by using diffraction of the radiation

Industry

CPC
G01N23/20

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/20by using diffraction of the radiation

Industries

Patents Grantslast 30 patents

Information Patent Grant
Quantitative analysis apparatus, method and program and manufacturi...
- Patent number 12,174,131
- Issue date Dec 24, 2024
- Rigaku Corporation
- Takahiro Kuzumaki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray-based test device and method for plugging removal effect of s...
- Patent number 12,174,133
- Issue date Dec 24, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Xiao Guo
- G01 - MEASURING TESTING
Information Patent Grant
Nitride semiconductor substrate, laminated structure, and method fo...
- Patent number 12,174,132
- Issue date Dec 24, 2024
- Sumitomo Chemical Company, Limited
- Takehiro Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scattering measurement analysis method, scattering measurement anal...
- Patent number 12,175,173
- Issue date Dec 24, 2024
- Rigaku Corporation
- Tomoyuki Iwata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation imaging apparatus and radiation imaging system
- Patent number 12,161,493
- Issue date Dec 10, 2024
- Canon Kabushiki Kaisha
- Misaki Kuriyama
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,166,006
- Issue date Dec 10, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitative analysis method of carbon based hybrid negative electrode
- Patent number 12,163,904
- Issue date Dec 10, 2024
- LG ENERGY SOLUTION, LTD.
- Hyo-Jung Yoon
- G01 - MEASURING TESTING
Information Patent Grant
Method for analysis and determination of heavy metal occurrence key...
- Patent number 12,159,691
- Issue date Dec 3, 2024
- Central South University
- Zhang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Material species identification system using material spectral data
- Patent number 12,146,844
- Issue date Nov 19, 2024
- Toyota Jidosha Kabushiki Kaisha
- Masaki Adachi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cell analysis apparatus and cell analysis method
- Patent number 12,146,846
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Akiko Hisada
- G01 - MEASURING TESTING
Information Patent Grant
Component residual stress testing platform based on neutron diffrac...
- Patent number 12,146,845
- Issue date Nov 19, 2024
- NCS TESTING TECHNOLOGY CO., LTD
- Lixia Yang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 12,136,532
- Issue date Nov 5, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for overlay metrology and apparatus thereof
- Patent number 12,130,246
- Issue date Oct 29, 2024
- ASML Netherlands B.V.
- Simon Gijsbert Josephus Mathijssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,132,026
- Issue date Oct 29, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for tuning microfluidic droplet frequency and synchronizing...
- Patent number 12,123,840
- Issue date Oct 22, 2024
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method for producing a magnetic powder
- Patent number 12,119,170
- Issue date Oct 15, 2024
- ABB Schweiz AG
- Reinhard Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
X-ray scanning system and method for inspecting an object
- Patent number 12,111,271
- Issue date Oct 8, 2024
- Seethru AI, Inc.
- Omar Al-Kofahi
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus, and method therefor
- Patent number 12,105,034
- Issue date Oct 1, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Method for scanning a sample by means of X-ray optics and an appara...
- Patent number 12,106,867
- Issue date Oct 1, 2024
- Bruker Nano GmbH
- Ulrich Waldschläger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for electron backscatter diffraction sample c...
- Patent number 12,099,024
- Issue date Sep 24, 2024
- FEI Company
- Austin Penrose Day
- G01 - MEASURING TESTING
Information Patent Grant
Diffractometer-based global in situ diagnostic system for animals
- Patent number 12,094,609
- Issue date Sep 17, 2024
- Arion Diagnostics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diffraction-based global in vitro diagnostic system
- Patent number 12,094,610
- Issue date Sep 17, 2024
- Bragg Analytics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 12,094,980
- Issue date Sep 17, 2024
- Japan Display Inc.
- Tatsuya Toda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Construction method for photocathode indirect competition sensor an...
- Patent number 12,092,601
- Issue date Sep 17, 2024
- Oil Crops Research Institute of Chinese Academy of Agricultural Sciences
- Zhaowei Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Protein binding domains stabilizing functional conformational state...
- Patent number 12,092,646
- Issue date Sep 17, 2024
- Trustees of Leland Stanford Junior University
