characterised by the material or shape of the object to be examined

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G01N21/95

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/95characterised by the material or shape of the object to be examined

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Lamp with double-walled housing, for hyperspectral imaging
- Patent number 12,287,296
- Issue date Apr 29, 2025
- Parata Systems, LLC
- Dries Johannes Pruimboom
- F21 - LIGHTING
Information Patent Grant
Video pipe inspection systems and methods with sensor data
- Patent number 12,287,297
- Issue date Apr 29, 2025
- SeeScan, Inc.
- Michael J. Martin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dark field microscope
- Patent number 12,287,470
- Issue date Apr 29, 2025
- ASML Netherlands B.V.
- Sebastianus Adrianus Goorden
- G01 - MEASURING TESTING
Information Patent Grant
Hub connection for pipeline inspection device
- Patent number 12,287,258
- Issue date Apr 29, 2025
- Milwaukee Electric Tool Corporation
- Samuel J. Krohlow
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Raman analysis of pharmaceutical dosage forms
- Patent number 12,287,289
- Issue date Apr 29, 2025
- Agilent Technologies LDA UK Limited
- Pavel Matousek
- G01 - MEASURING TESTING
Information Patent Grant
Region classification of film non-uniformity based on processing of...
- Patent number 12,288,724
- Issue date Apr 29, 2025
- Applied Materials, Inc.
- Dominic J. Benvegnu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ultrafast laser imaging with box lock-in
- Patent number 12,281,982
- Issue date Apr 22, 2025
- Monstr Sense Technologies, LLC
- Eric W. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Inspection layer to improve the detection of defects through optica...
- Patent number 12,281,991
- Issue date Apr 22, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- I-Che Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple particle beam microscope and associated method with an imp...
- Patent number 12,283,457
- Issue date Apr 22, 2025
- Carl Zeiss MultiSEM GmbH
- Nicole Rauwolf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate measurement subsystem
- Patent number 12,283,503
- Issue date Apr 22, 2025
- Applied Materials, Inc.
- Upendra V. Ummethala
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid chemical, method for producing liquid chemical, and method f...
- Patent number 12,282,259
- Issue date Apr 22, 2025
- FUJIFILM Corporation
- Tetsuya Kamimura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems and methods for voltage contrast imaging using photoreflect...
- Patent number 12,281,992
- Issue date Apr 22, 2025
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Grant
System for use with component of power generation apparatus
- Patent number 12,276,619
- Issue date Apr 15, 2025
- Rolls-Royce PLC
- Andrew D Norton
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Grant
Defect inspection device
- Patent number 12,276,618
- Issue date Apr 15, 2025
- HITACHI HIGH-TECH CORPORATION
- Kazuhide Sato
- G01 - MEASURING TESTING
Information Patent Grant
Laser processing device and laser processing method
- Patent number 12,269,125
- Issue date Apr 8, 2025
- Hamamatsu Photonics K.K.
- Takafumi Ogiwara
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of processing a cleaved semiconductor wafer
- Patent number 12,270,768
- Issue date Apr 8, 2025
- GlobalWafers Co., Ltd.
- Benjamin Michael Meyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection support apparatus, inspection support method, and comput...
- Patent number 12,270,766
- Issue date Apr 8, 2025
- NEC Corporation
- Akira Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and processing system
- Patent number 12,272,577
- Issue date Apr 8, 2025
- Hamamatsu Photonics K.K.
- Takeshi Sakamoto
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method to detect a defect on a lithographic sample and metrology sy...
- Patent number 12,271,115
- Issue date Apr 8, 2025
- Carl Zeiss SMT GmbH
- Toufic Jabbour
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wearable device for differential measurement on pulse rate and bloo...
- Patent number 12,268,475
