characterised by particular imaging or detection techniques

Industry

CPC
G01B9/02041

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02041characterised by particular imaging or detection techniques

Industries

Patents Grantslast 30 patents

Information Patent Grant
Compact snapshot dual-mode interferometric system
- Patent number 12,203,752
- Issue date Jan 21, 2025
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Grant
Photo-acoustic tomography defect testing system and method
- Patent number 12,146,861
- Issue date Nov 19, 2024
- Seurat Technologies, Inc.
- Francis L. Leard
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus of inner light layer illumination by multi-beam interfere...
- Patent number 12,123,716
- Issue date Oct 22, 2024
- Shangqing Liu
- G01 - MEASURING TESTING
Information Patent Grant
Spatially filtered talbot interferometer for wafer distortion measu...
- Patent number 12,104,891
- Issue date Oct 1, 2024
- Daniel Gene Smith
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting changes in direction of a light...
- Patent number 12,104,902
- Issue date Oct 1, 2024
- Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
- Johann Engelhardt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detecting nanoparticles and biological mol...
- Patent number 12,098,991
- Issue date Sep 24, 2024
- Koc Universitesi
- Hakan Urey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Focus scan type imaging device for imaging target object in sample...
- Patent number 12,055,491
- Issue date Aug 6, 2024
- Korea University Research and Business Foundation
- Won-Shik Choi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for optical coherence tomography angiography
- Patent number 11,972,544
- Issue date Apr 30, 2024
- Topcon Corporation
- Song Mei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Estimating gemstone weight in mounted settings
- Patent number 11,959,796
- Issue date Apr 16, 2024
- The RealReal, Inc.
- Loretta Catherine Castoro
- G01 - MEASURING TESTING
Information Patent Grant
Extended reality virtual distance measurement system
- Patent number 11,867,507
- Issue date Jan 9, 2024
- MLOptic Corp.
- Pengfei Wu
- G01 - MEASURING TESTING
Information Patent Grant
Method of inner light layer illumination by multi-beam interference...
- Patent number 11,808,568
- Issue date Nov 7, 2023
- Shangqing Liu
- G01 - MEASURING TESTING
Information Patent Grant
Scanning overlay metrology using overlay targets having multiple sp...
- Patent number 11,796,925
- Issue date Oct 24, 2023
- KLA Corporation
- Yuval Lubashevsky
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous phase-shift point diffraction interferometer and metho...
- Patent number 11,788,829
- Issue date Oct 17, 2023
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Peng Feng
- G01 - MEASURING TESTING
Information Patent Grant
Optical component for an ATR interferometric imaging device
- Patent number 11,747,134
- Issue date Sep 5, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Cyrielle Monpeurt
- G01 - MEASURING TESTING
Information Patent Grant
Atom interferometer
- Patent number 11,725,926
- Issue date Aug 15, 2023
- Nomad Atomics Pty Ltd
- Kyle Sage Hardman
- G01 - MEASURING TESTING
Information Patent Grant
2D multi-layer thickness measurement with reconstructed spectrum
- Patent number 11,684,253
- Issue date Jun 27, 2023
- Topcon Corporation
- Zaixing Mao
- G01 - MEASURING TESTING
Information Patent Grant
OCT image capture device
- Patent number 11,659,991
- Issue date May 30, 2023
- OCUMAX HEALTHCARE GMBH
- Holger Lubatschowski
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interference image acquiring device and method for acquiring interf...
- Patent number 11,630,059
- Issue date Apr 18, 2023
- Hamamatsu Photonics K.K.
- Toyohiko Yamauchi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring cracks in wall surface
- Patent number 11,595,558
- Issue date Feb 28, 2023
- Topcon Corporation
- Takashi Tanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Estimating gemstone weight in mounted settings
- Patent number 11,579,008
- Issue date Feb 14, 2023
- The RealReal, Inc.
