by using beat frequencies generated by mixing of two or more frequencies

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

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G01B9/02003by using beat frequencies generated by mixing of two or more frequencies

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Optical phase locked loops for generating highly-linear frequency c...
- Patent number 12,034,268
- Issue date Jul 9, 2024
- JASR Systems, LLC
- Tianyi Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
LIDAR waveform calibration system
- Patent number 11,994,630
- Issue date May 28, 2024
- AURORA OPERATIONS, INC.
- Andrew Steil Michaels
- B60 - VEHICLES IN GENERAL
Information Patent Grant
LIDAR waveform calibration system
- Patent number 11,965,992
- Issue date Apr 23, 2024
- AURORA OPERATIONS, INC.
- Andrew Steil Michaels
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Heterodyne one-dimensional grating measuring device and measuring m...
- Patent number 11,860,057
- Issue date Jan 2, 2024
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
- Wenhao Li
- G01 - MEASURING TESTING
Information Patent Grant
Optical systems with controlled mirror arrangements
- Patent number 11,841,223
- Issue date Dec 12, 2023
- Lockheed Martin Corporation
- Brian James Howley
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne grating interferometric method and system for two-degree...
- Patent number 11,802,757
- Issue date Oct 31, 2023
- Harbin Institute of Technology
- Pengcheng Hu
- G01 - MEASURING TESTING
Information Patent Grant
Demodulation of fiber optic interferometric sensors
- Patent number 11,747,133
- Issue date Sep 5, 2023
- Board of Trustees of Michigan State University
- Ming Han
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,703,317
- Issue date Jul 18, 2023
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Multiple target LIDAR system
- Patent number 11,668,805
- Issue date Jun 6, 2023
- OURS Technology, LLC
- Andrew Steil Michaels
- B60 - VEHICLES IN GENERAL
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Lidar phase noise cancellation system
- Patent number 11,635,500
- Issue date Apr 25, 2023
- OURS Technology, LLC
- Andrew Steil Michaels
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Measurement apparatus and measurement method using a laser and beat...
- Patent number 11,635,518
- Issue date Apr 25, 2023
- Mitutoyo Corporation
- Hiroki Ujihara
- G01 - MEASURING TESTING
Information Patent Grant
Optical interference measurement apparatus
- Patent number 11,578,963
- Issue date Feb 14, 2023
- Omron Corporation
- Kazuya Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Truncated non-linear interferometer-based sensor system
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- Issue date Jan 24, 2023
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
3D intraoral camera using frequency modulation
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- Issue date Jan 3, 2023
- Dental Imaging Technologies Corporation
- Chuanmao Fan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Lidar sensing arrangements
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- Issue date Nov 29, 2022
- Santec Corporation
- Changho Chong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distance measurement based on difference of two beat signals genera...
- Patent number 11,435,477
- Issue date Sep 6, 2022
- NEC Corporation
- Hidemi Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Laser interference device
- Patent number 11,353,315
- Issue date Jun 7, 2022
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G02 - OPTICS
Information Patent Grant
Method and system for interferometry
- Patent number 11,333,484
- Issue date May 17, 2022
- Ariel Scientific Innovations Ltd.
- Shmuel Sternklar
- G01 - MEASURING TESTING
Information Patent Grant
Swept frequency photonic integrated circuit for absolute metrology
- Patent number 11,320,255
- Issue date May 3, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Grant
Two-degree-of-freedom heterodyne grating interferometry measurement...
- Patent number 11,307,018
- Issue date Apr 19, 2022
- Tsinghua University
- Yu Zhu
- G01 - MEASURING TESTING
Information Patent Grant
(Multi-) heterodyne detection spectrometer setup
- Patent number 11,287,319
- Issue date Mar 29, 2022
- IRsweep AG
- Andreas Hugi
- G01 - MEASURING TESTING
Information Patent Grant
Cyclic error measurements and calibration procedures in interferome...
- Patent number 11,287,242
- Issue date Mar 29, 2022
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Measuring assembly for the frequency-based determination of the pos...
- Patent number 11,274,914
- Issue date Mar 15, 2022
- Carl Zeiss SMT GmbH
- Matthias Manger
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,221,204
- Issue date Jan 11, 2022
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Use of the sidebands of a mach-zehnder modulator for a FMCW distanc...
- Patent number 11,162,773
- Issue date Nov 2, 2021
- Hexagon Technology Center GmbH
- Yves Salvadé
- G01 - MEASURING TESTING
Information Patent Grant
Truncated nonlinear interferometer-based atomic force microscopes
- Patent number 11,119,386
- Issue date Sep 14, 2021
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Interferometry system and associated methods
- Patent number 11,009,341
- Issue date May 18, 2021
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Dual-channel laser audio monitoring system
- Patent number 10,753,791
- Issue date Aug 25, 2020
- TUBITAK
- Yildirim Bahadirlar
- G01 - MEASURING TESTING
Information Patent Grant
SNOM device using heterodyne detection
- Patent number 10,684,113
- Issue date Jun 16, 2020
- Centre National de la Recherche Scientifique
- Yannick De Wilde
- G01 - MEASURING TESTING
Information Patent Grant
Nonlinear interferometer systems and methods
- Patent number 10,605,727
- Issue date Mar 31, 2020
- UT-Battelle, LLC
- Joseph M. Lukens
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS
- Publication number 20240310158
- Publication date Sep 19, 2024
- Oxford University Innovation Limited
- Armin REICHOLD
- G01 - MEASURING TESTING
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AN INTERFEROMETER SYSTEM, POSITIONING SYSTEM, A LITHOGRAPHIC APPARA...
