characterised by the material or shape of the object to be examined

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G01N21/95

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/95characterised by the material or shape of the object to be examined

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Non-contact apparatus for measuring wafer thickness
- Patent number 12,209,853
- Issue date Jan 28, 2025
- Fujikoshi Machinery Corp.
- Chihiro Miyagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems, methods and apparatus for safe launch and recovery of an i...
- Patent number 12,209,974
- Issue date Jan 28, 2025
- Square Robot, Inc.
- Jerome Vaganay
- B08 - CLEANING
Information Patent Grant
Real-time detection of deflections and ruptures of EUV pellicle mem...
- Patent number 12,209,975
- Issue date Jan 28, 2025
- Intel Corporation
- John Ferdinand Magana
- G01 - MEASURING TESTING
Information Patent Grant
Edge defect detection via image analytics
- Patent number 12,211,195
- Issue date Jan 28, 2025
- Applied Materials, Inc.
- Yash Chhabra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement system and measurement method
- Patent number 12,203,870
- Issue date Jan 21, 2025
- Skyverse Technology Co., Ltd.
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting fused plastic pipes
- Patent number 12,203,873
- Issue date Jan 21, 2025
- WorldWide Nondestructive Testing, Inc.
- Kevin P. Bohne
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
EUV microscope
- Patent number 12,203,874
- Issue date Jan 21, 2025
- EUV TECH, INC.
- Chami N Perera
- G01 - MEASURING TESTING
Information Patent Grant
Method for quality assessment of a processing operation with adapti...
- Patent number 12,203,949
- Issue date Jan 21, 2025
- Fronius International GmbH
- Helmut Ennsbrunner
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Shape measurement system and shape measurement method
- Patent number 12,203,847
- Issue date Jan 21, 2025
- Nippon Telegraph and Telephone Corporation
- Nobutomo Hanzawa
- G01 - MEASURING TESTING
Information Patent Grant
Process tool for analyzing bonded workpiece interface
- Patent number 12,205,855
- Issue date Jan 21, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hau-Yi Hsiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection device and pattern inspection method
- Patent number 12,205,272
- Issue date Jan 21, 2025
- NuFlare Technology, Inc.
- Hiromu Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lighting fixture and multi-station lighting system
- Patent number 12,203,869
- Issue date Jan 21, 2025
- SUZHOU CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Lili Liu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Ingot evaluation method and detecting apparatus
- Patent number 12,203,871
- Issue date Jan 21, 2025
- GlobalWafers Co., Ltd.
- Hsiu Chi Liang
- G01 - MEASURING TESTING
Information Patent Grant
Damage detection from multi-view visual data
- Patent number 12,203,872
- Issue date Jan 21, 2025
- FYUSION, INC.
- Stefan Johannes Josef Holzer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting pattern defects
- Patent number 12,196,687
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ju-Ying Chen
- G01 - MEASURING TESTING
Information Patent Grant
Wearable devices comprising semiconductor diode light sources with...
- Patent number 12,193,790
- Issue date Jan 14, 2025
- Omni MedSci, Inc.
- Mohammed N. Islam
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and a device for detecting crystalline defects in a substrat...
- Patent number 12,196,681
- Issue date Jan 14, 2025
- UNITY SEMICONDUCTOR
- Hadrien Vergnet
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for detecting anomalies in objects
- Patent number 12,196,689
- Issue date Jan 14, 2025
- The Boeing Company
- James J. Troy
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method of inspecting wafer
- Patent number 12,196,669
- Issue date Jan 14, 2025
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,196,673
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Takeru Utsugi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for servicing aircraft engines
- Patent number 12,195,202
- Issue date Jan 14, 2025
- General Electric Company
- Satya Mohan Vamsi Andalam
- G01 - MEASURING TESTING
Information Patent Grant
Vortex dichroism dark-field confocal microscopy measurement apparat...
- Patent number 12,196,686
- Issue date Jan 14, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for detecting windshield cracks
- Patent number 12,198,484
- Issue date Jan 14, 2025
- Robert Bosch GmbH
- Mordechai Kornbluth
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Valuable document system
- Patent number 12,194,772
- Issue date Jan 14, 2025
- GIESECKE+DEVRIENT CURRENCY TECHNOLOGY GMBH
- Johann Kecht
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system, method for generating learning model to be used...
- Patent number 12,198,327
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Ryou Yumiba
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for efficient high harmonic generation
- Patent number 12,196,688
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Petrus Wilhelmus Smorenburg
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining post bonding overlay
- Patent number 12,197,137
- Issue date Jan 14, 2025
- KLA Corporation
- Franz Zach
- G01 - MEASURING TESTING
Information Patent Grant
Adhesion interface observation method
- Patent number 12,188,872
- Issue date Jan 7, 2025
- SUBARU CORPORATION
- Yugo Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Method and system of surface topography measurement for lithography
- Patent number 12,189,306
- Issue date Jan 7, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Yung-Yao Lee
- G01 - MEASURING TESTING
Information Patent Grant