- Issue date Apr 8, 2025
- Omni MedSci, Inc.
- Mohammed N. Islam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer defect detection device
- Patent number 12,265,038
- Issue date Apr 1, 2025
- PlayNitride Display Co., Ltd.
- Yi-Chia Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for contamination detection in additive fabrication and...
- Patent number 12,263,648
- Issue date Apr 1, 2025
- Formlabs, Inc.
- Shane Wighton
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Space-based circuit-replacing robotic system
- Patent number 12,263,959
- Issue date Apr 1, 2025
- The United States of America as represented by the Secretary of the Navy
- Daniel H. Muhleman
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Cylindrical shell detection method and cylindrical shell detection...
- Patent number 12,265,037
- Issue date Apr 1, 2025
- Advanced ACEBIOTEK CO., LTD.
- Jyh-Chern Chen
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for detecting light-emitting diode
- Patent number 12,265,116
- Issue date Apr 1, 2025
- Century Technology (Shenzhen) Corporation Limited
- Kuang-Hua Liu
- G01 - MEASURING TESTING
Information Patent Grant
Mitigation of undesired spectral effects in optical metrology
- Patent number 12,259,338
- Issue date Mar 25, 2025
- Onto Innovation Inc.
- Petar Žuvela
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection system and a method of use thereof
- Patent number 12,258,665
- Issue date Mar 25, 2025
- JNK TECH
- Youngjin Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display device and method of inspecting the same
- Patent number 12,262,581
- Issue date Mar 25, 2025
- Samsung Display Co., Ltd.
- Taejin Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for characterizing laser machining properties b...
- Patent number 12,257,644
- Issue date Mar 25, 2025
- IPG Photonics Corporation
- Paul J. L. Webster
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Light-source apparatus, inspection apparatus, and adjustment method
- Patent number 12,259,339
- Issue date Mar 25, 2025
- Lasertec Corporation
- Jun Sakuma
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VERIFICATION METHOD FOR A BIRD PROTECTION FUNCTION OF A GLASS SURFACE
- Publication number 20250137939
- Publication date May 1, 2025
- BirdShades Innovations GmbH
- Christoph CERNY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Inspection of Multiple Features of Patterned...
- Publication number 20250137938
- Publication date May 1, 2025
- ORBOTECH LTD.
- Vered Gatt
- G01 - MEASURING TESTING
Information Patent Application
SINGLE WAFER ORIENTATION TOOL-INDUCED SHIFT CLEANING
- Publication number 20250137920
- Publication date May 1, 2025
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A SEMICONDUCTOR PACKAGE
- Publication number 20250139757
- Publication date May 1, 2025
- Samsung Electronics Co., Ltd.
- Minwoo Jeon
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IDENTIFYING DEFECTS IN MATERIALLY INTEGRAL CONNECTIONS
- Publication number 20250137937
- Publication date May 1, 2025
- Beatrice BENDJUS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND ASSOCIATED METHODS FOR 3D SENSING AND IMAGING OF AN ENV...
- Publication number 20250130180
- Publication date Apr 24, 2025
- BrightAI Corporation
- Robert PARKER
- G01 - MEASURING TESTING
Information Patent Application
Visual Inspection Systems for Containers of Liquid Pharmaceutical P...
- Publication number 20250130176
- Publication date Apr 24, 2025
- Amgen Inc.
- Thomas Clark Pearson
- G01 - MEASURING TESTING
Information Patent Application
DETECTION, IDENTIFICATION AND SORTING OF CELLS AND CELL-ASSOCIATED...
- Publication number 20250123211
- Publication date Apr 17, 2025
- Battelle Memorial Institute
- Christopher SCHEITLIN
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT TOOL FOR CABLE-PREPARATION SYSTEM
- Publication number 20250125597
- Publication date Apr 17, 2025
- 3M Innovative Properties Company
- Douglas B. Gundel
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20250123220
- Publication date Apr 17, 2025
- Hitachi High-Tech Corporation
- Takanori KONDO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM TO FOR RAPID INSPECTION OF PHOTOLITHOGRAPHY RETICLE
