Cavities, resonators, free space arrangements, reflexion or interference arrangements

Industry

CPC
G01R27/2658

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Current Industry

G01R27/2658Cavities, resonators, free space arrangements, reflexion or interference arrangements

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Measuring device for determining a dielectric value
- Patent number 12,000,787
- Issue date Jun 4, 2024
- ENDRESS+HAUSER SE+CO.KG
- Thomas Blödt
- G01 - MEASURING TESTING
Information Patent Grant
Automated resonant waveguide cavity system for complex permittivity...
- Patent number 11,726,121
- Issue date Aug 15, 2023
- Duane Karns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitive sensing active electromagnetic emission cancellation
- Patent number 11,029,349
- Issue date Jun 8, 2021
- Synaptics Incorporated
- Robert J. Bolender
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for measuring absorbent hygiene products
- Patent number 10,852,252
- Issue date Dec 1, 2020
- TEWS Elektronik GmbH & Co. KG
- Udo Schlemm
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Sensor circuit
- Patent number 10,578,574
- Issue date Mar 3, 2020
- SHARP KABUSHIKI KAISHA
- Takeshi Mitsunaka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring dielectric constant
- Patent number 9,234,925
- Issue date Jan 12, 2016
- Korea Advanced Institute of Science and Technology
- Seong-Ook Park
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining phase fractions of multiphase...
- Patent number 9,146,197
- Issue date Sep 29, 2015
- Taylor Hobson Limited
- Jin-lin Hu
- G01 - MEASURING TESTING
Information Patent Grant
Microwave cavity with dielectric region and method thereof
- Patent number 9,013,191
- Issue date Apr 21, 2015
- The United States of America as represented by the Secretary of the Army
- Daniel M. Potrepka
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive determination of electromagnetic properties
- Patent number 8,400,166
- Issue date Mar 19, 2013
- The Boeing Company
- William Preston Geren
- G01 - MEASURING TESTING
Information Patent Grant
Scanning nanotube probe device and associated method
- Patent number 7,721,347
- Issue date May 18, 2010
- RF Nano Corporation
- Peter J. Burke
- G01 - MEASURING TESTING
Information Patent Grant
RF waveguide mode suppression in cavities used for measurement of d...
- Patent number 7,602,193
- Issue date Oct 13, 2009
- L-3 Communications Corporation
- J. Mark Baird
- G01 - MEASURING TESTING
Information Patent Grant
Method for quickly quantifying the resistance of a thin film as a f...
- Patent number 7,552,018
- Issue date Jun 23, 2009
- The United States of America as represented by the Secretary of the Navy
- Aaron D. Lazarus
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring grammage
- Patent number 7,423,435
- Issue date Sep 9, 2008
- Oji Paper Co., Ltd.
- Hidetada Sawamoto
- D21 - PAPER-MAKING PRODUCTION OF CELLULOSE
Information Patent Grant
Capacitance probe for thin dielectric film characterization
- Patent number 7,385,405
- Issue date Jun 10, 2008
- Veeco Instruments, Inc.
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Device to detect and measure the concentration and characterization...
- Patent number 7,034,549
- Issue date Apr 25, 2006
- The United States of America as represented by the Secretary of the Navy
- Robert E. Richardson, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance probe for thin dielectric film characterization
- Patent number 7,001,785
- Issue date Feb 21, 2006
- Veeco Instruments, Inc.
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Noncontact measuring system for electrical conductivity
- Patent number 6,879,167
- Issue date Apr 12, 2005
- Tohoku Techno Arch Co., Ltd.
- Yang Ju
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for precision measurement of microwave material propertie...
- Patent number 6,864,690
- Issue date Mar 8, 2005
- The United States of America as represented by the Secretary of the Army
- Steven C. Tidrow
- G01 - MEASURING TESTING
Information Patent Grant
Quasi-hemispherical fabry-perot resonator and method of operating t...
- Patent number 6,605,949
- Issue date Aug 12, 2003
- Forschungszentrum Karlsruhe GmbH
- Roland Heidinger
- G01 - MEASURING TESTING
Information Patent Grant
Fluid measurement of dielectric property change in hydraulic fluid
- Patent number 5,994,906
- Issue date Nov 30, 1999
- Caterpillar Inc.
- Dennis E. Morgan
- F15 - FLUID-PRESSURE ACTUATORS HYDRAULICS OR PNEUMATICS IN GENERAL
Information Patent Grant
Measuring apparatus and method of a permittivity of a dielectric ma...
- Patent number 5,744,970
- Issue date Apr 28, 1998
- LG Electronics Inc.
- Ki Chai Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for ascertaining the complex dielectric constant of tobacco
- Patent number 5,736,864
- Issue date Apr 7, 1998
