characterised by orthogonal acceleration

Industry

CPC
H01J49/401

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/401characterised by orthogonal acceleration

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Compact time-of-flight mass analyzer
- Patent number 12,191,134
- Issue date Jan 7, 2025
- Spacetek Technology AG
- Jürg Jost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis apparatuses and methods
- Patent number 12,176,198
- Issue date Dec 24, 2024
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aperture plate assembly
- Patent number 12,165,862
- Issue date Dec 10, 2024
- Micromass UK Limited
- Edward Scott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass analyser with spatial focussing
- Patent number 12,131,895
- Issue date Oct 29, 2024
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for multi-pass encoded frequency pushing
- Patent number 12,100,584
- Issue date Sep 24, 2024
- Leco Corporation
- Peter Markel Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis apparatuses and methods
- Patent number 12,057,305
- Issue date Aug 6, 2024
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top Time of Flight mass spectrometer
- Patent number 12,027,359
- Issue date Jul 2, 2024
- Micromass UK Limited
- Peter Carney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyzer with 3D electrostatic field
- Patent number 11,942,318
- Issue date Mar 26, 2024
- Shimadzu Corporation
- Vyacheslav Shchepunov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TOF MS detection system with improved dynamic range
- Patent number 11,881,387
- Issue date Jan 23, 2024
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal acceleration time-of-flight mass spectrometer
- Patent number 11,862,451
- Issue date Jan 2, 2024
- Shimadzu Corporation
- Takuya Suzumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,848,187
- Issue date Dec 19, 2023
- Micromass UK Limited
- Frank Buckley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accelerator for multi-pass mass spectrometers
- Patent number 11,817,303
- Issue date Nov 14, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method for analysing a gas by mass spectrometry
- Patent number 11,791,147
- Issue date Oct 17, 2023
- LEYBOLD GMBH
- Anthony Hin Yiu Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplexing method for separators
- Patent number 11,733,206
- Issue date Aug 22, 2023
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time of flight mass analyser
- Patent number 11,621,156
- Issue date Apr 4, 2023
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for high speed mass spectrometry
- Patent number 11,610,768
- Issue date Mar 21, 2023
- Thermo Finnigan LLC.
- Philip M. Remes
- G01 - MEASURING TESTING
Information Patent Grant
Multi-pass mass spectrometer with high duty cycle
- Patent number 11,587,779
- Issue date Feb 21, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,538,676
- Issue date Dec 27, 2022
- Micromass UK Limited
- Peter Carney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resonance ionization filter for secondary ion and accelerator mass...
- Patent number 11,501,960
- Issue date Nov 15, 2022
- The Government of the United States of America, as represented by the Secreta...
- Evan E. Groopman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionizer and mass spectrometer
- Patent number 11,495,447
- Issue date Nov 8, 2022
- Shimadzu Corporation
- Masaru Nishiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic ion filter for reducing highly abundant ions
- Patent number 11,488,818
- Issue date Nov 1, 2022
- Analytik Jena AG
- Roland Lehmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atmospheric pressure ion focusing device employing nonlinear DC vol...
- Patent number 11,480,544
- Issue date Oct 25, 2022
- Battelle Memorial Institute
- Adam L. Hollerbach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection system
- Patent number 11,476,104
- Issue date Oct 18, 2022
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometry device
- Patent number 11,443,934
- Issue date Sep 13, 2022
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analytical device
- Patent number 11,430,649
- Issue date Aug 30, 2022
- Shimadzu Corporation
- Shiro Mizutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry device
- Patent number 11,387,090
- Issue date Jul 12, 2022
- Jeol Ltd.
- Yoshihiko Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer and method of mass spectrometry
- Patent number 11,387,094
- Issue date Jul 12, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,385,202
- Issue date Jul 12, 2022
- Micromass UK Limited
- Robert Harold Bateman
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer
- Patent number 11,367,607
- Issue date Jun 21, 2022
- Micromass UK Limited
- Frank Buckley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer and program
- Patent number 11,361,957
- Issue date Jun 14, 2022
- Shimadzu Corporation
- Hideaki Izumi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RESIDUAL GAS ANALYSER, PROJECTION EXPOSURE APPARATUS COMPRISING A R...
- Publication number 20250166983
- Publication date May 22, 2025
- Carl Zeiss SMT GMBH
