Cantilever beams

Industry

CPC
G01R1/06727

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06727Cantilever beams

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Cantilever probe card device and elastic probe thereof
- Patent number 12,092,661
- Issue date Sep 17, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method thereof
- Patent number 12,092,656
- Issue date Sep 17, 2024
- Samsung Electronics Co., Ltd.
- Sungyoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a semiconductor device and a probe card including...
- Patent number 12,038,458
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Sung Hoon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus having a contactor for inspecting electrical c...
- Patent number 11,965,911
- Issue date Apr 23, 2024
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING
Information Patent Grant
Microwave resonator magnetic field measuring device and magnetic fi...
- Patent number 11,892,528
- Issue date Feb 6, 2024
- Christian-Albrechts-Universitaet Zu Kiel
- Sebastian Toxvaerd
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card and carrier thereof
- Patent number 11,879,912
- Issue date Jan 23, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly and micro vacuum probe station comprising same
- Patent number 11,867,753
- Issue date Jan 9, 2024
- Nextron Corporation
- Hakbeom Moon
- G01 - MEASURING TESTING
Information Patent Grant
Probe unit with a free length cantilever contactor and pedestal
- Patent number 11,860,190
- Issue date Jan 2, 2024
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing an electrical property of a test sample
- Patent number 11,693,028
- Issue date Jul 4, 2023
- KLA Corporation
- Frederik Westergaard Østerberg
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system
- Patent number 11,656,271
- Issue date May 23, 2023
- MPI Corporation
- Yi-Hsuan Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for characterizing processes of submicron semiconductor...
- Patent number 11,579,171
- Issue date Feb 14, 2023
- Meta Platforms Technologies, LLC
- Christopher Percival
- G02 - OPTICS
Information Patent Grant
High speed signal transmitting and receiving detection device
- Patent number 11,567,104
- Issue date Jan 31, 2023
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Topside contact device and method for characterization of high elec...
- Patent number 11,561,254
- Issue date Jan 24, 2023
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever-type probe with multiple metallic coatings
- Patent number 11,543,431
- Issue date Jan 3, 2023
- KLA Corporation
- Hongshuo Zou
- G01 - MEASURING TESTING
Information Patent Grant
Contact and test socket device for testing semiconductor device
- Patent number 11,486,896
- Issue date Nov 1, 2022
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Contact and test socket device for testing semiconductor device
- Patent number 11,486,897
- Issue date Nov 1, 2022
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Probe module and probe
- Patent number 11,391,756
- Issue date Jul 19, 2022
- HITACHI HIGH-TECH CORPORATION
- Ryo Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe head and corresponding contact probe
- Patent number 11,333,681
- Issue date May 17, 2022
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever contact probe and corresponding probe head
- Patent number 11,307,221
- Issue date Apr 19, 2022
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
Probe on carrier architecture for vertical probe arrays
- Patent number 11,293,947
- Issue date Apr 5, 2022
- FormFactor, Inc.
- Mukesh Selvaraj
- G01 - MEASURING TESTING
Information Patent Grant
Electrical contactor and electrical connecting apparatus
- Patent number 11,255,878
- Issue date Feb 22, 2022
- Kabushiki Kaisha Nihon Micronics
- Yasutaka Kishi
- G01 - MEASURING TESTING
Information Patent Grant
Position correction method, inspection apparatus, and probe card
- Patent number 11,119,122
- Issue date Sep 14, 2021
- Tokyo Electron Limited
- Kunihiro Furuya
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing apparatus with lateral movement of a probe suppo...
- Patent number 11,073,538
- Issue date Jul 27, 2021
- Intel Corporation
- Paul Diglio
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid probe head assembly for testing a wafer device under test
- Patent number 11,041,881
- Issue date Jun 22, 2021
- Xcerra Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Contact and test socket device for testing semiconductor device
- Patent number 10,935,572
- Issue date Mar 2, 2021
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus and contact
- Patent number 10,908,182
- Issue date Feb 2, 2021
- Kabushiki Kaisha Nihon Micronics
- Eichi Osato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probes with fiducial targets, probe systems including the same, and...
- Patent number 10,877,070
- Issue date Dec 29, 2020
- FormFactor Beaverton, Inc.
- Joseph George Frankel
- G01 - MEASURING TESTING
Information Patent Grant
Pin-type probes for contacting electronic circuits and methods for...
- Patent number 10,877,067
- Issue date Dec 29, 2020
- Microfabrica Inc.
- Richard T. Chen
- G01 - MEASURING TESTING
Information Patent Grant
Interconnect structure with varying modulus of elasticity
