characterised by the material or shape of the object to be examined

Industry

CPC
G01N21/95

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/95characterised by the material or shape of the object to be examined

Industries

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor measurement apparatus
- Patent number 12,222,282
- Issue date Feb 11, 2025
- Samsung Electronics Co., Ltd.
- Seoyeon Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection device and inspecting method using the same
- Patent number 12,222,294
- Issue date Feb 11, 2025
- Samsung Display Co., Ltd.
- Jeong Moon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for quality analysis of a product to be inspected
- Patent number 12,222,296
- Issue date Feb 11, 2025
- Multiscan Technologies, S.L.
- Simon Hendrik E. Van Olmen
- G01 - MEASURING TESTING
Information Patent Grant
Multi-sensor pipe inspection system and method
- Patent number 12,222,298
- Issue date Feb 11, 2025
- HYDROMAX USA, LLC
- Guy Schiavone
- G01 - MEASURING TESTING
Information Patent Grant
Method for assessing contrasts on surfaces
- Patent number 12,222,299
- Issue date Feb 11, 2025
- 4Art Holding AG
- Kai Zeh
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring localized characteristics of a tran...
- Patent number 12,221,229
- Issue date Feb 11, 2025
- The Boenig Company
- James W. Brown
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Inspection substrate
- Patent number 12,220,839
- Issue date Feb 11, 2025
- Disco Corporation
- Yoshikatsu Soejima
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
Method and device for detecting placement of wafers in wafer cassette
- Patent number 12,217,988
- Issue date Feb 4, 2025
- Hon Hai Precision Industry Co., Ltd.
- Yu-Ting Chou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device
- Patent number 12,216,064
- Issue date Feb 4, 2025
- FUJI CORPORATION
- Tomoya Fujimoto
- G01 - MEASURING TESTING
Information Patent Grant
ULED chip, uLED substrate and method for manufacturing the same, el...
- Patent number 12,218,273
- Issue date Feb 4, 2025
- BOE Technology Group Co., Ltd.
- Yuju Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanophotonic crack stop design
- Patent number 12,218,076
- Issue date Feb 4, 2025
- Meta Platforms, Inc.
- Pradip Sairam Pichumani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-contact apparatus for measuring wafer thickness
- Patent number 12,209,853
- Issue date Jan 28, 2025
- Fujikoshi Machinery Corp.
- Chihiro Miyagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Edge defect detection via image analytics
- Patent number 12,211,195
- Issue date Jan 28, 2025
- Applied Materials, Inc.
- Yash Chhabra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, methods and apparatus for safe launch and recovery of an i...
- Patent number 12,209,974
- Issue date Jan 28, 2025
- Square Robot, Inc.
- Jerome Vaganay
- B08 - CLEANING
Information Patent Grant
Real-time detection of deflections and ruptures of EUV pellicle mem...
- Patent number 12,209,975
- Issue date Jan 28, 2025
- Intel Corporation
- John Ferdinand Magana
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and measurement method
- Patent number 12,203,870
- Issue date Jan 21, 2025
- Skyverse Technology Co., Ltd.
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting fused plastic pipes
- Patent number 12,203,873
- Issue date Jan 21, 2025
- WorldWide Nondestructive Testing, Inc.
- Kevin P. Bohne
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
EUV microscope
- Patent number 12,203,874
- Issue date Jan 21, 2025
- EUV TECH, INC.
- Chami N Perera
- G01 - MEASURING TESTING
Information Patent Grant
Method for quality assessment of a processing operation with adapti...
- Patent number 12,203,949
- Issue date Jan 21, 2025
- Fronius International GmbH
- Helmut Ennsbrunner
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Shape measurement system and shape measurement method
- Patent number 12,203,847
- Issue date Jan 21, 2025
- Nippon Telegraph and Telephone Corporation
- Nobutomo Hanzawa
- G01 - MEASURING TESTING
Information Patent Grant
Process tool for analyzing bonded workpiece interface
- Patent number 12,205,855
- Issue date Jan 21, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hau-Yi Hsiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lighting fixture and multi-station lighting system
- Patent number 12,203,869
- Issue date Jan 21, 2025
- SUZHOU CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Lili Liu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Ingot evaluation method and detecting apparatus
- Patent number 12,203,871
- Issue date Jan 21, 2025
- GlobalWafers Co., Ltd.
- Hsiu Chi Liang
- G01 - MEASURING TESTING
Information Patent Grant
Damage detection from multi-view visual data
- Patent number 12,203,872
- Issue date Jan 21, 2025
- FYUSION, INC.
- Stefan Johannes Josef Holzer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection device and pattern inspection method
- Patent number 12,205,272
- Issue date Jan 21, 2025
- NuFlare Technology, Inc.
- Hiromu Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting pattern defects
- Patent number 12,196,687
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ju-Ying Chen
- G01 - MEASURING TESTING
Information Patent Grant
Wearable devices comprising semiconductor diode light sources with...
- Patent number 12,193,790
- Issue date Jan 14, 2025
- Omni MedSci, Inc.
- Mohammed N. Islam
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and a device for detecting crystalline defects in a substrat...
- Patent number 12,196,681
- Issue date Jan 14, 2025
- UNITY SEMICONDUCTOR
- Hadrien Vergnet
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for detecting anomalies in objects
- Patent number 12,196,689
- Issue date Jan 14, 2025
- The Boeing Company
- James J. Troy
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method of inspecting wafer
