characterised by particular mechanical design details

Industry

CPC
G01B9/02049

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02049characterised by particular mechanical design details

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Mirror unit and optical module
- Patent number 12,152,878
- Issue date Nov 26, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Heterogeneous integration detecting method and heterogeneous integr...
- Patent number 12,007,221
- Issue date Jun 11, 2024
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G01 - MEASURING TESTING
Information Patent Grant
Pre and post processing metrology apparatus
- Patent number 11,881,436
- Issue date Jan 23, 2024
- Applied Materials, Inc.
- Jun-Liang Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mirror unit and optical module
- Patent number 11,879,731
- Issue date Jan 23, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optomechanical inertial reference mirror for atom interferometer an...
- Patent number 11,867,713
- Issue date Jan 9, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Felipe Guzmán
- G01 - MEASURING TESTING
Information Patent Grant
Micro optic assemblies and optical interrogation systems
- Patent number 11,761,754
- Issue date Sep 19, 2023
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Grant
Optical component for an ATR interferometric imaging device
- Patent number 11,747,134
- Issue date Sep 5, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Cyrielle Monpeurt
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical system (MEMS) and (MEM) optical interferomet...
- Patent number 11,725,989
- Issue date Aug 15, 2023
- Green Vision Systems Ltd.
- Danny S. Moshe
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Systems, methods, and media for multiple reference arm spectral dom...
- Patent number 11,713,961
- Issue date Aug 1, 2023
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer filters with partial compensation structure
- Patent number 11,703,316
- Issue date Jul 18, 2023
- PSIQUANTUM, CORP.
- Koustuban Ravi
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,703,317
- Issue date Jul 18, 2023
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Multi-fiber optical probe and optical coherence tomography system
- Patent number 11,701,004
- Issue date Jul 18, 2023
- SYNAPTIVE MEDICAL INC.
- Siu Wai Jacky Mak
- G01 - MEASURING TESTING
Information Patent Grant
Optical module
- Patent number 11,635,290
- Issue date Apr 25, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical device
- Patent number 11,629,947
- Issue date Apr 18, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mirror unit and optical module
- Patent number 11,629,946
- Issue date Apr 18, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mirror unit and optical module
- Patent number 11,624,605
- Issue date Apr 11, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Differential height measurement using interstitial mirror plate
- Patent number 11,566,887
- Issue date Jan 31, 2023
- KLA Corporation
- Frank Chilese
- G01 - MEASURING TESTING
Information Patent Grant
Thickness measuring device
- Patent number 11,549,796
- Issue date Jan 10, 2023
- TECO IMAGE SYSTEMS CO., LTD
- Chien-Ying Chen
- G01 - MEASURING TESTING
Information Patent Grant
Scanning self-mixing interferometry system and sensor
- Patent number 11,536,555
- Issue date Dec 27, 2022
- Meta Platforms Technologies, LLC
- Maik Andre Scheller
- G01 - MEASURING TESTING
Information Patent Grant
Micro optic assemblies and optical interrogation systems
- Patent number 11,499,818
- Issue date Nov 15, 2022
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G02 - OPTICS
Information Patent Grant
Optical coherence tomography receiver
- Patent number 11,490,804
- Issue date Nov 8, 2022
- Alcon Inc.
- Muhammad K Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for interferometric measurement of a two or three...
- Patent number 11,493,325
- Issue date Nov 8, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Lun Kai Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Laser interference device
- Patent number 11,378,386
- Issue date Jul 5, 2022
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Stitching-measurement device and stitching-measurement method
- Patent number 11,365,964
- Issue date Jun 21, 2022
- The Institute of Optics and Electronics, The Chinese Academy of Sciences
- Fuchao Xu
- G01 - MEASURING TESTING
Information Patent Grant
Sensor head
- Patent number 11,340,059
- Issue date May 24, 2022
- Omron Corporation
- Shinya Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Swept frequency photonic integrated circuit for absolute metrology
- Patent number 11,320,255
- Issue date May 3, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Grant
Integrating 3D printing into multi-process fabrication schemes
- Patent number 11,241,839
- Issue date Feb 8, 2022
- Applied Materials, Inc.
- William H. McClintock
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Arrangement and method for robust single-shot interferometry
- Patent number 11,231,269
- Issue date Jan 25, 2022
- Universitat Stuttgart
- Klaus Körner
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,221,204
- Issue date Jan 11, 2022
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Optical module having high-accuracy spectral analysis
- Patent number 11,209,260
- Issue date Dec 28, 2021
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
REFLECTIVE CO-AXIAL INTERFEROMETER SYSTEMS AND METHODS THEREOF
- Publication number 20240426594
- Publication date Dec 26, 2024
- OptiPro Systems, LLC
- James F. Munro
- G01 - MEASURING TESTING
