by using diffraction of the radiation

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G01N23/20

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/20by using diffraction of the radiation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electrode for power storage devices and lithium-ion secondary battery
- Patent number 12,341,194
- Issue date Jun 24, 2025
- TDK Corporation
- Takuya Aoki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction imaging detector having multiple angled input faces
- Patent number 12,339,239
- Issue date Jun 24, 2025
- BRUKER TECHNOLOGIES LTD.
- Richard Thake Bytheway
- G01 - MEASURING TESTING
Information Patent Grant
Method and mechanical design of a flexure interface for ultra-high-...
- Patent number 12,337,473
- Issue date Jun 24, 2025
- UChicago Argonne, LLC
- Deming Shu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray diagnostic apparatus and tomosynthesis imaging method
- Patent number 12,336,850
- Issue date Jun 24, 2025
- Canon Medical Systems Corporation
- Yoshimasa Kobayashi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Systems and methods for real-time configurable backscatter scanners
- Patent number 12,332,191
- Issue date Jun 17, 2025
- Smiths Detection Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
Alpha diffractometer
- Patent number 12,332,192
- Issue date Jun 17, 2025
- Arion Diagnostics, Inc.
- Alexander P. Lazarev
- G01 - MEASURING TESTING
Information Patent Grant
Preparation method for iron-based alloy powder EBSD test sample
- Patent number 12,332,155
- Issue date Jun 17, 2025
- Central South University
- Zuming Liu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Detection method, apparatus and system
- Patent number 12,326,408
- Issue date Jun 10, 2025
- Nuctech Company Limited
- Zhi Zeng
- G01 - MEASURING TESTING
Information Patent Grant
Full beam metrology for x-ray scatterometry systems
- Patent number 12,320,763
- Issue date Jun 3, 2025
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray diffraction apparatus and measurement method
- Patent number 12,313,573
- Issue date May 27, 2025
- Rigaku Corporation
- Hisashi Konaka
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating concentration of sulfur
- Patent number 12,306,117
- Issue date May 20, 2025
- Sumitomo Rubber Industries, Ltd.
- Tomomi Shiozawa
- G01 - MEASURING TESTING
Information Patent Grant
Backscatter X-ray system
- Patent number 12,306,118
- Issue date May 20, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining the absolute structure of crystal
- Patent number 12,306,119
- Issue date May 20, 2025
- FEI Company
- Stefano Vespucci
- G01 - MEASURING TESTING
Information Patent Grant
Metal oxide film and method for forming metal oxide film
- Patent number 12,302,639
- Issue date May 13, 2025
- Semiconductor Energy Laboratory Co., Ltd.
- Masahiro Takahashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Backscatter imaging device, control method and inspection system
- Patent number 12,298,261
- Issue date May 13, 2025
- Nuctech Company Limited
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Serial synchrotron crystallography sample holding system
- Patent number 12,292,395
- Issue date May 6, 2025
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis system and method with multi-source design
- Patent number 12,292,396
- Issue date May 6, 2025
- SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
- Xuena Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for interpreting high energy interactions
- Patent number 12,292,398
- Issue date May 6, 2025
- Veracio Ltd.
- Brandon Lee Goodchild Drake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Correction amount specifying apparatus, method, program, and jig
- Patent number 12,287,301
- Issue date Apr 29, 2025
- Rigaku Corporation
- Takuya Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Single piece droplet generation and injection device for serial cry...
- Patent number 12,287,299
- Issue date Apr 29, 2025
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- G01 - MEASURING TESTING
Information Patent Grant
Parameterizing x-ray scattering measurement using slice-and-image t...
- Patent number 12,288,706
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for analyzing diffraction pattern of mixture, and...
- Patent number 12,287,300
- Issue date Apr 29, 2025
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Generation method and simulation method of magnetic configuration o...
- Patent number 12,287,382
- Issue date Apr 29, 2025
- GRADUATE SCHOOL OF CHINA ACADEMY OF ENGINEERING PHYSICS
- Ben Xu
- G01 - MEASURING TESTING
Information Patent Grant
State change tracking device, X-ray imaging system, state change tr...
- Patent number 12,276,622
- Issue date Apr 15, 2025
- Konica Minolta, Inc.
- Tadashi Arimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for adjusting drilling fluids
- Patent number 12,270,267
- Issue date Apr 8, 2025
- Robert W. Troy
- E21 - EARTH DRILLING MINING
Information Patent Grant
Targeted collimation of detectors using rear collimators
- Patent number 12,259,341
- Issue date Mar 25, 2025
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Grant
Hand-held portable backscatter inspection system
- Patent number 12,259,518
- Issue date Mar 25, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspecting device, and nondestructive inspecting method
- Patent number 12,259,340
- Issue date Mar 25, 2025
- Riken
- Kunihiro Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Handheld inspection device and method of inspecting an infrastructu...
- Patent number 12,259,342
- Issue date Mar 25, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for structurally characterizing compounds
- Patent number 12,259,343
- Issue date Mar 25, 2025
- The Regents of the University of California
