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Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
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G01R27/00
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
Current Industry
G01R27/00
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
Sub Industries
G01R27/02
Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom
G01R27/025
Measuring very high resistances, e.g. isolation resistances
G01R27/04
in circuits having distributed constants
G01R27/06
Measuring reflection coefficients Measuring standing-wave ratio
G01R27/08
Measuring resistance by measuring both voltage and current
G01R27/10
using two-coil or crossed-coil instruments forming quotient
G01R27/12
using hand generators
G01R27/14
Measuring resistance by measuring current or voltage obtained from a reference source
G01R27/16
Measuring impedance of element or network through which a current is passing from another source
G01R27/18
Measuring resistance to earth
G01R27/20
Measuring earth resistance Measuring contact resistance
G01R27/205
Measuring contact resistance of connections
G01R27/22
Measuring resistance of fluids
G01R27/26
Measuring inductance or capacitance Measuring quality factor
G01R27/2605
Measuring capacitance
G01R27/2611
Measuring inductance
G01R27/2617
Measuring dielectric properties
G01R27/2623
Measuring-systems or electronic circuits
G01R27/2629
Bridge circuits
G01R27/2635
Sample holders, electrodes or excitation arrangements
G01R27/2641
of plate type
G01R27/2647
of coaxial or concentric type
G01R27/2652
open-ended type
G01R27/2658
Cavities, resonators, free space arrangements, reflexion or interference arrangements
G01R27/2664
Transmission line, wave guide (closed or open-ended) or strip - or microstrip line arrangements
G01R27/267
Coils or antennae arrangements
G01R27/2676
Probes
G01R27/2682
using optical methods or electron beams
G01R27/2688
Measuring quality factor or dielectric loss
G01R27/2694
Measuring dielectric loss
G01R27/28
Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks
G01R27/30
with provision for recording characteristics
G01R27/32
in circuits having distributed constants
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last 30 patents
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Patent Grant
Theft detection and prevention in a power generation system
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Issue date
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Time-domain reflectometry protocol for sensors
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G01 - MEASURING TESTING
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Issue date
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B60 - VEHICLES IN GENERAL
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Electronic apparatus
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Issue date
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Solutionless sensor calibration
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Issue date
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G01 - MEASURING TESTING
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System and method for determining the impedance properties of a loa...
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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Issue date
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H01 - BASIC ELECTRIC ELEMENTS
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H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Inductance measurement circuits and methods using auto-adaptive flo...
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Issue date
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G01 - MEASURING TESTING
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On-die channel impedance verification
Patent number
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Issue date
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G06 - COMPUTING CALCULATING COUNTING
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Efficient wireless power charging apparatus and method thereof
Patent number
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Issue date
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ETA ELECTRONICS CO., LTD.
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H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Noise measurements with a capacitance sensor
Patent number
12,287,940
Issue date
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G06 - COMPUTING CALCULATING COUNTING
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Common mode evaluation in a differential galvanic isolation signal...
Patent number
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Issue date
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G01 - MEASURING TESTING
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Patent Grant
Measurement method for impedance of converter at multiple operating...
Patent number
12,276,683
Issue date
Apr 15, 2025
Zhejiang University
Pengfei Hu
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Apparatus for determination of capacitive and resistive characteris...
Patent number
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Issue date
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G11 - INFORMATION STORAGE
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Methods and systems for estimating coil impedance of an electromagn...
Patent number
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Issue date
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Cirrus Logic Inc.
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G01 - MEASURING TESTING
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Method and apparatus for determining cable length for plasma proces...
Patent number
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Issue date
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G01 - MEASURING TESTING
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Issue date
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B60 - VEHICLES IN GENERAL
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Component identification coding and reading
Patent number
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Issue date
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Patent Grant
Measuring the impedance in grounding systems
Patent number
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Issue date
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H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Calibration of the external resistance value in the power sourcing...
Patent number
12,270,843
Issue date
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H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Device, system, and method for double-circuit transmission systems
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Issue date
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H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Resistance measuring structures of stacked devices
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Issue date
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H01 - BASIC ELECTRIC ELEMENTS
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Inductive broad-band sensors for electromagnetic waves
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Issue date
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H01 - BASIC ELECTRIC ELEMENTS
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Ground conductor monitoring
Patent number
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Issue date
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WAGO Verwaltungsgesellschaft mbH
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G01 - MEASURING TESTING
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last 30 patents
Information
Patent Application
APPARATUS AND METHOD FOR GROUND FAULT MONITORING
Publication number
20250164577
Publication date
May 22, 2025
Advanced Energy Industries, Inc.
