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G01R31/31932

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/31932Comparators

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Test time reduction in circuits with redundancy flip-flops
- Patent number 12,265,124
- Issue date Apr 1, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with timing correction circuitry
- Patent number 12,123,911
- Issue date Oct 22, 2024
- NXP USA, INC.
- Shilpa Gupta
- G01 - MEASURING TESTING
Information Patent Grant
Power consumption measurement assembly and method, and chip power c...
- Patent number 12,032,022
- Issue date Jul 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xinwang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for integrated circuit testing
- Patent number 12,007,439
- Issue date Jun 11, 2024
- Winbond Electronics Corp.
- Kuo-Min Liao
- G01 - MEASURING TESTING
Information Patent Grant
Test method for control chip and related device
- Patent number 11,867,758
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device and operating method thereof
- Patent number 11,740,285
- Issue date Aug 29, 2023
- Kioxia Corporation
- Yuusuke Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for testing artificial intelligence chip, devi...
- Patent number 11,714,128
- Issue date Aug 1, 2023
- KUNLUNXIN TECHNOLOGY (BEIJING) COMPANY LIMITED
- Ziyu Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for ground fault detection
- Patent number 11,703,549
- Issue date Jul 18, 2023
- Northrop Grumman Systems Corporation
- Sunny Bagga
- G01 - MEASURING TESTING
Information Patent Grant
Speaker load diagnostics
- Patent number 11,218,823
- Issue date Jan 4, 2022
- Texas Instruments Incorporated
- Aditya Polepeddi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage spike detector and system for detecting voltage spikes in s...
- Patent number 11,150,292
- Issue date Oct 19, 2021
- Anora, LLC
- Pramodchandran Variyam
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test circuits and related methods
- Patent number 11,112,455
- Issue date Sep 7, 2021
- Texas Instruments Incorporated
- Jacco van Oevelen
- G01 - MEASURING TESTING
Information Patent Grant
Detection of performance degradation in integrated circuits
- Patent number 11,105,856
- Issue date Aug 31, 2021
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Grant
Fault detection
- Patent number 10,895,600
- Issue date Jan 19, 2021
- Melexis Technologies SA
- Javier Bilbao De Mendizabal
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, semiconductor system, and control method of s...
- Patent number 10,884,035
- Issue date Jan 5, 2021
- Renesas Electronics Corporation
- Kazuki Fukuoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Protocol analysis and visualization during simulation
- Patent number 10,816,600
- Issue date Oct 27, 2020
- Xilinx, Inc.
- David K. Liddell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic device detection and connection verification
- Patent number 10,782,348
- Issue date Sep 22, 2020
- KEITHLEY INSTRUMENTS, LLC
- Gregory Sobolewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, semiconductor system, and control method of s...
- Patent number 10,481,185
- Issue date Nov 19, 2019
- Renesas Electronics Corporation
- Kazuki Fukuoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for making a semiconductor device including threshold voltag...
- Patent number 10,191,105
- Issue date Jan 29, 2019
- ATOMERA INCORPORATED
- Richard Stephen Roy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Comparison device and method for comparing test pattern files of a...
- Patent number 9,921,269
- Issue date Mar 20, 2018
- King Yuan Electronics Co., Ltd.
- Fu-Tai Chen
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test system and method
- Patent number 9,417,283
- Issue date Aug 16, 2016
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
System and method for scan-testing of idle functional units in oper...
- Patent number 9,310,436
- Issue date Apr 12, 2016
- OmniVision Technologies, Inc.
- Jenny Picalausa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Automated test system with event detection capability
- Patent number 9,244,126
- Issue date Jan 26, 2016
- Teradyne, Inc.
- Ronald A. Sartschev
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor test system and method
- Patent number 9,222,977
- Issue date Dec 29, 2015
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and methods for compressing data received over multiple...
- Patent number 9,183,952
- Issue date Nov 10, 2015
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus
- Patent number 9,157,934
- Issue date Oct 13, 2015
- Advantest Corporation
- Takashi Kato
- G01 - MEASURING TESTING
Information Patent Grant
Measurement circuit and test apparatus
- Patent number 9,151,801
- Issue date Oct 6, 2015
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test system and method
- Patent number 9,121,906
- Issue date Sep 1, 2015
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
IC test circuitry with tri-state buffer, comparator, and scan cell
- Patent number 9,003,249
- Issue date Apr 7, 2015
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for testing electronic circuits
- Patent number 9,003,254
- Issue date Apr 7, 2015
- Ssu-Pin Ma
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor test system and method
- Patent number 8,880,967
- Issue date Nov 4, 2014
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FAULT DETECTION CIRCUIT
- Publication number 20250110176
