characterised by the material or shape of the object to be examined

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/95characterised by the material or shape of the object to be examined

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for detecting misshapen receptacle connector
- Patent number 12,327,957
- Issue date Jun 10, 2025
- Dell Products L.P.
- Shree Rathinasamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system for manufactured components
- Patent number 12,326,406
- Issue date Jun 10, 2025
- General Inspection, LLC
- Mike Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
In-situ apparatus for detecting abnormality in process tube
- Patent number 12,326,397
- Issue date Jun 10, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Jen Yang
- G01 - MEASURING TESTING
Information Patent Grant
Abnormality detecting device and abnormality detecting method
- Patent number 12,327,186
- Issue date Jun 10, 2025
- Tokyo Electron Limited
- Takuro Tsutsui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,326,407
- Issue date Jun 10, 2025
- ASML Netherlands B.V.
- Nitish Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Tool stabilization mechanism and related methods
- Patent number 12,326,553
- Issue date Jun 10, 2025
- General Electric Company
- Kirti Arvind Petkar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods for manufacturing and inspecting orthodontic aligners
- Patent number 12,322,093
- Issue date Jun 3, 2025
- Align Technology, Inc.
- Anatoliy Parpara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus to determine a patterning process parameter
- Patent number 12,322,660
- Issue date Jun 3, 2025
- ASML Netherlands B.V.
- Adriaan Johan Van Leest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for detecting contamination of thin-films
- Patent number 12,320,755
- Issue date Jun 3, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Liang Cheng
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Reflective waveplates for pupil polarization filtering
- Patent number 12,322,620
- Issue date Jun 3, 2025
- KLA Corporation
- Chong Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for inspection of multiple features of patterned...
- Patent number 12,320,758
- Issue date Jun 3, 2025
- Orbotech Ltd.
- Vered Gatt
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection tool system and method for wafer edge insp...
- Patent number 12,320,757
- Issue date Jun 3, 2025
- Camtek Ltd.
- Carmel Yehuda Drillman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for inspecting a surface with artifical intellige...
- Patent number 12,320,759
- Issue date Jun 3, 2025
- Virtek Vision International Inc.
- Ahmed Elhossini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pixel classification of film non-uniformity based on processing of...
- Patent number 12,322,659
- Issue date Jun 3, 2025
- Applied Materials, Inc.
- Dominic J. Benvegnu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection method of crease degree of screen and visual detection ap...
- Patent number 12,313,567
- Issue date May 27, 2025
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Yali Liu
- G01 - MEASURING TESTING
Information Patent Grant
Light reflection support and through hole inspection system
- Patent number 12,313,568
- Issue date May 27, 2025
- JOONGWOO M-TECH CO., LTD.
- Sung Soo Park
- G01 - MEASURING TESTING
Information Patent Grant
Video pipe inspection systems
- Patent number 12,313,966
- Issue date May 27, 2025
- SeeScan, Inc.
- Mark S. Olsson
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Inspection system for edge and bevel inspection of semiconductor st...
- Patent number 12,315,206
- Issue date May 27, 2025
- Camtek Ltd.
- Carmel Yehuda Drillman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Finishing line automatic inspection system and method
- Patent number 12,313,565
- Issue date May 27, 2025
- Columbia Insurance Company
- Richard Glassell
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 12,313,566
- Issue date May 27, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection apparatus, substrate inspection method, and re...
- Patent number 12,306,113
- Issue date May 20, 2025
- Tokyo Electron Limited
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Imaging spectropolarimeter and sample characterization methodology...
- Patent number 12,306,092
- Issue date May 20, 2025
- BRUKER NANO, INC.
- Mazen Zawaideh
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for detecting defects in semiconductor systems
- Patent number 12,306,112
- Issue date May 20, 2025
- AXIOMATIQUE TECHNOLOGIES, INC.
- Trevor A. Norman
- G01 - MEASURING TESTING
Information Patent Grant
Laser repair method and laser repair device
- Patent number 12,303,998
- Issue date May 20, 2025
- V Technology Co., Ltd.
- Michinobu Mizumura
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
3D image acquisition system for optical inspection and method for o...
- Patent number 12,306,110
- Issue date May 20, 2025
- Scuola universitaria professionale della Svizzera italiana (SUPSI)
- Daniele Guido Allegri
- G01 - MEASURING TESTING
Information Patent Grant
Wearable device such as for glucose measurement
- Patent number 12,307,731
- Issue date May 20, 2025
- Emcode Photonics LLC
- Shrenik Deliwala
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Inspection condition presentation apparatus, surface inspection app...
- Patent number 12,306,109
- Issue date May 20, 2025
- Resonac Corporation
- Katsuhisa Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for processing consolidated stacks of fiber re...
- Patent number 12,296,574
- Issue date May 13, 2025
- Airborne International B.V.
- Mark Muilwijk
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Control of a manufacturing process using contour curvature analysis...
- Patent number 12,299,868
- Issue date May 13, 2025
- Applied Materials Israel Ltd.
- Einat Frishman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coating condition detection method, coating condition detection dev...
- Patent number 12,297,143
- Issue date May 13, 2025
- Sumitomo Electric Industries, Ltd.
- Tadashi Enomoto
- C03 - GLASS MINERAL OR SLAG WOOL

