by using diffraction of the radiation

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CPC
G01N23/20

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/20by using diffraction of the radiation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring residual stress
- Patent number 12,241,803
- Issue date Mar 4, 2025
- Kobe Steel, Ltd.
- Mariko Matsuda
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Diffraction-based global in vitro diagnostic system
- Patent number 12,237,083
- Issue date Feb 25, 2025
- Bragg Analytics, Inc.
- Pavel Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined scatter and transmission multi-view imaging system
- Patent number 12,235,226
- Issue date Feb 25, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-precision timing clock method
- Patent number 12,226,246
- Issue date Feb 18, 2025
- Weng-Dah Ken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,222,303
- Issue date Feb 11, 2025
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Bifocal electron microscope
- Patent number 12,216,068
- Issue date Feb 4, 2025
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...
- Patent number 12,209,978
- Issue date Jan 28, 2025
- Danmarks Tekniske Universitet
- Yubin Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Residual stress measurement method of curved surface block
- Patent number 12,209,926
- Issue date Jan 28, 2025
- Metal Industries Research & Development Centre
- Zong Rong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting internal stress distribution of transparent mat...
- Patent number 12,203,881
- Issue date Jan 21, 2025
- Zhejiang University
- Haikuo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the diameter of filament diffraction fringes b...
- Patent number 12,196,540
- Issue date Jan 14, 2025
- Zhejiang University of Technology
- Qiang Lin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 12,196,691
- Issue date Jan 14, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for efficient high harmonic generation
- Patent number 12,196,688
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Petrus Wilhelmus Smorenburg
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting a structure across a cover layer c...
- Patent number 12,188,884
- Issue date Jan 7, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 12,188,883
- Issue date Jan 7, 2025
- Industrial Technology Research Institute
- Bo-Ching He
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation device
- Patent number 12,188,885
- Issue date Jan 7, 2025
- Kioxia Corporation
- Takehiro Nakai
- G01 - MEASURING TESTING
Information Patent Grant
X-ray backscatter imaging system for precise searching for containe...
- Patent number 12,181,428
- Issue date Dec 31, 2024
- KOREA INSTITUTE OF OCEAN SCIENCE & TECHNOLOGY
- Jongwon Park
- G01 - MEASURING TESTING
Information Patent Grant
X-ray system
- Patent number 12,181,427
- Issue date Dec 31, 2024
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
Methods, systems, and computer program products for determining a p...
- Patent number 12,181,459
- Issue date Dec 31, 2024
- Troxler Electronic Laboratories INC.
- Robert Ernest Troxler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Quantitative analysis apparatus, method and program and manufacturi...
- Patent number 12,174,131
- Issue date Dec 24, 2024
- Rigaku Corporation
- Takahiro Kuzumaki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray-based test device and method for plugging removal effect of s...
- Patent number 12,174,133
- Issue date Dec 24, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Xiao Guo
- G01 - MEASURING TESTING
Information Patent Grant
Nitride semiconductor substrate, laminated structure, and method fo...
- Patent number 12,174,132
- Issue date Dec 24, 2024
- Sumitomo Chemical Company, Limited
- Takehiro Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scattering measurement analysis method, scattering measurement anal...
- Patent number 12,175,173
- Issue date Dec 24, 2024
- Rigaku Corporation
- Tomoyuki Iwata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation imaging apparatus and radiation imaging system
- Patent number 12,161,493
- Issue date Dec 10, 2024
- Canon Kabushiki Kaisha
- Misaki Kuriyama
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,166,006
- Issue date Dec 10, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Estimation of the Crystallographic Texture of an Alloy
- Publication number 20250076224
- Publication date Mar 6, 2025
- The Boeing Company
- Yunpeng Zhang
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Adjusting Drilling Fluids
- Publication number 20250075571
- Publication date Mar 6, 2025
- Robert W. Troy
- E21 - EARTH DRILLING MINING
Information Patent Application
METHOD OF MANUFACTURING A COMPONENT TO REDUCE RISK OF COLD DWELL FA...
- Publication number 20250076227
- Publication date Mar 6, 2025
- Rolls-Royce Corporation
- Michael Glavicic
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