- Hosea M. Nelson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPOSITIONAL MAPPING EMPLOYING VARIABLE CHARGED PARTICLE BEAM PARA...
- Publication number 20250208072
- Publication date Jun 26, 2025
- FEI Company
- Cody Levien
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION METHOD, EVALUATION APPARATUS, AND STORAGE MEDIUM
- Publication number 20250208073
- Publication date Jun 26, 2025
- Konica Minolta, Inc.
- Shota Hashimoto
- G01 - MEASURING TESTING
Information Patent Application
RECORDING APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20250208071
- Publication date Jun 26, 2025
- Rigaku Corporation
- Yuji HATAYAMA
- G01 - MEASURING TESTING
Information Patent Application
THERMAL CHARACTERIZATION METHOD AND MANUFACTURING OF SEMICONDUCTOR...
- Publication number 20250201633
- Publication date Jun 19, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sam Vaziri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL APPARATUS, SYSTEM, METHOD AND PROGRAM
- Publication number 20250198953
- Publication date Jun 19, 2025
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY APPARATUS AND RELEVANT OPERATING METHOD FOR THE ANALYSIS OF N...
- Publication number 20250189466
- Publication date Jun 12, 2025
- DIAMATEX S.R.L.
- Danilo PACELLA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Analysis System, Analysis Method, and Analysis Program
- Publication number 20250189468
- Publication date Jun 12, 2025
- Hitachi High-Tech Corporation
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION DATA PROCESSING DEVICE AND X-RAY ANALYSIS DEVICE
- Publication number 20250180495
- Publication date Jun 5, 2025
- Rigaku Corporation
- Aya Ogi
- G01 - MEASURING TESTING
Information Patent Application
Combined Scatter and Transmission Multi-View Imaging System
- Publication number 20250180494
- Publication date Jun 5, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD
- Publication number 20250176925
- Publication date Jun 5, 2025
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROMETER
- Publication number 20250164421
- Publication date May 22, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Spectral Measurements Based On Perturbed Sp...
- Publication number 20250164411
- Publication date May 22, 2025
- KLA Corporation
- William McGahan
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENT SCREEN, X-RAY DETECTOR, AND X-RAY INSPECTION DEVI...
- Publication number 20250164651
- Publication date May 22, 2025
- Kabushiki Kaisha Toshiba
- Eiji OYAIZU
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND PROGRAM FOR ANALYZING SCAT...
- Publication number 20250155384
- Publication date May 15, 2025
- SAMSUNG ELECTRONICS CO., LTD.
- Koji MURATA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS, ANALYSIS METHOD, AND COMPUTER PROGRAM PRO...
- Publication number 20250155386
- Publication date May 15, 2025
- SAMSUNG ELECTRONICS CO,. LTD.
- Koji Murata
- G01 - MEASURING TESTING
Information Patent Application
INTERPRETATION DEVICE, INTERPRETATION METHOD, AND NON-TRANSITORY ST...
- Publication number 20250155382
- Publication date May 15, 2025
- Samsung Electronics Co., Ltd.
- Koji Murata
- G01 - MEASURING TESTING
Information Patent Application
RAIL DIAGNOSTIC INSPECTION APPARATUS
- Publication number 20250155383
- Publication date May 15, 2025
- TESMEC S.P.A.
- Silvestro Di Gioia
- G01 - MEASURING TESTING
Information Patent Application
Object Manipulator for an X-ray Inspection System
- Publication number 20250155385
- Publication date May 15, 2025
- Comet Yxlon GmbH
- Laurenz Rosemann
- G01 - MEASURING TESTING
Information Patent Application
BIFOCAL ELECTRON MICROSCOPE
- Publication number 20250155387
- Publication date May 15, 2025
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCANNING SYSTEM AND METHOD FOR INSPECTING AN OBJECT
- Publication number 20250146962
- Publication date May 8, 2025
- Seethru AI Inc.
- OMAR AL-KOFAHI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL AND X-RAY METROLOGY METHODS FOR PATTERNED SEMICONDUCTOR STR...
- Publication number 20250146961
- Publication date May 8, 2025
- KLA Corporation
- Daniel James Haxton
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
- Publication number 20250146960
- Publication date May 8, 2025
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...
- Publication number 20250137946
- Publication date May 1, 2025
- The Boeing Company
- Morteza Safai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MONITORING MODULE, X-RAY DIFFRACTION APPARATUS, AND MONITORING SYSTEM
- Publication number 20250132706
- Publication date Apr 24, 2025
- Rigaku Corporation
- Yuji HATAYAMA
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING TILT ANGLE OF SUBSTRATE STRUCTURES UTILIZING ANGULAR FO...
- Publication number 20250130183
- Publication date Apr 24, 2025
- Applied Materials, Inc.
- Alexander Buhse Brady
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION X-RAY REFLECTOMETER
- Publication number 20250110068
- Publication date Apr 3, 2025
- UChicago Argonne, LLC
- Raymond P. Conley
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ORIENTATING A SAMPLE FOR INSPECTION WITH CHAR...
- Publication number 20250110069
- Publication date Apr 3, 2025
- FEI Company
- Radovan VAŠINA
- G01 - MEASURING TESTING
Information Patent Application
EDS CALIBRATION
- Publication number 20250110070
- Publication date Apr 3, 2025
- FEI Company
- Michael Owen
- G01 - MEASURING TESTING
Information Patent Application
Hard X-ray Compatible Chamber for High Temperature In-Situ Material...
- Publication number 20250109498
- Publication date Apr 3, 2025
- UChicago Argonne, LLC
- Katherine J. Harmon
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS
- Publication number 20250102451
- Publication date Mar 27, 2025
- FEI Company
- Vojtech MAHEL
- G01 - MEASURING TESTING