- Achim SCHOELL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF BIOANALYTICAL ANALYSIS UTILIZING ION SPECTROMETRY, INCLUD...
- Publication number 20240369516
- Publication date Nov 7, 2024
- Bruker Daltonics GmbH & Co. KG
- Nikolas KESSLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER AND TUNING METHOD FOR THE SAME
- Publication number 20230386813
- Publication date Nov 30, 2023
- Shimadzu Corporation
- Kosuke UCHIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER AND TUNING METHOD FOR THE SAME
- Publication number 20230386817
- Publication date Nov 30, 2023
- Shimadzu Corporation
- Kosuke UCHIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20230377869
- Publication date Nov 23, 2023
- SHIMADZU CORPORATION
- Tomoya KUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER AND TUNING...
- Publication number 20230352293
- Publication date Nov 2, 2023
- Shimadzu Corporation
- Tomoyuki OSHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS OF MASS ANALYSING POSITIVELY CHARGED IONS AND...
- Publication number 20230274924
- Publication date Aug 31, 2023
- TOFWERK AG
- Urs ROHNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MASS SPECTROMETRY AND MASS SPECTROMETER
- Publication number 20230245875
- Publication date Aug 3, 2023
- Shimadzu Corporation
- Kazuma MAEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS
- Publication number 20230170204
- Publication date Jun 1, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20230022148
- Publication date Jan 26, 2023
- Shimadzu Corporation
- Takuya SUZUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Compact Time-of-Flight Mass Analyzer
- Publication number 20220344143
- Publication date Oct 27, 2022
- Spacetek Technology AG
- Jürg Jost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSIS APPARATUSES AND METHODS
- Publication number 20220328298
- Publication date Oct 13, 2022
- SHIMADZU CORPORATION
- Roger GILES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSIS APPARATUSES AND METHODS
- Publication number 20220328299
- Publication date Oct 13, 2022
- SHIMADZU CORPORATION
- Roger GILES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Apparatus for Improved Pumping of Ion Detector
- Publication number 20220277942
- Publication date Sep 1, 2022
- ADAPTAS SOLUTIONS PTY LTD
- Kevin Hunter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Multi-Pass Encoded Frequency Pushing
- Publication number 20220262616
- Publication date Aug 18, 2022
- Leco Corporation
- Peter Markel Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20220246418
- Publication date Aug 4, 2022
- Micromass UK Limited
- Frank Buckley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS ANALYSER WITH SPATIAL FOCUSSING
- Publication number 20220238320
- Publication date Jul 28, 2022
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APERTURE PLATE ASSEMBLY
- Publication number 20220208537
- Publication date Jun 30, 2022
- Micromass UK Limited
- Edward Scott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD FOR ANALYSING A GAS BY MASS SPECTROMETRY
- Publication number 20220005682
- Publication date Jan 6, 2022
- Leybold GmbH
- Anthony Hin Yiu Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20210384024
- Publication date Dec 9, 2021
- Micromass UK Limited
- Peter Carney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR HIGH SPEED MASS SPECTROMETRY
- Publication number 20210375611
- Publication date Dec 2, 2021
- Thermo Finnigan LLC
- Philip M. REMES
- G01 - MEASURING TESTING
Information Patent Application
IONIZER AND MASS SPECTROMETER
- Publication number 20210375609
- Publication date Dec 2, 2021
- SHIMADZU CORPORATION
- Masaru NISHIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Resonance Ionization Filter for Secondary Ion and Accelerator Mass...
- Publication number 20210366698
- Publication date Nov 25, 2021
- The Government of the United States of America, as represented by the Secreta...
- Evan E. Groopman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTION SYSTEM
- Publication number 20210327697
- Publication date Oct 21, 2021
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DYNAMIC ION FILTER FOR REDUCING HIGHLY ABUNDANT IONS
- Publication number 20210287895
- Publication date Sep 16, 2021
- Analytik Jena AG
- Roland Lehmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time of Flight Mass Spectrometer and Method Of Mass Spectrometry
- Publication number 20210272790
- Publication date Sep 2, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20210249250
- Publication date Aug 12, 2021
- SHIMADZU CORPORATION
- Kazuma MAEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATMOSPHERIC PRESSURE ION FOCUSING DEVICE EMPLOYING NONLINEAR DC VOL...
- Publication number 20210239650
- Publication date Aug 5, 2021
- Battelle Memorial Institute
- Adam L. Hollerbach
- G01 - MEASURING TESTING
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20210242008
- Publication date Aug 5, 2021
- SHIMADZU CORPORATION
- Tomoyuki OSHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometry Device
- Publication number 20210225630
- Publication date Jul 22, 2021
- JEOL Ltd.
- Yoshihiko Miwa
- H01 - BASIC ELECTRIC ELEMENTS