- Loretta Catherine Castoro
- G01 - MEASURING TESTING
Information Patent Grant
Differential height measurement using interstitial mirror plate
- Patent number 11,566,887
- Issue date Jan 31, 2023
- KLA Corporation
- Frank Chilese
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric parallel detection using digital rectification and...
- Patent number 11,566,886
- Issue date Jan 31, 2023
- HI LLC
- Hooman Mohseni
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor for surface inspection and metrology
- Patent number 11,561,080
- Issue date Jan 24, 2023
- Arun Anath Aiyer
- G01 - MEASURING TESTING
Information Patent Grant
Compact briefcase OCT system for point-of-care imaging
- Patent number 11,445,915
- Issue date Sep 20, 2022
- The Board of Trustees of the University of Illinois
- Stephen A. Boppart
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Mapping ciliary activity using phase resolved spectrally encoded in...
- Patent number 11,445,941
- Issue date Sep 20, 2022
- The Regents of the University of California
- Zhongping Chen
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Apparatus, systems, and methods for detecting light
- Patent number 11,441,889
- Issue date Sep 13, 2022
- Nokia Technologies Oy
- Xin Yuan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Wafer carrier thickness measuring device
- Patent number 11,371,829
- Issue date Jun 28, 2022
- SK SILTRON CO., LTD.
- Suk Jin Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polarization holographic microscope system and sample image acquisi...
- Patent number 11,365,961
- Issue date Jun 21, 2022
- Korea University Research and Business Foundation
- Youngwoon Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
State determination apparatus, state determination method, and comp...
- Patent number 11,365,963
- Issue date Jun 21, 2022
- NEC Corporation
- Subhajit Chaudhury
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Magnetic recording medium and magnetic recording and reproducing ap...
- Patent number 11,355,148
- Issue date Jun 7, 2022
- FUJIFILM Corporation
- Norihito Kasada
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR HIGH-RESOLUTION REFLECTION TOMOGRAPHIC IMAGING
- Publication number 20250052560
- Publication date Feb 13, 2025
- Korea Advanced Institute of Science and Techno logy
- YongKeun PARK
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETR...
- Publication number 20250044073
- Publication date Feb 6, 2025
- ORBOTECH LTD.
- Yulia Lovsky
- G01 - MEASURING TESTING
Information Patent Application
BOND-SELECTIVE FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20250012557
- Publication date Jan 9, 2025
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO REDUCE MEASUREMENT ERROR IN INTERFEROMETRY-BAS...
- Publication number 20240337478
- Publication date Oct 10, 2024
- KLA Corporation
- Yuchi Chen
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR OPTICAL COHERENCE TOMOGRAPHY ANGIOGRAPHY
- Publication number 20240249393
- Publication date Jul 25, 2024
- TOPCON CORPORATION
- Song Mei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Solid-State Distinct-Unidirectional Photonic Interferometers for Co...
- Publication number 20240230313
- Publication date Jul 11, 2024
- Val Parker
- G01 - MEASURING TESTING
Information Patent Application
Pixel-Diversity Nanoparticle Detection by Interferometric Reflectan...
- Publication number 20240201084
- Publication date Jun 20, 2024
- Trustees of Boston University
- M. Selim Ünlü
- G01 - MEASURING TESTING
Information Patent Application
THREE-PHASE SPECTRAL INTERFEROMETRY WITH IMPROVED SIGNAL RETRIEVAL
- Publication number 20240159511
- Publication date May 16, 2024
- LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
- Ryan Douglas Muir
- G11 - INFORMATION STORAGE
Information Patent Application
Solid-State Distinct-Unidirectional Photonic Interferometers for Co...
- Publication number 20240133672
- Publication date Apr 25, 2024
- Val Parker
- G01 - MEASURING TESTING
Information Patent Application
LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
- Publication number 20240118072
- Publication date Apr 11, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Application