Patents Applicationslast 30 patents

Information Patent Application
UNIT OR AN APPARATUS FOR CONTROLLING OR MANAGING PRODUCTS OR ROLLS
- Publication number 20250187767
- Publication date Jun 12, 2025
- PULSAR S.R.L.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD, RESIN SOLUTION, RESIST COMPOSITION OR THERMOSETT...
- Publication number 20250189903
- Publication date Jun 12, 2025
- Tokyo Ohka Kogyo Co., Ltd.
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND C...
- Publication number 20250191221
- Publication date Jun 12, 2025
- SONY GROUP CORPORATION
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECOND HARMONIC GENERATION (SHG) MEASUREMENT DEVICE AND MEASUREMENT...
- Publication number 20250189295
- Publication date Jun 12, 2025
- Samsung Electronics Co., Ltd.
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION SYSTEM OF ELIMINATING IMAGE NOISE
- Publication number 20250189458
- Publication date Jun 12, 2025
- GUDENG EQUIPMENT CO., LTD.
- G01 - MEASURING TESTING
Information Patent Application
IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS
- Publication number 20250189459
- Publication date Jun 12, 2025
- Corning Incorporated
- G01 - MEASURING TESTING
Information Patent Application
RADIATION EMITTER AND MEASUREMENT SYSTEM
- Publication number 20250189444
- Publication date Jun 12, 2025
- Industrial Technology Research Institute
- G01 - MEASURING TESTING
Information Patent Application
WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD
- Publication number 20250189460
- Publication date Jun 12, 2025
- INGENTEC CORPORATION
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD FOR A WAFER AND WAFER
- Publication number 20250189461
- Publication date Jun 12, 2025
- United Microelectronics Corp.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HETEROGENEOUS CHIPLET ID USING PHOTOLUMINESCENCE IN uASSEMBLER SYSTEM
- Publication number 20250180488
- Publication date Jun 5, 2025
- Xerox Corporation
- Jeng PING LU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WIRE ROD, ENAMELED WIRE, AND METHOD FOR MANUFACTURING ENAMELED WIRE
- Publication number 20250180491
- Publication date Jun 5, 2025
- Proterial, Ltd.
- Hajime NISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER INSPECTION USING A DYNAMIC SCAN PLAN
- Publication number 20250182266
- Publication date Jun 5, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Prashanth Venkatarama Reddy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR PACKAGE INSPECTION METHOD AND METHOD OF MANUFACTURING...
- Publication number 20250182267
- Publication date Jun 5, 2025
- Samsung Electronics Co., Ltd.
- Jaemin Jeon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS METHOD
- Publication number 20250180490
- Publication date Jun 5, 2025
- Canon Kabushiki Kaisha
- Makoto Kawaguchi
- G01 - MEASURING TESTING
Information Patent Application
DETECTING DAMAGED SEMICONDUCTOR WAFERS UTILIZING A SEMICONDUCTOR WA...
- Publication number 20250183073
- Publication date Jun 5, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chen Min LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process for Identifying and Correcting Defects or Non-Conformities...
- Publication number 20250180492
- Publication date Jun 5, 2025
- GRAPHIMECC GROUP S.R.L
- Andrea Ranzato Vianello
- B31 - MAKING ARTICLES OF PAPER OR CARDBOARD WORKING PAPER OR CARDBOARD
Information Patent Application
AUTOMATIC MAVERICK WAFER SCREENING USING DIE PASS PATTERN
- Publication number 20250172503
- Publication date May 29, 2025
- Infineon Technologies Canada Inc.