Information Patent Application
META-MATERIAL INTERFEROMETRY SYSTEMS AND METHODS
- Publication number 20240402407
- Publication date Dec 5, 2024
- Danbury Mission Technologies, LLC
- Alexander J. Majewski
- G02 - OPTICS
Information Patent Application
Laser Interferometer And Method Of Adjusting Optical Axis Of Laser...
- Publication number 20240384978
- Publication date Nov 21, 2024
- SEIKO EPSON CORPORATION
- Jun KITAGAWA
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER WITH ABSORBING LAYER
- Publication number 20240175671
- Publication date May 30, 2024
- Murata Manufacturing Co., Ltd.
- Ville KAAJAKARI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE
- Publication number 20240151510
- Publication date May 9, 2024
- Shimadzu Corporation
- Takahisa ARAKI
- G01 - MEASURING TESTING
Information Patent Application
Compact Thermal Expansion Compensator
- Publication number 20240151511
- Publication date May 9, 2024
- United States of America, as Represented by the Secretary of the Navy
- Michael J. Pero
- G01 - MEASURING TESTING
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20240110779
- Publication date Apr 4, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Methods and Apparatuses for Fabricating Polymeric Conformal Coating...
- Publication number 20240042481
- Publication date Feb 8, 2024
- UCL Business LTD
- Paul Beard
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
INTERFEROMETER FILTERS WITH PARTIAL COMPENSATION STRUCTURE
- Publication number 20240027179
- Publication date Jan 25, 2024
- Psiquantum, Corp.
- Koustuban Ravi
- G01 - MEASURING TESTING
Information Patent Application
MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS
- Publication number 20230417541
- Publication date Dec 28, 2023
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G02 - OPTICS
Information Patent Application
SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE REFERENCE ARM SPECTRAL DOM...
- Publication number 20230400293
- Publication date Dec 14, 2023
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Application
LASER INTERFEROMETER
- Publication number 20230243636
- Publication date Aug 3, 2023
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE
- Publication number 20230221106
- Publication date Jul 13, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
OPTICAL SYSTEM AND LITHOGRAPHY APPARATUS
- Publication number 20230221646
- Publication date Jul 13, 2023
- Carl Zeiss SMT GMBH
- Dirk Schaffer
- G02 - OPTICS
Information Patent Application
OPTICAL SYSTEM USING ENHANCED STATIC FRINGE CAPTURE
- Publication number 20230213334
- Publication date Jul 6, 2023
- BMV Optical Technologies Inc.
- Curtis Blake LaPlante
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER FILTERS WITH PARTIAL COMPENSATION STRUCTURE
- Publication number 20230168076
- Publication date Jun 1, 2023
- Psiquantum, Corp.
- Koustuban Ravi
- G01 - MEASURING TESTING
Information Patent Application
MICROPHONE COMPONENT AND METHOD OF MANUFACTURE
- Publication number 20230164470
- Publication date May 25, 2023
- SensiBel AS
- Sigbjørn KOLBERG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
HETEROGENEOUS INTEGRATION DETECTING METHOD AND HETEROGENEOUS INTEGR...
- Publication number 20230152086
- Publication date May 18, 2023
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G01 - MEASURING TESTING
Information Patent Application
Binary Optimization Using Shallow Boson Sampling
- Publication number 20230133597
- Publication date May 4, 2023
- ORCA Computing Limited
- Hugo Wallner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING SELF-MIXING INTERFEROMETRY WITH WAVEGUIDE
- Publication number 20230064721
- Publication date Mar 2, 2023
- Meta Platforms Technologies, LLC
- Maik Andre Scheller
- G01 - MEASURING TESTING
Information Patent Application
MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS
- Publication number 20230032157
- Publication date Feb 2, 2023
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY RECEIVER
- Publication number 20230021386
- Publication date Jan 26, 2023
- Alcon Inc.
- Muhammad K. Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS
- Publication number 20230009864
- Publication date Jan 12, 2023
- Jun-Liang SU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20230003504
- Publication date Jan 5, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
OCT DEVICE
- Publication number 20220236047
- Publication date Jul 28, 2022
- TOMEY CORPORATION
- Takashi KAMO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR CONFIGURING AND OPTIMISING PROGRAMMABLE PHOTONIC DEVICES...
- Publication number 20220221647
- Publication date Jul 14, 2022
- Universitat Politècnica de València
- Daniel PÉREZ LÓPEZ
- G01 - MEASURING TESTING
Information Patent Application
AUDIO SYSTEM THAT USES AN OPTICAL MICROPHONE
- Publication number 20220201403
- Publication date Jun 23, 2022
- Facebook Technologies, LLC
- Morteza Khaleghimeybodi
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Application
HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
- Publication number 20220187055
- Publication date Jun 16, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Application
SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE REFERENCE ARM SPECTRAL DOM...
- Publication number 20220170732
- Publication date Jun 2, 2022
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Application
OPTOMECHNICAL INERTIAL REFERENCE MIRROR FOR ATOM INTERFEROMETER AND...
- Publication number 20220163557
- Publication date May 26, 2022
- Arizona Board of Regents on Behalf of the University of Arizona
- Felipe Guzmán
- G01 - MEASURING TESTING