- Patent number 12,196,669
- Issue date Jan 14, 2025
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PLUG SYSTEM FOR SEWER INSPECTION SYSTEMS AND/OR SEWER MAINTENANCE S...
- Publication number 20250055225
- Publication date Feb 13, 2025
- iPEK International GmbH
- Gerhard Kennerknecht
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...
- Publication number 20250049326
- Publication date Feb 13, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...
- Publication number 20250052691
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Youngsun CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR DRAIN AND PIPE CLEANING AND INSPECTION
- Publication number 20250050388
- Publication date Feb 13, 2025
- ENBASIS INC.
- Jason Richard TURSCHAK
- B08 - CLEANING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
- Publication number 20250052667
- Publication date Feb 13, 2025
- SAMSUNG ELECTRONICS CO., LTD.
- Jooyoun KANG
- G01 - MEASURING TESTING
Information Patent Application
DUAL LENS INSPECTION DEVICE
- Publication number 20250052690
- Publication date Feb 13, 2025
- SUN YANG OPTICS DEVELOPMENT CO., LTD.
- SHENG CHE WU
- G01 - MEASURING TESTING
Information Patent Application
A METHOD AND SYSTEM FOR DISCRIMINATING DEFECTS PRESENT ON A FRONTSI...
- Publication number 20250052692
- Publication date Feb 13, 2025
- Unity Semiconductor
- Alexey Butkevich
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR INSPECTING DROPLET AND METHOD FOR INSPECTING DROPLET...
- Publication number 20250042152
- Publication date Feb 6, 2025
- SAMSUNG DISPLAY CO., LTD.
- TAEYOUNG SONG
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
PUPIL FILTER WITH SPATIALLY-VARYING TRANSMISSION
- Publication number 20250044679
- Publication date Feb 6, 2025
- KLA Corporation
- Alexander Pokrovskiy
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, LINEARLY MOVABLE BEAM DISPLACER, AND METHOD
- Publication number 20250044236
- Publication date Feb 6, 2025
- ASML NETHERLANDS B.V.
- Douglas C. CAPPELLI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING CRYSTAL DEFECT CONCENTRATION LOWER THAN 10 P...
- Publication number 20250044239
- Publication date Feb 6, 2025
- SEMILAB Zrt.
- Zsolt ZOLNAI
- G01 - MEASURING TESTING
Information Patent Application
SPECTACLE LENS PRODUCING METHOD, SPECTACLE LENS PRODUCING SYSTEM, A...
- Publication number 20250041982
- Publication date Feb 6, 2025
- Hoya Lens Thailand Ltd.
- Shigeki OOKUBO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER DEFECT INSPECTION SYSTEM
- Publication number 20250044241
- Publication date Feb 6, 2025
- SYNTEC RESOURCES CO., LTD.
- KANG-FENG FAN
- G01 - MEASURING TESTING
Information Patent Application
EDGE DEFECT DETECTION VIA IMAGE ANALYTICS
- Publication number 20250045900
- Publication date Feb 6, 2025
- Applied Materials, Inc.
- Yash Chhabra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Surface Inspection Device
- Publication number 20250044240
- Publication date Feb 6, 2025
- Hitachi High-Tech Corporation
- Ayumi TOMIYAMA
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETR...
- Publication number 20250044073
- Publication date Feb 6, 2025
- ORBOTECH LTD.
- Yulia Lovsky
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR INSPECTING ABNORMALITY IN ELECTRODES
- Publication number 20250035562
- Publication date Jan 30, 2025
- SK On Co., Ltd.
- Hye Ju JANG
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Sorting And Imaging Insects
- Publication number 20250031680
- Publication date Jan 30, 2025
- PIONEER HI-BRED INTERNATIONAL,INC.
- Michael Freeman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE TEST METHOD
- Publication number 20250035564
- Publication date Jan 30, 2025
- Samsung Electronics Co., Ltd.
- Sung-Il Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT DEVICE
- Publication number 20250035563
- Publication date Jan 30, 2025
- Samsung Electronics Co., Ltd.
- Ryuju Sato
- G01 - MEASURING TESTING
Information Patent Application
SELF CORRECTING OVEN TECHNOLOGY
- Publication number 20250033131
- Publication date Jan 30, 2025
- Jabil Inc.
- Charles Santhakumar
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE
- Publication number 20250027887
- Publication date Jan 23, 2025
- Applied Materials, Inc.
- Srikanth V. Racherla
- G01 - MEASURING TESTING
Information Patent Application
DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED
- Publication number 20250027885
- Publication date Jan 23, 2025
- YAYATECH CO., LTD.
- Chien-Cheng CHEN
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM
- Publication number 20250027886
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- SHAO-CHIEN CHIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CUTTER ANALYSIS AND MAPPING
- Publication number 20250029236
- Publication date Jan 23, 2025
- Halliburton Energy Services, Inc.
- William Brian Atkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...
- Publication number 20250017473
- Publication date Jan 16, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- G01 - MEASURING TESTING
Information Patent Application
DEEP LEARNING BASED MODE SELECTION FOR INSPECTION
- Publication number 20250020598
- Publication date Jan 16, 2025
- KLA Corporation
- Rajkumar Theagarajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSOR SYSTEM FOR DETERMINING A THICKNESS OF A MATERIAL BODY
- Publication number 20250020450
- Publication date Jan 16, 2025
- Cargill, Incorporated
- Amina ALAOUI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENTS USING CAMERA SENSOR COUPLED TO A CHEMICAL DETECTION SY...
- Publication number 20250017472
- Publication date Jan 16, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF DETECTING A CRACK IN A SEMICONDUCTOR ELEMENT, AND RELATE...
- Publication number 20250022122
- Publication date Jan 16, 2025
- KULICKE AND SOFFA INDUSTRIES, INC.
- Aashish Shah
- G06 - COMPUTING CALCULATING COUNTING

