characterised by manipulating or generating specific radiation properties

Industry

CPC
G01B9/02001

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02001characterised by manipulating or generating specific radiation properties

Industries

Patents Grantslast 30 patents

Information Patent Grant
Tomographic imaging system for transparent material composite thin...
- Patent number 11,846,587
- Issue date Dec 19, 2023
- Hyundai Motor Company
- Jusung Han
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for an adjustable beam directing optical system
- Patent number 11,796,306
- Issue date Oct 24, 2023
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
- Brett F. Bathel
- G01 - MEASURING TESTING
Information Patent Grant
Atom interferometer
- Patent number 11,725,926
- Issue date Aug 15, 2023
- Nomad Atomics Pty Ltd
- Kyle Sage Hardman
- G01 - MEASURING TESTING
Information Patent Grant
Laser device
- Patent number 11,699,891
- Issue date Jul 11, 2023
- NKT Photonics A/S
- Jens E. Pedersen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods, systems and apparatus of interferometry for imaging and se...
- Patent number 11,598,627
- Issue date Mar 7, 2023
- Virginia Tech Intellectual Properties, Inc.
- Yizheng Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method
- Patent number 11,525,664
- Issue date Dec 13, 2022
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for interferometric measurement of a two or three...
- Patent number 11,493,325
- Issue date Nov 8, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Lun Kai Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system and method for measuring diagonal diffraction-base...
- Patent number 11,353,321
- Issue date Jun 7, 2022
- KLA Corporation
- Roie Volkovich
- G01 - MEASURING TESTING
Information Patent Grant
Swept frequency photonic integrated circuit for absolute metrology
- Patent number 11,320,255
- Issue date May 3, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Grant
Robust interferometer and methods of using same
- Patent number 11,293,863
- Issue date Apr 5, 2022
- Vanderbilt University
- Darryl J. Bornhop
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography (OCT) system for producing profilometr...
- Patent number 11,262,184
- Issue date Mar 1, 2022
- Mitsubishi Electric Research Laboratories, Inc.
- David Millar
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional second harmonic dispersion interferometer
- Patent number 11,221,293
- Issue date Jan 11, 2022
- Frank Joseph Wessel
- G01 - MEASURING TESTING
Information Patent Grant
Laser device
- Patent number 11,152,761
- Issue date Oct 19, 2021
- NKT Photonics A/S
- Jens E. Pedersen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for interrogating an interferometer, an interferometric syst...
- Patent number 11,067,416
- Issue date Jul 20, 2021
- H NU PTY LTD
- John Haywood
- G01 - MEASURING TESTING
Information Patent Grant
Gas visualizing methods and systems with birefringent polarization...
- Patent number 10,612,975
- Issue date Apr 7, 2020
- FLIR Systems AB
- Jonas Sandsten
- G01 - MEASURING TESTING
Information Patent Grant
Optical imaging device and method for imaging a sample
- Patent number 10,398,306
- Issue date Sep 3, 2019
- Nanyang Technological University
- Linbo Liu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical fiber temperature control system and method
- Patent number 10,379,304
- Issue date Aug 13, 2019
- AFL Telecommunications LLC
- Mohamed Amine Jebali
- G05 - CONTROLLING REGULATING
Information Patent Grant
Laser device
- Patent number 10,340,657
- Issue date Jul 2, 2019
- NKT Photonics A/S
- Jens E. Pedersen
- G01 - MEASURING TESTING
Information Patent Grant
Crosstalk elimination or mitigation in optical coherence tomography
- Patent number 10,323,926
- Issue date Jun 18, 2019
- Canon U.S.A., Inc.
- Badr Elmaanaoui
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interference fringe projection apparatus and measurement apparatus
- Patent number 10,288,416
- Issue date May 14, 2019
- Olympus Corporation
