Circuits for simultaneous or sequential presentation of more than one variable

Industry

CPC
G01R13/28

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

Current Industry

G01R13/28Circuits for simultaneous or sequential presentation of more than one variable

Industries

Patents Grantslast 30 patents

Information Patent Grant
Multiprobe measurement device and method
- Patent number 11,867,724
- Issue date Jan 9, 2024
- Gerd Bresser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrical test and measurement device, measurement extension devic...
- Patent number 11,249,115
- Issue date Feb 15, 2022
- Rohde & Schwarz GmbH & Co. KG
- Philip Diegmann
- G01 - MEASURING TESTING
Information Patent Grant
Automatic detection of logical path segments in a measurement popul...
- Patent number 11,237,190
- Issue date Feb 1, 2022
- Tektronix, Inc.
- Keith D. Rule
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system and method
- Patent number 11,169,181
- Issue date Nov 9, 2021
- Gerd Bresser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring system and method
- Patent number 11,061,053
- Issue date Jul 13, 2021
- Gerd Bresser
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system and method
- Patent number 11,047,881
- Issue date Jun 29, 2021
- Gerd Bresser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Programmable interface-based validation and debug
- Patent number 9,152,520
- Issue date Oct 6, 2015
- Texas Instruments Incorporated
- Anshul Gahoi
- G01 - MEASURING TESTING
Information Patent Grant
System for simplified correlation of instrumentation probes and dat...
- Patent number 8,004,273
- Issue date Aug 23, 2011
- Marvell International Ltd.
- Patrick A. McKinley
- G01 - MEASURING TESTING
Information Patent Grant
Time correlation of signal power to distortion characteristics
- Patent number 7,751,470
- Issue date Jul 6, 2010
- Tektronix, Inc.
- Steven W. Stanton
- G01 - MEASURING TESTING
Information Patent Grant
Method of operating an oscilloscope
- Patent number 6,947,043
- Issue date Sep 20, 2005
- Tektronix, Inc.
- Kayla R. Klingman
- G01 - MEASURING TESTING
Information Patent Grant
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- Patent number 6,907,365
- Issue date Jun 14, 2005
- LeCroy Corporation
- Lawrence Steven Salant
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Displaying a number of measurement curves
- Patent number 6,876,937
- Issue date Apr 5, 2005
- Agilent Technologies, Inc.
- Michael Goericke
- G01 - MEASURING TESTING
Information Patent Grant
Mixer-based timebase for sampling multiple input signal references...
- Patent number 6,856,924
- Issue date Feb 15, 2005
- Agilent Technologies, Inc.
- Willard MacDonald
- G01 - MEASURING TESTING
Information Patent Grant
Acquisition system for a long record length digital storage oscillo...
- Patent number 6,807,496
- Issue date Oct 19, 2004
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Waveform display utilizing frequency-based coloring and navigation
- Patent number 6,184,898
- Issue date Feb 6, 2001
- Comparisonics Corporation
- Stephen V. Rice
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal waveform display system
- Patent number 5,933,129
- Issue date Aug 3, 1999
- Leader Electronics Corp.
- Haruhisa Egami
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method of displaying continuously acquired data as multiple traces...
- Patent number 5,684,508
- Issue date Nov 4, 1997
- Fluke Corporation
- Klaas Jan Brilman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for obtaining voltage-isolated measurement cha...
- Patent number 5,594,329
- Issue date Jan 14, 1997
- Fluke Corporation
- Rudolf G. van Ettinger
- G01 - MEASURING TESTING
Information Patent Grant
Display resolution enhancement using data compression and overlappi...
- Patent number 5,434,593
- Issue date Jul 18, 1995
- Gould Instrument Systems, Inc.
- Thomas H. Lecklider
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Vertical amplifier system for multitrace oscilloscope and method fo...
- Patent number 5,272,449
- Issue date Dec 21, 1993
- Kikusui Electronics Corporation
- Masao Izawa
- G01 - MEASURING TESTING
Information Patent Grant
Display tube control system
- Patent number 5,053,684
- Issue date Oct 1, 1991
- PPG Hellige B.V.
- Marinus A. M. Nooyen
- G01 - MEASURING TESTING
Information Patent Grant
System for displaying adaptive inference testing device information
- Patent number 5,020,011
- Issue date May 28, 1991
- Array Analysis, Inc.
- William D. Stark
- G01 - MEASURING TESTING
Information Patent Grant
Probability density histogram display
- Patent number 5,003,248
- Issue date Mar 26, 1991
- Hewlett-Packard Company
- Dana L. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Display circuit of an oscilloscope
- Patent number 4,866,352
- Issue date Sep 12, 1989
- Iwatsu Electric Co., Ltd.
- Fumihiko Motohashi
- G01 - MEASURING TESTING
Information Patent Grant
Touchscreen feedback system
- Patent number 4,821,030
- Issue date Apr 11, 1989
- Tektronix, Inc.
- Brian Batson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Equivalent time waveform data display
- Patent number 4,809,189
- Issue date Feb 28, 1989
- Tektronix, Inc.
- Brian E. Batson
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope trace attribute control system
- Patent number 4,774,438
- Issue date Sep 27, 1988
- Tektronix, Inc.
- Gregory S. Rogers
- G01 - MEASURING TESTING
Information Patent Grant
Signal controlled waveform recorder
- Patent number 4,631,697
- Issue date Dec 23, 1986
- Duffers Scientific, Inc.
- Hugo S. Ferguson
- G01 - MEASURING TESTING
Information Patent Grant
Video synthesizer
- Patent number 4,574,278
- Issue date Mar 4, 1986
- Ragen Data Systems, Inc.
- Steven P. Apelman
- G01 - MEASURING TESTING
Information Patent Grant
Oscillographic device for displaying multiple continuous waveforms
- Patent number 4,567,405
- Issue date Jan 28, 1986
- Tektronix, Inc.
- Lloyd R. Bristol
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING SYSTEM AND METHOD
- Publication number 20220034941
- Publication date Feb 3, 2022
- Rohde& Schwarz GmbH & Co. KG
- Gerd Bresser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERACTIVE INSTRUMENT MEASUREMENT ANALYTICS
- Publication number 20200233016
- Publication date Jul 23, 2020
- Tektronix, Inc.
- Keith D. Rule
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM AND METHOD
- Publication number 20190324061
- Publication date Oct 24, 2019
- Rohde& Schwarz GmbH & Co. KG
- Gerd Bresser
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TEST AND MEASUREMENT DEVICE, MEASUREMENT EXTENSION DEVIC...
- Publication number 20180335453
- Publication date Nov 22, 2018
- ROHDE & SCHWARZ GMBH & CO. KG
- Philip Diegmann
- G01 - MEASURING TESTING
Information Patent Application
Time correlation of signal power to distortion characteristics
- Publication number 20060176967
- Publication date Aug 10, 2006
- Steven W. Stanton
- G01 - MEASURING TESTING
Information Patent Application
Simultaneous presentation of locally acquired and remotely acquired...
- Publication number 20040174818
- Publication date Sep 9, 2004
- Donald A. Zocchi
- G01 - MEASURING TESTING
Information Patent Application
Mixer-based timebase for sampling multiple input signal references...
- Publication number 20040167733
- Publication date Aug 26, 2004
- Willard MacDonald
- G01 - MEASURING TESTING
Information Patent Application
Displaying a number of measurement curves
- Publication number 20040034500
- Publication date Feb 19, 2004
- Michael Goericke
- G01 - MEASURING TESTING
Information Patent Application
Acquisition system for a long record length digital storage oscillo...
- Publication number 20030208330
- Publication date Nov 6, 2003
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
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- Publication number 20030109996
- Publication date Jun 12, 2003
- Lawrence Steven Salant
- G06 - COMPUTING CALCULATING COUNTING

