Checking the presence, location, orientation or value

Industry

CPC
G01R31/2813

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2813Checking the presence, location, orientation or value

Industries

Patents Grantslast 30 patents

Information Patent Grant
Inductor detection
- Patent number 11,940,826
- Issue date Mar 26, 2024
- Texas Instruments Incorporated
- Sachin Sudhir Turkewadikar
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method for obtaining board parameters of printed circuit board
- Patent number 11,782,086
- Issue date Oct 10, 2023
- Montage Electronics (Shanghai) Co., Ltd.
- Wenjuan Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive test needle for measuring electrically conductive layers...
- Patent number 11,774,495
- Issue date Oct 3, 2023
- ATG LUTHER & MAELZER GMBH
- Stefan Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for testing a device under test
- Patent number 11,762,018
- Issue date Sep 19, 2023
- Rohde & Schwarz GmbH & Co. KG
- Corbett Rowell
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting errors or malfunctions in electrical or electr...
- Patent number 11,747,391
- Issue date Sep 5, 2023
- ENDRESS+HAUSER SE+CO.KG
- Christian Strittmatter
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying PCB core-layer properties
- Patent number 11,644,501
- Issue date May 9, 2023
- International Business Machines Corporation
- Tao Song
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor package having exposed redistribution layer features...
- Patent number 11,600,523
- Issue date Mar 7, 2023
- Microchip Technology Incorporated
- ManKit Lam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ball grid array current meter with a current sense wire
- Patent number 11,519,957
- Issue date Dec 6, 2022
- International Business Machines Corporation
- Layne A. Berge
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for testing a power module
- Patent number 11,360,139
- Issue date Jun 14, 2022
- ZHENGZHOU YUNHAI INFORMATION TECHNOLOGY CO., LTD.
- Xin Sui
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for electrical testing of an electrical assembly...
- Patent number 11,320,477
- Issue date May 3, 2022
- ATEIP GMBH
- Ulrich Pohl
- G01 - MEASURING TESTING
Information Patent Grant
Printed circuit board performance evaluation techniques
- Patent number 11,300,605
- Issue date Apr 12, 2022
- International Business Machines Corporation
- Layne A. Berge
- G01 - MEASURING TESTING
Information Patent Grant
Wire connector for vehicle
- Patent number 11,215,677
- Issue date Jan 4, 2022
- Hyundai Motor Company
- Gowri Shankar Mecheri Ravisubramanian
- G01 - MEASURING TESTING
Information Patent Grant
Work machine and method for determining polarity
- Patent number 11,219,150
- Issue date Jan 4, 2022
- FUJI CORPORATION
- Hiromi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Detecting unwanted components in a computer system based on EMI fin...
- Patent number 11,120,134
- Issue date Sep 14, 2021
- Oracle International Corporation
- Andrew J. Lewis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for testing motherboard
- Patent number 10,942,213
- Issue date Mar 9, 2021
- DFI Inc.
- Chia-yi Chang
- G01 - MEASURING TESTING
Information Patent Grant
Method of resonance analysis for electrical fault isolation
- Patent number 10,935,593
- Issue date Mar 2, 2021
- Intel Corporation
- Deepak Goyal
- G01 - MEASURING TESTING
Information Patent Grant
Foreign substance detecting circuit and electronic device including...
- Patent number 10,862,246
- Issue date Dec 8, 2020
- Samsung Electronics Co., Ltd.
- Jun-han Bae
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and device for automatic signal measurement
- Patent number 10,775,428
- Issue date Sep 15, 2020
- DFI Inc.
- Chia-yi Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Component leak detection apparatuses and methods
- Patent number 10,725,117
- Issue date Jul 28, 2020
- Landis+Gyr Technologies, LLC
- Verne Olson
- G01 - MEASURING TESTING
Information Patent Grant
Insertion position correction in an electronic component insertion...
- Patent number 10,712,381
- Issue date Jul 14, 2020
- Taiyo Yuden Co., Ltd.
- Hideaki Tago