- Iman ABDALI MASHHADI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Quality control method for a cable specimen
- Publication number 20250172505
- Publication date May 29, 2025
- NEXANS
- Espen DOEDENS
- G01 - MEASURING TESTING
Information Patent Application
CENTRIFUGAL FEEDER AND TABLET INSPECTION DEVICE COMPRISING SAME
- Publication number 20250172504
- Publication date May 29, 2025
- ENCLONY INC
- Kyung Ho LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS, METHODS AND APPARATUS FOR SAFE LAUNCH AND RECOVERY OF AN I...
- Publication number 20250172506
- Publication date May 29, 2025
- Square Robot, Inc.
- Jerome VAGANAY
- B08 - CLEANING
Information Patent Application
POLARIZING MICROSCOPE, CRYSTAL DEFECT EVALUATION DEVICE, AND CRYSTA...
- Publication number 20250164407
- Publication date May 22, 2025
- NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH...
- Shunta HARADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS TO IMPROVE DETECTION OF DEFECTS IN PHOTOMASK...
- Publication number 20250164871
- Publication date May 22, 2025
- Intel Corporation
- Yoshihiro Tezuka
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY
- Publication number 20250164410
- Publication date May 22, 2025
- TOKYO ELECTRON LIMITED
- Holger Tuitje
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mechanical Property Inspection Device And Injection Molding System
- Publication number 20250164391
- Publication date May 22, 2025
- SEIKO EPSON CORPORATION
- Masayasu FUKUOKA
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
DEPOSITION MONITOR FOR SEMICONDUCTOR MANUFACTURING SYSTEM
- Publication number 20250167021
- Publication date May 22, 2025
- Axcelis Technologies, Inc.
- Phillip Geissbuhler
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Methods And Systems For Spectral Measurements Based On Perturbed Sp...
- Publication number 20250164411
- Publication date May 22, 2025
- KLA Corporation
- William McGahan
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR QUALITY CONTROL OF A WELDING JOINT BETWEEN A PAIR OF END...
- Publication number 20250162086
- Publication date May 22, 2025
- ATOP S.p.A.
- Massimiliano GIACHI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Systems and Methods for Detection of Defects in Machine Surfaces
- Publication number 20250164409
- Publication date May 22, 2025
- MATTHEWS INTERNATIONAL CORPORATION
- Thomas HACKFORT
- G01 - MEASURING TESTING
Information Patent Application
Single-Pass 3D Reconstruction of Internal Surface of Pipelines Usin...
- Publication number 20250164412
- Publication date May 22, 2025
- NUTECH VENTURES
- Zhigang Shen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COOLING UNIT, OBJECTIVE LENS MODULE, AND SEMICONDUCTOR INSPECTION A...
- Publication number 20250155339
- Publication date May 15, 2025
- Hamamatsu Photonics K.K.
- Akihiro NAKAMURA
- G01 - MEASURING TESTING

characterised by the material or shape of the object to be examined

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for detecting misshapen receptacle connector

Inspection system for manufactured components

In-situ apparatus for detecting abnormality in process tube

Abnormality detecting device and abnormality detecting method

Inspection apparatus and inspection method

Tool stabilization mechanism and related methods

Methods for manufacturing and inspecting orthodontic aligners

Method and apparatus to determine a patterning process parameter

System and method for detecting contamination of thin-films

Reflective waveplates for pupil polarization filtering

System and method for inspection of multiple features of patterned...

