characterised by the material or shape of the object to be examined

Industry

CPC
G01N21/95

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/95characterised by the material or shape of the object to be examined

Industries

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for measuring a property of a substrate
- Patent number 11,977,034
- Issue date May 7, 2024
- ASML Netherlands B.V.
- Wouter Lodewijk Elings
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Surface shape detection device and detection method
- Patent number 11,977,035
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Kenichiro Yamada
- G01 - MEASURING TESTING
Information Patent Grant
See-through metrology systems, apparatus, and methods for optical d...
- Patent number 11,978,196
- Issue date May 7, 2024
- Yangyang Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rapid detection system for water and impurity of machine-harvested...
- Patent number 11,978,190
- Issue date May 7, 2024
- Shihezi University
- Ruoyu Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Insertion tool
- Patent number 11,977,217
- Issue date May 7, 2024
- General Electric Company
- Andrew Crispin Graham
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Image processing apparatus and image processing method
- Patent number 11,972,550
- Issue date Apr 30, 2024
- FUJIFILM Corporation
- Shuhei Horita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process for producing semiconductor wafers
- Patent number 11,972,986
- Issue date Apr 30, 2024
- Siltronic AG
- Michael Boy
- C30 - CRYSTAL GROWTH
Information Patent Grant
Imaging ellipsometry (IE)-based inspection method and method of fab...
- Patent number 11,972,960
- Issue date Apr 30, 2024
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multimodality multiplexed illumination for optical inspection systems
- Patent number 11,974,046
- Issue date Apr 30, 2024
- Yigal Katzir
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspection method and semiconductor device ins...
- Patent number 11,971,364
- Issue date Apr 30, 2024
- Hamamatsu Photonics K.K.
- Shinsuke Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Wafer processing system and rework method thereof
- Patent number 11,971,365
- Issue date Apr 30, 2024
- GlobalWafers Co., Ltd.
- Shang-Chi Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system
- Patent number 11,971,366
- Issue date Apr 30, 2024
- NAGANO AUTOMATION CO., LTD.
- Kenya Yamaura
- G01 - MEASURING TESTING
Information Patent Grant
Plant for processing products including a unit for detecting defect...
- Patent number 11,970,298
- Issue date Apr 30, 2024
- Pulsar S.r.l.
- Massimo Franzaroli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring mirror reflectance using solar illumination
- Patent number 11,971,321
- Issue date Apr 30, 2024
- Raytheon Company
- Stephen J. Schiller
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Inspection device and inspection method
- Patent number 11,971,367
- Issue date Apr 30, 2024
- JUKI CORPORATION
- Yasuyuki Nuriya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dark-field optical inspection device
- Patent number 11,965,834
- Issue date Apr 23, 2024
- UNITY SEMICONDUCTOR
- Mayeul Durand De Gevigney
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring variation, inspection system, computer program,...
- Patent number 11,966,168
- Issue date Apr 23, 2024
- ASML Netherlands B.V.
- Antoine Gaston Marie Kiers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing overlay results with absolute reference for se...
- Patent number 11,966,171
- Issue date Apr 23, 2024
- Tokyo Electron Limited
- Anton J. deVilliers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, methods and apparatuses for detecting and analyzing defect...
- Patent number 11,967,056
- Issue date Apr 23, 2024
- Infrastructure DL, LLC
- Robert Muchka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for gray field imaging
- Patent number 11,965,835
- Issue date Apr 23, 2024
- KLA Corporation
- Xiumei Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Assembly for detecting defects on a motor vehicle bodywork
- Patent number 11,965,836
- Issue date Apr 23, 2024
- PROOV STATION
- Gabriel Tissandier
- G01 - MEASURING TESTING
Information Patent Grant
Mask inspection apparatus and mask inspection method using the same
- Patent number 11,961,222
- Issue date Apr 16, 2024
- Samsung Display Co., Ltd.
- Sangdon Hwang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection camera devices and methods
- Patent number 11,962,943
- Issue date Apr 16, 2024
- SeeScan, Inc.
- Mark S. Olsson
- G01 - MEASURING TESTING
Information Patent Grant
SiC epitaxial wafer, production method therefor, and defect identif...
- Patent number 11,961,736
- Issue date Apr 16, 2024
- Resonac Corporation
- Ling Guo
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Defect examination on a semiconductor specimen
- Patent number 11,961,221
- Issue date Apr 16, 2024
- Applied Materials Israel Ltd.
- Dror Shemesh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Photolithography method and photolithography system
- Patent number 11,959,864
- Issue date Apr 16, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Chi-Hung Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
EUV mask defect tool apparatus
- Patent number 11,960,202
- Issue date Apr 16, 2024
- EUV TECH, INC.
- Chami N Perera
- G01 - MEASURING TESTING
Information Patent Grant
Method for defect inspection
- Patent number 11,953,448
- Issue date Apr 9, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Tsun-Cheng Tang
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction based overlay metrology tool and method of diffraction...
- Patent number 11,953,450
- Issue date Apr 9, 2024
- ASML Netherlands B.V.
- Arie Jeffrey Den Boef
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer evaluation method and semiconductor wafer manuf...
- Patent number 11,955,390
- Issue date Apr 9, 2024
