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characterised by particular imaging or detection techniques
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G01B9/02041
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
Current Industry
G01B9/02041
characterised by particular imaging or detection techniques
Industries
Overview
Organizations
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for optical coherence tomography angiography
Patent number
11,972,544
Issue date
Apr 30, 2024
Topcon Corporation
Song Mei
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Estimating gemstone weight in mounted settings
Patent number
11,959,796
Issue date
Apr 16, 2024
The RealReal, Inc.
Loretta Catherine Castoro
G01 - MEASURING TESTING
Information
Patent Grant
Extended reality virtual distance measurement system
Patent number
11,867,507
Issue date
Jan 9, 2024
MLOptic Corp.
Pengfei Wu
G01 - MEASURING TESTING
Information
Patent Grant
Method of inner light layer illumination by multi-beam interference...
Patent number
11,808,568
Issue date
Nov 7, 2023
Shangqing Liu
G01 - MEASURING TESTING
Information
Patent Grant
Scanning overlay metrology using overlay targets having multiple sp...
Patent number
11,796,925
Issue date
Oct 24, 2023
KLA Corporation
Yuval Lubashevsky
G01 - MEASURING TESTING
Information
Patent Grant
Simultaneous phase-shift point diffraction interferometer and metho...
Patent number
11,788,829
Issue date
Oct 17, 2023
Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
Peng Feng
G01 - MEASURING TESTING
Information
Patent Grant
Optical component for an ATR interferometric imaging device
Patent number
11,747,134
Issue date
Sep 5, 2023
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Cyrielle Monpeurt
G01 - MEASURING TESTING
Information
Patent Grant
Atom interferometer
Patent number
11,725,926
Issue date
Aug 15, 2023
Nomad Atomics Pty Ltd
Kyle Sage Hardman
G01 - MEASURING TESTING
Information
Patent Grant
2D multi-layer thickness measurement with reconstructed spectrum
Patent number
11,684,253
Issue date
Jun 27, 2023
Topcon Corporation
Zaixing Mao
G01 - MEASURING TESTING
Information
Patent Grant
OCT image capture device
Patent number
11,659,991
Issue date
May 30, 2023
OCUMAX HEALTHCARE GMBH
Holger Lubatschowski
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Interference image acquiring device and method for acquiring interf...
Patent number
11,630,059
Issue date
Apr 18, 2023
Hamamatsu Photonics K.K.
Toyohiko Yamauchi
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring cracks in wall surface
Patent number
11,595,558
Issue date
Feb 28, 2023
Topcon Corporation
Takashi Tanaka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Estimating gemstone weight in mounted settings
Patent number
11,579,008
Issue date
Feb 14, 2023
The RealReal, Inc.
Loretta Catherine Castoro
G01 - MEASURING TESTING
Information
Patent Grant
Differential height measurement using interstitial mirror plate
Patent number
11,566,887
Issue date
Jan 31, 2023
KLA Corporation
Frank Chilese
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric parallel detection using digital rectification and...
Patent number
11,566,886
Issue date
Jan 31, 2023
HI LLC
Hooman Mohseni
G01 - MEASURING TESTING
Information
Patent Grant
Optical sensor for surface inspection and metrology
Patent number
11,561,080
Issue date
Jan 24, 2023
Arun Anath Aiyer
G01 - MEASURING TESTING
Information
Patent Grant
Compact briefcase OCT system for point-of-care imaging
Patent number
11,445,915
Issue date
Sep 20, 2022
The Board of Trustees of the University of Illinois
Stephen A. Boppart
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Mapping ciliary activity using phase resolved spectrally encoded in...
Patent number
11,445,941
Issue date
Sep 20, 2022
The Regents of the University of California
Zhongping Chen
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Apparatus, systems, and methods for detecting light
Patent number
11,441,889
Issue date
Sep 13, 2022
Nokia Technologies Oy
Xin Yuan
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Wafer carrier thickness measuring device
Patent number
11,371,829
Issue date
Jun 28, 2022
SK SILTRON CO., LTD.
Suk Jin Jung
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Polarization holographic microscope system and sample image acquisi...