- G01 - MEASURING TESTING
Information Patent Grant
Measuring complex PCB-based interconnects in a production environment
- Patent number 10,712,398
- Issue date Jul 14, 2020
- Multek Technologies Limited
- Franz Gisin
- G01 - MEASURING TESTING
Information Patent Grant
Abnormality detector for electronic device
- Patent number 10,677,838
- Issue date Jun 9, 2020
- FANUC CORPORATION
- Masataka Tsuchimoto
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection apparatus and method
- Patent number 10,650,510
- Issue date May 12, 2020
- Koh Young Technology Inc.
- Seung Ae Seo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Strain gauge detection and orientation system
- Patent number 10,612,992
- Issue date Apr 7, 2020
- Lockheed Martin Corporation
- George N. Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for detecting a usability of a control device
- Patent number 10,507,779
- Issue date Dec 17, 2019
- Robert Bosch GmbH
- Rainer Zuschlag
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Power supply stress testing
- Patent number 10,495,683
- Issue date Dec 3, 2019
- VIAVI SOLUTIONS DEUTSCHLAND GMBH
- Reiner Schnizler
- G01 - MEASURING TESTING
Information Patent Grant
Conductivity inspection method of printed circuit board and manufac...
- Patent number 10,264,684
- Issue date Apr 16, 2019
- Nitto Denko Corporation
- Terukazu Ihara
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting faults on retention cell pins
- Patent number 10,222,421
- Issue date Mar 5, 2019
- Silicon Laboratories Inc.
- Mudit Srivastava
- G01 - MEASURING TESTING
Information Patent Grant
Insulation inspection method and insulation inspection apparatus
- Patent number 10,197,616
- Issue date Feb 5, 2019
- Nidec-Read Corporation
- Jun Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Top contact resistance measurement in vertical FETs
- Patent number 10,002,809
- Issue date Jun 19, 2018
- International Business Machines Corporation
- Kangguo Cheng
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Test Needle, Test Probe, and Flying Probe Tester for Testing Printe...
- Publication number 20230400509
- Publication date Dec 14, 2023
- ATG LUTHER & MAELZER GMBH
- Stefan Weiss
- G01 - MEASURING TESTING
Information Patent Application
BALL GRID ARRAY CURRENT METER WITH A CURRENT SENSE WIRE
- Publication number 20230105433
- Publication date Apr 6, 2023
- International Business Machines Corporation
- Layne A. Berge
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHODS AND SYSTEMS FOR AUTOMATIC WAVEFORM ANALYSIS
- Publication number 20230074806
- Publication date Mar 9, 2023
- Yangtze Memory Technologies Co., Ltd.
- Liqiang NI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBTAINING BOARD PARAMETERS OF PRINTED CIRCUIT BOARD
- Publication number 20230016096
- Publication date Jan 19, 2023
- Montage Electronics (Shanghai) Co., Ltd.
- Wenjuan ZHANG
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND OPERATION METHOD OF ELECTRONIC DEVICE FOR DET...
- Publication number 20230008917
- Publication date Jan 12, 2023
- Samsung Electronics Co., Ltd.
- Myeongjae HONG
- G01 - MEASURING TESTING
Information Patent Application
CHARGING PILE AND TESTING DEVICE, SYSTEM AND METHOD THEREOF
- Publication number 20220340032
- Publication date Oct 27, 2022
- Sungrow Power Supply Co., Ltd.
- Hongchuang Chen
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHOD FOR DETECTING ERRORS OR MALFUNCTIONS IN ELECTRICAL OR ELECTR...
- Publication number 20220317175
- Publication date Oct 6, 2022
- Endress+Hauser SE+Co. KG
- Christian Strittmatter
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Sampling Circuit
- Publication number 20220294671
- Publication date Sep 15, 2022
- Naoki Terao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR IDENTIFYING PCB CORE-LAYER PROPERTIES
- Publication number 20220091181
- Publication date Mar 24, 2022
- International Business Machines Corporation
- Tao Song
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A POWER MODULE
- Publication number 20210325446
- Publication date Oct 21, 2021
- ZHENGZHOU YUNHAI INFORMATION TECHNOLOGY CO., LTD.
- Xin SUI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ELECTRICAL TESTING OF AN ELECTRICAL ASSEMBLY