- Jan Steyaert
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and method, and s...
- Patent number 12,092,593
- Issue date Sep 17, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method to Control Gap for Sheet Manufacturing Measurement Processes
- Publication number 20240426604
- Publication date Dec 26, 2024
- Honeywell International Inc.
- Greg Reynen
- G01 - MEASURING TESTING
Information Patent Application
ARRAY SUBSTRATE
- Publication number 20240429320
- Publication date Dec 26, 2024
- Japan Display Inc.
- Tatsuya TODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
- Publication number 20240418660
- Publication date Dec 19, 2024
- FEI Company
- Daniel TOTONJIAN
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY SYSTEM
- Publication number 20240418658
- Publication date Dec 19, 2024
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...
- Publication number 20240393269
- Publication date Nov 28, 2024
- Carl Zeiss SMT GMBH
- Jens Oster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis Device and Analysis Method
- Publication number 20240385131
- Publication date Nov 21, 2024
- JEOL Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
METHOD, DEVICE AND COMPUTER PROGRAM FOR MONITORING A PART BY X-RAY
- Publication number 20240377341
- Publication date Nov 14, 2024
- SAFRAN
- Cédric FRAGNAUD
- G01 - MEASURING TESTING
Information Patent Application
Small-Angle X-Ray Scatterometry
- Publication number 20240377342
- Publication date Nov 14, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
- Publication number 20240369500
- Publication date Nov 7, 2024
- Robert Koch
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
- Publication number 20240369503
- Publication date Nov 7, 2024
- RTX Corporation
- Christopher Pelliccione
- G01 - MEASURING TESTING
Information Patent Application
X-Ray diffraction imaging detector having multiple angled input faces
- Publication number 20240361259
- Publication date Oct 31, 2024
- BRUKER TECHNOLOGIES LTD.
- Richard Thake Bytheway
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...
- Publication number 20240361260
- Publication date Oct 31, 2024
- TOHOKU UNIVERSITY
- Hiroshi JINNAI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TALBOT IMAGING APPARATUS AND X-RAY TALBOT IMAGING METHOD
- Publication number 20240361256
- Publication date Oct 31, 2024
- Konica Minolta, Inc.
- Mika Matsusaka
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DENOISING A REGION OF INTEREST OF A PATTERN
- Publication number 20240361262
- Publication date Oct 31, 2024
- ETROLOGY, LLC
- Vladislav Kaplan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR OPTIMIZED SAMPLE IRRADIATION IN A CABINET IRR...
- Publication number 20240353356
- Publication date Oct 24, 2024
- KUB TECHNOLOGIES, INC. DBA KUBTEC
- Vikram Butani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CRYSTAL PHASE INFORMATION EXTRACTION APPARATUS, CRYSTAL PHASE INFOR...
- Publication number 20240353357
- Publication date Oct 24, 2024
- Kabushiki Kaisha Toshiba
- Shuhei NITTA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...
- Publication number 20240345007
- Publication date Oct 17, 2024
- Zhejiang University
- Haikuo WANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATT...
- Publication number 20240345006
- Publication date Oct 17, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DISLOCATION ANALYSIS
- Publication number 20240337611
- Publication date Oct 10, 2024
- Oxford Instruments Nanotechnology Tools Limited
- Aimo WINKELMANN
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240328969
- Publication date Oct 3, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED ACCURACY
- Publication number 20240331179
- Publication date Oct 3, 2024
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20240328972
- Publication date Oct 3, 2024
- Rigaku Corporation
- Rieko SUENAGA
- G01 - MEASURING TESTING
Information Patent Application
SEM-EDS HOLDER DEVICE FOR THIN FILTER-TYPE SAMPLE
- Publication number 20240328968
- Publication date Oct 3, 2024
- Korea Institute of Science and Technology
- Hye Jung Chang
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240319120
- Publication date Sep 26, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE AND CRYSTAL EVALUATION METHOD
- Publication number 20240319122
- Publication date Sep 26, 2024
- KIOXIA Corporation
- Yuki OTSUKA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM
- Publication number 20240319121
- Publication date Sep 26, 2024
- Rigaku Corporation
- Yoshiyasu ITO
- G01 - MEASURING TESTING
Information Patent Application
METAL OXIDE FILM AND METHOD FOR FORMING METAL OXIDE FILM
- Publication number 20240321897
- Publication date Sep 26, 2024
- Semiconductor Energy Laboratory Co., Ltd.
- Masahiro TAKAHASHI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