- Patent number 10,866,264
- Issue date Dec 15, 2020
- Intel Corporation
- Pooya Tadayon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cantilever microprobes for contacting electronic components
- Patent number 10,788,512
- Issue date Sep 29, 2020
- Microfabrica Inc.
- Richard T. Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE
- Publication number 20240385223
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE
- Publication number 20240385217
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND MICRO ELECTRO MECHANICAL SYSTEM (M...
- Publication number 20240385218
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT SCATTERING PROBE
- Publication number 20240385219
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD THEREOF
- Publication number 20240385220
- Publication date Nov 21, 2024
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE
- Publication number 20240385221
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CANTILEVER PROBE MODULE
- Publication number 20240385222
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CONNECTOR CONTACT FORCE SENSING
- Publication number 20240264018
- Publication date Aug 8, 2024
- Arista Networks, Inc.
- Matthew Moe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Socketed Probes
- Publication number 20240125815
- Publication date Apr 18, 2024
- TRANSLARITY, INC.
- Raul Molina
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED CONTACT ELEMENT FOR A PROBE HEAD FOR TESTING HIGH-FREQUENC...
- Publication number 20240012025
- Publication date Jan 11, 2024
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE, PROBE SYSTEM INCLUDING THE PROBE DEVICE AND OPERATING...
- Publication number 20230400480
- Publication date Dec 14, 2023
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONEN...
- Publication number 20230358785
- Publication date Nov 9, 2023
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD AND CARRIER THEREOF
- Publication number 20230349948
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND ELASTIC PROBE THEREOF
- Publication number 20230349952
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
MULTI-BEAM CANTILEVER STYLE CONTACT PIN FOR IC TESTING
- Publication number 20230349949
- Publication date Nov 2, 2023
- EQUIPTEST ENGINEERING PTE LTD
- Michael GOH
- G01 - MEASURING TESTING
Information Patent Application
PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONEN...
- Publication number 20230314474
- Publication date Oct 5, 2023
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
Pin-Type Probes for Contacting Electronic Circuits and Methods for...
- Publication number 20230204626
- Publication date Jun 29, 2023
- Microfabrica Inc.
- Richard T. Chen
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, POSITION ADJUSTING UNIT AND POSITION ADJUSTIN...
- Publication number 20230003764
- Publication date Jan 5, 2023
- KABUSHIKI KAISHA NIHON MICRONICS
- SATOSHI NARITA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD THEREOF
- Publication number 20220404395
- Publication date Dec 22, 2022
- Korea Advanced Institute of Science and Technology
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
PROBE UNIT
- Publication number 20220390489
- Publication date Dec 8, 2022
- Kabushiki Kaisha Nihon Micronics
- SATOSHI NARITA
- G01 - MEASURING TESTING
Information Patent Application
TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELEC...
- Publication number 20220381816
- Publication date Dec 1, 2022
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR TESTING A SEMICONDUCTOR DEVICE AND A PROBE CARD INCLUDING...
- Publication number 20220308088
- Publication date Sep 29, 2022
- Korea Instrument Co.,Ltd.
- SUNG HOON LEE
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20220299564
- Publication date Sep 22, 2022
- MPI Corporation
- YI-HSUAN CHENG
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED SIGNAL TRANSMITTING AND RECEIVING DETECTION DEVICE
- Publication number 20220221488
- Publication date Jul 14, 2022
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
Cantilever-Type Probe with Multiple Metallic Coatings
- Publication number 20220214375
- Publication date Jul 7, 2022
- KLA Corporation
- Hongshuo Zou
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY AND MICRO VACUUM PROBE STATION COMPRISING SAME
- Publication number 20220137123
- Publication date May 5, 2022
- NEXTRON CORPORATION
- Hakbeom MOON
- G01 - MEASURING TESTING
Information Patent Application
Cantilever-Type Probe with Multiple Metallic Coatings
- Publication number 20210333307
- Publication date Oct 28, 2021
- KLA Corporation
- Hongshuo Zou
- G01 - MEASURING TESTING
Information Patent Application
Apparatus For Use With Exercise Equipment
- Publication number 20210245006
- Publication date Aug 12, 2021
- IncludeHealth, Inc.
- J. Ryan Eder
- G01 - MEASURING TESTING
Information Patent Application
MICROWAVE RESONATOR MAGNETIC FIELD MEASURING DEVICE AND MAGNETIC FI...
- Publication number 20210231757
- Publication date Jul 29, 2021
- CHRISTIAN-ALBRECHTS-UNIVERSITAET ZU KIEL
- Sebastian Toxvaerd
- G01 - MEASURING TESTING
Information Patent Application
CONTACT AND TEST SOCKET DEVICE FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20210148950
- Publication date May 20, 2021
- Dong Weon Hwang
- G01 - MEASURING TESTING