characterised by particular mechanical design details

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Mirror unit and optical module

Heterogeneous integration detecting method and heterogeneous integr...

Pre and post processing metrology apparatus

Mirror unit and optical module

Optomechanical inertial reference mirror for atom interferometer an...

Micro optic assemblies and optical interrogation systems

Optical component for an ATR interferometric imaging device

Microelectromechanical system (MEMS) and (MEM) optical interferomet...

Systems, methods, and media for multiple reference arm spectral dom...

Interferometer filters with partial compensation structure

Heterodyne photonic integrated circuit for absolute metrology

Multi-fiber optical probe and optical coherence tomography system

Optical module

Optical device

Mirror unit and optical module

Mirror unit and optical module

Differential height measurement using interstitial mirror plate

Thickness measuring device

Scanning self-mixing interferometry system and sensor

Micro optic assemblies and optical interrogation systems

Optical coherence tomography receiver

Device and method for interferometric measurement of a two or three...

Laser interference device

Stitching-measurement device and stitching-measurement method

Sensor head

Swept frequency photonic integrated circuit for absolute metrology

Integrating 3D printing into multi-process fabrication schemes

Arrangement and method for robust single-shot interferometry

Heterodyne photonic integrated circuit for absolute metrology

Optical module having high-accuracy spectral analysis

Patents Applicationslast 30 patents

REFLECTIVE CO-AXIAL INTERFEROMETER SYSTEMS AND METHODS THEREOF

META-MATERIAL INTERFEROMETRY SYSTEMS AND METHODS

Laser Interferometer And Method Of Adjusting Optical Axis Of Laser...

INTERFEROMETER WITH ABSORBING LAYER

ANALYSIS DEVICE

Compact Thermal Expansion Compensator

MIRROR UNIT AND OPTICAL MODULE

Methods and Apparatuses for Fabricating Polymeric Conformal Coating...

INTERFEROMETER FILTERS WITH PARTIAL COMPENSATION STRUCTURE

MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS

SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE REFERENCE ARM SPECTRAL DOM...

LASER INTERFEROMETER

OPTICAL DEVICE

OPTICAL SYSTEM AND LITHOGRAPHY APPARATUS

OPTICAL SYSTEM USING ENHANCED STATIC FRINGE CAPTURE

INTERFEROMETER FILTERS WITH PARTIAL COMPENSATION STRUCTURE

MICROPHONE COMPONENT AND METHOD OF MANUFACTURE

HETEROGENEOUS INTEGRATION DETECTING METHOD AND HETEROGENEOUS INTEGR...

Binary Optimization Using Shallow Boson Sampling

SCANNING SELF-MIXING INTERFEROMETRY WITH WAVEGUIDE

MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS

OPTICAL COHERENCE TOMOGRAPHY RECEIVER

METROLOGY APPARATUS

MIRROR UNIT AND OPTICAL MODULE

OCT DEVICE

METHOD FOR CONFIGURING AND OPTIMISING PROGRAMMABLE PHOTONIC DEVICES...

AUDIO SYSTEM THAT USES AN OPTICAL MICROPHONE

HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY

SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE REFERENCE ARM SPECTRAL DOM...

OPTOMECHNICAL INERTIAL REFERENCE MIRROR FOR ATOM INTERFEROMETER AND...