by using diffraction of the radiation

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CPC
G01N23/20

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/20by using diffraction of the radiation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Metal oxide film and method for forming metal oxide film
- Patent number 12,302,639
- Issue date May 13, 2025
- Semiconductor Energy Laboratory Co., Ltd.
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Backscatter imaging device, control method and inspection system
- Patent number 12,298,261
- Issue date May 13, 2025
- Nuctech Company Limited
- G01 - MEASURING TESTING
Information Patent Grant
Serial synchrotron crystallography sample holding system
- Patent number 12,292,395
- Issue date May 6, 2025
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis system and method with multi-source design
- Patent number 12,292,396
- Issue date May 6, 2025
- SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
- Xuena Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for interpreting high energy interactions
- Patent number 12,292,398
- Issue date May 6, 2025
- Veracio Ltd.
- Brandon Lee Goodchild Drake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Correction amount specifying apparatus, method, program, and jig
- Patent number 12,287,301
- Issue date Apr 29, 2025
- Rigaku Corporation
- Takuya Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Parameterizing x-ray scattering measurement using slice-and-image t...
- Patent number 12,288,706
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single piece droplet generation and injection device for serial cry...
- Patent number 12,287,299
- Issue date Apr 29, 2025
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for analyzing diffraction pattern of mixture, and...
- Patent number 12,287,300
- Issue date Apr 29, 2025
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Generation method and simulation method of magnetic configuration o...
- Patent number 12,287,382
- Issue date Apr 29, 2025
- GRADUATE SCHOOL OF CHINA ACADEMY OF ENGINEERING PHYSICS
- Ben Xu
- G01 - MEASURING TESTING
Information Patent Grant
State change tracking device, X-ray imaging system, state change tr...
- Patent number 12,276,622
- Issue date Apr 15, 2025
- Konica Minolta, Inc.
- Tadashi Arimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for adjusting drilling fluids
- Patent number 12,270,267
- Issue date Apr 8, 2025
- Robert W. Troy
- E21 - EARTH DRILLING MINING
Information Patent Grant
Targeted collimation of detectors using rear collimators
- Patent number 12,259,341
- Issue date Mar 25, 2025
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Grant
Hand-held portable backscatter inspection system
- Patent number 12,259,518
- Issue date Mar 25, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspecting device, and nondestructive inspecting method
- Patent number 12,259,340
- Issue date Mar 25, 2025
- Riken
- Kunihiro Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Handheld inspection device and method of inspecting an infrastructu...
- Patent number 12,259,342
- Issue date Mar 25, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for structurally characterizing compounds
- Patent number 12,259,343
- Issue date Mar 25, 2025
- The Regents of the University of California
- Hosea M. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining structure of substance in multicomponent sample
- Patent number 12,253,482
- Issue date Mar 18, 2025
- Kirin Holdings Kabushiki Kaisha
- Yoshimasa Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for manufacturing semiconductor devices
- Patent number 12,253,483
- Issue date Mar 18, 2025
- PSIQUANTUM CORP.
- Faraz Najafi
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring residual stress
- Patent number 12,241,803
- Issue date Mar 4, 2025
- Kobe Steel, Ltd.
- Mariko Matsuda
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Diffraction-based global in vitro diagnostic system
- Patent number 12,237,083
- Issue date Feb 25, 2025
- Bragg Analytics, Inc.
- Pavel Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined scatter and transmission multi-view imaging system
- Patent number 12,235,226
- Issue date Feb 25, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-precision timing clock method
- Patent number 12,226,246
- Issue date Feb 18, 2025
- Weng-Dah Ken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,222,303
- Issue date Feb 11, 2025
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Bifocal electron microscope
- Patent number 12,216,068
- Issue date Feb 4, 2025
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...
- Patent number 12,209,978
- Issue date Jan 28, 2025
- Danmarks Tekniske Universitet
- Yubin Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Residual stress measurement method of curved surface block
- Patent number 12,209,926
- Issue date Jan 28, 2025
- Metal Industries Research & Development Centre
- Zong Rong Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY SCANNING SYSTEM AND METHOD FOR INSPECTING AN OBJECT
- Publication number 20250146962
- Publication date May 8, 2025
- Seethru AI Inc.
- OMAR AL-KOFAHI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL AND X-RAY METROLOGY METHODS FOR PATTERNED SEMICONDUCTOR STR...
- Publication number 20250146961
- Publication date May 8, 2025
- KLA Corporation