- Publication number 20210181248
- Publication date Jun 17, 2021
- ATEIP GMBH
- Ulrich POHL
- G01 - MEASURING TESTING
Information Patent Application
Inspection Method for Pins and Vias of Differential Signal Lines
- Publication number 20210148965
- Publication date May 20, 2021
- Inventec (Pudong) Technology Corp.
- Chih-Yun Chang
- G01 - MEASURING TESTING
Information Patent Application
BALL GRID ARRAY CURRENT METER WITH A CURRENT SENSE WIRE
- Publication number 20210096168
- Publication date Apr 1, 2021
- International Business Machines Corporation
- Layne A. Berge
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
WORK MACHINE AND METHOD FOR DETERMINING POLARITY
- Publication number 20200396877
- Publication date Dec 17, 2020
- FUJI CORPORATION
- Hiromi SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
Capacitive Test Needle for Measuring Electrically Conductive Layers...
- Publication number 20200348359
- Publication date Nov 5, 2020
- XCERRA CORPORATION
- Stefan Weiss
- G01 - MEASURING TESTING
Information Patent Application
DETECTING UNWANTED COMPONENTS IN A COMPUTER SYSTEM BASED ON EMI FIN...
- Publication number 20200201999
- Publication date Jun 25, 2020
- ORACLE INTERNATIONAL CORPORATION
- Andrew J. Lewis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND METHOD FOR TESTING MOTHERBOARD
- Publication number 20190391201
- Publication date Dec 26, 2019
- DFI Inc.
- Chia-yi CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND DEVICE FOR AUTOMATIC SIGNAL MEASUREMENT
- Publication number 20190391202
- Publication date Dec 26, 2019
- DFI Inc.
- Chia-yi CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPONENT LEAK DETECTION APPARATUSES AND METHODS
- Publication number 20190369153
- Publication date Dec 5, 2019
- LANDIS+GYR TECHNOLOGIES, LLC
- Verne Olson
- G01 - MEASURING TESTING
Information Patent Application
PRINTED CIRCUIT BOARD PERFORMANCE EVALUATION TECHNIQUES
- Publication number 20190361069
- Publication date Nov 28, 2019
- International Business Machines Corporation
- LAYNE A. BERGE
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MEASUREMENT SYSTEM AND METHOD FOR TESTING A DEVICE UNDER TEST
- Publication number 20190302184
- Publication date Oct 3, 2019
- ROHDE & SCHWARZ GMBH & CO. KG
- Corbett Rowell
- G01 - MEASURING TESTING
Information Patent Application
POWER SUPPLY STRESS TESTING
- Publication number 20190219629
- Publication date Jul 18, 2019
- VIAVI SOLUTIONS DEUTSCHLAND GMBH
- Reiner SCHNIZLER
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF RESONANCE ANALYSIS FOR ELECTRICAL FAULT ISOLATION
- Publication number 20190204376
- Publication date Jul 4, 2019
- Deepak Goyal
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN SUBSTANCE DETECTING CIRCUIT AND ELECTRONIC DEVICE INCLUDING...
- Publication number 20190181590
- Publication date Jun 13, 2019
- Samsung Electronics Co., Ltd.
- Jun-han BAE
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
UTILIZING NON-VOLATILE PHASE CHANGE MEMORY IN OFFLINE STATUS AND ER...
- Publication number 20190179721
- Publication date Jun 13, 2019
- Mark Vinod Kapoor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ABNORMALITY DETECTOR FOR ELECTRONIC DEVICE
- Publication number 20190154752
- Publication date May 23, 2019
- FANUC CORPORATION
- Masataka TSUCHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
INSERTION POSITION CORRECTION IN AN ELECTRONIC COMPONENT INSERTION...
- Publication number 20180334334
- Publication date Nov 22, 2018
- Taiyo Yuden Co., Ltd.
- HIDEAKI TAGO
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
SEMICONDUCTOR PACKAGE HAVING EXPOSED REDISTRIBUTION LAYER FEATURES...
- Publication number 20180294186
- Publication date Oct 11, 2018
- MICROCHIP TECHNOLOGY INCORPORATED
- ManKit Lam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEAKAGE CURRENT PROTECTION DEVICE
- Publication number 20180292443
- Publication date Oct 11, 2018
- Chengli LI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TOP CONTACT RESISTANCE MEASUREMENT IN VERTICAL FETS
- Publication number 20180025954
- Publication date Jan 25, 2018
- International Business Machines Corporation
- Kangguo Cheng
- G01 - MEASURING TESTING