- Publication number 20250123555
- Publication date Apr 17, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jia-Lin SYU
- G01 - MEASURING TESTING
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
- Publication number 20250123210
- Publication date Apr 17, 2025
- NOVA LTD
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING METHOD, PROCESSING APPARATUS, AND PROCESSING SYSTEM
- Publication number 20250123218
- Publication date Apr 17, 2025
- Lenovo (Beijing) Limited
- Yonghua LIU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MONITORING DEFECT OF SEMICONDUCTOR STRUCTURE
- Publication number 20250116612
- Publication date Apr 10, 2025
- UNIVERSITY-INDUSTRY FOUNDATION(UIF), YONSEI UNIVERSITY
- Mann Ho CHO
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD
- Publication number 20250116614
- Publication date Apr 10, 2025
- Hydromax USA, LLC
- Guy Schiavone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOOD ASSESSMENT DEVICE AND METHOD THEREOF
- Publication number 20250116596
- Publication date Apr 10, 2025
- HCL Technologies Limited
- GURGENIUS SINGH KAPOOR
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED MODES FOR SCANNING ACOUSTIC MICROSCOPE INSPECTION IN SEMIC...
- Publication number 20250116598
- Publication date Apr 10, 2025
- KLA Corporation
- Daniel Ivanov Kavaldjiev
- G01 - MEASURING TESTING
Information Patent Application
EUV Microscope
- Publication number 20250116615
- Publication date Apr 10, 2025
- EUV TECH, INC.
- CHAMI N. PERERA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MODEL-BASED ACOUSTO-OPTIC DEPTH-METROLOGY OF SPECIMENS
- Publication number 20250116597
- Publication date Apr 10, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Guy Shwartz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THIN FILM MONITORING METHOD AND DEVICE
- Publication number 20250116613
- Publication date Apr 10, 2025
- UNIVERSITY-INDUSTRY FOUNDATION(UIF), YONSEI UNIVERSITY
- Mann Ho CHO
- G01 - MEASURING TESTING
Information Patent Application
Using Force Sensing to Prevent Borescope Damage
- Publication number 20250116855
- Publication date Apr 10, 2025
- Baker Hughes Holdings LLC
- Andrew Tang
- G01 - MEASURING TESTING
Information Patent Application
MULTI-PHASE INTERFEROMETER FOR 3D METROLOGY
- Publication number 20250109934
- Publication date Apr 3, 2025
- ORBOTECH LTD.
- Yuri Paskover
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection equipment for checking multiple utensils made of...
- Publication number 20250110061
- Publication date Apr 3, 2025
- Changzhou City Cheng Xin Environmental Protection Technology Co., Ltd.
- Tzung-shen LAI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...
- Publication number 20250102446
- Publication date Mar 27, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Menachem LAPID
- G01 - MEASURING TESTING
Information Patent Application
ULTRABROADBAND PHOTOCONDUCTION METHOD AND APPARATUS FOR DEFECT DENS...
- Publication number 20250102448
- Publication date Mar 27, 2025
- Oregon State University
- Kyle Timothy Vogt
- G01 - MEASURING TESTING
Information Patent Application
BLUR REDUCTION TECHNIQUES FOR SEMICONDUCTOR INSPECTION
- Publication number 20250102822
- Publication date Mar 27, 2025
- ONTO INNOVATION INC.
- Jian Ding
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM FOR YARN BOBBINS AND METHOD FOR INSPECTING YARN B...
- Publication number 20250101640
- Publication date Mar 27, 2025
- SANKO TEKSTIL ISLETMELERI SANAYI VE TICARET ANONIM SIRKETI BASPINAR SUBESI
- Hakan KONUKOGLU
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...
- Publication number 20250102445
- Publication date Mar 27, 2025
- Lasertec Corporation
- Ko GONDAIRA
- G01 - MEASURING TESTING
Information Patent Application
Electrical Performance Prediction Based On Structural Measurements...
- Publication number 20250105064
- Publication date Mar 27, 2025
- KLA Corporation
- Zhengquan Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PACKAGED ITEM INSPECTION DEVICE AND PACKAGED ITEM INSPECTION METHOD
- Publication number 20250100735
- Publication date Mar 27, 2025
- CKD CORPORATION
- Yukihiro Taguchi
- G01 - MEASURING TESTING