- Daichi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Robust interferometer and methods of using same
- Patent number 10,261,013
- Issue date Apr 16, 2019
- Vanderbilt University
- Darryl J. Bornhop
- G01 - MEASURING TESTING
Information Patent Grant
Device for managing pulses in pump-probe spectroscopy
- Patent number 10,190,972
- Issue date Jan 29, 2019
- Ecole Polytechnique
- Laura Antonucci
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus and imaging method
- Patent number 10,113,859
- Issue date Oct 30, 2018
- SCREEN Holdings Co., Ltd.
- Kenji Ueyama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring thickness
- Patent number 10,088,297
- Issue date Oct 2, 2018
- Samsung Electronics Co., Ltd.
- Sung Yoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Caliper sensor and method using mid-infrared interferometry
- Patent number 10,072,922
- Issue date Sep 11, 2018
- Honeywell Limited
- Sebastien Tixier
- G01 - MEASURING TESTING
Information Patent Grant
Dual-phase interferometry for charge modulation mapping in ICS
- Patent number 9,983,260
- Issue date May 29, 2018
- The United States of America as represented by the Secretary of the Air Force
- Abdulkadir Yurt
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measuring system and machining system comprising the same
- Patent number 9,869,540
- Issue date Jan 16, 2018
- NOPORVIS CO., LTD.
- Wei-Hung Su
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Light penetration depth evaluation method, performance test method...
- Patent number 9,839,358
- Issue date Dec 12, 2017
- Fujifilm Corporation
- Heijiro Hirayama
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Tracking and characterizing particles with holographic video micros...
- Patent number 9,810,894
- Issue date Nov 7, 2017
- New York University
- David G. Grier
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Phase control for dual atom interferometers
- Patent number 9,772,175
- Issue date Sep 26, 2017
- AOSense, Inc.
- Adam T. Black
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FILTERING FOR CO-SENSOR FUSION IN ATOMIC SENSORS
- Publication number 20240125587
- Publication date Apr 18, 2024
- Vector Atomic, Inc.
- Jonathan Lynn KOHLER
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
LASER DEVICE
- Publication number 20240106198
- Publication date Mar 28, 2024
- NKT PHOTONICS A/S
- Jens E. PEDERSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR AN ADJUSTABLE BEAM DIRECTING OPTICAL SYSTEM
- Publication number 20240019240
- Publication date Jan 18, 2024
- United States of America as represented by the Administrator of NASA
- Brett F. Bathel
- G01 - MEASURING TESTING
Information Patent Application
Adaptive Optical Sensing Using Speckle Prediction
- Publication number 20240003671
- Publication date Jan 4, 2024
- Apple Inc.
- Mingzhou Jin
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD
- Publication number 20230417532
- Publication date Dec 28, 2023
- BEIJING U-PRECISION TECH CO., LTD.
- Guohua SUN
- G01 - MEASURING TESTING
Information Patent Application
LASER INTERFEROMETER
- Publication number 20230280152
- Publication date Sep 7, 2023
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
TOMOGRAPHIC IMAGING SYSTEM FOR TRANSPARENT MATERIAL COMPOSITE THIN...
- Publication number 20230003645
- Publication date Jan 5, 2023
- Hyundai Motor Company
- Jusung Han
- G01 - MEASURING TESTING
Information Patent Application
STABILIZED FREQUENCY GENERATOR
- Publication number 20220299309
- Publication date Sep 22, 2022
- Tin Komljenovic
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR AN ADJUSTABLE BEAM DIRECTING OPTICAL SYSTEM
- Publication number 20220099429
- Publication date Mar 31, 2022
- United States of America as represented by the Administrator of NASA
- Brett F. Bathel
- G02 - OPTICS
Information Patent Application
Two-Dimensional Second Harmonic Dispersion Interferometer
- Publication number 20220091032
- Publication date Mar 24, 2022
- Frank Joseph Wessel
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND METHODS FOR MEASURING TURBINE BLADE TIP CLEARANCE
- Publication number 20220090582
- Publication date Mar 24, 2022
