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Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
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G01R27/00
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
Current Industry
G01R27/00
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
Sub Industries
G01R27/02
Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom
G01R27/025
Measuring very high resistances, e.g. isolation resistances
G01R27/04
in circuits having distributed constants
G01R27/06
Measuring reflection coefficients Measuring standing-wave ratio
G01R27/08
Measuring resistance by measuring both voltage and current
G01R27/10
using two-coil or crossed-coil instruments forming quotient
G01R27/12
using hand generators
G01R27/14
Measuring resistance by measuring current or voltage obtained from a reference source
G01R27/16
Measuring impedance of element or network through which a current is passing from another source
G01R27/18
Measuring resistance to earth
G01R27/20
Measuring earth resistance Measuring contact resistance
G01R27/205
Measuring contact resistance of connections
G01R27/22
Measuring resistance of fluids
G01R27/26
Measuring inductance or capacitance Measuring quality factor
G01R27/2605
Measuring capacitance
G01R27/2611
Measuring inductance
G01R27/2617
Measuring dielectric properties
G01R27/2623
Measuring-systems or electronic circuits
G01R27/2629
Bridge circuits
G01R27/2635
Sample holders, electrodes or excitation arrangements
G01R27/2641
of plate type
G01R27/2647
of coaxial or concentric type
G01R27/2652
open-ended type
G01R27/2658
Cavities, resonators, free space arrangements, reflexion or interference arrangements
G01R27/2664
Transmission line, wave guide (closed or open-ended) or strip - or microstrip line arrangements
G01R27/267
Coils or antennae arrangements
G01R27/2676
Probes
G01R27/2682
using optical methods or electron beams
G01R27/2688
Measuring quality factor or dielectric loss
G01R27/2694
Measuring dielectric loss
G01R27/28
Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks
G01R27/30
with provision for recording characteristics
G01R27/32
in circuits having distributed constants
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Patents Grants
last 30 patents
Information
Patent Grant
Grounding impedance measuring circuit and grounding impedance measu...
Patent number
12,366,597
Issue date
Jul 22, 2025
HUNAN SMALL QUICK SMART ELECTRONIC TECHNOLOGY CO., LTD.
Xiu Lian Li
G01 - MEASURING TESTING
Information
Patent Grant
Touch screen sensor
Patent number
12,366,942
Issue date
Jul 22, 2025
3M Innovative Properties Company
Matthew H. Frey
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Interference detection and mitigation in inductive sensor applicati...
Patent number
12,366,932
Issue date
Jul 22, 2025
Cirrus Logic Inc.
Gregory C. Yancey
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
In-situ evaluation method and system for loess collapsibility based...
Patent number
12,360,070
Issue date
Jul 15, 2025
CHINA JIKAN RESEARCH INSTITUTE OF ENGINEERING INVESTIGATIONS AND DESIGN Co., Ltd
Jie Cao
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to generate an alert based on health of an ear...
Patent number
12,360,146
Issue date
Jul 15, 2025
Sonjib Banerjee
G08 - SIGNALLING
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Patent Grant
Device that includes a MEMS tunable filter and a method for operati...
Patent number
12,360,147
Issue date
Jul 15, 2025
UNISPECTRAL LTD.
Peleg Levin
G02 - OPTICS
Information
Patent Grant
Impedance measurement circuit and impedance measurement method thereof
Patent number
12,360,551
Issue date
Jul 15, 2025
Taiwan Semiconductor Manufacturing Company, Ltd
Tsung-Che Lu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Interactive test equipment for quality evaluation of power transformer
Patent number
12,360,177
Issue date
Jul 15, 2025
Po-Cheng Ko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Capacitance measurement circuit
Patent number
12,352,794
Issue date
Jul 8, 2025
Guangzhou University
Yanhan Zeng
G01 - MEASURING TESTING
Information
Patent Grant
Substrate inspection apparatus and substrate inspection method
Patent number
12,352,808
Issue date
Jul 8, 2025
Samsung Electronics Co., Ltd.
Sekye Jeon
G01 - MEASURING TESTING
Information
Patent Grant
Devices and methods for smart sensor application
Patent number
12,352,806
Issue date
Jul 8, 2025
Analog Devices International Unlimited Company
GuangYang Qu
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for determining the temperature of a resistance heating d...
Patent number
12,351,002
Issue date
Jul 8, 2025
Gentherm GmbH
Dávid Szabolcs Simon
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Downhole fault detection in well system using spread spectrum time...
Patent number
12,352,158
Issue date
Jul 8, 2025
Halliburton Energy Services, Inc.
Jonathon N. Joubran
E21 - EARTH DRILLING MINING
Information
Patent Grant
Removing test equipment intermodulation interference and noise from...
