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Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
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CPC
G01R27/00
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
Current Industry
G01R27/00
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
Sub Industries
G01R27/02
Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom
G01R27/025
Measuring very high resistances, e.g. isolation resistances
G01R27/04
in circuits having distributed constants
G01R27/06
Measuring reflection coefficients Measuring standing-wave ratio
G01R27/08
Measuring resistance by measuring both voltage and current
G01R27/10
using two-coil or crossed-coil instruments forming quotient
G01R27/12
using hand generators
G01R27/14
Measuring resistance by measuring current or voltage obtained from a reference source
G01R27/16
Measuring impedance of element or network through which a current is passing from another source
G01R27/18
Measuring resistance to earth
G01R27/20
Measuring earth resistance Measuring contact resistance
G01R27/205
Measuring contact resistance of connections
G01R27/22
Measuring resistance of fluids
G01R27/26
Measuring inductance or capacitance Measuring quality factor
G01R27/2605
Measuring capacitance
G01R27/2611
Measuring inductance
G01R27/2617
Measuring dielectric properties
G01R27/2623
Measuring-systems or electronic circuits
G01R27/2629
Bridge circuits
G01R27/2635
Sample holders, electrodes or excitation arrangements
G01R27/2641
of plate type
G01R27/2647
of coaxial or concentric type
G01R27/2652
open-ended type
G01R27/2658
Cavities, resonators, free space arrangements, reflexion or interference arrangements
G01R27/2664
Transmission line, wave guide (closed or open-ended) or strip - or microstrip line arrangements
G01R27/267
Coils or antennae arrangements
G01R27/2676
Probes
G01R27/2682
using optical methods or electron beams
G01R27/2688
Measuring quality factor or dielectric loss
G01R27/2694
Measuring dielectric loss
G01R27/28
Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks
G01R27/30
with provision for recording characteristics
G01R27/32
in circuits having distributed constants
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Patents Grants
last 30 patents
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Patent Grant
Measuring instrument and measuring method
Patent number
12,222,379
Issue date
Feb 11, 2025
Tokyo Electron Limited
Takayuki Hatanaka
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance detection circuit and method, and electronic device
Patent number
12,224,745
Issue date
Feb 11, 2025
Tencent Technology (Shenzhen) Company Limited
Yuan Dai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Insulation resistance detection system for electric vehicle and ins...
Patent number
12,222,405
Issue date
Feb 11, 2025
Delta Electronics, Inc.
Chien-Yu Tseng
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Device and method for detecting defects of high-voltage cable cross...
Patent number
12,216,182
Issue date
Feb 4, 2025
STATE GRID JIANGSU ELECTRIC POWER CO., LTD. RESEARCH INSTITUTE
Jingying Cao
G01 - MEASURING TESTING
Information
Patent Grant
Gas sensors
Patent number
12,216,049
Issue date
Feb 4, 2025
Drager Safety AG & Co. KGaA
Håkon Sagberg
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting an insulation fault in a vehicle on-board elec...
Patent number
12,214,674
Issue date
Feb 4, 2025
VITESCO TECHNOLOGIES GBMH
Franz Pfeilschifter
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Battery measurement
Patent number
12,216,172
Issue date
Feb 4, 2025
CELLIFE TECHNOLOGIES OY
Roni Luhtala
G01 - MEASURING TESTING
Information
Patent Grant
Current reference operative drive-sense circuit (dsc) with voltage...
Patent number
12,216,862
Issue date
Feb 4, 2025
SIGMASENSE, LLC.
Patrick Troy Gray
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Vascular sap measurement sensor
Patent number
12,216,076
Issue date
Feb 4, 2025
National University Corporation Kagawa University
Fusao Shimokawa
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device having a testing method for determining defects i...
Patent number
12,216,144
Issue date
Feb 4, 2025
Samsung Display Co., Ltd.
Eunsol Seo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for accurate reference voltage trimming
Patent number
12,210,054
Issue date
Jan 28, 2025
Texas Instruments Incorporated
Kar Hou Chai
G01 - MEASURING TESTING
Information
Patent Grant
Ultra-fast coulomb blockade thermometer
Patent number
12,209,918
Issue date
Jan 28, 2025
Aalto University Foundation sr
Jukka Pekola
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining the electrical resistance of an electric sup...
Patent number
12,210,044
Issue date
Jan 28, 2025
Robert Bosch GmbH
Helmut Suelzle
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Piezoelectric device having a support with a neutral fiber
Patent number
12,209,913
Issue date
Jan 28, 2025
TDK ELECTRONICS AG
Sandro Kappert
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Impedance measurement jig and method of controlling a substrate-pro...
Patent number
12,210,045
Issue date
Jan 28, 2025
Samsung Electronics Co., Ltd.
Byeongsang Kim
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Wheatstone bridge high accuracy impedance sensing circuit with incr...