Detection method of wrinkle degree of screen and visual detection d...
- Patent number 12,188,879
- Issue date Jan 7, 2025
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Yali Liu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR INSPECTING ABNORMALITY IN ELECTRODES
- Publication number 20250035562
- Publication date Jan 30, 2025
- SK On Co., Ltd.
- Hye Ju JANG
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Sorting And Imaging Insects
- Publication number 20250031680
- Publication date Jan 30, 2025
- PIONEER HI-BRED INTERNATIONAL,INC.
- Michael Freeman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE TEST METHOD
- Publication number 20250035564
- Publication date Jan 30, 2025
- Samsung Electronics Co., Ltd.
- Sung-Il Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT DEVICE
- Publication number 20250035563
- Publication date Jan 30, 2025
- Samsung Electronics Co., Ltd.
- Ryuju Sato
- G01 - MEASURING TESTING
Information Patent Application
SELF CORRECTING OVEN TECHNOLOGY
- Publication number 20250033131
- Publication date Jan 30, 2025
- Jabil Inc.
- Charles Santhakumar
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE
- Publication number 20250027887
- Publication date Jan 23, 2025
- Applied Materials, Inc.
- Srikanth V. Racherla
- G01 - MEASURING TESTING
Information Patent Application
DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED
- Publication number 20250027885
- Publication date Jan 23, 2025
- YAYATECH CO., LTD.
- Chien-Cheng CHEN
- G01 - MEASURING TESTING
Information Patent Application
CUTTER ANALYSIS AND MAPPING
- Publication number 20250029236
- Publication date Jan 23, 2025
- Halliburton Energy Services, Inc.
- William Brian Atkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM
- Publication number 20250027886
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- SHAO-CHIEN CHIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...
- Publication number 20250017473
- Publication date Jan 16, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- G01 - MEASURING TESTING
Information Patent Application
DEEP LEARNING BASED MODE SELECTION FOR INSPECTION
- Publication number 20250020598
- Publication date Jan 16, 2025
- KLA Corporation
- Rajkumar Theagarajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSOR SYSTEM FOR DETERMINING A THICKNESS OF A MATERIAL BODY
- Publication number 20250020450
- Publication date Jan 16, 2025
- Cargill, Incorporated
- Amina ALAOUI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENTS USING CAMERA SENSOR COUPLED TO A CHEMICAL DETECTION SY...
- Publication number 20250017472
- Publication date Jan 16, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF DETECTING A CRACK IN A SEMICONDUCTOR ELEMENT, AND RELATE...
- Publication number 20250022122
- Publication date Jan 16, 2025
- KULICKE AND SOFFA INDUSTRIES, INC.
- Aashish Shah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIME-OF-FLIGHT MEASUREMENT ON USER WITH CAMERAS AND POSITION SENSOR
- Publication number 20250009232
- Publication date Jan 9, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIDAR DEFECT DETECTION SYSTEM AND METHOD FOR USE IN CAN MANUFACTURI...
- Publication number 20250012923
- Publication date Jan 9, 2025
- Stolle Machinery Company, LLC
- Sayon Chandrakanthan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and method for side-wall inspection of pulp containers
- Publication number 20250012733
- Publication date Jan 9, 2025
- KRONES AG
- Peter LINDNER
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
VISUAL INSPECTION ASSISTANCE DEVICE
- Publication number 20250012735
- Publication date Jan 9, 2025
- CKD CORPORATION
- Takamasa Ohtani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF OPTIMIZING OVERLAY MEASUREMENT CONDITION AND OVERLAY MEAS...
- Publication number 20250012736
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Dohun Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...
- Publication number 20250014164
- Publication date Jan 9, 2025
- ASML NETHERLANDS B.V.
- Vasco Tomas TENNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE INSPECTION APPARATUS
- Publication number 20250012732
- Publication date Jan 9, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
Multiple Pass Optical Measurements Of Semiconductor Structures
- Publication number 20250012734
- Publication date Jan 9, 2025
- KLA Corporation
- Zhengquan Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL METROLOGY WITH INFLUENCE MAP OF UNKNOWN SECTION
- Publication number 20250012737
- Publication date Jan 9, 2025
- ONTO INNOVATION INC.
- Yiliang LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REMOTE SENSING SYSTEM WITH TIME-OF-FLIGHT SENSOR, ACTIVE ILLUMINATO...
- Publication number 20250009233
- Publication date Jan 9, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
360° MANHOLE INSPECTION SYSTEM AND METHOD
- Publication number 20250016455
- Publication date Jan 9, 2025
- Envirosight LLC
- Stéphane CUENET
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEMS AND METHODS FOR DAMAGE DETECTION
- Publication number 20250014163
- Publication date Jan 9, 2025
- Belron International Limited
- Kelly Francis
- B60 - VEHICLES IN GENERAL
Information Patent Application
PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...
- Publication number 20250003888
- Publication date Jan 2, 2025
- Onto Innovation Inc.
- John M. Thornell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
- Publication number 20250003882
- Publication date Jan 2, 2025
- NOVA LTD
- GILAD BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...
- Publication number 20250003893
- Publication date Jan 2, 2025
- Tsinghua University
- Dameng Liu
- G01 - MEASURING TESTING
Information Patent Application
Method and optical system for imaging optical defect
- Publication number 20240426761
- Publication date Dec 26, 2024
- John Le
- G01 - MEASURING TESTING