Patent number
12,345,748
Issue date
Jul 1, 2025
LITEPOINT CORPORATION
Chen Cao
G01 - MEASURING TESTING
Information
Patent Grant
High-bandwidth coaxial interface test fixture
Patent number
12,345,778
Issue date
Jul 1, 2025
NVIDIA Corporation
Yongwei Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inductance detection for power converters
Patent number
12,339,303
Issue date
Jun 24, 2025
Texas Instruments Incorporated
Rengang Chen
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Power conversion device, estimation device, and estimation method
Patent number
12,341,446
Issue date
Jun 24, 2025
Kabushiki Kaisha Yaskawa Denki
Keita Shimamoto
G01 - MEASURING TESTING
Information
Patent Grant
Device for controlling trapped ions having an electrode circuitry c...
Patent number
12,339,329
Issue date
Jun 24, 2025
Infineon Technologies Austria AG
Clemens Roessler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measuring method of resistivity of a wafer
Patent number
12,334,403
Issue date
Jun 17, 2025
ZING SEMICONDUCTOR CORPORATION
Xing Wei
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Drift suppression method, proximity sensor and wireless device
Patent number
12,332,092
Issue date
Jun 17, 2025
Semtech Corporation
Chaouki Rouaissia
G01 - MEASURING TESTING
Information
Patent Grant
Through substrate via (TSV) validation structure for an integrated...
Patent number
12,334,416
Issue date
Jun 17, 2025
NXP USA, INC.
Darrell Glenn Hill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Techniques for testing PLP capacitors
Patent number
12,332,710
Issue date
Jun 17, 2025
Kioxia Corporation
Paul Abrahams
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for estimating neutral impedance and detecting...
Patent number
12,332,288
Issue date
Jun 17, 2025
Aclara Technologies LLC
Gregory Berchin
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for power theft detection
Patent number
12,332,289
Issue date
Jun 17, 2025
Duke Energy Corporation, A-PLUS Community Solutions, Inc.
Ron K. Wages
G01 - MEASURING TESTING
Information
Patent Grant
Inductive sensing methods, devices and systems
Patent number
12,326,467
Issue date
Jun 10, 2025
Cypress Semiconductor Corporation
Andriy Maharyta
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Display substrates, display apparatuses and methods of detecting cr...
Patent number
12,326,412
Issue date
Jun 10, 2025
Chengdu BOE Optoelectronics Technology Co., Ltd.
Tingliang Liu
G01 - MEASURING TESTING
Information
Patent Grant
Combined processing of borehole imagers and dielectric tools
Patent number
12,326,389
Issue date
Jun 10, 2025
Halliburton Energy Services, Inc.
Ahmed Fouda
E21 - EARTH DRILLING MINING
Information
Patent Grant
Self-calibration system and procedure for autonomous loop and groun...
Patent number
12,320,884
Issue date
Jun 3, 2025
APLICACIONES TECNOLOGICAS, S.A.
Verónica Pomar Pedredo
G01 - MEASURING TESTING
Information
Patent Grant
Aerosol-generating device for detecting insertion of aerosol-genera...
Patent number
12,317,935
Issue date
Jun 3, 2025
KT & G Corporation
Yong Hwan Kim
A24 - TOBACCO CIGARS CIGARETTES SMOKERS' REQUISITES
Information
Patent Grant
Measurement systems and associated techniques for sensing electrica...
Patent number
12,320,795
Issue date
Jun 3, 2025
NanoDX, Inc.
Sergey A. Dryga
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DETERMINING INTERFERENCE IN A TEST CHANNEL
Publication number
20250237727
Publication date
Jul 24, 2025
LitePoint Corporation
Chen Cao
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC APPARATUS
Publication number
20250240888
Publication date
Jul 24, 2025
SAMSUNG DISPLAY CO., LTD.
JAEJIN OH
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
PROTECTIVE EARTH MONITORING SYSTEM AND METHOD
Publication number
20250237685
Publication date
Jul 24, 2025
HELLA GmbH & Co. KGaA
Alan Wayne Brown
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Indirect, Accurate, and Linear Fluid Level and Moisture Concentrati...
Publication number
20250231134
Publication date
Jul 17, 2025
Robert J Bowman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Power Quality Measurement for a Grid-Connected Generator System
Publication number
20250231229
Publication date
Jul 17, 2025
CATERPILLAR ENERGY SOLUTIONS GMBH
Assiet AREN
G01 - MEASURING TESTING
Information
Patent Application
High-bandwidth Vector Network Analyzer System for Transmitting and...
Publication number
20250231268
Publication date
Jul 17, 2025
Transcom (Shanghai) Technology Co., Ltd.
Shuang CHEN
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
VEHICLE CHARGING STATION AND METHOD OF MONITORING A CONNECTOR OF A...
Publication number
20250222816
Publication date
Jul 10, 2025
ABB E-mobility B.V.
Sebastian Dreier-Schmidt
B60 - VEHICLES IN GENERAL
Information
Patent Application
ELECTRONIC DEVICE AND IMPEDANCE MEASUREMENT METHOD
Publication number
20250227836
Publication date
Jul 10, 2025
InnoLux Corporation
Cheng-Yeh TSAO
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
DISPLAY DEVICE AND TEST METHOD THEREFOR
Publication number
20250224432
Publication date
Jul 10, 2025
Xiamen Tianma Optoelectronics Co., Ltd.
