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Circuits for simultaneous or sequential presentation of more than one variable
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G01R13/28
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R13/00
Arrangements for displaying electric variables or waveforms
Current Industry
G01R13/28
Circuits for simultaneous or sequential presentation of more than one variable
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Patents Grants
last 30 patents
Information
Patent Grant
Multiprobe measurement device and method
Patent number
11,867,724
Issue date
Jan 9, 2024
Gerd Bresser
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electrical test and measurement device, measurement extension devic...
Patent number
11,249,115
Issue date
Feb 15, 2022
Rohde & Schwarz GmbH & Co. KG
Philip Diegmann
G01 - MEASURING TESTING
Information
Patent Grant
Automatic detection of logical path segments in a measurement popul...
Patent number
11,237,190
Issue date
Feb 1, 2022
Tektronix, Inc.
Keith D. Rule
G01 - MEASURING TESTING
Information
Patent Grant
Measuring system and method
Patent number
11,169,181
Issue date
Nov 9, 2021
Gerd Bresser
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measuring system and method
Patent number
11,061,053
Issue date
Jul 13, 2021
Gerd Bresser
G01 - MEASURING TESTING
Information
Patent Grant
Measuring system and method
Patent number
11,047,881
Issue date
Jun 29, 2021
Gerd Bresser
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Programmable interface-based validation and debug
Patent number
9,152,520
Issue date
Oct 6, 2015
Texas Instruments Incorporated
Anshul Gahoi
G01 - MEASURING TESTING
Information
Patent Grant
System for simplified correlation of instrumentation probes and dat...
Patent number
8,004,273
Issue date
Aug 23, 2011
Marvell International Ltd.
Patrick A. McKinley
G01 - MEASURING TESTING
Information
Patent Grant
Time correlation of signal power to distortion characteristics
Patent number
7,751,470
Issue date
Jul 6, 2010
Tektronix, Inc.
Steven W. Stanton
G01 - MEASURING TESTING
Information
Patent Grant
Method of operating an oscilloscope
Patent number
6,947,043
Issue date
Sep 20, 2005
Tektronix, Inc.
Kayla R. Klingman
G01 - MEASURING TESTING
Information
Patent Grant
Context sensitive toolbar
Patent number
6,907,365
Issue date
Jun 14, 2005
LeCroy Corporation
Lawrence Steven Salant
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Displaying a number of measurement curves
Patent number
6,876,937
Issue date
Apr 5, 2005
Agilent Technologies, Inc.
Michael Goericke
G01 - MEASURING TESTING
Information
Patent Grant
Mixer-based timebase for sampling multiple input signal references...
Patent number
6,856,924
Issue date
Feb 15, 2005
Agilent Technologies, Inc.
Willard MacDonald
G01 - MEASURING TESTING
Information
Patent Grant
Acquisition system for a long record length digital storage oscillo...
Patent number
6,807,496
Issue date
Oct 19, 2004
Tektronix, Inc.
John J. Pickerd
G01 - MEASURING TESTING
Information
Patent Grant
Waveform display utilizing frequency-based coloring and navigation
Patent number
6,184,898
Issue date
Feb 6, 2001
Comparisonics Corporation
Stephen V. Rice
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Signal waveform display system
Patent number
5,933,129
Issue date
Aug 3, 1999
Leader Electronics Corp.
Haruhisa Egami
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Method of displaying continuously acquired data as multiple traces...
Patent number
5,684,508
Issue date
Nov 4, 1997
Fluke Corporation
Klaas Jan Brilman
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for obtaining voltage-isolated measurement cha...
Patent number
5,594,329
Issue date
Jan 14, 1997
Fluke Corporation
Rudolf G. van Ettinger
G01 - MEASURING TESTING
Information
Patent Grant
Display resolution enhancement using data compression and overlappi...
Patent number
5,434,593
Issue date
Jul 18, 1995
Gould Instrument Systems, Inc.
Thomas H. Lecklider
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Vertical amplifier system for multitrace oscilloscope and method fo...
Patent number
5,272,449
Issue date
Dec 21, 1993
Kikusui Electronics Corporation
Masao Izawa
G01 - MEASURING TESTING
Information
Patent Grant
Display tube control system
Patent number
5,053,684
Issue date
Oct 1, 1991
PPG Hellige B.V.