- Parker-Hannifin Corporation
- Lewis J. Boyd
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD
- Publication number 20220042782
- Publication date Feb 10, 2022
- MITUTOYO CORPORATION
- Masayuki NARA
- G01 - MEASURING TESTING
Information Patent Application
ATOM INTERFEROMETER
- Publication number 20220018650
- Publication date Jan 20, 2022
- NOMAD ATOMICS PTY LTD
- Kyle Sage HARDMAN
- G01 - MEASURING TESTING
Information Patent Application
LASER DEVICE
- Publication number 20220006261
- Publication date Jan 6, 2022
- NKT PHOTONICS A/S
- Jens E. PEDERSEN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR INTERFEROMETRIC MEASUREMENT OF A TWO OR THREE...
- Publication number 20210389118
- Publication date Dec 16, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Lun Kai CHENG
- G01 - MEASURING TESTING
Information Patent Application
Metrology System and Method for Measuring Diagonal Diffraction-Base...
- Publication number 20210389125
- Publication date Dec 16, 2021
- KLA Corporation
- Roie Volkovich
- G01 - MEASURING TESTING
Information Patent Application
ENDOSCOPIC IMAGING USING NANOSCALE METASURFACES
- Publication number 20210068665
- Publication date Mar 11, 2021
- President and Fellows of Harvard College
- Hamid PAHLEVANINEZHAD
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
LASER DEVICE
- Publication number 20190334314
- Publication date Oct 31, 2019
- NKT PHOTONICS A/S
- Jens E. PEDERSEN
- G01 - MEASURING TESTING
Information Patent Application
Robust Interferometer and Methods of Using Same
- Publication number 20190178795
- Publication date Jun 13, 2019
- Vanderbilt University
- Darryl J. Bornhop
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL AMPLIFIER, OPTICAL COHERENCE TOMOGRAPHY INCLUDING OPTICAL A...
- Publication number 20190059717
- Publication date Feb 28, 2019
- Canon Kabushiki Kaisha
- Takeshi Yoshioka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHODS, SYSTEMS AND APPARATUS OF INTERFEROMETRY FOR IMAGING AND SE...
- Publication number 20190056212
- Publication date Feb 21, 2019
- Virginia Tech Intellectual Properties, Inc.
- YIZHENG ZHU
- G01 - MEASURING TESTING
Information Patent Application
CROSSTALK ELIMINATION OR MITIGATION IN OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20180372477
- Publication date Dec 27, 2018
- Canon U.S.A., Inc.
- Badr Elmaanaoui
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
GAS VISUALIZING METHODS AND SYSTEMS WITH BIREFRINGENT POLARIZATION...
- Publication number 20180106674
- Publication date Apr 19, 2018
- FLIR Systems AB
- Jonas Sandsten
- G01 - MEASURING TESTING
Information Patent Application
INTERFERENCE FRINGE PROJECTION APPARATUS AND MEASUREMENT APPARATUS
- Publication number 20180073864
- Publication date Mar 15, 2018
- OLYMPUS CORPORATION
- Daichi WATANABE
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS AND IMAGE PROCESSING METHOD
- Publication number 20180003479
- Publication date Jan 4, 2018
- Canon Kabushiki Kaisha
- Nobuhiro Tomatsu
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FIBER TEMPERATURE CONTROL SYSTEM AND METHOD
- Publication number 20170371117
- Publication date Dec 28, 2017
- AFL TELECOMMUNICATIONS LLC
- Mohamed Amine Jebali
- G02 - OPTICS
Information Patent Application
Method For Simultaneously Measuring Magnetic And Gravitational Fiel...
- Publication number 20170336193
- Publication date Nov 23, 2017
- United States of America as represented by the Secretary of the Navy
- Francesco Narducci
- G01 - MEASURING TESTING
Information Patent Application
LASER DEVICE
- Publication number 20170324216
- Publication date Nov 9, 2017
- NKT PHOTONICS A/S
- Jens E. PEDERSEN
- G01 - MEASURING TESTING
Information Patent Application
LIGHT PENETRATION DEPTH EVALUATION METHOD, PERFORMANCE TEST METHOD...
- Publication number 20170224219
- Publication date Aug 10, 2017
- FUJIFILM CORPORATION
- Heijiro HIRAYAMA
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS AND IMAGING METHOD
- Publication number 20170167847
- Publication date Jun 15, 2017
- SCREEN Holdings Co., Ltd.
- Kenji UEYAMA
- G01 - MEASURING TESTING