characterised by the material or shape of the object to be examined

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Non-contact apparatus for measuring wafer thickness

Systems, methods and apparatus for safe launch and recovery of an i...

Real-time detection of deflections and ruptures of EUV pellicle mem...

Edge defect detection via image analytics

Measurement system and measurement method

System and method for inspecting fused plastic pipes

EUV microscope

Method for quality assessment of a processing operation with adapti...

Shape measurement system and shape measurement method

Process tool for analyzing bonded workpiece interface

Pattern inspection device and pattern inspection method

Lighting fixture and multi-station lighting system

Ingot evaluation method and detecting apparatus

Damage detection from multi-view visual data

Method for inspecting pattern defects

Wearable devices comprising semiconductor diode light sources with...

Method and a device for detecting crystalline defects in a substrat...

Systems and methods for detecting anomalies in objects

Inspection apparatus and method of inspecting wafer

Defect inspection apparatus and defect inspection method

System and method for servicing aircraft engines

Vortex dichroism dark-field confocal microscopy measurement apparat...

Systems and methods for detecting windshield cracks

Valuable document system

Measurement system, method for generating learning model to be used...

Method and apparatus for efficient high harmonic generation

System and method for determining post bonding overlay

Adhesion interface observation method

Method and system of surface topography measurement for lithography

Detection method of wrinkle degree of screen and visual detection d...

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR INSPECTING ABNORMALITY IN ELECTRODES

Methods And Systems For Sorting And Imaging Insects

SUBSTRATE TEST METHOD

SEMICONDUCTOR MEASUREMENT DEVICE

SELF CORRECTING OVEN TECHNOLOGY

SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE

DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED

CUTTER ANALYSIS AND MAPPING

DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM

WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...

DEEP LEARNING BASED MODE SELECTION FOR INSPECTION

SENSOR SYSTEM FOR DETERMINING A THICKNESS OF A MATERIAL BODY

MEASUREMENTS USING CAMERA SENSOR COUPLED TO A CHEMICAL DETECTION SY...

METHODS OF DETECTING A CRACK IN A SEMICONDUCTOR ELEMENT, AND RELATE...

TIME-OF-FLIGHT MEASUREMENT ON USER WITH CAMERAS AND POSITION SENSOR

LIDAR DEFECT DETECTION SYSTEM AND METHOD FOR USE IN CAN MANUFACTURI...

Apparatus and method for side-wall inspection of pulp containers

VISUAL INSPECTION ASSISTANCE DEVICE

METHOD OF OPTIMIZING OVERLAY MEASUREMENT CONDITION AND OVERLAY MEAS...

METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...

SURFACE INSPECTION APPARATUS

Multiple Pass Optical Measurements Of Semiconductor Structures

OPTICAL METROLOGY WITH INFLUENCE MAP OF UNKNOWN SECTION

REMOTE SENSING SYSTEM WITH TIME-OF-FLIGHT SENSOR, ACTIVE ILLUMINATO...

360° MANHOLE INSPECTION SYSTEM AND METHOD

SYSTEMS AND METHODS FOR DAMAGE DETECTION

PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...

HYBRID METROLOGY METHOD AND SYSTEM

METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...

Method and optical system for imaging optical defect