characterised by a particular beam path configuration

Industry

CPC
G01B9/02015

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02015characterised by a particular beam path configuration

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for an adjustable beam directing optical system
- Patent number 12,203,751
- Issue date Jan 21, 2025
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
- Brett F. Bathel
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring a substrate and method for correcting cyclic e...
- Patent number 12,135,211
- Issue date Nov 5, 2024
- Carl Zeiss SMT GmbH
- Stephan Zschaeck
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Tomography convergence-type oral scanner
- Patent number 12,011,336
- Issue date Jun 18, 2024
- HUVITS CO., LTD.
- Hyo Sang Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for determining the position of a target stru...
- Patent number 11,927,891
- Issue date Mar 12, 2024
- ASML Netherlands B.V.
- Nitesh Pandey
- G01 - MEASURING TESTING
Information Patent Grant
Locking a self-homodyne mixed beat frequency to an external frequen...
- Patent number 11,914,038
- Issue date Feb 27, 2024
- Aeva, Inc.
- Bryce Bradford
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement system and method using optical signal tran...
- Patent number 11,906,368
- Issue date Feb 20, 2024
- Fluke Corporation
- Mohammad Amin Tadayon
- G01 - MEASURING TESTING
Information Patent Grant
Optical module, signal processing system, and signal processing method
- Patent number 11,898,841
- Issue date Feb 13, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne grating interferometric method and system for two-degree...
- Patent number 11,802,757
- Issue date Oct 31, 2023
- Harbin Institute of Technology
- Pengcheng Hu
- G01 - MEASURING TESTING
Information Patent Grant
Integrated photonic chip with coherent receiver and variable optica...
- Patent number 11,802,759
- Issue date Oct 31, 2023
- Eric Swanson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for an adjustable beam directing optical system
- Patent number 11,796,306
- Issue date Oct 24, 2023
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
- Brett F. Bathel
- G01 - MEASURING TESTING
Information Patent Grant
Light emitting device, optical detection system, optical detection...
- Patent number 11,796,311
- Issue date Oct 24, 2023
- SKYVERSE TECHNOLOGY CO., LTD.
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for decomposition to account for imperfect be...
- Patent number 11,747,132
- Issue date Sep 5, 2023
- Xanadu Quantum Technologies Inc.
- Ish Dhand
- G01 - MEASURING TESTING
Information Patent Grant
Single-laser light source system for cold atom interferometers
- Patent number 11,733,028
- Issue date Aug 22, 2023
- NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY
- Jun Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser interferometry systems and methods
- Patent number 11,703,315
- Issue date Jul 18, 2023
- Nordson Corporation
- Jerome Joseph Dapore
- G01 - MEASURING TESTING
Information Patent Grant
System and method of phase-locked fiber interferometry
- Patent number 11,644,301
- Issue date May 9, 2023
- National Technology & Engineering Solutions of Sandia, LLC
- Aaron Michael Katzenmeyer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical interferometry proximity sensor with optical path extender
- Patent number 11,629,948
- Issue date Apr 18, 2023
- Apple Inc.
- Nathan Shou
- G01 - MEASURING TESTING
Information Patent Grant
Method of characterizing, calibrating, and controlling galvanometer...
- Patent number 11,624,812
- Issue date Apr 11, 2023
- James MacMillan
- G01 - MEASURING TESTING
Information Patent Grant
Position measurement system, interferometer system and lithographic...
- Patent number 11,619,886
- Issue date Apr 4, 2023
- ASML Netherlands B.V.
- Johannes Mathias Theodorus Antonius Adriaens
- G01 - MEASURING TESTING
Information Patent Grant
Rayleigh fading mitigation via short pulse coherent distributed aco...
- Patent number 11,566,937
- Issue date Jan 31, 2023
- NEC Corporation
- Ezra Ip
- G01 - MEASURING TESTING
Information Patent Grant
Differential height measurement using interstitial mirror plate
- Patent number 11,566,887
- Issue date Jan 31, 2023
- KLA Corporation
- Frank Chilese
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography receiver
- Patent number 11,490,804
- Issue date Nov 8, 2022
- Alcon Inc.
- Muhammad K Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Grant
Coherence range imaging using common path interference
- Patent number 11,473,896
- Issue date Oct 18, 2022
- Canon U.S.A., Inc.
- Badr Elmaanaoui
- G01 - MEASURING TESTING
Information Patent Grant
Extending the range of spectrally controlled interferometry by supe...
- Patent number 11,385,044
- Issue date Jul 12, 2022
- APRE INSTRUMENTS, INC.
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Grant
Control method for fast trapping and high-frequency mutual ejection...
- Patent number 11,361,875
- Issue date Jun 14, 2022
- NO. 717 RESEARCH INSTITUTE OF CHINA SHIPBUILDING INDUSTRY CORPORATION
- Fusheng Chen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Real-time scan point homogenization for terrestrial laser scanner
- Patent number 11,340,058
- Issue date May 24, 2022
- Faro Technologies, Inc.
- Julian Becker
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for airy beam optical coherence tomography
- Patent number 11,314,096
- Issue date Apr 26, 2022
- The Curators of the University of Missouri
- Ping Yu
- G02 - OPTICS
Information Patent Grant
Self-mix module utilizing filters
- Patent number 11,307,019
- Issue date Apr 19, 2022
- Vixar, Inc.
- Klein Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for generating a linear chirp from a laser light source
- Patent number 11,119,213
- Issue date Sep 14, 2021
- Aeva, Inc.
- Bryce Bradford
- G01 - MEASURING TESTING
Information Patent Grant
Integrated reflectometer or ellipsometer
- Patent number 11,112,231
- Issue date Sep 7, 2021
- Applied Materials, Inc.
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Cascade Fourier domain optical coherence tomography
- Patent number 11,098,999
- Issue date Aug 24, 2021
- University of Rochester
- Di Xu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
Switchable Multi-Configuration OCT
- Publication number 20240344820
- Publication date Oct 17, 2024
- OPTOS PLC
- Bavishna Balagopal
- G01 - MEASURING TESTING
Information Patent Application
BROADBAND PROFILER SYSTEM AND METHOD FOR CONSTRUCTING A THREE-DIMEN...
- Publication number 20240288261
- Publication date Aug 29, 2024
- AP Infosense Limited
- Kam Chiu LAU
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVE INTERFEROMETER SYSTEMS AND METHODS THEREOF
- Publication number 20240230311
- Publication date Jul 11, 2024
- OptiPro Systems, LLC
- Robert D. NIEDERRITER
- G01 - MEASURING TESTING
Information Patent Application
MEASURING INSTRUMENT WITH A SCANNING ABSOLUTE DISTANCE METER
- Publication number 20240077301
- Publication date Mar 7, 2024
- Leica Geosystems AG
- Thomas LÜTHI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR AN ADJUSTABLE BEAM DIRECTING OPTICAL SYSTEM
- Publication number 20240019240
- Publication date Jan 18, 2024
- United States of America as represented by the Administrator of NASA
- Brett F. Bathel
- G01 - MEASURING TESTING
Information Patent Application
CHROMATIC CONFOCAL MEASURING DEVICE
- Publication number 20230417533
- Publication date Dec 28, 2023
- PRECITEC OPTRONIK GMBH
- Christoph Dietz
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFEROMETRIC RANGE SENSOR
- Publication number 20230314122
- Publication date Oct 5, 2023
- Omron Corporation
- Masayuki HAYAKAWA
- G02 - OPTICS
Information Patent Application
Optical Coherence Tomography With Self-Inspecting Imaging Device
- Publication number 20230280153
- Publication date Sep 7, 2023
- LightLab Imaging, Inc.
- Steven M. Stromski
- G01 - MEASURING TESTING
Information Patent Application
SINE-COSINE OPTICAL FREQUENCY DETECTION DEVICES FOR PHOTONICS INTEG...
- Publication number 20230236295
- Publication date Jul 27, 2023
- Xiaotian Steve Yao
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-LASER LIGHT SOURCE SYSTEM FOR COLD ATOM INTERFEROMETERS
- Publication number 20230228555
- Publication date Jul 20, 2023
- NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY
- Jun YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Illumination System with Etendue-Squeezing Module and Method Thereof
- Publication number 20230078844
- Publication date Mar 16, 2023
- Apollo Medical Optics, Ltd.
- Tuan-Shu HO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFERENCE RANGE SENSOR
- Publication number 20230084871
- Publication date Mar 16, 2023
- Omron Corporation
- Kazuya KIMURA
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer
- Publication number 20230085489
- Publication date Mar 16, 2023
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G02 - OPTICS
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY RECEIVER
- Publication number 20230021386
- Publication date Jan 26, 2023
- Alcon Inc.
- Muhammad K. Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING A SUBSTRATE AND METHOD FOR CORRECTING CYCLIC E...
- Publication number 20220260359
- Publication date Aug 18, 2022
- Carl Zeiss SMT GMBH
- Stephan Zschaeck
- G01 - MEASURING TESTING
Information Patent Application
Optical Interferometry Proximity Sensor with Optical Path Extender
- Publication number 20220244041
- Publication date Aug 4, 2022
- Apple Inc.
- Nathan Shou
- G01 - MEASURING TESTING
Information Patent Application
OCT DEVICE
- Publication number 20220236047
- Publication date Jul 28, 2022
- TOMEY CORPORATION
- Takashi KAMO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHODS AND APPARATUS FOR DECOMPOSITION TO ACCOUNT FOR IMPERFECT BE...
- Publication number 20220196382
- Publication date Jun 23, 2022
- Xanadu Quantum Technologies Inc.
- Ish DHAND
- G01 - MEASURING TESTING
Information Patent Application
TOMOGRAPHY CONVERGENCE-TYPE ORAL SCANNER
- Publication number 20220183799
- Publication date Jun 16, 2022
- HUVITZ CO., LTD.
- Hyo Sang JEONG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CABLE FOR INTERFEROMETRIC ENDPOINT DETECTION
- Publication number 20220148862
- Publication date May 12, 2022
- Applied Materials, Inc.
- Lei LIAN
- G01 - MEASURING TESTING
Information Patent Application
LOCKING A SELF-HOMODYNE MIXED BEAT FREQUENCY TO AN EXTERNAL FREQUEN...
- Publication number 20220146675
- Publication date May 12, 2022
- Aeva, Inc.
- Bryce Bradford
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE, SIGNAL PROCESSING SYSTEM, AND SIGNAL PROCESSING METHOD
- Publication number 20220099430
- Publication date Mar 31, 2022
- Hamamatsu Photonics K.K.
- Tomofumi SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR AN ADJUSTABLE BEAM DIRECTING OPTICAL SYSTEM
- Publication number 20220099429
- Publication date Mar 31, 2022
- United States of America as represented by the Administrator of NASA
- Brett F. Bathel
- G02 - OPTICS
Information Patent Application
PHYSICAL UNCLONABLE FUNCTION FROM AN INTEGRATED PHOTONIC INTERFEROM...
- Publication number 20220069990
- Publication date Mar 3, 2022
- Clemson University
- JUDSON D. RYCKMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE MEASUREMENT SYSTEM AND METHOD USING OPTICAL SIGNAL TRAN...
- Publication number 20210381908
- Publication date Dec 9, 2021
- FLUKE CORPORATION
- Mohammad Amin Tadayon
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Methods for Determining the Position of a Target Stru...
- Publication number 20210364936
- Publication date Nov 25, 2021
- ASML NETHERLANDS B.V.
- Nitesh PANDEY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Integrated Photonic Chip with Coherent Receiver and Variable Optica...
- Publication number 20210356249
- Publication date Nov 18, 2021
- Eric SWANSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE HOLDER FOR USE WITH INTERFEROMETER
- Publication number 20210301870
- Publication date Sep 30, 2021
- Corning Incorporated
- Ronnie Rex Fesperman
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Apparatus and Method for Integrating Continuous and Discontinuous I...
- Publication number 20210293543
- Publication date Sep 23, 2021
- James R. Huddle
- G01 - MEASURING TESTING
Information Patent Application
CONTROL METHOD FOR FAST TRAPPING AND HIGH-FREQUENCY MUTUAL EJECTION...
- Publication number 20210265072
- Publication date Aug 26, 2021
- No. 717 Research Institute of China Shipbuilding Industry Corporation
- Fusheng CHEN
- G01 - MEASURING TESTING

characterised by a particular beam path configuration

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and apparatus for an adjustable beam directing optical system

Device for measuring a substrate and method for correcting cyclic e...

Tomography convergence-type oral scanner

Apparatus and methods for determining the position of a target stru...

Locking a self-homodyne mixed beat frequency to an external frequen...

Temperature measurement system and method using optical signal tran...

Optical module, signal processing system, and signal processing method

Heterodyne grating interferometric method and system for two-degree...

Integrated photonic chip with coherent receiver and variable optica...

Methods and apparatus for an adjustable beam directing optical system

Light emitting device, optical detection system, optical detection...

Methods and apparatus for decomposition to account for imperfect be...

Single-laser light source system for cold atom interferometers

Laser interferometry systems and methods

System and method of phase-locked fiber interferometry

Optical interferometry proximity sensor with optical path extender

Method of characterizing, calibrating, and controlling galvanometer...

Position measurement system, interferometer system and lithographic...

Rayleigh fading mitigation via short pulse coherent distributed aco...

Differential height measurement using interstitial mirror plate

Optical coherence tomography receiver

Coherence range imaging using common path interference

Extending the range of spectrally controlled interferometry by supe...

Control method for fast trapping and high-frequency mutual ejection...

Real-time scan point homogenization for terrestrial laser scanner

Systems and methods for airy beam optical coherence tomography

Self-mix module utilizing filters

Method for generating a linear chirp from a laser light source

Integrated reflectometer or ellipsometer

Cascade Fourier domain optical coherence tomography

Patents Applicationslast 30 patents

Switchable Multi-Configuration OCT

BROADBAND PROFILER SYSTEM AND METHOD FOR CONSTRUCTING A THREE-DIMEN...

REFLECTIVE INTERFEROMETER SYSTEMS AND METHODS THEREOF

MEASURING INSTRUMENT WITH A SCANNING ABSOLUTE DISTANCE METER

METHODS AND APPARATUS FOR AN ADJUSTABLE BEAM DIRECTING OPTICAL SYSTEM

CHROMATIC CONFOCAL MEASURING DEVICE

OPTICAL INTERFEROMETRIC RANGE SENSOR

Optical Coherence Tomography With Self-Inspecting Imaging Device

SINE-COSINE OPTICAL FREQUENCY DETECTION DEVICES FOR PHOTONICS INTEG...

SINGLE-LASER LIGHT SOURCE SYSTEM FOR COLD ATOM INTERFEROMETERS

Illumination System with Etendue-Squeezing Module and Method Thereof

OPTICAL INTERFERENCE RANGE SENSOR

Laser Interferometer

OPTICAL COHERENCE TOMOGRAPHY RECEIVER

DEVICE FOR MEASURING A SUBSTRATE AND METHOD FOR CORRECTING CYCLIC E...

Optical Interferometry Proximity Sensor with Optical Path Extender

OCT DEVICE

METHODS AND APPARATUS FOR DECOMPOSITION TO ACCOUNT FOR IMPERFECT BE...

TOMOGRAPHY CONVERGENCE-TYPE ORAL SCANNER

OPTICAL CABLE FOR INTERFEROMETRIC ENDPOINT DETECTION

LOCKING A SELF-HOMODYNE MIXED BEAT FREQUENCY TO AN EXTERNAL FREQUEN...

OPTICAL MODULE, SIGNAL PROCESSING SYSTEM, AND SIGNAL PROCESSING METHOD

METHODS AND APPARATUS FOR AN ADJUSTABLE BEAM DIRECTING OPTICAL SYSTEM

PHYSICAL UNCLONABLE FUNCTION FROM AN INTEGRATED PHOTONIC INTERFEROM...

TEMPERATURE MEASUREMENT SYSTEM AND METHOD USING OPTICAL SIGNAL TRAN...

Apparatus and Methods for Determining the Position of a Target Stru...

Integrated Photonic Chip with Coherent Receiver and Variable Optica...

SUBSTRATE HOLDER FOR USE WITH INTERFEROMETER

Apparatus and Method for Integrating Continuous and Discontinuous I...

CONTROL METHOD FOR FAST TRAPPING AND HIGH-FREQUENCY MUTUAL EJECTION...