combination of measurements, 2 kinds of secondary emission

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CPC
G01N2223/072

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/072combination of measurements, 2 kinds of secondary emission

Industries

Patents Grantslast 30 patents

Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for determining sample composition from spectral...
- Patent number 11,703,468
- Issue date Jul 18, 2023
- FEI Company
- Oleksii Kaplenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analyzer
- Patent number 11,609,191
- Issue date Mar 21, 2023
- Jeol Ltd.
- Kazunori Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam irradiation apparatus and control method
- Patent number 11,424,100
- Issue date Aug 23, 2022
- Hitachi High-Tech Science Corporation
- Takuma Aso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,327,032
- Issue date May 10, 2022
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for rapid analysis of gold
- Patent number 9,528,951
- Issue date Dec 27, 2016
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
- James Tickner
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for determining the performance of a photolithographic mask
- Patent number 9,431,212
- Issue date Aug 30, 2016
- Carl Zeiss SMS GmbH
- Markus Waiblinger
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer
- Patent number 4,280,049
- Issue date Jul 21, 1981
- U.S. Philips Corporation
- Helmut W. W. Werner
- G01 - MEASURING TESTING
Information Patent Grant
3567928
- Patent number 3,567,928
- Issue date Mar 2, 1971
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD
- Publication number 20210090855
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Takuma ASO
- G01 - MEASURING TESTING
Information Patent Application
Analyzer
- Publication number 20210025838
- Publication date Jan 28, 2021
- JEOL Ltd.
- Kazunori Tsukamoto
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR STRESS TESTING OF MATERIALS
- Publication number 20210010958
- Publication date Jan 14, 2021
- Institut National de la Recherche Scientifique
- Patrizio ANTICI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200363349
- Publication date Nov 19, 2020
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process for Performing Automated Mineralogy
- Publication number 20140183357
- Publication date Jul 3, 2014
- Michael D. Smith
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE PERFORMANCE OF A PHOTOLITHOGRAPHIC MASK
- Publication number 20130126728
- Publication date May 23, 2013
- CARL ZEISS SMS GMBH
- Markus Waiblinger
- G01 - MEASURING TESTING

combination of measurements, 2 kinds of secondary emission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Patterned x-ray emitting target

Method and system for determining sample composition from spectral...

Analyzer

Charged particle beam irradiation apparatus and control method

Method of examining a sample using a charged particle microscope

Method for rapid analysis of gold

Method for determining the performance of a photolithographic mask

X-ray spectrometer

3567928

Patents Applicationslast 30 patents

PATTERNED X-RAY EMITTING TARGET

CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD

Analyzer

METHOD AND SYSTEM FOR STRESS TESTING OF MATERIALS

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

Process for Performing Automated Mineralogy

METHOD FOR DETERMINING THE PERFORMANCE OF A PHOTOLITHOGRAPHIC MASK