- Daniel James Haxton
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
- Publication number 20250146960
- Publication date May 8, 2025
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...
- Publication number 20250137946
- Publication date May 1, 2025
- The Boeing Company
- Morteza Safai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MONITORING MODULE, X-RAY DIFFRACTION APPARATUS, AND MONITORING SYSTEM
- Publication number 20250132706
- Publication date Apr 24, 2025
- Rigaku Corporation
- Yuji HATAYAMA
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING TILT ANGLE OF SUBSTRATE STRUCTURES UTILIZING ANGULAR FO...
- Publication number 20250130183
- Publication date Apr 24, 2025
- Applied Materials, Inc.
- Alexander Buhse Brady
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION X-RAY REFLECTOMETER
- Publication number 20250110068
- Publication date Apr 3, 2025
- UChicago Argonne, LLC
- Raymond P. Conley
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ORIENTATING A SAMPLE FOR INSPECTION WITH CHAR...
- Publication number 20250110069
- Publication date Apr 3, 2025
- FEI Company
- Radovan VAŠINA
- G01 - MEASURING TESTING
Information Patent Application
EDS CALIBRATION
- Publication number 20250110070
- Publication date Apr 3, 2025
- FEI Company
- Michael Owen
- G01 - MEASURING TESTING
Information Patent Application
Hard X-ray Compatible Chamber for High Temperature In-Situ Material...
- Publication number 20250109498
- Publication date Apr 3, 2025
- UChicago Argonne, LLC
- Katherine J. Harmon
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS
- Publication number 20250102451
- Publication date Mar 27, 2025
- FEI Company
- Vojtech MAHEL
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION APPARATUS, CORRECTION METHOD, AND CORRECTION PROGRAM
- Publication number 20250093284
- Publication date Mar 20, 2025
- Rigaku Corporation
- Takumi Ota
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR IDENTIFYING AND DISPLAYING MATERIAL TYPES...
- Publication number 20250095333
- Publication date Mar 20, 2025
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Ji Wook JEONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES
- Publication number 20250095955
- Publication date Mar 20, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Forward Library Based Seeding For Efficient X-Ray Scatterometry Mea...
- Publication number 20250085241
- Publication date Mar 13, 2025
- KLA Corporation
- Rebecca Shen
- G01 - MEASURING TESTING
Information Patent Application
Estimation of the Crystallographic Texture of an Alloy
- Publication number 20250076224
- Publication date Mar 6, 2025
- The Boeing Company
- Yunpeng Zhang
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Adjusting Drilling Fluids
- Publication number 20250075571
- Publication date Mar 6, 2025
- Robert W. Troy
- E21 - EARTH DRILLING MINING
Information Patent Application
METHOD OF MANUFACTURING A COMPONENT TO REDUCE RISK OF COLD DWELL FA...
- Publication number 20250076227
- Publication date Mar 6, 2025
- Rolls-Royce Corporation
- Michael Glavicic
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
METAL OXIDATION DETERMINING APPARATUS
- Publication number 20250076226
- Publication date Mar 6, 2025
- Adaptix Ltd.
- Robert Cernik
- G01 - MEASURING TESTING
Information Patent Application
EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF
- Publication number 20250076222
- Publication date Mar 6, 2025
- UIH AMERICA, INC.
- Hongdi LI
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD AND PR...
- Publication number 20250076225
- Publication date Mar 6, 2025
- Rigaku Corporation
- Toshihide SHIBASAKI
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE BEAM ANALYZER AND PARTICLE BEAM ANALYSIS METHOD
- Publication number 20250067688
- Publication date Feb 27, 2025
- Hitachi, Ltd
- Akinori ASAHARA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20250067689
- Publication date Feb 27, 2025
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION
- Publication number 20250060324
- Publication date Feb 20, 2025
- TOKYO ELECTRON LIMITED
- Francisco Machuca
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Detection Structure with a Plurality of Scintillator Volumes...
- Publication number 20250052915
- Publication date Feb 13, 2025
- Viken Detection Corporation
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
ENERGY DISPERSIVE X-RAY SPECTROSCOPY PHASE SPECTRUM SYNTHESIS
- Publication number 20250044245
- Publication date Feb 6, 2025
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING ABRASION RESISTANCE OF RUBBER COMPOSITION AND...
- Publication number 20250043117
- Publication date Feb 6, 2025
- Sumitomo Rubber Industries, Ltd.
- Ryo MASHITA
- B60 - VEHICLES IN GENERAL
Information Patent Application
COUNTERFEIT DETECTION AND PROVENANCE WITH GRATING INTERFEROMETRY, B...
- Publication number 20250045538
- Publication date Feb 6, 2025
- Leslie G. BUTLER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERFACE DETECTION IN RECIPROCAL SPACE
- Publication number 20250037286
- Publication date Jan 30, 2025
- FEI Company
- John Francis Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR EVALUATING SiC SUBSTRATE, METHOD FOR MANUFACTURING SiC S...
- Publication number 20250035570
- Publication date Jan 30, 2025
- Resonac Corporation
- Hiromasa SUO
- H01 - BASIC ELECTRIC ELEMENTS

