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3567928
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Information
Patent Grant
3567928
References
Source
Patent Number
3,567,928
Date Filed
Not available
Date Issued
Tuesday, March 2, 1971
54 years ago
CPC
G01N23/223 - by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N23/22 - by measuring secondary emission
H01J35/02 - Details
H01J35/04 - Electrodes mutual position thereof and constructional adaptations of the electrodes therefor
G01N2223/072 - combination of measurements, 2 kinds of secondary emission
G01N2223/076 - X-ray fluorescence
G01N2223/084 - photo-electric effect
G01N2223/204 - source created from radiated target
US Classifications
378 - X-ray or gamma ray systems or devices
250 - Radiant energy
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