- Hauni Maschinenbau AG
- Henning Moller
- A24 - TOBACCO CIGARS CIGARETTES SMOKERS' REQUISITES
Information Patent Grant
Mixed fluid time domain reflectometry sensors
- Patent number 5,723,979
- Issue date Mar 3, 1998
- Charles L. Mohr
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring electromagnetic radiation absorption
- Patent number 5,698,978
- Issue date Dec 16, 1997
- Northrop Grumman Corporation
- Phillip H. Darling
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for use in determining surface conductivity at microwave...
- Patent number 5,594,351
- Issue date Jan 14, 1997
- The United States of America as represented by the administrator of the Natio...
- Chase P. Hearn
- G01 - MEASURING TESTING
Information Patent Grant
Mixed fluid time domain reflectometry sensors
- Patent number 5,554,936
- Issue date Sep 10, 1996
- Charles L. Mohr
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for unobtrusively measuring physical properties i...
- Patent number 5,537,042
- Issue date Jul 16, 1996
- ELDEC Corporation
- Jon F. Beutler
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric constant measuring method and apparatus
- Patent number 5,532,604
- Issue date Jul 2, 1996
- New Oji Paper Co. Ltd.
- Shinichi Nagata
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the measurement of the dielectric constant...
- Patent number 5,500,599
- Issue date Mar 19, 1996
- Nu-Tech GmbH
- Gerd Stange
- G01 - MEASURING TESTING
Information Patent Grant
Microwave sensor for identifying the surface properties of a workpi...
- Patent number 5,497,098
- Issue date Mar 5, 1996
- McDonnell Douglas Corporation
- Garret G. Heil
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIELECTRIC CHARACTERISTIC MEASUREMENT METHOD AND DIELECTRIC CHARACT...
- Publication number 20240168071
- Publication date May 23, 2024
- EM labs, Inc.
- Yoshiyuki YANAGIMOTO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED RESONANT WAVEGUIDE CAVITY SYSTEM FOR COMPLEX PERMITTIVITY...
- Publication number 20220170972
- Publication date Jun 2, 2022
- Battelle Memorial Institute
- Duane Karns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITIVE SENSING ACTIVE ELECTROMAGNETIC EMISSION CANCELLATION
- Publication number 20200300900
- Publication date Sep 24, 2020
- SYNAPTICS INCORPORATED
- Robert J. Bolender
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING DIELECTRIC CONSTANT
- Publication number 20140361791
- Publication date Dec 11, 2014
- Seong-Ook PARK
- G01 - MEASURING TESTING
Information Patent Application
MICROWAVE CAVITY WITH DIELECTRIC REGION AND METHOD THEREOF
- Publication number 20130063158
- Publication date Mar 14, 2013
- U.S. Government as represented by the Secretary of Army
- DANIEL M. POTREPKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING PHASE FRACTIONS OF MULTIPHASE...
- Publication number 20120111124
- Publication date May 10, 2012
- TAYLOR HOBSON LIMITED
- Jin-lin Hu
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE DETERMINATION OF ELECTROMAGNETIC PROPERTIES
- Publication number 20100277184
- Publication date Nov 4, 2010
- The Boeing Company
- William Preston Geren
- G01 - MEASURING TESTING
Information Patent Application
SCANNING NANOTUBE PROBE DEVICE AND ASSOCIATED METHOD
- Publication number 20090055977
- Publication date Feb 26, 2009
- Peter J. Burke
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring grammage
- Publication number 20060288782
- Publication date Dec 28, 2006
- OJI PAPER CO., LTD.
- Hidetada Sawamoto
- G01 - MEASURING TESTING
Information Patent Application
Capacitance probe for thin dielectric film characterization
- Publication number 20060183255
- Publication date Aug 17, 2006
- Veeco Instruments, Inc.
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Application
Resonator housing for microwaves
- Publication number 20050225332
- Publication date Oct 13, 2005
- Hauni Maschinenbau AG
- Dierk Schroder
- G01 - MEASURING TESTING
Information Patent Application
Device to detect and measure the concentration and characterization...
- Publication number 20050218909
- Publication date Oct 6, 2005
- Government of the United States of America as represented by the Secretary of...
- Robert E. Richardson
- G01 - MEASURING TESTING
Information Patent Application
Method and system for measuring thickness of thin films with automa...
- Publication number 20040227524
- Publication date Nov 18, 2004
- Boris Kesil
- G01 - MEASURING TESTING
Information Patent Application
Noncontact measuring system for electrical conductivity
- Publication number 20040100280
- Publication date May 27, 2004
- TOHOKU TECHNO ARCH CO., LTD.
- Yang Ju
- G01 - MEASURING TESTING
Information Patent Application
Quasi-hemispherical fabry-perot resonator and method of operating t...
- Publication number 20010008378
- Publication date Jul 19, 2001
- Roland Heidinger
- G01 - MEASURING TESTING