Marinus A. M. Nooyen
G01 - MEASURING TESTING
Information
Patent Grant
System for displaying adaptive inference testing device information
Patent number
5,020,011
Issue date
May 28, 1991
Array Analysis, Inc.
William D. Stark
G01 - MEASURING TESTING
Information
Patent Grant
Probability density histogram display
Patent number
5,003,248
Issue date
Mar 26, 1991
Hewlett-Packard Company
Dana L. Johnson
G01 - MEASURING TESTING
Information
Patent Grant
Display circuit of an oscilloscope
Patent number
4,866,352
Issue date
Sep 12, 1989
Iwatsu Electric Co., Ltd.
Fumihiko Motohashi
G01 - MEASURING TESTING
Information
Patent Grant
Touchscreen feedback system
Patent number
4,821,030
Issue date
Apr 11, 1989
Tektronix, Inc.
Brian Batson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Equivalent time waveform data display
Patent number
4,809,189
Issue date
Feb 28, 1989
Tektronix, Inc.
Brian E. Batson
G01 - MEASURING TESTING
Information
Patent Grant
Oscilloscope trace attribute control system
Patent number
4,774,438
Issue date
Sep 27, 1988
Tektronix, Inc.
Gregory S. Rogers
G01 - MEASURING TESTING
Information
Patent Grant
Signal controlled waveform recorder
Patent number
4,631,697
Issue date
Dec 23, 1986
Duffers Scientific, Inc.
Hugo S. Ferguson
G01 - MEASURING TESTING
Information
Patent Grant
Video synthesizer
Patent number
4,574,278
Issue date
Mar 4, 1986
Ragen Data Systems, Inc.
Steven P. Apelman
G01 - MEASURING TESTING
Information
Patent Grant
Oscillographic device for displaying multiple continuous waveforms
Patent number
4,567,405
Issue date
Jan 28, 1986
Tektronix, Inc.
Lloyd R. Bristol
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEASURING SYSTEM AND METHOD
Publication number
20220034941
Publication date
Feb 3, 2022
Rohde& Schwarz GmbH & Co. KG
Gerd Bresser
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTERACTIVE INSTRUMENT MEASUREMENT ANALYTICS
Publication number
20200233016
Publication date
Jul 23, 2020
Tektronix, Inc.
Keith D. Rule
G01 - MEASURING TESTING
Information
Patent Application
MEASURING SYSTEM AND METHOD
Publication number
20190324061
Publication date
Oct 24, 2019
Rohde& Schwarz GmbH & Co. KG
Gerd Bresser
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICAL TEST AND MEASUREMENT DEVICE, MEASUREMENT EXTENSION DEVIC...
Publication number
20180335453
Publication date
Nov 22, 2018
ROHDE & SCHWARZ GMBH & CO. KG
Philip Diegmann
G01 - MEASURING TESTING
Information
Patent Application
Time correlation of signal power to distortion characteristics
Publication number
20060176967
Publication date
Aug 10, 2006
Steven W. Stanton
G01 - MEASURING TESTING
Information
Patent Application
Simultaneous presentation of locally acquired and remotely acquired...
Publication number
20040174818
Publication date
Sep 9, 2004
Donald A. Zocchi
G01 - MEASURING TESTING
Information
Patent Application
Mixer-based timebase for sampling multiple input signal references...
Publication number
20040167733
Publication date
Aug 26, 2004
Willard MacDonald
G01 - MEASURING TESTING
Information
Patent Application
Displaying a number of measurement curves
Publication number
20040034500
Publication date
Feb 19, 2004
Michael Goericke
G01 - MEASURING TESTING
Information
Patent Application
Acquisition system for a long record length digital storage oscillo...
Publication number
20030208330
Publication date
Nov 6, 2003
John J. Pickerd
G01 - MEASURING TESTING
Information
Patent Application
Context sensitive toolbar
Publication number
20030109996
Publication date
Jun 12, 2003
Lawrence Steven Salant
G06 - COMPUTING CALCULATING COUNTING