Circuits for simultaneous or sequential presentation of more than one variable

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multiprobe measurement device and method

Electrical test and measurement device, measurement extension devic...

Automatic detection of logical path segments in a measurement popul...

Measuring system and method

Measuring system and method

Measuring system and method

Programmable interface-based validation and debug

System for simplified correlation of instrumentation probes and dat...

Time correlation of signal power to distortion characteristics

Method of operating an oscilloscope

Context sensitive toolbar

Displaying a number of measurement curves

Mixer-based timebase for sampling multiple input signal references...

Acquisition system for a long record length digital storage oscillo...

Waveform display utilizing frequency-based coloring and navigation

Signal waveform display system

Method of displaying continuously acquired data as multiple traces...

Method and apparatus for obtaining voltage-isolated measurement cha...

Display resolution enhancement using data compression and overlappi...

Vertical amplifier system for multitrace oscilloscope and method fo...

Display tube control system

System for displaying adaptive inference testing device information

Probability density histogram display

Display circuit of an oscilloscope

Touchscreen feedback system

Equivalent time waveform data display

Oscilloscope trace attribute control system

Signal controlled waveform recorder

Video synthesizer

Oscillographic device for displaying multiple continuous waveforms

Patents Applicationslast 30 patents

MEASURING SYSTEM AND METHOD

INTERACTIVE INSTRUMENT MEASUREMENT ANALYTICS

MEASURING SYSTEM AND METHOD

ELECTRICAL TEST AND MEASUREMENT DEVICE, MEASUREMENT EXTENSION DEVIC...

Time correlation of signal power to distortion characteristics

Simultaneous presentation of locally acquired and remotely acquired...

Mixer-based timebase for sampling multiple input signal references...

Displaying a number of measurement curves

Acquisition system for a long record length digital storage oscillo...

Context sensitive toolbar