combination of measurements, 2 kinds of secondary emission

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CPC
G01N2223/072

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/072combination of measurements, 2 kinds of secondary emission

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method and system for determining sample composition from spectral...
- Patent number 11,703,468
- Issue date Jul 18, 2023
- FEI Company
- Oleksii Kaplenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analyzer
- Patent number 11,609,191
- Issue date Mar 21, 2023
- Jeol Ltd.
- Kazunori Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam irradiation apparatus and control method
- Patent number 11,424,100
- Issue date Aug 23, 2022
- Hitachi High-Tech Science Corporation
- Takuma Aso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,327,032
- Issue date May 10, 2022
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for rapid analysis of gold
- Patent number 9,528,951
- Issue date Dec 27, 2016
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
- James Tickner
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for determining the performance of a photolithographic mask
- Patent number 9,431,212
- Issue date Aug 30, 2016
- Carl Zeiss SMS GmbH
- Markus Waiblinger
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer
- Patent number 4,280,049
- Issue date Jul 21, 1981
- U.S. Philips Corporation
- Helmut W. W. Werner
- G01 - MEASURING TESTING
Information Patent Grant
3567928
- Patent number 3,567,928
- Issue date Mar 2, 1971
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD
- Publication number 20210090855
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Takuma ASO
- G01 - MEASURING TESTING
Information Patent Application
Analyzer
- Publication number 20210025838
- Publication date Jan 28, 2021
- JEOL Ltd.
- Kazunori Tsukamoto
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR STRESS TESTING OF MATERIALS
- Publication number 20210010958
- Publication date Jan 14, 2021
- Institut National de la Recherche Scientifique
- Patrizio ANTICI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200363349
- Publication date Nov 19, 2020
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process for Performing Automated Mineralogy
- Publication number 20140183357
- Publication date Jul 3, 2014
- Michael D. Smith
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE PERFORMANCE OF A PHOTOLITHOGRAPHIC MASK
- Publication number 20130126728
- Publication date May 23, 2013
- CARL ZEISS SMS GMBH
- Markus Waiblinger
- G01 - MEASURING TESTING

combination of measurements, 2 kinds of secondary emission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for determining sample composition from spectral...

Analyzer

Charged particle beam irradiation apparatus and control method

Method of examining a sample using a charged particle microscope

Method for rapid analysis of gold

Method for determining the performance of a photolithographic mask

X-ray spectrometer

3567928

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD

Analyzer

METHOD AND SYSTEM FOR STRESS TESTING OF MATERIALS

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

Process for Performing Automated Mineralogy

METHOD FOR DETERMINING THE PERFORMANCE OF A PHOTOLITHOGRAPHIC MASK