Semiconductor inspection tool system and method for wafer edge insp...

Method and system for inspecting a surface with artifical intellige...

Pixel classification of film non-uniformity based on processing of...

Detection method of crease degree of screen and visual detection ap...

Light reflection support and through hole inspection system

Video pipe inspection systems

Inspection system for edge and bevel inspection of semiconductor st...

Finishing line automatic inspection system and method

Defect inspection device and defect inspection method

Substrate inspection apparatus, substrate inspection method, and re...

Imaging spectropolarimeter and sample characterization methodology...

Methods and apparatus for detecting defects in semiconductor systems

Laser repair method and laser repair device

3D image acquisition system for optical inspection and method for o...

Wearable device such as for glucose measurement

Inspection condition presentation apparatus, surface inspection app...

Apparatus and method for processing consolidated stacks of fiber re...

Control of a manufacturing process using contour curvature analysis...

Coating condition detection method, coating condition detection dev...

Patents Applicationslast 30 patents

UNIT OR AN APPARATUS FOR CONTROLLING OR MANAGING PRODUCTS OR ROLLS

INSPECTION METHOD, RESIN SOLUTION, RESIST COMPOSITION OR THERMOSETT...

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND C...

SECOND HARMONIC GENERATION (SHG) MEASUREMENT DEVICE AND MEASUREMENT...

OPTICAL INSPECTION SYSTEM OF ELIMINATING IMAGE NOISE

IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS

RADIATION EMITTER AND MEASUREMENT SYSTEM

WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD

TEST METHOD FOR A WAFER AND WAFER

HETEROGENEOUS CHIPLET ID USING PHOTOLUMINESCENCE IN uASSEMBLER SYSTEM

WIRE ROD, ENAMELED WIRE, AND METHOD FOR MANUFACTURING ENAMELED WIRE

WAFER INSPECTION USING A DYNAMIC SCAN PLAN

SEMICONDUCTOR PACKAGE INSPECTION METHOD AND METHOD OF MANUFACTURING...

ANALYSIS METHOD

DETECTING DAMAGED SEMICONDUCTOR WAFERS UTILIZING A SEMICONDUCTOR WA...

Process for Identifying and Correcting Defects or Non-Conformities...

AUTOMATIC MAVERICK WAFER SCREENING USING DIE PASS PATTERN

Quality control method for a cable specimen

CENTRIFUGAL FEEDER AND TABLET INSPECTION DEVICE COMPRISING SAME

SYSTEMS, METHODS AND APPARATUS FOR SAFE LAUNCH AND RECOVERY OF AN I...

POLARIZING MICROSCOPE, CRYSTAL DEFECT EVALUATION DEVICE, AND CRYSTA...

METHODS AND APPARATUS TO IMPROVE DETECTION OF DEFECTS IN PHOTOMASK...

OPTICAL METROLOGY

Mechanical Property Inspection Device And Injection Molding System

DEPOSITION MONITOR FOR SEMICONDUCTOR MANUFACTURING SYSTEM

Methods And Systems For Spectral Measurements Based On Perturbed Sp...

METHOD FOR QUALITY CONTROL OF A WELDING JOINT BETWEEN A PAIR OF END...

Systems and Methods for Detection of Defects in Machine Surfaces

Single-Pass 3D Reconstruction of Internal Surface of Pipelines Usin...

COOLING UNIT, OBJECTIVE LENS MODULE, AND SEMICONDUCTOR INSPECTION A...