Cathodoluminescence

Industry

CPC
H01J2237/2808

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2808Cathodoluminescence

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Time-resolved cathodoluminescence sample probing
- Patent number 11,798,778
- Issue date Oct 24, 2023
- ATTOLIGHT AG
- Christian Monachon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for wavelength resolved angular resolved cathodoluminescence
- Patent number 11,764,032
- Issue date Sep 19, 2023
- Gatan, Inc.
- Michael Bertilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for alignment of cathodoluminescence optics
- Patent number 11,205,559
- Issue date Dec 21, 2021
- Gatan, Inc.
- John Andrew Hunt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for wavelength resolved angular resolved cathodoluminescence
- Patent number 10,943,764
- Issue date Mar 9, 2021
- Gatan, Inc.
- Michael Bertilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
- Patent number 10,903,042
- Issue date Jan 26, 2021
- TECHNISCHE UNIVERSITEIT DELFT
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combined SEM-CL and FIB-IOE microscopy
- Patent number 10,896,802
- Issue date Jan 19, 2021
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
- Patent number 10,453,649
- Issue date Oct 22, 2019
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample chamber device for electron microscope, and electron microsc...
- Patent number 10,312,049
- Issue date Jun 4, 2019
- Korea Research Institute of Standards and Science
- Bok Lae Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holder device for electron microscope
- Patent number 10,312,050
- Issue date Jun 4, 2019
- SNU R&DB Foundation
- Young Woon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide field atmospheric scanning electron microscope
- Patent number 10,262,832
- Issue date Apr 16, 2019
- Gerasimos Daniel Danilatos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder with light emitting and transferring elements for a c...
- Patent number 9,812,288
- Issue date Nov 7, 2017
- Hitachi High-Technologies Corporation
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-color nanoscale imaging based on nanoparticle cathodoluminesc...
- Patent number 9,541,512
- Issue date Jan 10, 2017
- President and Fellows of Harvard College
- Ronald Walsworth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for improving characteristic peak signals in anal...
- Patent number 9,406,496
- Issue date Aug 2, 2016
- Universitat de Barcelona
- Sonia Estrade Albiol
- G01 - MEASURING TESTING
Information Patent Grant
Integrated optical and charged particle inspection apparatus
- Patent number 9,378,921
- Issue date Jun 28, 2016
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjustable cathodoluminescence detection system and microscope empl...
- Patent number 9,228,962
- Issue date Jan 5, 2016
- Centre National de la Recherche
- Mathieu Kociak
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing a sample and charged particle beam device for a...
- Patent number 9,159,532
- Issue date Oct 13, 2015
- Carl Zeiss Microscopy Ltd.
- Edward Hill
- G01 - MEASURING TESTING
Information Patent Grant
Diamond
- Patent number 8,986,645
- Issue date Mar 24, 2015
- Element Six Limited
- Daniel James Twitchen
- B44 - DECORATIVE ARTS
Information Patent Grant
Inspection apparatus and replaceable door for a vacuum chamber of s...
- Patent number 8,895,921
- Issue date Nov 25, 2014
- Delmic B.V.
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Grant
Deconvolution of time-gated cathodoluminescence images
- Patent number 8,674,320
- Issue date Mar 18, 2014
- Attolight SA
- Jean Berney
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam system having a hollow light guide
- Patent number 8,648,301
- Issue date Feb 11, 2014
- Carl Zeiss Microscopy Ltd.
- Stewart Bean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection device and particle beam device having a detection device
- Patent number 8,513,604
- Issue date Aug 20, 2013
- Carl Zeiss Microscopy GmbH
- Christian Thomas
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detection system
- Patent number 8,421,007
- Issue date Apr 16, 2013
- TOHOKU UNIVERSITY
- Masami Terauchi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope, an interface and a method for observi...
- Patent number 8,334,510
- Issue date Dec 18, 2012
- B-Nano Ltd.
- Dov Shachal
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting sample
- Patent number 8,119,994
- Issue date Feb 21, 2012
- Jeol Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Specimen holder, specimen inspection apparatus, and specimen inspec...
- Patent number 8,030,622
- Issue date Oct 4, 2011
- Jeol Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for simultaneous SEM and optical examination
- Patent number 7,968,843
- Issue date Jun 28, 2011
- Jeol Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection apparatus, sample inspection method and sample in...
- Patent number 7,923,700
- Issue date Apr 12, 2011
- Jeol Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and reagent solution
- Patent number 7,906,760
- Issue date Mar 15, 2011
- Jeol Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Specimen holder, specimen inspection apparatus, specimen inspection...
- Patent number 7,745,802
- Issue date Jun 29, 2010
- Jeol Ltd.
- Hidetoshi Nishiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical apparatus for simultaneous observing a sample with...
- Patent number 7,718,979
- Issue date May 18, 2010
- FEI Company
- William Ralph Knowles
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR INSPECTING A SAMPLE BY MEANS OF MULTIPLE C...
