inspection system comprising a beam former to project a poly...

Process monitoring of deep structures with X-ray scatterometry

Method for improving an EBSD/TKD map

Screening system

System and method for identifying nuclear threats

Method and system for determining sample composition from spectral...

Combined scanning x-ray generator, composite inspection apparatus,...

Multi-view imaging system

X-ray imaging system and method of x-ray imaging

Detection of crystallographic properties in aerospace components

Graphene-based electro-microfluidic devices and methods for protein...

Toner

Process monitoring of deep structures with X-ray scatterometry

Stationary tomographic X-ray imaging systems for automatically sort...

Methods for aligning a spectrometer

Method and system for determining molecular structure

Combined scatter and transmission multi-view imaging system

Process monitoring of deep structures with X-ray scatterometry

X-ray inspection device

Method of analyzing an object in two stages using a transmission sp...

X-ray inspection system for pipes

Calibration of a small angle X-ray scatterometry based metrology sy...

Method and system for liquid detection

Method and system for analyzing an object by diffractometry using a...

Patents Applicationslast 30 patents

Combined Scatter and Transmission Multi-View Imaging System

IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...

AN X-RAY SYSTEM

Rotational X-ray Inspection System and Method

PARAMETERIZING X-RAY SCATTERING MEASUREMENT USING SLICE-AND-IMAGE T...

HANDHELD INSPECTION DEVICE AND METHOD OF INSPECTING AN INFRASTRUCTU...

METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL...

A SAMPLE INSPECTION SYSTEM

BACKSCATTER IMAGING SYSTEM

Combined Scatter and Transmission Multi-View Imaging System

SYSTEM AND METHOD FOR IDENTIFYING NUCLEAR THREATS

Process Monitoring Of Deep Structures With X-Ray Scatterometry

COMBINED SCANNING X-RAY GENERATOR, COMPOSITE INSPECTION APPARATUS,...

Backscatter X-ray System

TONER

METHOD AND SYSTEM FOR DETERMINING MOLECULAR STRUCTURE

Stationary Tomographic X-Ray Imaging Systems for Identifying Threat...

Stationary Tomographic X-Ray Imaging Systems for Automatically Sort...

Combined Scatter and Transmission Multi-View Imaging System

Process Monitoring Of Deep Structures With X-Ray Scatterometry

Data Collection, Processing and Storage Systems for X-Ray Tomograph...

GENERATION OF DIFFRACTION SIGNATURE OF ITEM WITHIN OBJECT

X-RAY INSPECTION DEVICE

Process Monitoring Of Deep Structures With X-Ray Scatterometry

Combined Scatter and Transmission Multi-View Imaging System

A Method And System For Analyzing An Object By Diffractometry Using...

A Method Of Analyzing An Object In Two Stages Using A Transmission...

GENERATION OF DIFFRACTION SIGNATURE OF ITEM WITHIN OBJECT

MATERIAL DISCRIMINATION USING SCATTERING AND STOPPING OF MUONS AND...

Methods and Systems for the Rapid Detection of Concealed Objects