Patent number
11,365,961
Issue date
Jun 21, 2022
Korea University Research and Business Foundation
Youngwoon Choi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
State determination apparatus, state determination method, and comp...
Patent number
11,365,963
Issue date
Jun 21, 2022
NEC Corporation
Subhajit Chaudhury
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Magnetic recording medium and magnetic recording and reproducing ap...
Patent number
11,355,148
Issue date
Jun 7, 2022
FUJIFILM Corporation
Norihito Kasada
G11 - INFORMATION STORAGE
Information
Patent Grant
Real-time scan point homogenization for terrestrial laser scanner
Patent number
11,340,058
Issue date
May 24, 2022
Faro Technologies, Inc.
Julian Becker
G01 - MEASURING TESTING
Information
Patent Grant
Sensor head
Patent number
11,340,059
Issue date
May 24, 2022
Omron Corporation
Shinya Furukawa
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for interferometric multifocus microscopy
Patent number
11,340,057
Issue date
May 24, 2022
Northwestern University
Kuan He
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for interferometry
Patent number
11,333,484
Issue date
May 17, 2022
Ariel Scientific Innovations Ltd.
Shmuel Sternklar
G01 - MEASURING TESTING
Information
Patent Grant
Optical systems and methods for measuring rotational movement
Patent number
11,280,603
Issue date
Mar 22, 2022
OTM TECHNOLOGIES LTD.
Opher Kinrot
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Interferometer with multiple wavelength sources of different cohere...
Patent number
11,274,915
Issue date
Mar 15, 2022
Arizona Board of Regents on behalf of the University of Arizona
Stanley Pau
G01 - MEASURING TESTING
Information
Patent Grant
Method for monitoring time-dependent properties of light during sca...
Patent number
11,262,185
Issue date
Mar 1, 2022
OPTORES GMBH
Robert Huber
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Patents Applications
last 30 patents
Information
Patent Application
Solid-State Distinct-Unidirectional Photonic Interferometers for Co...
Publication number
20240133672
Publication date
Apr 25, 2024
Val Parker
G01 - MEASURING TESTING
Information
Patent Application
LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
Publication number
20240118072
Publication date
Apr 11, 2024
Samsung Electronics Co., Ltd.
Sungho Jang
G01 - MEASURING TESTING
Information
Patent Application
Apparatus of Inner Light Layer Illumination by Multi-beam Interfere...
Publication number
20240085168
Publication date
Mar 14, 2024
Shangqing Liu
G02 - OPTICS
Information
Patent Application
MACHINE-LEARNING TECHNIQUES FOR SPARSE-TO-DENSE SPECTRAL RECONSTRUC...
Publication number
20230267659
Publication date
Aug 24, 2023
NVIDIA Corporation
Benjamin ECKART
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SCANNING OVERLAY METROLOGY USING OVERLAY TARGETS HAVING MULTIPLE SP...
Publication number
20230213875
Publication date
Jul 6, 2023
Yuval Lubashevsky
G01 - MEASURING TESTING
Information
Patent Application
COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM
Publication number
20230168075
Publication date
Jun 1, 2023
Arizona Board of Regents on behalf of The University of Arizona
Rongguang Liang
G01 - MEASURING TESTING
Information
Patent Application
SIMULTANEOUS PHASE-SHIFT POINT DIFFRACTION INTERFEROMETER AND METHO...
Publication number
20230160684
Publication date
May 25, 2023
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
Peng FENG
G01 - MEASURING TESTING
Information
Patent Application
LOW-COHERENCE INTERFEROMETER WITH SURFACE POWER COMPENSATION
Publication number
20230160686
Publication date
May 25, 2023
Corning Incorporated
Joshua Monroe Cobb
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL CONTACT METROLOGY
Publication number
20230092947
Publication date
Mar 23, 2023
Zygo Corporation
Leslie L. Deck
G01 - MEASURING TESTING
Information
Patent Application
DEVICES, SYSTEMS, AND METHODS FOR IMAGE SYNCHRONIZATION IN INTRACOR...
Publication number
20230015390
Publication date
Jan 19, 2023
Canon U.S.A., Inc.
