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Circuits for displaying non-recurrent functions such as transients Circuits for triggering Circuits for sychronisation Circuits for time-base expansion
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R13/00
Arrangements for displaying electric variables or waveforms
Current Industry
G01R13/32
Circuits for displaying non-recurrent functions such as transients Circuits for triggering Circuits for sychronisation Circuits for time-base expansion
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Patents Grants
last 30 patents
Information
Patent Grant
Method, system, and non-transitory computer readable medium for det...
Patent number
11,982,690
Issue date
May 14, 2024
Fulian Precision Electronics (Tianjin) Co., LTD.
Po-Hui Lu
G01 - MEASURING TESTING
Information
Patent Grant
Methods for triggering oscilloscopes and oscilloscopes employing th...
Patent number
11,867,726
Issue date
Jan 9, 2024
Micron Technology, Inc.
Daniel B. Stewart
G01 - MEASURING TESTING
Information
Patent Grant
Parallel trigger model for test and measurement instruments
Patent number
11,061,077
Issue date
Jul 13, 2021
KEITHLEY INSTRUMENTS, LLC
Brian P. Frackelton
G01 - MEASURING TESTING
Information
Patent Grant
Multi-channel triggering apparatus and method
Patent number
11,016,123
Issue date
May 25, 2021
Keysight Technologies, Inc.
Andrew Robert Lehane
G01 - MEASURING TESTING
Information
Patent Grant
Measurement method and measurement apparatus
Patent number
10,976,350
Issue date
Apr 13, 2021
Rohde & Schwarz GmbH & Co. KG
Andrew Schaefer
G01 - MEASURING TESTING
Information
Patent Grant
Enabling a trigger in a test and measurement instrument
Patent number
10,656,183
Issue date
May 19, 2020
Tektronix, Inc.
David L. Kelly
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device and method with automated trigger function
Patent number
10,495,670
Issue date
Dec 3, 2019
Rohde & Schwarz GmbH & Co. KG
Johann Huber
G01 - MEASURING TESTING
Information
Patent Grant
Automatic frequency prescaler
Patent number
10,481,179
Issue date
Nov 19, 2019
Tektronix, Inc.
David L. Kelly
G01 - MEASURING TESTING
Information
Patent Grant
Multi-scope control and synchronization system
Patent number
9,651,579
Issue date
May 16, 2017
Tektronix, Inc.
Barton T. Hickman
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Measuring device having a trigger unit
Patent number
9,250,268
Issue date
Feb 2, 2016
Rohde & Schwarz GmbH & Co. KG
Markus Freidhof
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for gathering signal states for debugging a circuit
Patent number
8,983,790
Issue date
Mar 17, 2015
Xilinx, Inc.
Ushasri Merugu
G01 - MEASURING TESTING
Information
Patent Grant
Voice-activated pulser
Patent number
8,954,334
Issue date
Feb 10, 2015
Zanavox
David Edward Newman
G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information
Patent Grant
Driving an electronic instrument
Patent number
8,531,176
Issue date
Sep 10, 2013
Teradyne, Inc.
Steven D. Roach
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for using logical values to represent sequence of...
Patent number
8,370,677
Issue date
Feb 5, 2013
Tektronix, Inc.
Sven Foerster
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Waveform analyzer
Patent number
8,054,907
Issue date
Nov 8, 2011
John David Hamre
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and system for digital triggering of signals on the basis of...
Patent number
8,046,182
Issue date
Oct 25, 2011
Rohde & Schwarz GmbH & Co. KG
Markus Freidhof
G01 - MEASURING TESTING
Information
Patent Grant
Time synchronization of master and slave devices
Patent number
7,787,576
Issue date
Aug 31, 2010
Tektronix, Inc.
Sven Foerster
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Frame signal waveform observation apparatus and method
Patent number
7,508,844
Issue date
Mar 24, 2009
Anritsu Corporation
Mitsuo Amagai
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus providing multiple channel multiple instrument...
