combination of measurements, at least 1 secondary emission

Industry

CPC
G01N2223/071

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/071combination of measurements, at least 1 secondary emission

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Apparatus to operate a quality control in industrial production lin...
- Patent number 12,181,429
- Issue date Dec 31, 2024
- DE.TEC.TOR S.r.l.
- Giuseppe Pitta'
- G01 - MEASURING TESTING
Information Patent Grant
Method for temperature monitoring in cryo-electron microscopy
- Patent number 12,070,753
- Issue date Aug 27, 2024
- FEI Company
- Jakub Drahotsky
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,921,059
- Issue date Mar 5, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray examination device
- Patent number 11,821,856
- Issue date Nov 21, 2023
- Anton Paar GmbH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Grant
Through-tubing, cased-hole sealed material density evaluation using...
- Patent number 11,815,478
- Issue date Nov 14, 2023
- Halliburton Energy Services, Inc.
- Pablo Vieira Rego
- E21 - EARTH DRILLING MINING
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
Refining defect detection using process window
- Patent number 11,728,192
- Issue date Aug 15, 2023
- GLOBALFOUNDRIES U.S. Inc.
- Chenlong Miao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscopy analysis method
- Patent number 11,686,693
- Issue date Jun 27, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Nicolas Bernier
- G01 - MEASURING TESTING
Information Patent Grant
System and method for calibrating a PET scanner
- Patent number 11,619,755
- Issue date Apr 4, 2023
- Shanghai United Imaging Healthcare Co., Ltd.
- Xinyu Lyu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,579,099
- Issue date Feb 14, 2023
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
System and method using x-rays for depth-resolving metrology and an...
- Patent number 11,549,895
- Issue date Jan 10, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 11,467,103
- Issue date Oct 11, 2022
- APPLIED SCIENCE LABORATORY CO., LTD.
- Hiroyoshi Soejima
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Analyzing apparatus, analyzing method, and program
- Patent number 11,293,885
- Issue date Apr 5, 2022
- Horiba, Ltd.
- Yusuke Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method
- Patent number 11,199,494
- Issue date Dec 14, 2021
- General Electric Company
- Venkata Vijayaraghava Nalladega
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction and X-ray spectroscopy method and related apparatus
- Patent number 11,105,756
- Issue date Aug 31, 2021
- NINGBO GALAXY MATERIALS TECHNOLOGY CO. LTD.
- Xiao-dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
System and methods for computing physical properties of materials u...
- Patent number 10,830,713
- Issue date Nov 10, 2020
- DigiM Solution LLC
- ShuAng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for calibrating a PET scanner
- Patent number 10,663,608
- Issue date May 26, 2020
- Shanghai United Imaging Healthcare Co., Ltd.
- Xinyu Lyu
- G01 - MEASURING TESTING
Information Patent Grant
Multi-function x-ray metrology tool for production inspection/monit...
- Patent number 10,330,612
- Issue date Jun 25, 2019
- Applied Materials, Inc.
- Lin Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for estimation of heat value using dual energy...
- Patent number 10,197,513
- Issue date Feb 5, 2019
- MANTEX IP AB
- Ragnar Kullenberg
- G01 - MEASURING TESTING
Information Patent Grant
Portable apparatus for soil chemical characterization
- Patent number 10,107,770
- Issue date Oct 23, 2018
- Texas Tech University System
- David Weindorf
- G01 - MEASURING TESTING
Information Patent Grant
Image data processing
- Patent number 10,043,274
- Issue date Aug 7, 2018
- FEI Company
- Trond Karsten Varslot
- E21 - EARTH DRILLING MINING
Information Patent Grant
Deterioration analyzing method
- Patent number 9,851,342
- Issue date Dec 26, 2017
- Sumitomo Rubber Industries, Ltd.
- Fusae Kaneko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quantitative X-ray analysis—ratio correction
- Patent number 9,851,313
- Issue date Dec 26, 2017
- PANalytical B.V.
- Waltherus Van Den Hoogenhof
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measurement device and computer program for evaluating patt...
- Patent number 9,804,107
- Issue date Oct 31, 2017
- Hitachi High-Technologies Corporation
- Akiyuki Sugiyama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Air slide analyzer system and method
- Patent number 9,719,948
- Issue date Aug 1, 2017
- XRSciences, LLC
- Colin Charette
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Direct Sampling from Phase-Separated Sample for Hydrophobicity Asse...
- Publication number 20240272101
- Publication date Aug 15, 2024
- DH Technologies Development Pte. Ltd.
- Thomas COVEY
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER
- Publication number 20230243988
- Publication date Aug 3, 2023
- Shanghai United Imaging Healthcare Co., Ltd.
- Xinyu LYU
- G01 - MEASURING TESTING
Information Patent Application
REFINING DEFECT DETECTION USING PROCESS WINDOW
- Publication number 20230024266
- Publication date Jan 26, 2023
- GLOBALFOUNDRIES U.S. Inc.
- Chenlong Miao
- G01 - MEASURING TESTING
Information Patent Application
X-RAY EXAMINATION DEVICE
- Publication number 20220381712
- Publication date Dec 1, 2022
- ANTON PAAR GMBH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Application
THROUGH-TUBING, CASED-HOLE SEALED MATERIAL DENSITY EVALUATION USING...
- Publication number 20220373484
- Publication date Nov 24, 2022
- Halliburton Energy Services, Inc.
- Pablo Vieira Rego
- E21 - EARTH DRILLING MINING
Information Patent Application
PULSED NEUTRON APPARATUS AND METHOD FOR USING SAME TO ANALYZE CORE...
- Publication number 20220349846
- Publication date Nov 3, 2022
- CORE LABORATORIES LP
- Derek Raymond Beckett
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMPROVING AN EBSD/TKD MAP
- Publication number 20220221412
- Publication date Jul 14, 2022
- BRUKER NANO GMBH
- Daniel Radu GORAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20210096065
- Publication date Apr 1, 2021
- GENERAL ELECTRIC COMPANY
- Venkata Vijayaraghava Nalladega
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam System and Overlay Shift Amount Measurement M...
- Publication number 20210055098
- Publication date Feb 25, 2021
- HITACHI HIGH-TECH CORPORATION
- Takuma YAMAKI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPY ANALYSIS METHOD
- Publication number 20210010956
- Publication date Jan 14, 2021
- Commissariat a I'Energie Atomique et aux Energies Alternatives
- Nicolas BERNIER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER
- Publication number 20200284928
- Publication date Sep 10, 2020
- Shanghai United Imaging Healthcare Co., Ltd.
- Xinyu LYU
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING APPARATUS, ANALYZING METHOD, AND PROGRAM
- Publication number 20200209173
- Publication date Jul 2, 2020
- Horiba, Ltd.
- Yusuke MIZUNO
- G01 - MEASURING TESTING
Information Patent Application
IN SITU MICROSCOPY OF ROTATIONALLY DEFORMED SAMPLE
- Publication number 20190317033
- Publication date Oct 17, 2019
- Oxford University Innovation Limited
- Lars HANSEN
- G01 - MEASURING TESTING
Information Patent Application
System and Methods for Computing Physical Properties of Materials U...
- Publication number 20190154597
- Publication date May 23, 2019
- DigiM Solution LLC
- Shuang Zhang
- G01 - MEASURING TESTING
Information Patent Application
Portable Apparatus for Soil Chemical Characterization
- Publication number 20170122889
- Publication date May 4, 2017
- TEXAS TECH UNIVERSITY SYSTEM
- David Weindorf
- G01 - MEASURING TESTING
Information Patent Application
Air Slide Analyzer System and Method
- Publication number 20170023500
- Publication date Jan 26, 2017
- XRSciences LLC
- Colin Charette
- G01 - MEASURING TESTING
Information Patent Application
Pattern Measurement Device and Computer Program
- Publication number 20160313266
- Publication date Oct 27, 2016
- Hitachi High-Technologies Corporation
- Akiyuki SUGIYAMA
- G01 - MEASURING TESTING
Information Patent Application
DETERIORATION ANALYZING METHOD
- Publication number 20140349407
- Publication date Nov 27, 2014
- Fusae Kaneko
- G01 - MEASURING TESTING
Information Patent Application
Microscopy Visualization
- Publication number 20140126801
- Publication date May 8, 2014
- University of Utah Research Foundation
- Steven P. Callahan
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR PERFORMING X-RAY ANALYSIS OF A SAMPLE
- Publication number 20120294418
- Publication date Nov 22, 2012
- THERMO FISHER SCIENTIFIC (ECUBLENS) SARL
- Ravisekhar Yellepeddi
- G01 - MEASURING TESTING
Information Patent Application
Image Data Processing
- Publication number 20110181701
- Publication date Jul 28, 2011
- The Australian National University
- Trond Karsten Varslot
- G06 - COMPUTING CALCULATING COUNTING