METAL OXIDATION DETERMINING APPARATUS
- Publication number 20250076226
- Publication date Mar 6, 2025
- Adaptix Ltd.
- Robert Cernik
- G01 - MEASURING TESTING
Information Patent Application
EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF
- Publication number 20250076222
- Publication date Mar 6, 2025
- UIH AMERICA, INC.
- Hongdi LI
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD AND PR...
- Publication number 20250076225
- Publication date Mar 6, 2025
- Rigaku Corporation
- Toshihide SHIBASAKI
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE BEAM ANALYZER AND PARTICLE BEAM ANALYSIS METHOD
- Publication number 20250067688
- Publication date Feb 27, 2025
- Hitachi, Ltd
- Akinori ASAHARA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20250067689
- Publication date Feb 27, 2025
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION
- Publication number 20250060324
- Publication date Feb 20, 2025
- TOKYO ELECTRON LIMITED
- Francisco Machuca
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Detection Structure with a Plurality of Scintillator Volumes...
- Publication number 20250052915
- Publication date Feb 13, 2025
- Viken Detection Corporation
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
ENERGY DISPERSIVE X-RAY SPECTROSCOPY PHASE SPECTRUM SYNTHESIS
- Publication number 20250044245
- Publication date Feb 6, 2025
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING ABRASION RESISTANCE OF RUBBER COMPOSITION AND...
- Publication number 20250043117
- Publication date Feb 6, 2025
- Sumitomo Rubber Industries, Ltd.
- Ryo MASHITA
- B60 - VEHICLES IN GENERAL
Information Patent Application
COUNTERFEIT DETECTION AND PROVENANCE WITH GRATING INTERFEROMETRY, B...
- Publication number 20250045538
- Publication date Feb 6, 2025
- Leslie G. BUTLER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERFACE DETECTION IN RECIPROCAL SPACE
- Publication number 20250037286
- Publication date Jan 30, 2025
- FEI Company
- John Francis Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR EVALUATING SiC SUBSTRATE, METHOD FOR MANUFACTURING SiC S...
- Publication number 20250035570
- Publication date Jan 30, 2025
- Resonac Corporation
- Hiromasa SUO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...
- Publication number 20250027891
- Publication date Jan 23, 2025
- Saudi Arabian Oil Company
- Mohamed SOUA
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING METHOD, INFORMATION PROCESSING SYSTEM, AND N...
- Publication number 20250029683
- Publication date Jan 23, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- KOKI UENO
- G01 - MEASURING TESTING
Information Patent Application
Adaptable X-Ray Analysis Apparatus
- Publication number 20250020601
- Publication date Jan 16, 2025
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...
- Publication number 20250020602
- Publication date Jan 16, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Hyeon KANG
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED THIN FILM DEPOSITION SYSTEM AND THIN FILM DEPOSITION METH...
- Publication number 20250011918
- Publication date Jan 9, 2025
- Seoul National University R&DB Foundation
- Gyu Chul Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE AND SAMPLE ANALYSIS METHOD USING T...
- Publication number 20250012740
- Publication date Jan 9, 2025
- KIOXIA Corporation
- Takeshi OWAKI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...
- Publication number 20250012742
- Publication date Jan 9, 2025
- VG SYSTEMS LIMITED
- Austin Penrose DAY
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVIC...
- Publication number 20250003896
- Publication date Jan 2, 2025
- Rigaku Corporation
- Akihito YAMANO
- G01 - MEASURING TESTING
Information Patent Application
Substrate Alloy Influence Compensation
- Publication number 20250003897
- Publication date Jan 2, 2025
- THERMO FISHER SCIENTIFIC MESSTECHNIK GMBH
- Alexander Britting
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...
- Publication number 20250003895
- Publication date Jan 2, 2025
- Canon Kabushiki Kaisha
- Atsushi IWASHITA
- G01 - MEASURING TESTING
Information Patent Application
HARDWARE FOR AUTOMATION OF COMPUTER TOMOGRAPHY SAMPLE CHANGING
- Publication number 20250003894
- Publication date Jan 2, 2025
- Raytheon Technologies Corporation
- Robert Koch
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE QUANTITATIVE MEASUREMENT OF AN ELEMENT IN A PIECE
- Publication number 20250003944
- Publication date Jan 2, 2025
- SAFRAN HELICOPTER ENGINES
- Cyril Roger VERNAULT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to Control Gap for Sheet Manufacturing Measurement Processes
- Publication number 20240426604
- Publication date Dec 26, 2024
- Honeywell International Inc.
- Greg Reynen
- G01 - MEASURING TESTING
Information Patent Application
ARRAY SUBSTRATE
- Publication number 20240429320
- Publication date Dec 26, 2024
- Japan Display Inc.
- Tatsuya TODA
- H01 - BASIC ELECTRIC ELEMENTS