Checking the presence, location, orientation or value

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inductor detection

Method for obtaining board parameters of printed circuit board

Capacitive test needle for measuring electrically conductive layers...

Measurement system and method for testing a device under test

Method for detecting errors or malfunctions in electrical or electr...

Method for identifying PCB core-layer properties

Semiconductor package having exposed redistribution layer features...

Ball grid array current meter with a current sense wire

Method for testing a power module

Method and device for electrical testing of an electrical assembly...

Printed circuit board performance evaluation techniques

Wire connector for vehicle

Work machine and method for determining polarity

Detecting unwanted components in a computer system based on EMI fin...

Device and method for testing motherboard

Method of resonance analysis for electrical fault isolation

Foreign substance detecting circuit and electronic device including...

System and device for automatic signal measurement

Component leak detection apparatuses and methods

Insertion position correction in an electronic component insertion...

Measuring complex PCB-based interconnects in a production environment

Abnormality detector for electronic device

Substrate inspection apparatus and method

Strain gauge detection and orientation system

Method and device for detecting a usability of a control device

Power supply stress testing

Conductivity inspection method of printed circuit board and manufac...

Method for detecting faults on retention cell pins

Insulation inspection method and insulation inspection apparatus

Top contact resistance measurement in vertical FETs

Patents Applicationslast 30 patents

Test Needle, Test Probe, and Flying Probe Tester for Testing Printe...

BALL GRID ARRAY CURRENT METER WITH A CURRENT SENSE WIRE

METHODS AND SYSTEMS FOR AUTOMATIC WAVEFORM ANALYSIS

METHOD FOR OBTAINING BOARD PARAMETERS OF PRINTED CIRCUIT BOARD

ELECTRONIC DEVICE AND OPERATION METHOD OF ELECTRONIC DEVICE FOR DET...

CHARGING PILE AND TESTING DEVICE, SYSTEM AND METHOD THEREOF

METHOD FOR DETECTING ERRORS OR MALFUNCTIONS IN ELECTRICAL OR ELECTR...

Sampling Circuit

METHOD FOR IDENTIFYING PCB CORE-LAYER PROPERTIES

METHOD FOR TESTING A POWER MODULE

METHOD AND DEVICE FOR ELECTRICAL TESTING OF AN ELECTRICAL ASSEMBLY

Inspection Method for Pins and Vias of Differential Signal Lines

BALL GRID ARRAY CURRENT METER WITH A CURRENT SENSE WIRE

WORK MACHINE AND METHOD FOR DETERMINING POLARITY

Capacitive Test Needle for Measuring Electrically Conductive Layers...

DETECTING UNWANTED COMPONENTS IN A COMPUTER SYSTEM BASED ON EMI FIN...

DEVICE AND METHOD FOR TESTING MOTHERBOARD

SYSTEM AND DEVICE FOR AUTOMATIC SIGNAL MEASUREMENT

COMPONENT LEAK DETECTION APPARATUSES AND METHODS

PRINTED CIRCUIT BOARD PERFORMANCE EVALUATION TECHNIQUES

MEASUREMENT SYSTEM AND METHOD FOR TESTING A DEVICE UNDER TEST

POWER SUPPLY STRESS TESTING

METHOD OF RESONANCE ANALYSIS FOR ELECTRICAL FAULT ISOLATION

FOREIGN SUBSTANCE DETECTING CIRCUIT AND ELECTRONIC DEVICE INCLUDING...

UTILIZING NON-VOLATILE PHASE CHANGE MEMORY IN OFFLINE STATUS AND ER...

ABNORMALITY DETECTOR FOR ELECTRONIC DEVICE

INSERTION POSITION CORRECTION IN AN ELECTRONIC COMPONENT INSERTION...

SEMICONDUCTOR PACKAGE HAVING EXPOSED REDISTRIBUTION LAYER FEATURES...

LEAKAGE CURRENT PROTECTION DEVICE

TOP CONTACT RESISTANCE MEASUREMENT IN VERTICAL FETS