- Sumco Corporation
- Takahiro Nagasawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CARVED CODE QUALITY DETECTION APPARATUS AND SYSTEM
- Publication number 20240151655
- Publication date May 9, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Xiaohong ZOU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTING A DEFECT IN A SPECIMEN
- Publication number 20240151653
- Publication date May 9, 2024
- GLOBALFOUNDRIES U.S. Inc.
- RICHARD PAUL GOOD
- G01 - MEASURING TESTING
Information Patent Application
COMMUNICATION HOLE INSPECTION DEVICE AND COMMUNICATION HOLE INSPECT...
- Publication number 20240151654
- Publication date May 9, 2024
- HONDA MOTOR CO., LTD.
- Ken AKIYAMA
- B22 - CASTING POWDER METALLURGY
Information Patent Application
APPARATUS AND METHOD FOR CHARACTERIZING A MICROLITHOGRAPHIC MASK
- Publication number 20240152057
- Publication date May 9, 2024
- Carl Zeiss SMT GMBH
- Johannes Ruoff
- G01 - MEASURING TESTING
Information Patent Application
HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM
- Publication number 20240144467
- Publication date May 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR RAPID INSPECTION OF PRINTED CIRCUIT BOARD USI...
- Publication number 20240142516
- Publication date May 2, 2024
- Battelle Memorial Institute
- Thomas F. Kent
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR EVALUATING CRYSTAL DEFECTS IN SILICON CARBIDE SINGLE CRY...
- Publication number 20240142390
- Publication date May 2, 2024
- Shin-Etsu Handotai Co., Ltd.
- Yutaka SHIGA
- C30 - CRYSTAL GROWTH
Information Patent Application
INSPECTION METHOD FOR DISPLAY DEVICE
- Publication number 20240142391
- Publication date May 2, 2024
- SAMSUNG DISPLAY CO., LTD.
- DAEHONG KIM
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE TREATMENT SYSTEM INCLU...
- Publication number 20240142389
- Publication date May 2, 2024
- SEMES CO., LTD.
- Jeong Hoon HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection System
- Publication number 20240142388
- Publication date May 2, 2024
- MA micro automation GmbH
- Bodo Ergert
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...
- Publication number 20240145315
- Publication date May 2, 2024
- Samsung Electronics Co., Ltd.
- EUNHEE JEANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER
- Publication number 20240136232
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Inkeun BAEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240131559
- Publication date Apr 25, 2024
- Ackley Machine Corporation
- E. Michael ACKLEY
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
PHASE RETRIEVAL
- Publication number 20240133807
- Publication date Apr 25, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Benny Kirshner
- G01 - MEASURING TESTING
Information Patent Application
GAS FLOW CONFIGURATIONS FOR SEMICONDUCTOR INSPECTIONS
- Publication number 20240133825
- Publication date Apr 25, 2024
- KLA Corporation
- Chunhai Wang
- G01 - MEASURING TESTING
Information Patent Application
CONTACT CLEANING APPARATUS
- Publication number 20240131561
- Publication date Apr 25, 2024
- Illinois Tool Works Inc.
- Sheila HAMILTON
- B08 - CLEANING
Information Patent Application
Finishing Line Automatic Inspection System and Method
- Publication number 20240125710
- Publication date Apr 18, 2024
- Columbia Insurance Company
- Richard Glassell
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
Defect Inspection System and Method
- Publication number 20240125713
- Publication date Apr 18, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hao Chun Yang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANALYZING COMPOSITE SEMIPERMEABLE MEMBRANE
- Publication number 20240123408
- Publication date Apr 18, 2024
- TORAY INDUSTRIES, INC.
- Koji Nakatsuji
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240125709
- Publication date Apr 18, 2024
- Samsung Electronics Co., Ltd.
- Donggun Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING SEMICONDUCTOR WAFER, METHOD FOR SELECTING SEM...
- Publication number 20240128130
- Publication date Apr 18, 2024
- Shin-Etsu Handotai Co., Ltd.
- Junya SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER CRYSTALLIZATION MONITORING DEVICE AND METHOD OF LASER CRYSTAL...
- Publication number 20240118221
- Publication date Apr 11, 2024
- SAMSUNG DISPLAY CO., LTD.
- JI-HWAN KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface Inspection Device
- Publication number 20240118223
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Katsuhiko KIMURA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION AND REMOVAL APPARATUS AND METHOD
- Publication number 20240118222
- Publication date Apr 11, 2024
- PlayNitride Display Co., Ltd.
- Chang-Rong Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING DEFECTS ON WAFERS, SYSTEM FOR DETECTING DEFECT...
- Publication number 20240112323
- Publication date Apr 4, 2024
- United Semiconductor (Xiamen) Co., Ltd.
- Yu Peng Hong
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE ARTICULATION TRANSFORMATION BASED ON IMAGE TRANSF...
- Publication number 20240112328
- Publication date Apr 4, 2024
- Baker Hughes Holdings LLC
- Clark A. Bendall
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE TEST APPARATUS AND METHOD
- Publication number 20240110879
- Publication date Apr 4, 2024
- SEMES CO., LTD.
- Gyunam PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE INSPECTION SYSTEM AND A METHOD OF USE THEREOF
- Publication number 20240102169
- Publication date Mar 28, 2024
- JNK TECH
- Youngjin Choi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Apparatus for detecting defects of reflective element
- Publication number 20240103026
- Publication date Mar 28, 2024
- Hong-I Tsai
- G01 - MEASURING TESTING
Information Patent Application
PHOTORESIST CHARACTERISTICS ANALYSIS METHOD AND CHARACTERISTICS ANA...
- Publication number 20240102927
- Publication date Mar 28, 2024
- FEMTO Deployments Inc.
- Akira WATANABE
- H01 - BASIC ELECTRIC ELEMENTS