combination of measurements, at least 1 secondary emission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus to operate a quality control in industrial production lin...

Method for temperature monitoring in cryo-electron microscopy

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Method for improving an EBSD/TKD map

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

X-ray examination device

Through-tubing, cased-hole sealed material density evaluation using...

Apparatuses and methods for combined simultaneous analyses of mater...

Refining defect detection using process window

Electron microscopy analysis method

System and method for calibrating a PET scanner

X-ray reflectometry apparatus and method thereof for measuring thre...

System and method using x-rays for depth-resolving metrology and an...

X-ray analyzer

Analyzing apparatus, analyzing method, and program

Inspection system and method

X-ray diffraction and X-ray spectroscopy method and related apparatus

System and methods for computing physical properties of materials u...

System and method for calibrating a PET scanner

Multi-function x-ray metrology tool for production inspection/monit...

Method and apparatus for estimation of heat value using dual energy...

Portable apparatus for soil chemical characterization

Image data processing

Deterioration analyzing method

Quantitative X-ray analysis—ratio correction

Pattern measurement device and computer program for evaluating patt...

Air slide analyzer system and method

Patents Applicationslast 30 patents

INSPECTION APPARATUS AND INSPECTION METHOD

Direct Sampling from Phase-Separated Sample for Hydrophobicity Asse...

SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER

REFINING DEFECT DETECTION USING PROCESS WINDOW

X-RAY EXAMINATION DEVICE

THROUGH-TUBING, CASED-HOLE SEALED MATERIAL DENSITY EVALUATION USING...

PULSED NEUTRON APPARATUS AND METHOD FOR USING SAME TO ANALYZE CORE...

METHOD FOR IMPROVING AN EBSD/TKD MAP

INSPECTION SYSTEM AND METHOD

Charged Particle Beam System and Overlay Shift Amount Measurement M...

ELECTRON MICROSCOPY ANALYSIS METHOD

SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER

ANALYZING APPARATUS, ANALYZING METHOD, AND PROGRAM

IN SITU MICROSCOPY OF ROTATIONALLY DEFORMED SAMPLE

System and Methods for Computing Physical Properties of Materials U...

Portable Apparatus for Soil Chemical Characterization

Air Slide Analyzer System and Method

Pattern Measurement Device and Computer Program

DETERIORATION ANALYZING METHOD

Microscopy Visualization

METHOD AND APPARATUS FOR PERFORMING X-RAY ANALYSIS OF A SAMPLE

Image Data Processing