by using diffraction of the radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Metal oxide film and method for forming metal oxide film

Backscatter imaging device, control method and inspection system

Serial synchrotron crystallography sample holding system

X-ray analysis system and method with multi-source design

Systems and methods for interpreting high energy interactions

Correction amount specifying apparatus, method, program, and jig

Parameterizing x-ray scattering measurement using slice-and-image t...

Single piece droplet generation and injection device for serial cry...

Device and method for analyzing diffraction pattern of mixture, and...

Generation method and simulation method of magnetic configuration o...

State change tracking device, X-ray imaging system, state change tr...

Methods and systems for adjusting drilling fluids

Targeted collimation of detectors using rear collimators

Hand-held portable backscatter inspection system

Nondestructive inspecting device, and nondestructive inspecting method

Handheld inspection device and method of inspecting an infrastructu...

Systems and methods for structurally characterizing compounds

Method for determining structure of substance in multicomponent sample

Methods and systems for manufacturing semiconductor devices

Method for measuring residual stress

Inspection apparatus and inspection method

Diffraction-based global in vitro diagnostic system

Combined scatter and transmission multi-view imaging system

Spectrometer

Ultra-precision timing clock method

Transmissive small-angle scattering device

Bifocal electron microscope

Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...

X-ray detector system with at least two stacked flat Bragg diffractors

Residual stress measurement method of curved surface block

Patents Applicationslast 30 patents

X-RAY SCANNING SYSTEM AND METHOD FOR INSPECTING AN OBJECT

OPTICAL AND X-RAY METROLOGY METHODS FOR PATTERNED SEMICONDUCTOR STR...

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...

INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...

MONITORING MODULE, X-RAY DIFFRACTION APPARATUS, AND MONITORING SYSTEM

DETERMINING TILT ANGLE OF SUBSTRATE STRUCTURES UTILIZING ANGULAR FO...

HIGH RESOLUTION X-RAY REFLECTOMETER

METHOD AND SYSTEM FOR ORIENTATING A SAMPLE FOR INSPECTION WITH CHAR...

EDS CALIBRATION

Hard X-ray Compatible Chamber for High Temperature In-Situ Material...

SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS

CORRECTION APPARATUS, CORRECTION METHOD, AND CORRECTION PROGRAM

APPARATUS AND METHOD FOR IDENTIFYING AND DISPLAYING MATERIAL TYPES...

METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES

Forward Library Based Seeding For Efficient X-Ray Scatterometry Mea...

Estimation of the Crystallographic Texture of an Alloy

Methods and Systems for Adjusting Drilling Fluids

METHOD OF MANUFACTURING A COMPONENT TO REDUCE RISK OF COLD DWELL FA...

METAL OXIDATION DETERMINING APPARATUS

EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF

INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD AND PR...

PARTICLE BEAM ANALYZER AND PARTICLE BEAM ANALYSIS METHOD

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION

X-Ray Detection Structure with a Plurality of Scintillator Volumes...

ENERGY DISPERSIVE X-RAY SPECTROSCOPY PHASE SPECTRUM SYNTHESIS

METHOD FOR EVALUATING ABRASION RESISTANCE OF RUBBER COMPOSITION AND...

COUNTERFEIT DETECTION AND PROVENANCE WITH GRATING INTERFEROMETRY, B...

INTERFACE DETECTION IN RECIPROCAL SPACE

METHOD FOR EVALUATING SiC SUBSTRATE, METHOD FOR MANUFACTURING SiC S...