Patent number
7,398,175
Issue date
Jul 8, 2008
Tektronix, Inc.
Que Thuy Tran
G01 - MEASURING TESTING
Information
Patent Grant
Pattern trigger in a coherent timebase
Patent number
7,285,946
Issue date
Oct 23, 2007
LeCroy Corporation
Stephen C. Ems
G01 - MEASURING TESTING
Information
Patent Grant
Waveform measuring apparatus for measuring waveform data and writin...
Patent number
7,246,017
Issue date
Jul 17, 2007
Yokogawa Electric Corporation
Shin'ichi Nakano
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for the digital and analog triggering of a sig...
Patent number
7,227,349
Issue date
Jun 5, 2007
Tektronix, Inc.
Donald C. Kirkpatrick
G01 - MEASURING TESTING
Information
Patent Grant
Oscilloscope having advanced triggering capability
Patent number
7,191,079
Issue date
Mar 13, 2007
Tektronix, Inc.
Patrick A. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Qualification signal measurement, trigger, and/or display system
Patent number
6,990,416
Issue date
Jan 24, 2006
Agilent Technologies, Inc.
Jordan D. Kobalka
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system for sampling a signal and evaluating data repres...
Patent number
6,799,128
Issue date
Sep 28, 2004
Agilent Technologies, Inc.
Christopher P Duff
G01 - MEASURING TESTING
Information
Patent Grant
Timebase for sampling an input signal having a synchronous trigger
Patent number
6,650,101
Issue date
Nov 18, 2003
Agilent Technologies, Inc.
Willard MacDonald
G01 - MEASURING TESTING
Information
Patent Grant
Digital oscilloscope with trigger qualification based on pattern re...
Patent number
6,621,913
Issue date
Sep 16, 2003
Fluke Corporation
Johan de Vries
G01 - MEASURING TESTING
Information
Patent Grant
Integrated trigger function display system and methodology for trig...
Patent number
6,396,517
Issue date
May 28, 2002
Agilent Technologies, Inc.
Douglas James Beck
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Timing generation circuit for an electro-optic oscilloscope
Patent number
6,288,529
Issue date
Sep 11, 2001
Ando Electric Co., Ltd.
Nobuaki Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
External trigger delay compensation apparatus
Patent number
6,279,130
Issue date
Aug 21, 2001
Tektronix, Inc.
Michael F. Moser
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD, SYSTEM, AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR DET...
Publication number
20230305038
Publication date
Sep 28, 2023
Fulian Precision Electronics (Tianjin) Co., LTD.
PO-HUI LU
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ANALYZING A SIGNAL AND SIGNAL ANALYSIS DEVICE
Publication number
20220043031
Publication date
Feb 10, 2022
ROHDE & SCHWARZ GMBH & CO. KG
Markus Freidhof
G01 - MEASURING TESTING
Information
Patent Application
INSTRUMENT FOR ANALYZING AN INPUT SIGNAL
Publication number
20220011347
Publication date
Jan 13, 2022
ROHDE & SCHWARZ GMBH & CO. KG
Andrew Schaefer
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR TRIGGERING OSCILLOSCOPES AND OSCILLOSCOPES EMPLOYING TH...
Publication number
20210072287
Publication date
Mar 11, 2021
Micron Technology, Inc.
Daniel B. Stewart
G01 - MEASURING TESTING
Information
Patent Application
DISPLAY DATA GENERATION DEVICE, DISPLAY DATA GENERATION METHOD, AND...
Publication number
20200393497
Publication date
Dec 17, 2020
Mitsubishi Electric Corporation
Osamu NASU
G01 - MEASURING TESTING
Information
Patent Application
Measurement method and measurement apparatus
Publication number
20200341034
Publication date
Oct 29, 2020
Rohde& Schwarz GmbH & Co. KG
Andrew Schaefer
G01 - MEASURING TESTING
Information
Patent Application
Multi-Channel Triggering Apparatus and Method
Publication number
20200132727
Publication date
Apr 30, 2020
KEYSIGHT TECHNOLOGIES, INC.