Badr Elmaanaoui
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SENSOR FOR SURFACE INSPECTION AND METROLOGY
Publication number
20220381550
Publication date
Dec 1, 2022
Arun Anath AIYER
G01 - MEASURING TESTING
Information
Patent Application
FOCUS SCAN TYPE IMAGING DEVICE FOR IMAGING TARGET OBJECT IN SAMPLE...
Publication number
20220381695
Publication date
Dec 1, 2022
Korea University Research and Business Foundation
Won-Shik CHOI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SYSTEM AND METHOD OF FORMING THE SAME
Publication number
20220326151
Publication date
Oct 13, 2022
Agency for Science, Technology and Research
Leonid KRIVITSKIY
G01 - MEASURING TESTING
Information
Patent Application
Method of Inner Light Layer Illumination by multi-beam Interference...
Publication number
20220252384
Publication date
Aug 11, 2022
Shangqing Liu
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFERENCE MEASURING APPARATUS AND OPTICAL INTERFERENCE M...
Publication number
20220221266
Publication date
Jul 14, 2022
TOPCON CORPORATION
Homare MOMIYAMA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL COMPONENT FOR AN ATR INTERFEROMETRIC IMAGING DEVICE
Publication number
20220196384
Publication date
Jun 23, 2022
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Cyrielle MONPEURT
G02 - OPTICS
Information
Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR DETECTING LIGHT
Publication number
20220026193
Publication date
Jan 27, 2022
Nokia Technologies Oy
Xin YUAN
G01 - MEASURING TESTING
Information
Patent Application
ATOM INTERFEROMETER
Publication number
20220018650
Publication date
Jan 20, 2022
NOMAD ATOMICS PTY LTD
Kyle Sage HARDMAN
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE, PROGRAM, CONTROL DEVICE, AND IMAGING SYSTEM
Publication number
20220015626
Publication date
Jan 20, 2022
Nikon Corporation
Tomohiro KAWASAKI
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Photo-Acoustic Tomography Defect Testing System And Method
Publication number
20210382013
Publication date
Dec 9, 2021
Seurat Technologies, Inc.
Francis L. Leard
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR OPTICAL COHERENCE TOMOGRAPHY ANGIOGRAPHY
Publication number
20210358096
Publication date
Nov 18, 2021
TOPCON CORPORATION
Song Mei
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR DETECTING NANOPARTICLES AND BIOLOGICAL MOL...
Publication number
20210348998
Publication date
Nov 11, 2021
KOC UNIVERSITESI
Hakan UREY
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTERFEROMETRIC PARALLEL DETECTION USING DIGITAL RECTIFICATION AND...
Publication number
20210341280
Publication date
Nov 4, 2021
HI LLC
Hooman Mohseni
G01 - MEASURING TESTING
Information
Patent Application
Optical Measurement System
Publication number
20210278198
Publication date
Sep 9, 2021
Yu-Yen Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Detecting Changes in Direction of a Light...
Publication number
20210239452
Publication date
Aug 5, 2021
Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.v
Johann Engelhardt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR INTERFEROMETRIC MULTIFOCUS MICROSCOPY
Publication number
20210215472
Publication date
Jul 15, 2021
Northwestern University
Kuan He
G01 - MEASURING TESTING
Information
Patent Application
POLARIZATION HOLOGRAPHIC MICROSCOPE SYSTEM AND SAMPLE IMAGE ACQUISI...
Publication number
20210199417
Publication date
Jul 1, 2021
Korea University Research and Business Foundation
Youngwoon CHOI
G02 - OPTICS
Information
Patent Application
OCT IMAGE CAPTURE DEVICE
Publication number
20210145273
Publication date
May 20, 2021
Rowiak GmbH
Holger Lubatschowski
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER WITH MULTIPLE WAVELENGTH SOURCES OF DIFFERENT COHERE...
Publication number
20210088321
Publication date
Mar 25, 2021
Stanley Pau
G01 - MEASURING TESTING
Information
Patent Application
SELF-MIXING PARTICULATE MATTER SENSORS USING VCSELS WITH EXTRINSIC...
Publication number
20210080245
Publication date
Mar 18, 2021
Apple Inc.
Mehmet MUTLU
H01 - BASIC ELECTRIC ELEMENTS