characterised by orthogonal acceleration

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Compact time-of-flight mass analyzer

Mass analysis apparatuses and methods

Aperture plate assembly

Time of flight mass analyser with spatial focussing

Methods and systems for multi-pass encoded frequency pushing

Mass analysis apparatuses and methods

Bench-top Time of Flight mass spectrometer

Mass analyzer with 3D electrostatic field

TOF MS detection system with improved dynamic range

Orthogonal acceleration time-of-flight mass spectrometer

Mass spectrometer

Accelerator for multi-pass mass spectrometers

Mass spectrometer and method for analysing a gas by mass spectrometry

Multiplexing method for separators

Multi-reflecting time of flight mass analyser

Methods and apparatus for high speed mass spectrometry

Multi-pass mass spectrometer with high duty cycle

Mass spectrometer

Resonance ionization filter for secondary ion and accelerator mass...

Ionizer and mass spectrometer

Dynamic ion filter for reducing highly abundant ions

Atmospheric pressure ion focusing device employing nonlinear DC vol...

Ion detection system

Time-of-flight mass spectrometry device

Analytical device

Mass spectrometry device

Time of flight mass spectrometer and method of mass spectrometry

Mass spectrometer

Mass spectrometer

Time-of-flight mass spectrometer and program

Patents Applicationslast 30 patents

RESIDUAL GAS ANALYSER, PROJECTION EXPOSURE APPARATUS COMPRISING A R...

METHOD OF BIOANALYTICAL ANALYSIS UTILIZING ION SPECTROMETRY, INCLUD...

TIME-OF-FLIGHT MASS SPECTROMETER AND TUNING METHOD FOR THE SAME

TIME-OF-FLIGHT MASS SPECTROMETER AND TUNING METHOD FOR THE SAME

ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER

ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER AND TUNING...

METHOD AND APPARATUS OF MASS ANALYSING POSITIVELY CHARGED IONS AND...

METHOD FOR MASS SPECTROMETRY AND MASS SPECTROMETER

ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS

ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER

Compact Time-of-Flight Mass Analyzer

MASS ANALYSIS APPARATUSES AND METHODS

MASS ANALYSIS APPARATUSES AND METHODS

Methods and Apparatus for Improved Pumping of Ion Detector

Methods and Systems for Multi-Pass Encoded Frequency Pushing

MASS SPECTROMETER

TIME OF FLIGHT MASS ANALYSER WITH SPATIAL FOCUSSING

APERTURE PLATE ASSEMBLY

MASS SPECTROMETER AND METHOD FOR ANALYSING A GAS BY MASS SPECTROMETRY

MASS SPECTROMETER

METHODS AND APPARATUS FOR HIGH SPEED MASS SPECTROMETRY

IONIZER AND MASS SPECTROMETER

Resonance Ionization Filter for Secondary Ion and Accelerator Mass...

ION DETECTION SYSTEM

DYNAMIC ION FILTER FOR REDUCING HIGHLY ABUNDANT IONS

Time of Flight Mass Spectrometer and Method Of Mass Spectrometry

MASS SPECTROMETER

ATMOSPHERIC PRESSURE ION FOCUSING DEVICE EMPLOYING NONLINEAR DC VOL...

TIME-OF-FLIGHT MASS SPECTROMETER

Mass Spectrometry Device