characterised by the material or shape of the object to be examined

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and apparatus for measuring a property of a substrate

Surface shape detection device and detection method

See-through metrology systems, apparatus, and methods for optical d...

Rapid detection system for water and impurity of machine-harvested...

Insertion tool

Image processing apparatus and image processing method

Process for producing semiconductor wafers

Imaging ellipsometry (IE)-based inspection method and method of fab...

Multimodality multiplexed illumination for optical inspection systems

Semiconductor device inspection method and semiconductor device ins...

Wafer processing system and rework method thereof

Inspection system

Plant for processing products including a unit for detecting defect...

Monitoring mirror reflectance using solar illumination

Inspection device and inspection method

Dark-field optical inspection device

Method of measuring variation, inspection system, computer program,...

Method for producing overlay results with absolute reference for se...

Systems, methods and apparatuses for detecting and analyzing defect...

Apparatus and method for gray field imaging

Assembly for detecting defects on a motor vehicle bodywork

Mask inspection apparatus and mask inspection method using the same

Inspection camera devices and methods

SiC epitaxial wafer, production method therefor, and defect identif...

Defect examination on a semiconductor specimen

Photolithography method and photolithography system

EUV mask defect tool apparatus

Method for defect inspection

Diffraction based overlay metrology tool and method of diffraction...

Semiconductor wafer evaluation method and semiconductor wafer manuf...

Patents Applicationslast 30 patents

CARVED CODE QUALITY DETECTION APPARATUS AND SYSTEM

SYSTEM AND METHOD FOR DETECTING A DEFECT IN A SPECIMEN

COMMUNICATION HOLE INSPECTION DEVICE AND COMMUNICATION HOLE INSPECT...

APPARATUS AND METHOD FOR CHARACTERIZING A MICROLITHOGRAPHIC MASK

HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM

SYSTEM AND METHOD FOR RAPID INSPECTION OF PRINTED CIRCUIT BOARD USI...

METHOD FOR EVALUATING CRYSTAL DEFECTS IN SILICON CARBIDE SINGLE CRY...

INSPECTION METHOD FOR DISPLAY DEVICE

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE TREATMENT SYSTEM INCLU...

Inspection System

SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...

METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER

INSPECTION SYSTEM

PHASE RETRIEVAL

GAS FLOW CONFIGURATIONS FOR SEMICONDUCTOR INSPECTIONS

CONTACT CLEANING APPARATUS

Finishing Line Automatic Inspection System and Method

Defect Inspection System and Method

METHOD FOR ANALYZING COMPOSITE SEMIPERMEABLE MEMBRANE

SEMICONDUCTOR MEASUREMENT APPARATUS

METHOD FOR EVALUATING SEMICONDUCTOR WAFER, METHOD FOR SELECTING SEM...

LASER CRYSTALLIZATION MONITORING DEVICE AND METHOD OF LASER CRYSTAL...

Surface Inspection Device

DEFECT DETECTION AND REMOVAL APPARATUS AND METHOD

METHOD FOR DETECTING DEFECTS ON WAFERS, SYSTEM FOR DETECTING DEFECT...

INSPECTION DEVICE ARTICULATION TRANSFORMATION BASED ON IMAGE TRANSF...

SUBSTRATE TEST APPARATUS AND METHOD

SUBSTRATE INSPECTION SYSTEM AND A METHOD OF USE THEREOF

Apparatus for detecting defects of reflective element

PHOTORESIST CHARACTERISTICS ANALYSIS METHOD AND CHARACTERISTICS ANA...