by using diffraction of the radiation

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CPC
G01N23/20

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/20by using diffraction of the radiation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Bifocal electron microscope
- Patent number 12,216,068
- Issue date Feb 4, 2025
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...
- Patent number 12,209,978
- Issue date Jan 28, 2025
- Danmarks Tekniske Universitet
- Yubin Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Residual stress measurement method of curved surface block
- Patent number 12,209,926
- Issue date Jan 28, 2025
- Metal Industries Research & Development Centre
- Zong Rong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting internal stress distribution of transparent mat...
- Patent number 12,203,881
- Issue date Jan 21, 2025
- Zhejiang University
- Haikuo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the diameter of filament diffraction fringes b...
- Patent number 12,196,540
- Issue date Jan 14, 2025
- Zhejiang University of Technology
- Qiang Lin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 12,196,691
- Issue date Jan 14, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for efficient high harmonic generation
- Patent number 12,196,688
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Petrus Wilhelmus Smorenburg
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting a structure across a cover layer c...
- Patent number 12,188,884
- Issue date Jan 7, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 12,188,883
- Issue date Jan 7, 2025
- Industrial Technology Research Institute
- Bo-Ching He
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation device
- Patent number 12,188,885
- Issue date Jan 7, 2025
- Kioxia Corporation
- Takehiro Nakai
- G01 - MEASURING TESTING
Information Patent Grant
X-ray backscatter imaging system for precise searching for containe...
- Patent number 12,181,428
- Issue date Dec 31, 2024
- KOREA INSTITUTE OF OCEAN SCIENCE & TECHNOLOGY
- Jongwon Park
- G01 - MEASURING TESTING
Information Patent Grant
X-ray system
- Patent number 12,181,427
- Issue date Dec 31, 2024
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
Methods, systems, and computer program products for determining a p...
- Patent number 12,181,459
- Issue date Dec 31, 2024
- Troxler Electronic Laboratories INC.
- Robert Ernest Troxler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Quantitative analysis apparatus, method and program and manufacturi...
- Patent number 12,174,131
- Issue date Dec 24, 2024
- Rigaku Corporation
- Takahiro Kuzumaki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray-based test device and method for plugging removal effect of s...
- Patent number 12,174,133
- Issue date Dec 24, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Xiao Guo
- G01 - MEASURING TESTING
Information Patent Grant
Nitride semiconductor substrate, laminated structure, and method fo...
- Patent number 12,174,132
- Issue date Dec 24, 2024
- Sumitomo Chemical Company, Limited
- Takehiro Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scattering measurement analysis method, scattering measurement anal...
- Patent number 12,175,173
- Issue date Dec 24, 2024
- Rigaku Corporation
- Tomoyuki Iwata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,166,006
- Issue date Dec 10, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation imaging apparatus and radiation imaging system
- Patent number 12,161,493
- Issue date Dec 10, 2024
- Canon Kabushiki Kaisha
- Misaki Kuriyama
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitative analysis method of carbon based hybrid negative electrode
- Patent number 12,163,904
- Issue date Dec 10, 2024
- LG ENERGY SOLUTION, LTD.
- Hyo-Jung Yoon
- G01 - MEASURING TESTING
Information Patent Grant
Method for analysis and determination of heavy metal occurrence key...
- Patent number 12,159,691
- Issue date Dec 3, 2024
- Central South University
- Zhang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Material species identification system using material spectral data
- Patent number 12,146,844
- Issue date Nov 19, 2024
- Toyota Jidosha Kabushiki Kaisha
- Masaki Adachi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cell analysis apparatus and cell analysis method
- Patent number 12,146,846
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Akiko Hisada
- G01 - MEASURING TESTING
Information Patent Grant
Component residual stress testing platform based on neutron diffrac...
- Patent number 12,146,845
- Issue date Nov 19, 2024
- NCS TESTING TECHNOLOGY CO., LTD
- Lixia Yang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 12,136,532
- Issue date Nov 5, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EVALUATING SiC SUBSTRATE, METHOD FOR MANUFACTURING SiC S...
- Publication number 20250035570
- Publication date Jan 30, 2025
- Resonac Corporation
- Hiromasa SUO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFACE DETECTION IN RECIPROCAL SPACE
- Publication number 20250037286
- Publication date Jan 30, 2025
- FEI Company
- John Francis Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...
- Publication number 20250027891
- Publication date Jan 23, 2025
- Saudi Arabian Oil Company
- Mohamed SOUA
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING METHOD, INFORMATION PROCESSING SYSTEM, AND N...
- Publication number 20250029683
- Publication date Jan 23, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- KOKI UENO
- G01 - MEASURING TESTING
Information Patent Application
Adaptable X-Ray Analysis Apparatus
- Publication number 20250020601
- Publication date Jan 16, 2025
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...
- Publication number 20250020602
- Publication date Jan 16, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Hyeon KANG
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED THIN FILM DEPOSITION SYSTEM AND THIN FILM DEPOSITION METH...
- Publication number 20250011918
- Publication date Jan 9, 2025
- Seoul National University R&DB Foundation
- Gyu Chul Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE AND SAMPLE ANALYSIS METHOD USING T...
- Publication number 20250012740
- Publication date Jan 9, 2025
- KIOXIA Corporation
- Takeshi OWAKI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...
- Publication number 20250012742
- Publication date Jan 9, 2025
- VG SYSTEMS LIMITED
- Austin Penrose DAY
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVIC...
- Publication number 20250003896
- Publication date Jan 2, 2025
- Rigaku Corporation
- Akihito YAMANO
- G01 - MEASURING TESTING
Information Patent Application
Substrate Alloy Influence Compensation
- Publication number 20250003897
- Publication date Jan 2, 2025
- THERMO FISHER SCIENTIFIC MESSTECHNIK GMBH
- Alexander Britting
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...
- Publication number 20250003895
- Publication date Jan 2, 2025
- Canon Kabushiki Kaisha
- Atsushi IWASHITA
- G01 - MEASURING TESTING
Information Patent Application
HARDWARE FOR AUTOMATION OF COMPUTER TOMOGRAPHY SAMPLE CHANGING
- Publication number 20250003894
- Publication date Jan 2, 2025
- Raytheon Technologies Corporation
- Robert Koch
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE QUANTITATIVE MEASUREMENT OF AN ELEMENT IN A PIECE
- Publication number 20250003944
- Publication date Jan 2, 2025
- SAFRAN HELICOPTER ENGINES
- Cyril Roger VERNAULT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to Control Gap for Sheet Manufacturing Measurement Processes
- Publication number 20240426604
- Publication date Dec 26, 2024
- Honeywell International Inc.
- Greg Reynen
- G01 - MEASURING TESTING
Information Patent Application
ARRAY SUBSTRATE
- Publication number 20240429320
- Publication date Dec 26, 2024
- Japan Display Inc.
- Tatsuya TODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
- Publication number 20240418660
- Publication date Dec 19, 2024
- FEI Company
- Daniel TOTONJIAN
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY SYSTEM
- Publication number 20240418658
- Publication date Dec 19, 2024
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...
- Publication number 20240393269
- Publication date Nov 28, 2024
- Carl Zeiss SMT GMBH
- Jens Oster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis Device and Analysis Method
- Publication number 20240385131
- Publication date Nov 21, 2024
- JEOL Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
METHOD, DEVICE AND COMPUTER PROGRAM FOR MONITORING A PART BY X-RAY
- Publication number 20240377341
- Publication date Nov 14, 2024
- SAFRAN
- Cédric FRAGNAUD
- G01 - MEASURING TESTING
Information Patent Application
Small-Angle X-Ray Scatterometry
- Publication number 20240377342
- Publication date Nov 14, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
- Publication number 20240369500
- Publication date Nov 7, 2024
- Robert Koch
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
- Publication number 20240369503
- Publication date Nov 7, 2024
- RTX Corporation
- Christopher Pelliccione
- G01 - MEASURING TESTING
Information Patent Application
X-Ray diffraction imaging detector having multiple angled input faces
- Publication number 20240361259
- Publication date Oct 31, 2024
- BRUKER TECHNOLOGIES LTD.
- Richard Thake Bytheway
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...
- Publication number 20240361260
- Publication date Oct 31, 2024
- TOHOKU UNIVERSITY
- Hiroshi JINNAI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING

by using diffraction of the radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Bifocal electron microscope

Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...

X-ray detector system with at least two stacked flat Bragg diffractors

Residual stress measurement method of curved surface block

Method of detecting internal stress distribution of transparent mat...

Method for measuring distribution of pores in electrode for seconda...

Method for measuring the diameter of filament diffraction fringes b...

X-ray based measurements in patterned structure

Method and apparatus for efficient high harmonic generation

Method and system for inspecting a structure across a cover layer c...

X-ray reflectometry apparatus and method thereof for measuring thre...

Evaluation device

X-ray backscatter imaging system for precise searching for containe...

X-ray system

Methods, systems, and computer program products for determining a p...

Quantitative analysis apparatus, method and program and manufacturi...

X-ray-based test device and method for plugging removal effect of s...

Nitride semiconductor substrate, laminated structure, and method fo...

Scattering measurement analysis method, scattering measurement anal...

Transmission electron microscope and inspection method using transm...

Bonding wire for semiconductor devices

Radiation imaging apparatus and radiation imaging system

System, method, and apparatus for x-ray backscatter inspection of p...

Quantitative analysis method of carbon based hybrid negative electrode

Method for analysis and determination of heavy metal occurrence key...

Material species identification system using material spectral data

Cell analysis apparatus and cell analysis method

Component residual stress testing platform based on neutron diffrac...

X-ray fluorescence analyzer

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Patents Applicationslast 30 patents

METHOD FOR EVALUATING SiC SUBSTRATE, METHOD FOR MANUFACTURING SiC S...

INTERFACE DETECTION IN RECIPROCAL SPACE

DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...

INFORMATION PROCESSING METHOD, INFORMATION PROCESSING SYSTEM, AND N...

Adaptable X-Ray Analysis Apparatus

METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...

AUTOMATED THIN FILM DEPOSITION SYSTEM AND THIN FILM DEPOSITION METH...

TRANSMISSION ELECTRON MICROSCOPE AND SAMPLE ANALYSIS METHOD USING T...

METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...

CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVIC...

Substrate Alloy Influence Compensation

IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...

HARDWARE FOR AUTOMATION OF COMPUTER TOMOGRAPHY SAMPLE CHANGING

METHOD FOR THE QUANTITATIVE MEASUREMENT OF AN ELEMENT IN A PIECE

PATTERNED X-RAY EMITTING TARGET

Method to Control Gap for Sheet Manufacturing Measurement Processes

ARRAY SUBSTRATE

PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...

AN X-RAY SYSTEM

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...

Analysis Device and Analysis Method

METHOD, DEVICE AND COMPUTER PROGRAM FOR MONITORING A PART BY X-RAY

Small-Angle X-Ray Scatterometry

INSPECTION APPARATUS AND INSPECTION METHOD

METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...

METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...

X-Ray diffraction imaging detector having multiple angled input faces

METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...

X-RAY ANALYZER