Apparatus of Inner Light Layer Illumination by Multi-beam Interfere...
- Publication number 20240085168
- Publication date Mar 14, 2024
- Shangqing Liu
- G02 - OPTICS
Information Patent Application
MACHINE-LEARNING TECHNIQUES FOR SPARSE-TO-DENSE SPECTRAL RECONSTRUC...
- Publication number 20230267659
- Publication date Aug 24, 2023
- NVIDIA Corporation
- Benjamin ECKART
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING OVERLAY METROLOGY USING OVERLAY TARGETS HAVING MULTIPLE SP...
- Publication number 20230213875
- Publication date Jul 6, 2023
- Yuval Lubashevsky
- G01 - MEASURING TESTING
Information Patent Application
COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM
- Publication number 20230168075
- Publication date Jun 1, 2023
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
SIMULTANEOUS PHASE-SHIFT POINT DIFFRACTION INTERFEROMETER AND METHO...
- Publication number 20230160684
- Publication date May 25, 2023
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Peng FENG
- G01 - MEASURING TESTING
Information Patent Application
LOW-COHERENCE INTERFEROMETER WITH SURFACE POWER COMPENSATION
- Publication number 20230160686
- Publication date May 25, 2023
- Corning Incorporated
- Joshua Monroe Cobb
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CONTACT METROLOGY
- Publication number 20230092947
- Publication date Mar 23, 2023
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
DEVICES, SYSTEMS, AND METHODS FOR IMAGE SYNCHRONIZATION IN INTRACOR...
- Publication number 20230015390
- Publication date Jan 19, 2023
- Canon U.S.A., Inc.
- Badr Elmaanaoui
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR FOR SURFACE INSPECTION AND METROLOGY
- Publication number 20220381550
- Publication date Dec 1, 2022
- Arun Anath AIYER
- G01 - MEASURING TESTING
Information Patent Application
FOCUS SCAN TYPE IMAGING DEVICE FOR IMAGING TARGET OBJECT IN SAMPLE...
- Publication number 20220381695
- Publication date Dec 1, 2022
- Korea University Research and Business Foundation
- Won-Shik CHOI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND METHOD OF FORMING THE SAME
- Publication number 20220326151
- Publication date Oct 13, 2022
- Agency for Science, Technology and Research
- Leonid KRIVITSKIY
- G01 - MEASURING TESTING
Information Patent Application
Method of Inner Light Layer Illumination by multi-beam Interference...
- Publication number 20220252384
- Publication date Aug 11, 2022
- Shangqing Liu
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFERENCE MEASURING APPARATUS AND OPTICAL INTERFERENCE M...
- Publication number 20220221266
- Publication date Jul 14, 2022
- TOPCON CORPORATION
- Homare MOMIYAMA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COMPONENT FOR AN ATR INTERFEROMETRIC IMAGING DEVICE
- Publication number 20220196384
- Publication date Jun 23, 2022
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Cyrielle MONPEURT
- G02 - OPTICS
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR DETECTING LIGHT
- Publication number 20220026193
- Publication date Jan 27, 2022
- Nokia Technologies Oy
- Xin YUAN
- G01 - MEASURING TESTING
Information Patent Application
ATOM INTERFEROMETER
- Publication number 20220018650
- Publication date Jan 20, 2022
- NOMAD ATOMICS PTY LTD
- Kyle Sage HARDMAN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE, PROGRAM, CONTROL DEVICE, AND IMAGING SYSTEM
- Publication number 20220015626
- Publication date Jan 20, 2022
- Nikon Corporation
- Tomohiro KAWASAKI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Photo-Acoustic Tomography Defect Testing System And Method
- Publication number 20210382013
- Publication date Dec 9, 2021
- Seurat Technologies, Inc.
- Francis L. Leard
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR OPTICAL COHERENCE TOMOGRAPHY ANGIOGRAPHY
- Publication number 20210358096
- Publication date Nov 18, 2021
- TOPCON CORPORATION
- Song Mei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING NANOPARTICLES AND BIOLOGICAL MOL...
- Publication number 20210348998
- Publication date Nov 11, 2021
- KOC UNIVERSITESI
- Hakan UREY
- G06 - COMPUTING CALCULATING COUNTING