Andrew Robert Lehane
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Automatic Frequency Prescaler
Publication number
20170003321
Publication date
Jan 5, 2017
Tektronix, Inc.
David L. Kelly
G01 - MEASURING TESTING
Information
Patent Application
MULTI-SCOPE CONTROL AND SYNCHRONIZATION SYSTEM
Publication number
20160077131
Publication date
Mar 17, 2016
Tektronix, Inc.
Barton T. Hickman
G01 - MEASURING TESTING
Information
Patent Application
MEASURING DEVICE HAVING A TRIGGER UNIT
Publication number
20130099827
Publication date
Apr 25, 2013
Markus Freidhof
G01 - MEASURING TESTING
Information
Patent Application
Voice-Activated Pulser
Publication number
20130093445
Publication date
Apr 18, 2013
David Edward Newman
G01 - MEASURING TESTING
Information
Patent Application
DRIVING AN ELECTRONIC INSTRUMENT
Publication number
20110267030
Publication date
Nov 3, 2011
Steven D. Roach
G01 - MEASURING TESTING
Information
Patent Application
Time Synchronization of Master and Slave Devices
Publication number
20100223487
Publication date
Sep 2, 2010
TEKTRONIX INTERNATIONAL SALES GMBH
Sven Foerster
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method and System for Digital Triggering of Signals on the Basis of...
Publication number
20080270054
Publication date
Oct 30, 2008
ROHDE &SCHWARZ GMBH & CO. KG
Markus Freidhof
G01 - MEASURING TESTING
Information
Patent Application
Time synchronization of master and slave devices
Publication number
20060244501
Publication date
Nov 2, 2006
Sven Foerster
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Pattern trigger in a coherent timebase
Publication number
20060176151
Publication date
Aug 10, 2006
LeCroy Corporation
Stephen C. Ems
G01 - MEASURING TESTING
Information
Patent Application
Waveform analyzer
Publication number
20060132116
Publication date
Jun 22, 2006
John David Hamre
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Trigger signal generation system frame signal waveform observation...
Publication number
20050271087
Publication date
Dec 8, 2005
Anritus Corporation
Mitsuo Amagai
G01 - MEASURING TESTING
Information
Patent Application
Waveform measuring apparatus
Publication number
20050234665
Publication date
Oct 20, 2005
YOKOGAWA ELECTRIC CORPORATION
Shin'ichi Nakano
G01 - MEASURING TESTING
Information
Patent Application
Oscilloscope having advanced triggering capability
Publication number
20050225310
Publication date
Oct 13, 2005
Patrick A. Smith
G01 - MEASURING TESTING
Information
Patent Application
Qualification signal measurement, trigger, and/or display system
Publication number
20050038615
Publication date
Feb 17, 2005
Jordan D. Kobalka
G01 - MEASURING TESTING
Information
Patent Application
Automated storage of unique waveforms presented as an oscilloscope...
Publication number
20040189636
Publication date
Sep 30, 2004
Frederick A. Azinger
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus providing multiple channel multiple instrument...
Publication number
20040119620
Publication date
Jun 24, 2004
Que Thuy Tran
G01 - MEASURING TESTING
Information
Patent Application
Measurement system for sampling a signal and evaluating data repres...
Publication number
20040088125
Publication date
May 6, 2004
Christopher P. Duff
G01 - MEASURING TESTING
Information
Patent Application
TIMEBASE FOR SAMPLING AN INPUT SIGNAL HAVING A SYNCHRONOUS TRIGGER
Publication number
20030189423
Publication date
Oct 9, 2003
Willard MacDonald
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for the digital and analog triggering of a sig...
Publication number
20030154452
Publication date
Aug 14, 2003
Donald C. Kirkpatrick
G01 - MEASURING TESTING