- Publication number 20240061351
- Publication date Feb 22, 2024
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
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CONTACT-TYPE VIBRATION PHOTON SENSOR USING DOPPLER EFFECT AND MANUF...
- Publication number 20230375397
- Publication date Nov 23, 2023
- OTN INTELLIGENT TECHNOLOGY (SUZHOU) CO., LTD
- Xiaohai LIU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
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OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...
- Publication number 20230288182
- Publication date Sep 14, 2023
- Nippon Telegraph and Telephone Corporation
- Hiroki SAKUMA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFEROMETRIC RANGE SENSOR
- Publication number 20230288562
- Publication date Sep 14, 2023
- Omron Corporation
- Kazuya KIMURA
- G01 - MEASURING TESTING
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OPTICAL SYSTEMS WITH CONTROLLED MIRROR ARRANGEMENTS
- Publication number 20230266116
- Publication date Aug 24, 2023
- Lockheed Martin Corporation
- Brian James HOWLEY
- G01 - MEASURING TESTING
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TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM
- Publication number 20230161220
- Publication date May 25, 2023
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
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HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM
- Publication number 20230062525
- Publication date Mar 2, 2023
- MITUTOYO CORPORATION
- Nick HARTMANN
- G01 - MEASURING TESTING
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LIDAR WAVEFORM CALIBRATION SYSTEM
- Publication number 20220283276
- Publication date Sep 8, 2022
- OURS Technology, LLC
- Andrew Steil Michaels
- B60 - VEHICLES IN GENERAL
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HETERODYNE ONE-DIMENSIONAL GRATING MEASURING DEVICE AND MEASURING M...
- Publication number 20220221372
- Publication date Jul 14, 2022
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
- WENHAO LI
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
- Publication number 20220187055
- Publication date Jun 16, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Application
HETERODYNE GRATING INTERFEROMETRIC METHOD AND SYSTEM FOR TWO-DEGREE...
- Publication number 20220090907
- Publication date Mar 24, 2022
- HARBIN INSTITUTE OF TECHNOLOGY
- Pengcheng HU
- G01 - MEASURING TESTING
Information Patent Application
LIDAR PHASE NOISE CANCELLATION SYSTEM
- Publication number 20220075075
- Publication date Mar 10, 2022
- OURS Technology, LLC
- Andrew Steil Michaels
- G01 - MEASURING TESTING
Information Patent Application
SWEPT FREQUENCY PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
- Publication number 20220049945
- Publication date Feb 17, 2022
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Application
TRUNCATED NON-LINEAR INTERFEROMETER-BASED SENSOR SYSTEM
- Publication number 20210405503
- Publication date Dec 30, 2021
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Application
DEMODULATION OF FIBER OPTIC INTERFEROMETRIC SENSORS
- Publication number 20210333089
- Publication date Oct 28, 2021
- Board of Trustees of Michigan State University
- Ming HAN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE LOCKED LOOPS FOR GENERATING HIGHLY-LINEAR FREQUENCY C...
- Publication number 20210328402
- Publication date Oct 21, 2021
- JASR Systems, LLC
- Tianyi Hu
- H01 - BASIC ELECTRIC ELEMENTS
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LASER INTERFERENCE DEVICE
- Publication number 20210293523
- Publication date Sep 23, 2021
- MITUTOYO CORPORATION
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
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OPTICAL INTERFERENCE MEASUREMENT APPARATUS
- Publication number 20210285755
- Publication date Sep 16, 2021
- Omron Corporation
- Kazuya KIMURA
- G01 - MEASURING TESTING
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LIDAR SENSING ARRANGEMENTS
- Publication number 20210278538
- Publication date Sep 9, 2021
- SANTEC CORPORATION
- Changho CHONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING ASSEMBLY FOR THE FREQUENCY-BASED DETERMINATION OF THE POS...
- Publication number 20210080244
- Publication date Mar 18, 2021
- Carl Zeiss SMT GMBH
- Matthias MANGER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INTERFEROMETRY
- Publication number 20210033380
- Publication date Feb 4, 2021
- Ariel Scientific Innovations Ltd.
- Shmuel STERNKLAR
- G01 - MEASURING TESTING
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USE OF THE SIDEBANDS OF A MACH-ZEHNDER MODULATOR FOR A FMCW DISTANC...
- Publication number 20200064116
- Publication date Feb 27, 2020
- HEXAGON TECHNOLOGY CENTER GMBH
- Yves SALVADÉ
- G02 - OPTICS
Information Patent Application
INTERFEROMETRY SYSTEM AND METHODS FOR SUBSTRATE PROCESSING
- Publication number 20200011652
- Publication date Jan 9, 2020
- Applied Materials, Inc.
- Benjamin M. JOHNSTON
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS
- Publication number 20190353474
- Publication date Nov 21, 2019
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
3D INTRAORAL CAMERA USING FREQUENCY MODULATION
- Publication number 20190343377
- Publication date Nov 14, 2019
- Carestream Dental Technology Topco Limited
- Chuanmao Fan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
POSITION SENSING ARRANGEMENT AND LITHOGRAPHIC APPARATUS INCLUDING S...
- Publication number 20190049866
- Publication date Feb 14, 2019
- ASML NETHERLANDS B.V.
- Simon Reinald HUISMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEVICE FOR IMAGING THE ELECTROMAGNETIC FIELD OF A SAMPLE
- Publication number 20190041185
- Publication date Feb 7, 2019
- Centre National De La Recherche Scientifique-cnrs
- Yannick DE WILDE
- G01 - MEASURING TESTING
Information Patent Application
DUAL-CHANNEL LASER AUDIO MONITORING SYSTEM
- Publication number 20190041258
- Publication date Feb 7, 2019
- Tubitak
- Yldirim BAHADIRLAR
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
LASER MULTIBEAM DIFFERENTIAL INTERFEROMETRIC SENSOR AND METHODS FOR...
- Publication number 20180216927
- Publication date Aug 2, 2018
- The University of Mississippi
- Aranchuk VYACHESLAV
- G01 - MEASURING TESTING