Patent number
12,203,965
Issue date
Jan 21, 2025
SIGMASENSE, LLC.
Phuong Huynh
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Rating substrate support assemblies based on impedance circuit elec...
Patent number
12,205,791
Issue date
Jan 21, 2025
Applied Materials, Inc.
Arvind Shankar Raman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Interconnect structure of semiconductor device
Patent number
12,207,571
Issue date
Jan 21, 2025
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Asami Nishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Impedance measurement
Patent number
12,203,967
Issue date
Jan 21, 2025
Nicholas Weiner
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive measurement method and apparatus for the turn-to-tu...
Patent number
12,196,792
Issue date
Jan 14, 2025
Shanghai Jiaotong University
Wei Wu
G01 - MEASURING TESTING
Information
Patent Grant
Current estimation in a power converter
Patent number
12,199,514
Issue date
Jan 14, 2025
Cirrus Logic Inc.
Malcolm Blyth
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for open-loop ignition of a smoke generator fue...
Patent number
12,196,423
Issue date
Jan 14, 2025
SharkNinja Operating LLC
Nicholas Chow
A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information
Patent Grant
Deriving a capacitance-ratio information, device and method
Patent number
12,196,793
Issue date
Jan 14, 2025
NXP B.V.
Harish Kundur Subramaniyan
G01 - MEASURING TESTING
Information
Patent Grant
Vector network analyzer with digital interface
Patent number
12,196,794
Issue date
Jan 14, 2025
Rohde & Schwarz GmbH & Co. KG
Steffen Heuel
G01 - MEASURING TESTING
Information
Patent Grant
Local oscillator (LO) generation for carrier aggregation in phased...
Patent number
12,191,897
Issue date
Jan 7, 2025
Intel Corporation
Ashoke Ravi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for testing a sensor, and electronic circuit
Patent number
12,189,016
Issue date
Jan 7, 2025
Robert Bosch GmbH
Domenico Tangredi
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for determining a position of a rotor of a three-...
Patent number
12,191,784
Issue date
Jan 7, 2025
Mitsubishi Electric Corporation
Nicolas Voyer
G01 - MEASURING TESTING
Information
Patent Grant
Calibration system and calibration method for a vector network anal...
Patent number
12,188,968
Issue date
Jan 7, 2025
Rohde & Schwarz GmbH & Co. KG
Maximilian Friesinger
G01 - MEASURING TESTING
Information
Patent Grant
Capacitive compensation for vertical interconnect accesses
Patent number
12,185,462
Issue date
Dec 31, 2024
Achronix Semiconductor Corporation
Hansel Desmond Dsilva
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Systems and methods for isolation resistance monitoring in a batter...
Patent number
12,181,503
Issue date
Dec 31, 2024
WISK AERO LLC
Hongxia Chen
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
RESISTIVE HEATING DEVICE
Publication number
20250048501
Publication date
Feb 6, 2025
Diamond Coatings Ltd
Jason Adrian EITE
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR ESTIMATING NEUTRAL IMPEDANCE AND DETECTING...
Publication number
20250044330
Publication date
Feb 6, 2025
ACLARA TECHNOLOGIES LLC
Gregory Berchin
G01 - MEASURING TESTING
Information
Patent Application
HIGH-FREQUENCY COMPONENT TEST DEVICE AND METHOD THEREOF
Publication number
20250044332
Publication date
Feb 6, 2025
Industrial Technology Research Institute
Sih-Han LI
G01 - MEASURING TESTING
Information
Patent Application
SWITCH WITH SERVICE LIFE INDICATOR
Publication number
20250044355
Publication date
Feb 6, 2025
Honeywell International Inc.
Fu XIANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR MEASURING HIGH VOLTAGE DEVICES USING A CORREC...
Publication number
20250044374
Publication date
Feb 6, 2025
Megger Sweden AB
Peter WERELIUS
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETERMINING A GROUNDING RESISTANCE, GROUNDING RESISTANCE...
Publication number
20250044331
Publication date
Feb 6, 2025
DEHN SE
Vikas Almadi
G01 - MEASURING TESTING
Information
Patent Application
TEST STRUCTURE AND METHOD FOR CALIBRATING GATE PARASITIC CAPACITANCE
Publication number
20250038054
Publication date
Jan 30, 2025
Shanghai Huali Integrated Circuit Corporation
Qianqian ZHANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
AUTOMATED ELECTRICAL CONNECTOR WEAR MONITORING
Publication number
20250035687
Publication date
Jan 30, 2025
International Business Machines Corporation
Shawn Matthew Johnston
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MEASURING DEVICE FOR CAPACITANCE OF SEMICONDUCTOR DEVICE AND MEASUR...
Publication number
20250035689
Publication date
Jan 30, 2025
Mitsubishi Electric Corporation
Masayoshi HIRAO
G01 - MEASURING TESTING
Information
Patent Application
Capacitance Measurement Circuitry for a Resonant Tank
Publication number
20250035688
Publication date
Jan 30, 2025
Apple Inc.
Timo W. Gossmann
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS WITH MAGNETIC BODY MEASUREMENT
Publication number
20250035719
Publication date
Jan 30, 2025
Samsung Electronics Co., Ltd.
Jae Sung YOON
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC FIELD GENERATION
Publication number
20250025062
Publication date
Jan 23, 2025
HM TECHNOLOGY INTERNATIONAL LIMITED
Hrand Mami MAMIGONIANS
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD AND APPARATUS FOR DETECTING INSULATION IMPEDANCE OF DIRECT C...
Publication number
20250027978
Publication date
Jan 23, 2025
HOYMILES POWER ELECTRONICS INC.
Bingwen WENG
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
CHARGING STATION HEALTH MONITORING DEVICE AND METHOD
Publication number
20250028011
Publication date
Jan 23, 2025
TE Connectivity Solutions GMBH
Ram Kishore Venkatesan
B60 - VEHICLES IN GENERAL
Information
Patent Application
MEASUREMENT DEVICE FOR CHARACTERIZING A DEVICE-UNDER-TEST
Publication number
20250027986
Publication date
Jan 23, 2025
ROHDE & SCHWARZ GMBH & CO. KG
Thorsten LUECK
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR INLINE BILAYER CAPACITANCE MONITORING
Publication number
20250019741
Publication date
Jan 16, 2025
Roche Sequencing Solutions, Inc.
Ashraf Wahba
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
BATTERY CURRENT ESTIMATION
Publication number
20250020707
Publication date
Jan 16, 2025
VOLVO TRUCK CORPORATION
Emil LIDSTRÖM
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETERMINING THE DURATION OF DISPERSION HARDENING
Publication number
20250020706
Publication date
Jan 16, 2025
HERAEUS PRECIOUS METALS GMBH & CO. KG
Matthias WEGNER
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CORRECTING CAPACITANCE MEASUREMENT VALUE UNDER HIGH LEAK...
Publication number
20250020751
Publication date
Jan 16, 2025
Shanghai Huali Integrated Circuit Corporation
Xiaoming LIU
G01 - MEASURING TESTING
Information
Patent Application
Heat Detection Device
Publication number
20250020520
Publication date
Jan 16, 2025
DAIFUKU CO., LTD.
Hiroumi Murai
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF DETECTING A CRACK IN A SEMICONDUCTOR ELEMENT, AND RELATE...
Publication number
20250022122
Publication date
Jan 16, 2025
KULICKE AND SOFFA INDUSTRIES, INC.
Aashish Shah
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CURVE INDUCTIVE SENSOR
Publication number
20250012555
Publication date
Jan 9, 2025
Magnisity Ltd.
Ron BARAK
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETECTING AN OPEN LOAD FAULT
Publication number
20250012669
Publication date
Jan 9, 2025
ROBERT BOSCH GmbH
Andreas Schwaerzle
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT OF INSULATION RESISTANCE OF AN ELECTRICAL INSULATOR
Publication number
20250012835
Publication date
Jan 9, 2025
Megger Instruments Ltd
Stanislaw ZUREK
G01 - MEASURING TESTING
Information
Patent Application
IMPEDANCE DETECTION CIRCUIT, IMPEDANCE CONTROL CIRCUIT, AND DOHERTY...
Publication number
20250015765
Publication date
Jan 9, 2025
MURATA MANUFACTURING CO., LTD.
Shohei IMAI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
CLOSED-LOOP MULTIPLE-OUTPUT RADIO FREQUENCY (RF) MATCHING
Publication number
20250015819
Publication date
Jan 9, 2025
LAM RESEARCH CORPORATION
Eller Y. Juco
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR COMPUTING AN INSULATION RESISTANCE IN AN UNGROUNDED DC P...
Publication number
20250004025
Publication date
Jan 2, 2025
BENDER GMBH & CO. KG
Burkhard Macht
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC WIRE INSPECTION SYSTEM, ELECTRIC WIRE INSPECTION METHOD, A...
Publication number
20250004032
Publication date
Jan 2, 2025
AUTONETWORKS TECHNOLOGIES, LTD.
Hirokazu KOMORI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR DETERMINING A CAPACITANCE OF A CAPACITOR, CAPACITOR MONI...
Publication number
20250004029
Publication date
Jan 2, 2025
SKELETON TECHNOLOGIES GMBH
Bertram SCHEMEL
G01 - MEASURING TESTING
Information
Patent Application
LOW POWER CAPACITOR SENSOR ARRAY
Publication number
20250003772
Publication date
Jan 2, 2025
Raytheon Company
Krishna Shivaram
G01 - MEASURING TESTING