Zhongming CAI
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
MEASUREMENT INSTRUMENT
Publication number
20250224433
Publication date
Jul 10, 2025
ROHDE &SCHWARZ GMBH & CO. KG
Susanne HIRSCHMANN
G01 - MEASURING TESTING
Information
Patent Application
PHASE DISCRIMINATOR FOR REFLECTED WAVES AND OPERATING METHOD THEREOF
Publication number
20250216430
Publication date
Jul 3, 2025
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Seunghyun JANG
G01 - MEASURING TESTING
Information
Patent Application
CAPACITANCE MEASUREMENT METHOD FOR A CAPACITIVE DEVICE
Publication number
20250216431
Publication date
Jul 3, 2025
United Microelectronics Corp.
Pei Chieh Chiu
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR EVALUATING DIELECTRIC LOSSES IN HVDC ELECTRIC...
Publication number
20250208181
Publication date
Jun 26, 2025
PRYSMIAN S.P.A.
Giuseppe RIZZO
G01 - MEASURING TESTING
Information
Patent Application
MEASURING ARRANGEMENT AND MEASURING METHOD FOR MEASURING A LOOP IMP...
Publication number
20250208180
Publication date
Jun 26, 2025
BENDER GMBH & CO. KG
Julian Reitz
G01 - MEASURING TESTING
Information
Patent Application
DEGRADATION FACTOR ESTIMATION DEVICE, DEGRADATION FACTOR DIAGNOSIS...
Publication number
20250211167
Publication date
Jun 26, 2025
Hitachi, Ltd
Toru KOUNO
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
STORAGE BATTERY, BATTERY UNIT AND BATTERY MONITORING DEVICE
Publication number
20250201953
Publication date
Jun 19, 2025
DENSO CORPORATION
Minoru OKAMIYA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CAPACITIVE SENSOR AND METHOD FOR OPERATING A CAPACITIVE SENSOR
Publication number
20250199041
Publication date
Jun 19, 2025
ROBERT BOSCH GmbH
David Slogsnat
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DETECTION METHOD FOR DETECTING A VEHICLE WITHIN AN AREA
Publication number
20250196901
Publication date
Jun 19, 2025
ALSTOM HOLDINGS
Andrea PASQUALIS
B61 - RAILWAYS
Information
Patent Application
BATTERY PACK, DETECTION METHOD THEREOF, AND BATTERY MANAGEMENT SYSTEM
Publication number
20250201942
Publication date
Jun 19, 2025
Huawei Digital Power Technologies Co., Ltd.
Cheng Xiong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IR DROP COMPENSATION
Publication number
20250202461
Publication date
Jun 19, 2025
International Business Machines Corporation
Takeo Yasuda
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
PIXELATED CAPACITOR SENSOR CHARGE SHARING READOUT SYSTEM
Publication number
20250198961
Publication date
Jun 19, 2025
NXP B.V.
Alphons Litjes
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR DETERMINING AN ELECTRICAL PARAMETER OF A BUS BAR
Publication number
20250199033
Publication date
Jun 19, 2025
Volvo Car Corporation
Kenneth ANDERSSON
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR CHIP
Publication number
20250199042
Publication date
Jun 19, 2025
Sony Semiconductor Solutions Corporation
Yuta TOEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Circuit arrangement for evaluating an output signal, and sensor device
Publication number
20250189611
Publication date
Jun 12, 2025
Balluff GmbH
Marton Palmann
G01 - MEASURING TESTING
Information
Patent Application
CIRCUITS AND METHODS TO CALIBRATE MIRROR DISPLACEMENT
Publication number
20250189291
Publication date
Jun 12, 2025
TEXAS INSTRUMENTS INCORPORATED
Robert Floyd Payne
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
METHOD FOR MEASURING THE PHASE OF A COMPLEX IMPEDANCE
Publication number
20250189566
Publication date
Jun 12, 2025
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Esteban CABANILLAS
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF MEASURING FUSE RESISTANCE AND NON-TRANSITORY C...
Publication number
20250189568
Publication date
Jun 12, 2025
NANYA TECHNOLOGY CORPORATION
Mei Chuan PENG
G01 - MEASURING TESTING
Information
Patent Application
MEASURING THE PHASE OF A COMPLEX IMPEDANCE THROUGH THRESHOLDING
Publication number
20250189567
Publication date
Jun 12, 2025
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Esteban CABANILLAS
G01 - MEASURING TESTING
Information
Patent Application
MOTOR CONTROL SYSTEM
Publication number
20250189586
Publication date
Jun 12, 2025
Rohm Co., Ltd.
Naoyuki Usagawa
G01 - MEASURING TESTING
Information
Patent Application
Current reference operative drive-sense circuit (DSC) with voltage...
Publication number
20250190070
Publication date
Jun 12, 2025
SIGMASENSE, LLC.
Patrick Troy Gray
G06 - COMPUTING CALCULATING COUNTING