by using beat frequencies generated by mixing of two or more frequencies

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical phase locked loops for generating highly-linear frequency c...

LIDAR waveform calibration system

LIDAR waveform calibration system

Heterodyne one-dimensional grating measuring device and measuring m...

Optical systems with controlled mirror arrangements

Heterodyne grating interferometric method and system for two-degree...

Demodulation of fiber optic interferometric sensors

Heterodyne photonic integrated circuit for absolute metrology

Multiple target LIDAR system

Lidar phase noise cancellation system

Measurement apparatus and measurement method using a laser and beat...

Optical interference measurement apparatus

Truncated non-linear interferometer-based sensor system

3D intraoral camera using frequency modulation

Lidar sensing arrangements

Distance measurement based on difference of two beat signals genera...

Laser interference device

Method and system for interferometry

Swept frequency photonic integrated circuit for absolute metrology

Two-degree-of-freedom heterodyne grating interferometry measurement...

(Multi-) heterodyne detection spectrometer setup

Cyclic error measurements and calibration procedures in interferome...

Measuring assembly for the frequency-based determination of the pos...

Heterodyne photonic integrated circuit for absolute metrology

Use of the sidebands of a mach-zehnder modulator for a FMCW distanc...

Truncated nonlinear interferometer-based atomic force microscopes

Interferometry system and associated methods

Dual-channel laser audio monitoring system

SNOM device using heterodyne detection

Nonlinear interferometer systems and methods

Patents Applicationslast 30 patents

INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS

AN INTERFEROMETER SYSTEM, POSITIONING SYSTEM, A LITHOGRAPHIC APPARA...

CONTACT-TYPE VIBRATION PHOTON SENSOR USING DOPPLER EFFECT AND MANUF...

OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...

OPTICAL INTERFEROMETRIC RANGE SENSOR

OPTICAL SYSTEMS WITH CONTROLLED MIRROR ARRANGEMENTS

TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM

HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM

LIDAR WAVEFORM CALIBRATION SYSTEM

HETERODYNE ONE-DIMENSIONAL GRATING MEASURING DEVICE AND MEASURING M...

HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY

HETERODYNE GRATING INTERFEROMETRIC METHOD AND SYSTEM FOR TWO-DEGREE...

LIDAR PHASE NOISE CANCELLATION SYSTEM

SWEPT FREQUENCY PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY

TRUNCATED NON-LINEAR INTERFEROMETER-BASED SENSOR SYSTEM

DEMODULATION OF FIBER OPTIC INTERFEROMETRIC SENSORS

OPTICAL PHASE LOCKED LOOPS FOR GENERATING HIGHLY-LINEAR FREQUENCY C...

LASER INTERFERENCE DEVICE

OPTICAL INTERFERENCE MEASUREMENT APPARATUS

LIDAR SENSING ARRANGEMENTS

MEASURING ASSEMBLY FOR THE FREQUENCY-BASED DETERMINATION OF THE POS...

METHOD AND SYSTEM FOR INTERFEROMETRY

USE OF THE SIDEBANDS OF A MACH-ZEHNDER MODULATOR FOR A FMCW DISTANC...

INTERFEROMETRY SYSTEM AND METHODS FOR SUBSTRATE PROCESSING

INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS

3D INTRAORAL CAMERA USING FREQUENCY MODULATION

POSITION SENSING ARRANGEMENT AND LITHOGRAPHIC APPARATUS INCLUDING S...

DEVICE FOR IMAGING THE ELECTROMAGNETIC FIELD OF A SAMPLE

DUAL-CHANNEL LASER AUDIO MONITORING SYSTEM

LASER MULTIBEAM DIFFERENTIAL INTERFEROMETRIC SENSOR AND METHODS FOR...