by using diffraction of the radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for measuring residual stress

Inspection apparatus and inspection method

Diffraction-based global in vitro diagnostic system

Combined scatter and transmission multi-view imaging system

Spectrometer

Ultra-precision timing clock method

Transmissive small-angle scattering device

Bifocal electron microscope

Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...

X-ray detector system with at least two stacked flat Bragg diffractors

Residual stress measurement method of curved surface block

Method of detecting internal stress distribution of transparent mat...

Method for measuring distribution of pores in electrode for seconda...

Method for measuring the diameter of filament diffraction fringes b...

X-ray based measurements in patterned structure

Method and apparatus for efficient high harmonic generation

Method and system for inspecting a structure across a cover layer c...

X-ray reflectometry apparatus and method thereof for measuring thre...

Evaluation device

X-ray backscatter imaging system for precise searching for containe...

X-ray system

Methods, systems, and computer program products for determining a p...

Quantitative analysis apparatus, method and program and manufacturi...

X-ray-based test device and method for plugging removal effect of s...

Nitride semiconductor substrate, laminated structure, and method fo...

Scattering measurement analysis method, scattering measurement anal...

Transmission electron microscope and inspection method using transm...

Radiation imaging apparatus and radiation imaging system

Bonding wire for semiconductor devices

System, method, and apparatus for x-ray backscatter inspection of p...

Patents Applicationslast 30 patents

Estimation of the Crystallographic Texture of an Alloy

Methods and Systems for Adjusting Drilling Fluids

METHOD OF MANUFACTURING A COMPONENT TO REDUCE RISK OF COLD DWELL FA...

METAL OXIDATION DETERMINING APPARATUS

EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF

INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD AND PR...

PARTICLE BEAM ANALYZER AND PARTICLE BEAM ANALYSIS METHOD

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION

X-Ray Detection Structure with a Plurality of Scintillator Volumes...

ENERGY DISPERSIVE X-RAY SPECTROSCOPY PHASE SPECTRUM SYNTHESIS

METHOD FOR EVALUATING ABRASION RESISTANCE OF RUBBER COMPOSITION AND...

COUNTERFEIT DETECTION AND PROVENANCE WITH GRATING INTERFEROMETRY, B...

INTERFACE DETECTION IN RECIPROCAL SPACE

METHOD FOR EVALUATING SiC SUBSTRATE, METHOD FOR MANUFACTURING SiC S...

DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...

INFORMATION PROCESSING METHOD, INFORMATION PROCESSING SYSTEM, AND N...

Adaptable X-Ray Analysis Apparatus

METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...

AUTOMATED THIN FILM DEPOSITION SYSTEM AND THIN FILM DEPOSITION METH...

TRANSMISSION ELECTRON MICROSCOPE AND SAMPLE ANALYSIS METHOD USING T...

METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...

CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVIC...

Substrate Alloy Influence Compensation

IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...

HARDWARE FOR AUTOMATION OF COMPUTER TOMOGRAPHY SAMPLE CHANGING

METHOD FOR THE QUANTITATIVE MEASUREMENT OF AN ELEMENT IN A PIECE

PATTERNED X-RAY EMITTING TARGET

Method to Control Gap for Sheet Manufacturing Measurement Processes

ARRAY SUBSTRATE