Cavities, resonators, free space arrangements, reflexion or interference arrangements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measuring device for determining a dielectric value

Automated resonant waveguide cavity system for complex permittivity...

Capacitive sensing active electromagnetic emission cancellation

Device and method for measuring absorbent hygiene products

Sensor circuit

Apparatus and method for measuring dielectric constant

Method and apparatus for determining phase fractions of multiphase...

Microwave cavity with dielectric region and method thereof

Non-destructive determination of electromagnetic properties

Scanning nanotube probe device and associated method

RF waveguide mode suppression in cavities used for measurement of d...

Method for quickly quantifying the resistance of a thin film as a f...

Method and apparatus for measuring grammage

Capacitance probe for thin dielectric film characterization

Device to detect and measure the concentration and characterization...

Capacitance probe for thin dielectric film characterization

Noncontact measuring system for electrical conductivity

Apparatus for precision measurement of microwave material propertie...

Quasi-hemispherical fabry-perot resonator and method of operating t...

Fluid measurement of dielectric property change in hydraulic fluid

Measuring apparatus and method of a permittivity of a dielectric ma...

Apparatus for ascertaining the complex dielectric constant of tobacco

Mixed fluid time domain reflectometry sensors

System and method for measuring electromagnetic radiation absorption

Apparatus for use in determining surface conductivity at microwave...

Mixed fluid time domain reflectometry sensors

Method and system for unobtrusively measuring physical properties i...

Dielectric constant measuring method and apparatus

Method and apparatus for the measurement of the dielectric constant...

Microwave sensor for identifying the surface properties of a workpi...

Patents Applicationslast 30 patents

DIELECTRIC CHARACTERISTIC MEASUREMENT METHOD AND DIELECTRIC CHARACT...

AUTOMATED RESONANT WAVEGUIDE CAVITY SYSTEM FOR COMPLEX PERMITTIVITY...

CAPACITIVE SENSING ACTIVE ELECTROMAGNETIC EMISSION CANCELLATION

APPARATUS AND METHOD FOR MEASURING DIELECTRIC CONSTANT

MICROWAVE CAVITY WITH DIELECTRIC REGION AND METHOD THEREOF

METHOD AND APPARATUS FOR DETERMINING PHASE FRACTIONS OF MULTIPHASE...

NON-DESTRUCTIVE DETERMINATION OF ELECTROMAGNETIC PROPERTIES

SCANNING NANOTUBE PROBE DEVICE AND ASSOCIATED METHOD

Method and apparatus for measuring grammage

Capacitance probe for thin dielectric film characterization

Resonator housing for microwaves

Device to detect and measure the concentration and characterization...

Method and system for measuring thickness of thin films with automa...

Noncontact measuring system for electrical conductivity

Quasi-hemispherical fabry-perot resonator and method of operating t...