characterised by particular imaging or detection techniques

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Compact snapshot dual-mode interferometric system

Photo-acoustic tomography defect testing system and method

Apparatus of inner light layer illumination by multi-beam interfere...

Spatially filtered talbot interferometer for wafer distortion measu...

Method and apparatus for detecting changes in direction of a light...

Method and apparatus for detecting nanoparticles and biological mol...

Focus scan type imaging device for imaging target object in sample...

Method and apparatus for optical coherence tomography angiography

Estimating gemstone weight in mounted settings

Extended reality virtual distance measurement system

Method of inner light layer illumination by multi-beam interference...

Scanning overlay metrology using overlay targets having multiple sp...

Simultaneous phase-shift point diffraction interferometer and metho...

Optical component for an ATR interferometric imaging device

Atom interferometer

2D multi-layer thickness measurement with reconstructed spectrum

OCT image capture device

Interference image acquiring device and method for acquiring interf...

Apparatus and method for measuring cracks in wall surface

Estimating gemstone weight in mounted settings

Differential height measurement using interstitial mirror plate

Interferometric parallel detection using digital rectification and...

Optical sensor for surface inspection and metrology

Compact briefcase OCT system for point-of-care imaging

Mapping ciliary activity using phase resolved spectrally encoded in...

Apparatus, systems, and methods for detecting light

Wafer carrier thickness measuring device

Polarization holographic microscope system and sample image acquisi...

State determination apparatus, state determination method, and comp...

Magnetic recording medium and magnetic recording and reproducing ap...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR HIGH-RESOLUTION REFLECTION TOMOGRAPHIC IMAGING

THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETR...

BOND-SELECTIVE FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY

SYSTEM AND METHOD TO REDUCE MEASUREMENT ERROR IN INTERFEROMETRY-BAS...

METHOD AND APPARATUS FOR OPTICAL COHERENCE TOMOGRAPHY ANGIOGRAPHY

Solid-State Distinct-Unidirectional Photonic Interferometers for Co...

Pixel-Diversity Nanoparticle Detection by Interferometric Reflectan...

THREE-PHASE SPECTRAL INTERFEROMETRY WITH IMPROVED SIGNAL RETRIEVAL

Solid-State Distinct-Unidirectional Photonic Interferometers for Co...

LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME

Apparatus of Inner Light Layer Illumination by Multi-beam Interfere...

MACHINE-LEARNING TECHNIQUES FOR SPARSE-TO-DENSE SPECTRAL RECONSTRUC...

SCANNING OVERLAY METROLOGY USING OVERLAY TARGETS HAVING MULTIPLE SP...

COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM

SIMULTANEOUS PHASE-SHIFT POINT DIFFRACTION INTERFEROMETER AND METHO...

LOW-COHERENCE INTERFEROMETER WITH SURFACE POWER COMPENSATION

OPTICAL CONTACT METROLOGY

DEVICES, SYSTEMS, AND METHODS FOR IMAGE SYNCHRONIZATION IN INTRACOR...

OPTICAL SENSOR FOR SURFACE INSPECTION AND METROLOGY

FOCUS SCAN TYPE IMAGING DEVICE FOR IMAGING TARGET OBJECT IN SAMPLE...

OPTICAL SYSTEM AND METHOD OF FORMING THE SAME

Method of Inner Light Layer Illumination by multi-beam Interference...

OPTICAL INTERFERENCE MEASURING APPARATUS AND OPTICAL INTERFERENCE M...

OPTICAL COMPONENT FOR AN ATR INTERFEROMETRIC IMAGING DEVICE

APPARATUS, SYSTEMS, AND METHODS FOR DETECTING LIGHT

ATOM INTERFEROMETER

OPTICAL DEVICE, PROGRAM, CONTROL DEVICE, AND IMAGING SYSTEM

Photo-Acoustic Tomography Defect Testing System And Method

METHOD AND APPARATUS FOR OPTICAL COHERENCE TOMOGRAPHY ANGIOGRAPHY

METHOD AND APPARATUS FOR DETECTING NANOPARTICLES AND BIOLOGICAL MOL...