characterised by manipulating or generating specific radiation properties

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Tomographic imaging system for transparent material composite thin...

Methods and apparatus for an adjustable beam directing optical system

Atom interferometer

Laser device

Methods, systems and apparatus of interferometry for imaging and se...

Calibration method

Device and method for interferometric measurement of a two or three...

Metrology system and method for measuring diagonal diffraction-base...

Swept frequency photonic integrated circuit for absolute metrology

Robust interferometer and methods of using same

Optical coherence tomography (OCT) system for producing profilometr...

Two-dimensional second harmonic dispersion interferometer

Laser device

System for interrogating an interferometer, an interferometric syst...

Gas visualizing methods and systems with birefringent polarization...

Optical imaging device and method for imaging a sample

Optical fiber temperature control system and method

Laser device

Crosstalk elimination or mitigation in optical coherence tomography

Interference fringe projection apparatus and measurement apparatus

Robust interferometer and methods of using same

Device for managing pulses in pump-probe spectroscopy

Imaging apparatus and imaging method

Apparatus and method for measuring thickness

Caliper sensor and method using mid-infrared interferometry

Dual-phase interferometry for charge modulation mapping in ICS

Displacement measuring system and machining system comprising the same

Light penetration depth evaluation method, performance test method...

Tracking and characterizing particles with holographic video micros...

Phase control for dual atom interferometers

Patents Applicationslast 30 patents

FILTERING FOR CO-SENSOR FUSION IN ATOMIC SENSORS

LASER DEVICE

METHODS AND APPARATUS FOR AN ADJUSTABLE BEAM DIRECTING OPTICAL SYSTEM

Adaptive Optical Sensing Using Speckle Prediction

INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD

LASER INTERFEROMETER

TOMOGRAPHIC IMAGING SYSTEM FOR TRANSPARENT MATERIAL COMPOSITE THIN...

STABILIZED FREQUENCY GENERATOR

METHODS AND APPARATUS FOR AN ADJUSTABLE BEAM DIRECTING OPTICAL SYSTEM

Two-Dimensional Second Harmonic Dispersion Interferometer

OPTICAL SYSTEMS AND METHODS FOR MEASURING TURBINE BLADE TIP CLEARANCE

CALIBRATION METHOD

ATOM INTERFEROMETER

LASER DEVICE

DEVICE AND METHOD FOR INTERFEROMETRIC MEASUREMENT OF A TWO OR THREE...

Metrology System and Method for Measuring Diagonal Diffraction-Base...

ENDOSCOPIC IMAGING USING NANOSCALE METASURFACES

LASER DEVICE

Robust Interferometer and Methods of Using Same

OPTICAL AMPLIFIER, OPTICAL COHERENCE TOMOGRAPHY INCLUDING OPTICAL A...

METHODS, SYSTEMS AND APPARATUS OF INTERFEROMETRY FOR IMAGING AND SE...

CROSSTALK ELIMINATION OR MITIGATION IN OPTICAL COHERENCE TOMOGRAPHY

GAS VISUALIZING METHODS AND SYSTEMS WITH BIREFRINGENT POLARIZATION...

INTERFERENCE FRINGE PROJECTION APPARATUS AND MEASUREMENT APPARATUS

IMAGE PROCESSING APPARATUS AND IMAGE PROCESSING METHOD

OPTICAL FIBER TEMPERATURE CONTROL SYSTEM AND METHOD

Method For Simultaneously Measuring Magnetic And Gravitational Fiel...

LASER DEVICE

LIGHT PENETRATION DEPTH EVALUATION METHOD, PERFORMANCE TEST METHOD...

IMAGING APPARATUS AND IMAGING METHOD