by using diffraction of the radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electrode for power storage devices and lithium-ion secondary battery

X-ray diffraction imaging detector having multiple angled input faces

Method and mechanical design of a flexure interface for ultra-high-...

X-ray diagnostic apparatus and tomosynthesis imaging method

Systems and methods for real-time configurable backscatter scanners

Alpha diffractometer

Preparation method for iron-based alloy powder EBSD test sample

Detection method, apparatus and system

Full beam metrology for x-ray scatterometry systems

X-ray diffraction apparatus and measurement method

Method of evaluating concentration of sulfur

Backscatter X-ray system

Methods and systems for determining the absolute structure of crystal

Metal oxide film and method for forming metal oxide film

Backscatter imaging device, control method and inspection system

Serial synchrotron crystallography sample holding system

X-ray analysis system and method with multi-source design

Systems and methods for interpreting high energy interactions

Correction amount specifying apparatus, method, program, and jig

Single piece droplet generation and injection device for serial cry...

Parameterizing x-ray scattering measurement using slice-and-image t...

Device and method for analyzing diffraction pattern of mixture, and...

Generation method and simulation method of magnetic configuration o...

State change tracking device, X-ray imaging system, state change tr...

Methods and systems for adjusting drilling fluids

Targeted collimation of detectors using rear collimators

Hand-held portable backscatter inspection system

Nondestructive inspecting device, and nondestructive inspecting method

Handheld inspection device and method of inspecting an infrastructu...

Systems and methods for structurally characterizing compounds

Patents Applicationslast 30 patents

COMPOSITIONAL MAPPING EMPLOYING VARIABLE CHARGED PARTICLE BEAM PARA...

EVALUATION METHOD, EVALUATION APPARATUS, AND STORAGE MEDIUM

RECORDING APPARATUS, SYSTEM, METHOD, AND PROGRAM

THERMAL CHARACTERIZATION METHOD AND MANUFACTURING OF SEMICONDUCTOR...

CONTROL APPARATUS, SYSTEM, METHOD AND PROGRAM

X-RAY APPARATUS AND RELEVANT OPERATING METHOD FOR THE ANALYSIS OF N...

Analysis System, Analysis Method, and Analysis Program

X-RAY DIFFRACTION DATA PROCESSING DEVICE AND X-RAY ANALYSIS DEVICE

Combined Scatter and Transmission Multi-View Imaging System

NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD

SPECTROMETER

Methods And Systems For Spectral Measurements Based On Perturbed Sp...

X-RAY FLUORESCENT SCREEN, X-RAY DETECTOR, AND X-RAY INSPECTION DEVI...

ANALYSIS APPARATUS, ANALYSIS METHOD, AND PROGRAM FOR ANALYZING SCAT...

X-RAY ANALYSIS APPARATUS, ANALYSIS METHOD, AND COMPUTER PROGRAM PRO...

INTERPRETATION DEVICE, INTERPRETATION METHOD, AND NON-TRANSITORY ST...

RAIL DIAGNOSTIC INSPECTION APPARATUS

Object Manipulator for an X-ray Inspection System

BIFOCAL ELECTRON MICROSCOPE

X-RAY SCANNING SYSTEM AND METHOD FOR INSPECTING AN OBJECT

OPTICAL AND X-RAY METROLOGY METHODS FOR PATTERNED SEMICONDUCTOR STR...

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...

INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...

MONITORING MODULE, X-RAY DIFFRACTION APPARATUS, AND MONITORING SYSTEM

DETERMINING TILT ANGLE OF SUBSTRATE STRUCTURES UTILIZING ANGULAR FO...

HIGH RESOLUTION X-RAY REFLECTOMETER

METHOD AND SYSTEM FOR ORIENTATING A SAMPLE FOR INSPECTION WITH CHAR...

EDS CALIBRATION

Hard X-ray Compatible Chamber for High Temperature In-Situ Material...

SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS