characterised by error reduction techniques

Industry

CPC
G01B9/02055

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02055characterised by error reduction techniques

Industries

Patents Grantslast 30 patents

Information Patent Grant
Calibration kit for an optical scanning device
- Patent number 12,044,844
- Issue date Jul 23, 2024
- QISDA Corporation
- Tzu-Huan Hsu
- G02 - OPTICS
Information Patent Grant
Methods and systems of characterizing and counting microbiological...
- Patent number 11,525,153
- Issue date Dec 13, 2022
- Battelle Memorial Institute
- Curtis J. Larimer
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Spatial accuracy correction method and apparatus
- Patent number 11,366,448
- Issue date Jun 21, 2022
- Mitutoyo Corporation
- Shinichiro Yanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical coherence tomographic device
- Patent number 10,918,285
- Issue date Feb 16, 2021
- Tomey Corporation
- Masahiro Yamanari
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical roughness sensor for a coordinate measuring machine
- Patent number 10,775,150
- Issue date Sep 15, 2020
- Hexagon Technology Center GmbH
- Thomas Jensen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for nondestructive determination of core size...
- Patent number 10,704,986
- Issue date Jul 7, 2020
- Beihang University
- Xiaobin Xu
- G02 - OPTICS
Information Patent Grant
Method and apparatus for determining a plurality of spatial coordin...
- Patent number 10,422,629
- Issue date Sep 24, 2019
- Carl Zeiss Industrielle Messtechnik GmbH
- Nils Haverkamp
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring displacement
- Patent number 10,156,433
- Issue date Dec 18, 2018
- The Chinese University of Hong Kong
- Shih-Chi Chen
- G01 - MEASURING TESTING
Information Patent Grant
Intensity noise reduction methods and apparatus for interferometric...
- Patent number 10,006,753
- Issue date Jun 26, 2018
- LightLab Imaging, Inc.
- Joseph M. Schmitt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Compact, low dispersion, and low aberration adaptive optics scannin...
- Patent number 9,740,003
- Issue date Aug 22, 2017
- Thorlabs, Inc.
- Benjamin Michael Potsaid
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Multiple measurement channel detector circuit for interferometers
- Patent number 9,702,686
- Issue date Jul 11, 2017
- Michelson Diagnostics Ltd
- Simon Richard Hattersley
- G01 - MEASURING TESTING
Information Patent Grant
Interferential position-measuring device and method for operating a...
- Patent number 9,664,502
- Issue date May 30, 2017
- Dr. Johannes Heidenhain GmbH
- Markus Meissner
- G01 - MEASURING TESTING
Information Patent Grant
Daily checking and calibrating method of length measuring machine
- Patent number 9,470,518
- Issue date Oct 18, 2016
- Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Wende Huang
- G01 - MEASURING TESTING
Information Patent Grant
Profile measuring apparatus
- Patent number 9,335,160
- Issue date May 10, 2016
- Nikon Corporation
- Yuka Ito
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for calibrating the apex offset on fiberoptic...
- Patent number 9,014,528
- Issue date Apr 21, 2015
- James T. Chivers
- G01 - MEASURING TESTING
Information Patent Grant
Apolarized interferometric system, and apolarized interferometric m...
- Patent number 8,953,169
- Issue date Feb 10, 2015
- IXBLUE
- Herve Lefevre
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-stable incoherent light source
- Patent number 8,902,425
- Issue date Dec 2, 2014
- University of Zagreb
- Dubravko Ivan Babic
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal-polarization mirau interferometry and beam-splitting mod...
- Patent number 8,334,981
- Issue date Dec 18, 2012
- National Taipei University of Technology
- Sheng-Lih Yeh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANGULAR AVERAGING CALIBRATION ON BARE WAFER METROLOGY TOOLS FOR ESF...
- Publication number 20240353219
- Publication date Oct 24, 2024
- KLA Corporation
- Haifeng Wang
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS
- Publication number 20240077304
- Publication date Mar 7, 2024
- TOKYO SEIMITSU CO., LTD.
- Tasuku SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
Optical Coherence Tomography With Self-Inspecting Imaging Device
- Publication number 20230280153
- Publication date Sep 7, 2023
- LightLab Imaging, Inc.
- Steven M. Stromski
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR NONDESTRUCTIVE DETERMINATION OF CORE SIZE...
- Publication number 20190316988
- Publication date Oct 17, 2019
- BEIHANG UNIVERSITY
- Xiaobin Xu
- G01 - MEASURING TESTING
Information Patent Application
Intensity Noise Reduction Methods and Apparatus for Interferometric...
- Publication number 20180306569
- Publication date Oct 25, 2018
- LightLab Imaging, Inc.
- Joseph M. Schmitt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CONTROL SYSTEM, AND CONTROL METHOD AND PROGRAM FOR CONTROL SYSTEM
- Publication number 20180120087
- Publication date May 3, 2018
- Omron Corporation
- Hiroshi SAWARAGI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING A PLURALITY OF SPATIAL COORDIN...
- Publication number 20170234676
- Publication date Aug 17, 2017
- Carl Zeiss Industrielle Messtechnik GmbH
- Nils HAVERKAMP
- G01 - MEASURING TESTING
Information Patent Application
COMPACT, LOW DISPERSION, AND LOW ABERRATION ADAPTIVE OPTICS SCANNIN...
- Publication number 20160062112
- Publication date Mar 3, 2016
- THORLABS, INC.
- Benjamin Michael Potsaid
- G02 - OPTICS
Information Patent Application
PHASE-INVERTED SIDELOBE-ANNIHILATED OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20160047644
- Publication date Feb 18, 2016
- The University of Hong Kong
- Kenneth Kin Yip Wong
- G01 - MEASURING TESTING
Information Patent Application
Intensity Noise Reduction Methods and Apparatus for Interferometric...
- Publication number 20150153157
- Publication date Jun 4, 2015
- LightLab Imaging, Inc.
- Joseph M. Schmitt
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR CONTROLLING AN OPTICAL SURFACE TO BE MEASURED
- Publication number 20150036149
- Publication date Feb 5, 2015
- THALES
- Julien Fouraz
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR CIRCUITS FOR INTERFEROMETERS
- Publication number 20140218745
- Publication date Aug 7, 2014
- Michelson Diagnostics Ltd.
- Simon Richard Hattersley
- G01 - MEASURING TESTING
Information Patent Application
COMPACT, LOW DISPERSION, AND LOW ABERRATION ADAPTIVE OPTICS SCANNIN...
- Publication number 20140104618
- Publication date Apr 17, 2014
- THORLABS, INC.
- Benjamin Michael Potsaid
- G02 - OPTICS
Information Patent Application
Temperature-stable incoherent light source
- Publication number 20130265584
- Publication date Oct 10, 2013
- Dubravko Ivan Babic
- G01 - MEASURING TESTING
Information Patent Application
APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC M...
- Publication number 20130222810
- Publication date Aug 29, 2013
- Herve Lefevre
- G01 - MEASURING TESTING
Information Patent Application
Profile measuring apparatus
- Publication number 20110270562
- Publication date Nov 3, 2011
- Nikon Corporation
- Yuka Ito
- G01 - MEASURING TESTING
Information Patent Application
Intensity Noise Reduction Methods and Apparatus for Interferometric...
- Publication number 20110228280
- Publication date Sep 22, 2011
- LightLab Imaging, Inc.
- Joseph M. Schmitt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ORTHOGONAL-POLARIZATION MIRAU INTERFEROMETRY AND BEAM-SPLITTING MOD...
- Publication number 20100214570
- Publication date Aug 26, 2010
- National Taipei University of Technology
- Sheng-Lih Yeh
- G01 - MEASURING TESTING

characterised by error reduction techniques

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Calibration kit for an optical scanning device

Methods and systems of characterizing and counting microbiological...

Spatial accuracy correction method and apparatus

Optical coherence tomographic device

Optical roughness sensor for a coordinate measuring machine

Method and apparatus for nondestructive determination of core size...

Method and apparatus for determining a plurality of spatial coordin...

System and method for measuring displacement

Intensity noise reduction methods and apparatus for interferometric...

Compact, low dispersion, and low aberration adaptive optics scannin...

Multiple measurement channel detector circuit for interferometers

Interferential position-measuring device and method for operating a...

Daily checking and calibrating method of length measuring machine

Profile measuring apparatus

Method and apparatus for calibrating the apex offset on fiberoptic...

Apolarized interferometric system, and apolarized interferometric m...

Temperature-stable incoherent light source

Orthogonal-polarization mirau interferometry and beam-splitting mod...

Patents Applicationslast 30 patents

ANGULAR AVERAGING CALIBRATION ON BARE WAFER METROLOGY TOOLS FOR ESF...

ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS

Optical Coherence Tomography With Self-Inspecting Imaging Device

METHOD AND APPARATUS FOR NONDESTRUCTIVE DETERMINATION OF CORE SIZE...

Intensity Noise Reduction Methods and Apparatus for Interferometric...

CONTROL SYSTEM, AND CONTROL METHOD AND PROGRAM FOR CONTROL SYSTEM

METHOD AND APPARATUS FOR DETERMINING A PLURALITY OF SPATIAL COORDIN...

COMPACT, LOW DISPERSION, AND LOW ABERRATION ADAPTIVE OPTICS SCANNIN...

PHASE-INVERTED SIDELOBE-ANNIHILATED OPTICAL COHERENCE TOMOGRAPHY

Intensity Noise Reduction Methods and Apparatus for Interferometric...

SYSTEM FOR CONTROLLING AN OPTICAL SURFACE TO BE MEASURED

DETECTOR CIRCUITS FOR INTERFEROMETERS

COMPACT, LOW DISPERSION, AND LOW ABERRATION ADAPTIVE OPTICS SCANNIN...

Temperature-stable incoherent light source

APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC M...

Profile measuring apparatus

Intensity Noise Reduction Methods and Apparatus for Interferometric...

ORTHOGONAL-POLARIZATION MIRAU INTERFEROMETRY AND BEAM-SPLITTING MOD...