by using diffraction of the radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Quantitative analysis apparatus, method and program and manufacturi...

X-ray-based test device and method for plugging removal effect of s...

Nitride semiconductor substrate, laminated structure, and method fo...

Scattering measurement analysis method, scattering measurement anal...

Transmission electron microscope and inspection method using transm...

Radiation imaging apparatus and radiation imaging system

Bonding wire for semiconductor devices

System, method, and apparatus for x-ray backscatter inspection of p...

Quantitative analysis method of carbon based hybrid negative electrode

Method for analysis and determination of heavy metal occurrence key...

Material species identification system using material spectral data

Cell analysis apparatus and cell analysis method

Component residual stress testing platform based on neutron diffrac...

X-ray fluorescence analyzer

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Method for overlay metrology and apparatus thereof

Bonding wire for semiconductor devices

Device for tuning microfluidic droplet frequency and synchronizing...

Method for producing a magnetic powder

X-ray scanning system and method for inspecting an object

Single-crystal X-ray structure analysis apparatus, and method therefor

Method for scanning a sample by means of X-ray optics and an appara...

Device and method for measuring short-wavelength characteristic X-r...

Methods and apparatus for electron backscatter diffraction sample c...

Diffractometer-based global in situ diagnostic system for animals

Diffraction-based global in vitro diagnostic system

Semiconductor device

Construction method for photocathode indirect competition sensor an...

Protein binding domains stabilizing functional conformational state...

Single-crystal X-ray structure analysis apparatus and method, and s...

Patents Applicationslast 30 patents

Method to Control Gap for Sheet Manufacturing Measurement Processes

ARRAY SUBSTRATE

PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...

AN X-RAY SYSTEM

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...

Analysis Device and Analysis Method

METHOD, DEVICE AND COMPUTER PROGRAM FOR MONITORING A PART BY X-RAY

Small-Angle X-Ray Scatterometry

INSPECTION APPARATUS AND INSPECTION METHOD

METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...

METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...

X-Ray diffraction imaging detector having multiple angled input faces

METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...

X-RAY ANALYZER

X-RAY TALBOT IMAGING APPARATUS AND X-RAY TALBOT IMAGING METHOD

SYSTEM AND METHOD FOR DENOISING A REGION OF INTEREST OF A PATTERN

SYSTEM AND METHOD FOR OPTIMIZED SAMPLE IRRADIATION IN A CABINET IRR...

CRYSTAL PHASE INFORMATION EXTRACTION APPARATUS, CRYSTAL PHASE INFOR...

METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...

SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATT...

METHOD FOR DISLOCATION ANALYSIS

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED ACCURACY

ANALYSIS APPARATUS, SYSTEM, METHOD, AND PROGRAM

SEM-EDS HOLDER DEVICE FOR THIN FILTER-TYPE SAMPLE

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

ELECTRON MICROSCOPE AND CRYSTAL EVALUATION METHOD

ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM

METAL OXIDE FILM AND METHOD FOR FORMING METAL OXIDE FILM