- Publication number 20230020967
- Publication date Jan 19, 2023
- DELMIC IP B.V.
- Andries Pieter Johan EFFTING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CATHODOLUMINESCENCE ELECTRON MICROSCOPE
- Publication number 20220216028
- Publication date Jul 7, 2022
- ATTOLIGHT AG
- BERNEY Jean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-RESOLVED CATHODOLUMINESCENCE SAMPLE PROBING
- Publication number 20220020559
- Publication date Jan 20, 2022
- ATTOLIGHT AG
- Christian Monachon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR WAVELENGTH RESOLVED ANGULAR RESOLVED CATHODOLUMINESCENCE
- Publication number 20210210305
- Publication date Jul 8, 2021
- GATAN, INC.
- Michael Bertilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ALIGNMENT OF CATHODOLUMINESCENCE OPTICS
- Publication number 20210125807
- Publication date Apr 29, 2021
- GATAN, INC.
- John Andrew Hunt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for inspecting a sample using a plurality of c...
- Publication number 20200035447
- Publication date Jan 30, 2020
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR WAVELENGTH RESOLVED ANGULAR RESOLVED CATHODOLUMINESCENCE
- Publication number 20190371569
- Publication date Dec 5, 2019
- GATAN, INC.
- Michael Bertilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINED SEM-CL AND FIB-IOE MICROSCOPY
- Publication number 20190198288
- Publication date Jun 27, 2019
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE CHAMBER DEVICE FOR ELECTRON MICROSCOPE, AND ELECTRON MICROSC...
- Publication number 20180158645
- Publication date Jun 7, 2018
- Korea Research Institute of Standards and Science
- Bok Lae CHO
- G02 - OPTICS
Information Patent Application
Apparatus and method for inspecting a sample using a plurality of c...
- Publication number 20170133198
- Publication date May 11, 2017
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER, OBSERVATION SYSTEM, AND IMAGE GENERATION METHOD
- Publication number 20170069458
- Publication date Mar 9, 2017
- Hitachi High-Technologies Corporation
- Minami SHOUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ANALYZING A SAMPLE AND CHARGED PARTICLE BEAM DEVICE FOR A...
- Publication number 20140197310
- Publication date Jul 17, 2014
- Edward Hill
- G01 - MEASURING TESTING
Information Patent Application
Multi-Color Nanoscale Imaging Based On Nanoparticle Cathodoluminesc...
- Publication number 20140194314
- Publication date Jul 10, 2014
- President and Fellows of Harvard College
- Ronald Walsworth
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING ANGULAR LUMINESCENCE IN A CHARGED P...
- Publication number 20140027632
- Publication date Jan 30, 2014
- GATAN, INC.
- David Stowe
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE LIGHT SOURCE MICROSCOPE
- Publication number 20130335817
- Publication date Dec 19, 2013
- Shinichiro Isobe
- G02 - OPTICS
Information Patent Application
METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANAL...
- Publication number 20130240728
- Publication date Sep 19, 2013
- Universitat De Barcelona
- Sonia Estrade Albiol
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND REPLACEABLE DOOR FOR A VACUUM CHAMBER OF S...
- Publication number 20130200262
- Publication date Aug 8, 2013
- DELMIC B.V.
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Application
Deconvolution of Time-Gated Cathodoluminescence Images
- Publication number 20130193342
- Publication date Aug 1, 2013
- ATTOLIGHT SA
- Jean Berney
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR COLLECTION OF CATHODOLUMINESCENCE SIGNALS
- Publication number 20130141803
- Publication date Jun 6, 2013
- GATAN, INC.
- Simon Galloway
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SAMPLE ANALYSIS BY THREE DIMENSIONAL CATHODOL...
- Publication number 20130140459
- Publication date Jun 6, 2013
- GATAN, INC.
- Simon Galloway
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE BEAM SYSTEM HAVING A HOLLOW LIGHT GUIDE
- Publication number 20130075604
- Publication date Mar 28, 2013
- Carl Zeiss Microscopy Ltd.
- Stewart Bean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADJUSTABLE CATHODOLUMINESCENCE DETECTION SYSTEM AND MICROSCOPE EMPL...
- Publication number 20130068966
- Publication date Mar 21, 2013
- Centre National de la Recherche Scientifique
- Mathieu Kociak
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Detection System
- Publication number 20120292508
- Publication date Nov 22, 2012
- JEOL Ltd.
- Masami Terauchi
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PROBING IN ELECTRON MICROSCOPES
- Publication number 20120138792
- Publication date Jun 7, 2012
- NANOFACTORY INSTRUMENTS AB
- Andrey Danilov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detection device and particle beam device having a detection device
- Publication number 20110220793
- Publication date Sep 15, 2011
- Christian Thomas
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20110168889
- Publication date Jul 14, 2011
- Dov Shachal
- G01 - MEASURING TESTING
Information Patent Application
Sample Inspection Apparatus, Sample Inspection Method and Sample In...
- Publication number 20100096549
- Publication date Apr 22, 2010
- JEOL Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspec...
- Publication number 20090314955
- Publication date Dec 24, 2009
- JEOL Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Inspection
- Publication number 20090256074
- Publication date Oct 15, 2009
- JEOL Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
Inspection Method and Reagent Solution
- Publication number 20090250609
- Publication date Oct 8, 2009
- JEOL Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING

Cathodoluminescence

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Time-resolved cathodoluminescence sample probing

Apparatus for wavelength resolved angular resolved cathodoluminescence

System and method for alignment of cathodoluminescence optics

Apparatus for wavelength resolved angular resolved cathodoluminescence

Apparatus and method for inspecting a sample using a plurality of c...

Combined SEM-CL and FIB-IOE microscopy

Apparatus and method for inspecting a sample using a plurality of c...

Sample chamber device for electron microscope, and electron microsc...

Holder device for electron microscope

Wide field atmospheric scanning electron microscope

Sample holder with light emitting and transferring elements for a c...

Multi-color nanoscale imaging based on nanoparticle cathodoluminesc...

Method and system for improving characteristic peak signals in anal...

Integrated optical and charged particle inspection apparatus

Adjustable cathodoluminescence detection system and microscope empl...

Method of analyzing a sample and charged particle beam device for a...

Diamond

Inspection apparatus and replaceable door for a vacuum chamber of s...

Deconvolution of time-gated cathodoluminescence images

Particle beam system having a hollow light guide

Detection device and particle beam device having a detection device

X-ray detection system

Scanning electron microscope, an interface and a method for observi...

Apparatus and method for inspecting sample

Specimen holder, specimen inspection apparatus, and specimen inspec...

Method and apparatus for simultaneous SEM and optical examination

Sample inspection apparatus, sample inspection method and sample in...

Inspection method and reagent solution

Specimen holder, specimen inspection apparatus, specimen inspection...

Particle-optical apparatus for simultaneous observing a sample with...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR INSPECTING A SAMPLE BY MEANS OF MULTIPLE C...

CATHODOLUMINESCENCE ELECTRON MICROSCOPE

TIME-RESOLVED CATHODOLUMINESCENCE SAMPLE PROBING

APPARATUS FOR WAVELENGTH RESOLVED ANGULAR RESOLVED CATHODOLUMINESCENCE

SYSTEM AND METHOD FOR ALIGNMENT OF CATHODOLUMINESCENCE OPTICS

Apparatus and method for inspecting a sample using a plurality of c...

APPARATUS FOR WAVELENGTH RESOLVED ANGULAR RESOLVED CATHODOLUMINESCENCE

COMBINED SEM-CL AND FIB-IOE MICROSCOPY

SAMPLE CHAMBER DEVICE FOR ELECTRON MICROSCOPE, AND ELECTRON MICROSC...

Apparatus and method for inspecting a sample using a plurality of c...

SAMPLE HOLDER, OBSERVATION SYSTEM, AND IMAGE GENERATION METHOD

METHOD OF ANALYZING A SAMPLE AND CHARGED PARTICLE BEAM DEVICE FOR A...

Multi-Color Nanoscale Imaging Based On Nanoparticle Cathodoluminesc...

SYSTEM AND METHOD FOR MEASURING ANGULAR LUMINESCENCE IN A CHARGED P...

MULTIPLE LIGHT SOURCE MICROSCOPE

METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANAL...

INSPECTION APPARATUS AND REPLACEABLE DOOR FOR A VACUUM CHAMBER OF S...

Deconvolution of Time-Gated Cathodoluminescence Images

APPARATUS FOR COLLECTION OF CATHODOLUMINESCENCE SIGNALS

SYSTEM AND METHOD FOR SAMPLE ANALYSIS BY THREE DIMENSIONAL CATHODOL...

PARTICLE BEAM SYSTEM HAVING A HOLLOW LIGHT GUIDE

ADJUSTABLE CATHODOLUMINESCENCE DETECTION SYSTEM AND MICROSCOPE EMPL...

X-Ray Detection System

OPTICAL PROBING IN ELECTRON MICROSCOPES

Detection device and particle beam device having a detection device

SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...

Sample Inspection Apparatus, Sample Inspection Method and Sample In...

Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspec...

Apparatus and Method for Inspection

Inspection Method and Reagent Solution