Cantilever beams

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Cantilever probe card device and elastic probe thereof

Test apparatus and test method thereof

Probe for testing a semiconductor device and a probe card including...

Inspection apparatus having a contactor for inspecting electrical c...

Microwave resonator magnetic field measuring device and magnetic fi...

Cantilever probe card and carrier thereof

Probe assembly and micro vacuum probe station comprising same

Probe unit with a free length cantilever contactor and pedestal

Probe for testing an electrical property of a test sample

Wafer inspection system

Probe card for characterizing processes of submicron semiconductor...

High speed signal transmitting and receiving detection device

Topside contact device and method for characterization of high elec...

Cantilever-type probe with multiple metallic coatings

Contact and test socket device for testing semiconductor device

Contact and test socket device for testing semiconductor device

Probe module and probe

Cantilever probe head and corresponding contact probe

Cantilever contact probe and corresponding probe head

Probe on carrier architecture for vertical probe arrays

Electrical contactor and electrical connecting apparatus

Position correction method, inspection apparatus, and probe card

Electrical testing apparatus with lateral movement of a probe suppo...

Hybrid probe head assembly for testing a wafer device under test

Contact and test socket device for testing semiconductor device

Electrical connecting apparatus and contact

Probes with fiducial targets, probe systems including the same, and...

Pin-type probes for contacting electronic circuits and methods for...

Interconnect structure with varying modulus of elasticity

Cantilever microprobes for contacting electronic components

Patents Applicationslast 30 patents

CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE

CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE

CANTILEVER PROBE CARD DEVICE AND MICRO ELECTRO MECHANICAL SYSTEM (M...

CANTILEVER PROBE CARD DEVICE AND LIGHT SCATTERING PROBE

TEST APPARATUS AND TEST METHOD THEREOF

CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE

CANTILEVER PROBE CARD DEVICE AND CANTILEVER PROBE MODULE

CONNECTOR CONTACT FORCE SENSING

Socketed Probes

IMPROVED CONTACT ELEMENT FOR A PROBE HEAD FOR TESTING HIGH-FREQUENC...

PROBE DEVICE, PROBE SYSTEM INCLUDING THE PROBE DEVICE AND OPERATING...

PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONEN...

CANTILEVER PROBE CARD AND CARRIER THEREOF

CANTILEVER PROBE CARD DEVICE AND ELASTIC PROBE THEREOF

MULTI-BEAM CANTILEVER STYLE CONTACT PIN FOR IC TESTING

PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONEN...

Pin-Type Probes for Contacting Electronic Circuits and Methods for...

INSPECTION APPARATUS, POSITION ADJUSTING UNIT AND POSITION ADJUSTIN...

TEST APPARATUS AND TEST METHOD THEREOF

PROBE UNIT

TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELEC...

PROBE FOR TESTING A SEMICONDUCTOR DEVICE AND A PROBE CARD INCLUDING...

WAFER INSPECTION SYSTEM

HIGH SPEED SIGNAL TRANSMITTING AND RECEIVING DETECTION DEVICE

Cantilever-Type Probe with Multiple Metallic Coatings

PROBE ASSEMBLY AND MICRO VACUUM PROBE STATION COMPRISING SAME

Cantilever-Type Probe with Multiple Metallic Coatings

Apparatus For Use With Exercise Equipment

MICROWAVE RESONATOR MAGNETIC FIELD MEASURING DEVICE AND MAGNETIC FI...

CONTACT AND TEST SOCKET DEVICE FOR TESTING SEMICONDUCTOR DEVICE