characterised by the material or shape of the object to be examined

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor measurement apparatus

Optical inspection device and inspecting method using the same

Inspection system for quality analysis of a product to be inspected

Multi-sensor pipe inspection system and method

Method for assessing contrasts on surfaces

System and method for measuring localized characteristics of a tran...

Inspection substrate

Method and device for detecting placement of wafers in wafer cassette

Inspection device

ULED chip, uLED substrate and method for manufacturing the same, el...

Nanophotonic crack stop design

Non-contact apparatus for measuring wafer thickness

Edge defect detection via image analytics

Systems, methods and apparatus for safe launch and recovery of an i...

Real-time detection of deflections and ruptures of EUV pellicle mem...

Measurement system and measurement method

System and method for inspecting fused plastic pipes

EUV microscope

Method for quality assessment of a processing operation with adapti...

Shape measurement system and shape measurement method

Process tool for analyzing bonded workpiece interface

Lighting fixture and multi-station lighting system

Ingot evaluation method and detecting apparatus

Damage detection from multi-view visual data

Pattern inspection device and pattern inspection method

Method for inspecting pattern defects

Wearable devices comprising semiconductor diode light sources with...

Method and a device for detecting crystalline defects in a substrat...

Systems and methods for detecting anomalies in objects

Inspection apparatus and method of inspecting wafer

Patents Applicationslast 30 patents

PLUG SYSTEM FOR SEWER INSPECTION SYSTEMS AND/OR SEWER MAINTENANCE S...

WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...

SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...

SYSTEMS AND METHODS FOR DRAIN AND PIPE CLEANING AND INSPECTION

OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD

DUAL LENS INSPECTION DEVICE

A METHOD AND SYSTEM FOR DISCRIMINATING DEFECTS PRESENT ON A FRONTSI...

APPARATUS FOR INSPECTING DROPLET AND METHOD FOR INSPECTING DROPLET...

PUPIL FILTER WITH SPATIALLY-VARYING TRANSMISSION

INSPECTION APPARATUS, LINEARLY MOVABLE BEAM DISPLACER, AND METHOD

METHOD FOR DETERMINING CRYSTAL DEFECT CONCENTRATION LOWER THAN 10 P...

SPECTACLE LENS PRODUCING METHOD, SPECTACLE LENS PRODUCING SYSTEM, A...

WAFER DEFECT INSPECTION SYSTEM

EDGE DEFECT DETECTION VIA IMAGE ANALYTICS

Surface Inspection Device

THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETR...

METHOD AND DEVICE FOR INSPECTING ABNORMALITY IN ELECTRODES

Methods And Systems For Sorting And Imaging Insects

SUBSTRATE TEST METHOD

SEMICONDUCTOR MEASUREMENT DEVICE

SELF CORRECTING OVEN TECHNOLOGY

SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE

DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED

DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM

CUTTER ANALYSIS AND MAPPING

WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...

DEEP LEARNING BASED MODE SELECTION FOR INSPECTION

SENSOR SYSTEM FOR DETERMINING A THICKNESS OF A MATERIAL BODY

MEASUREMENTS USING CAMERA SENSOR COUPLED TO A CHEMICAL DETECTION SY...

METHODS OF DETECTING A CRACK IN A SEMICONDUCTOR ELEMENT, AND RELATE...