characterised by the material or shape of the object to be examined

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Lamp with double-walled housing, for hyperspectral imaging

Video pipe inspection systems and methods with sensor data

Dark field microscope

Hub connection for pipeline inspection device

Raman analysis of pharmaceutical dosage forms

Region classification of film non-uniformity based on processing of...

Ultrafast laser imaging with box lock-in

Inspection layer to improve the detection of defects through optica...

Multiple particle beam microscope and associated method with an imp...

Substrate measurement subsystem

Liquid chemical, method for producing liquid chemical, and method f...

Systems and methods for voltage contrast imaging using photoreflect...

System for use with component of power generation apparatus

Defect inspection device

Laser processing device and laser processing method

Method of processing a cleaved semiconductor wafer

Inspection support apparatus, inspection support method, and comput...

Inspection device and processing system

Method to detect a defect on a lithographic sample and metrology sy...

Wearable device for differential measurement on pulse rate and bloo...

Wafer defect detection device

Techniques for contamination detection in additive fabrication and...

Space-based circuit-replacing robotic system

Cylindrical shell detection method and cylindrical shell detection...

Device and method for detecting light-emitting diode

Mitigation of undesired spectral effects in optical metrology

Substrate inspection system and a method of use thereof

Display device and method of inspecting the same

Methods and systems for characterizing laser machining properties b...

Light-source apparatus, inspection apparatus, and adjustment method

Patents Applicationslast 30 patents

VERIFICATION METHOD FOR A BIRD PROTECTION FUNCTION OF A GLASS SURFACE

System and Method for Inspection of Multiple Features of Patterned...

SINGLE WAFER ORIENTATION TOOL-INDUCED SHIFT CLEANING

METHOD OF INSPECTING A SEMICONDUCTOR PACKAGE

METHOD FOR IDENTIFYING DEFECTS IN MATERIALLY INTEGRAL CONNECTIONS

SYSTEMS AND ASSOCIATED METHODS FOR 3D SENSING AND IMAGING OF AN ENV...

Visual Inspection Systems for Containers of Liquid Pharmaceutical P...

DETECTION, IDENTIFICATION AND SORTING OF CELLS AND CELL-ASSOCIATED...

MEASUREMENT TOOL FOR CABLE-PREPARATION SYSTEM

Defect Inspection Apparatus and Defect Inspection Method

METHOD AND SYSTEM TO FOR RAPID INSPECTION OF PHOTOLITHOGRAPHY RETICLE

RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES

PROCESSING METHOD, PROCESSING APPARATUS, AND PROCESSING SYSTEM

METHOD AND APPARATUS FOR MONITORING DEFECT OF SEMICONDUCTOR STRUCTURE

MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD

FOOD ASSESSMENT DEVICE AND METHOD THEREOF

ENHANCED MODES FOR SCANNING ACOUSTIC MICROSCOPE INSPECTION IN SEMIC...

EUV Microscope

MODEL-BASED ACOUSTO-OPTIC DEPTH-METROLOGY OF SPECIMENS

THIN FILM MONITORING METHOD AND DEVICE

Using Force Sensing to Prevent Borescope Damage

MULTI-PHASE INTERFEROMETER FOR 3D METROLOGY

Optical inspection equipment for checking multiple utensils made of...

OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...

ULTRABROADBAND PHOTOCONDUCTION METHOD AND APPARATUS FOR DEFECT DENS...

BLUR REDUCTION TECHNIQUES FOR SEMICONDUCTOR INSPECTION

INSPECTION SYSTEM FOR YARN BOBBINS AND METHOD FOR INSPECTING YARN B...

LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...

Electrical Performance Prediction Based On Structural Measurements...

PACKAGED ITEM INSPECTION DEVICE AND PACKAGED ITEM INSPECTION METHOD