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combining plural defective memory devices to provide a contiguous address range
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Industry
CPC
G11C29/886
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Parent Industries
G
PHYSICS
G11
Information storage
G11C
STATIC STORES
G11C29/00
Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation
Current Industry
G11C29/886
combining plural defective memory devices to provide a contiguous address range
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