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H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Patent Application
METHOD AND DEVICE FOR ESTIMATING IMPEDANCE OF CONVERTER OUTPUT ELEMENT
Publication number
20250164534
Publication date
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G01 - MEASURING TESTING
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20250155482
Publication date
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HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
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G01 - MEASURING TESTING
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ISOLATION DETECTION
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Publication date
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G01 - MEASURING TESTING
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MEASUREMENT OF TISSUE VIABILITY
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A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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G01 - MEASURING TESTING
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SEMICONDUCTOR MEASUREMENT DEVICE AND SEMICONDUCTOR MEASUREMENT METHOD
Publication number
20250155483
Publication date
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RENESAS ELECTRONICS CORPORATION
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G01 - MEASURING TESTING
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BATTERY MONITORING SYSTEMS WITH DIRECT ELECTRICAL CONNECTION FOR CA...
Publication number
20250158254
Publication date
May 15, 2025
GM GLOBAL TECHNOLOGY OPERATIONS LLC
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G01 - MEASURING TESTING
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METHOD AND APPARATUS WITH FREQUENCY CHARACTERISTICS ANALYSIS OF PRI...
Publication number
20250155484
Publication date
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Doyun KIM
G01 - MEASURING TESTING
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Patent Application
RATING SUBSTRATE SUPPORT ASSEMBLIES BASED ON IMPEDANCE CIRCUIT ELEC...
Publication number
20250157788
Publication date
May 15, 2025
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G06 - COMPUTING CALCULATING COUNTING
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FERROELECTRIC SENSOR
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20250146880
Publication date
May 8, 2025
TDK Electronics AG
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B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
APPARATUS FOR INSPECTING INSULATION STATE OF PHOTOVOLTAIC MODULE, A...
Publication number
20250150033
Publication date
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H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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SYSTEM AND METHOD OF MEASURING CAPACITANCE OF DEVICE-UNDER-TEST
Publication number
20250147086
Publication date
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MAO-HSUAN CHOU
G01 - MEASURING TESTING
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EMBEDDED COPLANAR WAVEGUIDES FOR THIN-FILM MATERIAL CHARACTERIZATIO...
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20250141078
Publication date
May 1, 2025
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H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
METHODS AND APPARATUS FOR IN-SITU MEASUREMENT OF MUTUTAL INDUCTANCE...
Publication number
20250138071
Publication date
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H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
METHOD FOR INSULATION MONITORING AND INSULATION MONITORING DEVICE W...
Publication number
20250138068
Publication date
May 1, 2025
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H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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ELECTRONIC DEVICE HAVING A TESTING METHOD FOR DETERMINING DEFECTS I...
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20250138070
Publication date
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G06 - COMPUTING CALCULATING COUNTING
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SIGNAL PROCESSING CIRCUIT AND MEASUREMENT SYSTEM
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20250138072
Publication date
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H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Application
CIRCUITS AND METHODS FOR SHUNT RESISTANCE MEASUREMENT
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20250138069
Publication date
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ALLEGRO MICROSYSTEMS, LLC
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G01 - MEASURING TESTING
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Patent Application
CIRCUIT FOR OPERATING A CAPACITIVE SENSOR AND SENSOR APPARATUS
Publication number
20250130260
Publication date
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B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
CONFIGURABLE RADIO FREQUENCY SYSTEM
Publication number
20250130273
Publication date
Apr 24, 2025
ROHDE & SCHWARZ GMBH & CO. KG
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G01 - MEASURING TESTING
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20250129942
Publication date
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G01 - MEASURING TESTING
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POWER VECTOR ANALYZER
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20250130279
Publication date
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Tektronix, Inc.
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G01 - MEASURING TESTING
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ELECTRICAL IMPEDANCE SPECTROSCOPY
Publication number
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Publication date
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G01 - MEASURING TESTING
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Publication date
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G06 - COMPUTING CALCULATING COUNTING
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Patent Application
MONITOR STRUCTURES FOR MEASURING DEVICE IMPEDANCE
Publication number
20250123316
Publication date
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TEXAS INSTRUMENTS INCORPORATED
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G01 - MEASURING TESTING
Information
Patent Application
CIRCUITRY FOR MEASUREMENT OF ELECTROCHEMICAL CELLS
Publication number
20250116691
Publication date
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Cirrus Logic International Semiconductor Ltd.
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G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION SYSTEM AND CALIBRATION METHOD FOR A VECTOR NETWORK ANAL...
Publication number
20250116746
Publication date
Apr 10, 2025
ROHDE & SCHWARZ GMBH & CO. KG
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G01 - MEASURING TESTING
Information
Patent Application
SENSOR CIRCUIT HAVING A COMPENSATING RESISTOR FOR COMPENSATING A TE...
Publication number
20250110160
Publication date
Apr 3, 2025
INFINEON TECHNOLOGIES AG
Michael EMMERT
G01 - MEASURING TESTING
Information
Patent Application
Transformer Test System and Method
Publication number
20250110191
Publication date
Apr 3, 2025
AVO MULTI-AMP CORPORATION D/B/A MEGGER
Oleh Iwanusiw
G01 - MEASURING TESTING