- Publication date Apr 3, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Weibing Jing
- G01 - MEASURING TESTING
Information Patent Application
TEST TIME REDUCTION IN CIRCUITS WITH REDUNDANCY FLIP-FLOPS
- Publication number 20250102574
- Publication date Mar 27, 2025
- STMicroelectronics International N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Application
MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL...
- Publication number 20240402251
- Publication date Dec 5, 2024
- Intel Corporation
- Aryeh FARBER
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH TIMING CORRECTION CIRCUITRY
- Publication number 20240345163
- Publication date Oct 17, 2024
- NXP USA, Inc.
- Shilpa Gupta
- G01 - MEASURING TESTING
Information Patent Application
TEST LOAD CIRCUIT
- Publication number 20240241189
- Publication date Jul 18, 2024
- QUANTA COMPUTER INC.
- Kuo-Chan HSU
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE
- Publication number 20240230759
- Publication date Jul 11, 2024
- KIOXIA Corporation
- Mikio SHIRAISHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INTEGRATED CIRCUIT TESTING
- Publication number 20240219465
- Publication date Jul 4, 2024
- WINBOND ELECTRONICS CORP.
- Kuo-Min Liao
- G01 - MEASURING TESTING
Information Patent Application
SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20240175922
- Publication date May 30, 2024
- Rohm Co., Ltd.
- Ryosuke SUMII
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE
- Publication number 20240133953
- Publication date Apr 25, 2024
- KIOXIA Corporation
- Mikio SHIRAISHI
- G01 - MEASURING TESTING
Information Patent Application
POWER CONSUMPTION MEASUREMENT ASSEMBLY AND METHOD, AND CHIP POWER C...
- Publication number 20220099741
- Publication date Mar 31, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xinwang CHEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR GROUND FAULT DETECTION
- Publication number 20210341547
- Publication date Nov 4, 2021
- Northrop Grumman Systems Corporation
- SUNNY BAGGA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
BUILT-IN SELF-TEST CIRCUITS AND RELATED METHODS
- Publication number 20200271722
- Publication date Aug 27, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Jacco van Oevelen
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS
- Publication number 20200150181
- Publication date May 14, 2020
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Application
SPEAKER LOAD DIAGNOSTICS
- Publication number 20200112808
- Publication date Apr 9, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Aditya POLEPEDDI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND CONTROL METHOD OF S...
- Publication number 20200041547
- Publication date Feb 6, 2020
- RENESAS ELECTRONICS CORPORATION
- Kazuki FUKUOKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAULT DETECTION
- Publication number 20180284190
- Publication date Oct 4, 2018
- Melexis Technologies SA
- Javier BILBAO DE MENDIZABAL
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND CONTROL METHOD OF S...
- Publication number 20180095115
- Publication date Apr 5, 2018
- RENESAS ELECTRONICS CORPORATION
- Kazuki FUKUOKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MAKING A SEMICONDUCTOR DEVICE INCLUDING THRESHOLD VOLTAG...
- Publication number 20180052205
- Publication date Feb 22, 2018
- ATOMERA INCORPORATED
- Richard Stephen Roy
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR COMPRESSING DATA RECEIVED OVER MULTIPLE...
- Publication number 20140237305
- Publication date Aug 21, 2014
- Micron Technology, Inc.
- James S. Rehmeyer
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR TESTING ELECTRONIC CIRCUITS
- Publication number 20140195870
- Publication date Jul 10, 2014
- Ssu-Pin Ma
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST SYSTEM AND METHOD
- Publication number 20140181609
- Publication date Jun 26, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST SYSTEM AND METHOD
- Publication number 20140068363
- Publication date Mar 6, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20140043051
- Publication date Feb 13, 2014
- TOKYO ELECTRON LIMITED
- Haruo IWATSU
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS
- Publication number 20130335101
- Publication date Dec 19, 2013
- Advantest Corporation
- Takashi KATO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST SYSTEM AND METHOD
- Publication number 20130275825
- Publication date Oct 17, 2013
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20120331346
- Publication date Dec 27, 2012
- Advantest Corporation
- Hiromi OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS
- Publication number 20120323519
- Publication date Dec 20, 2012
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST SYSTEM AND METHOD
- Publication number 20120260140
- Publication date Oct 11, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
High Speed Test Circuit and Method
- Publication number 20120229146
- Publication date Sep 13, 2012
- PieceMakers Technology, Incorporation
- Tah-Kang Ting
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT CIRCUIT AND TEST APPARATUS
- Publication number 20120161800
- Publication date Jun 28, 2012
- Advantest Corporation
- Masahiro ISHIDA
- G01 - MEASURING TESTING

Comparators

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Test time reduction in circuits with redundancy flip-flops

Integrated circuit with timing correction circuitry

Power consumption measurement assembly and method, and chip power c...

Method and apparatus for integrated circuit testing

Test method for control chip and related device

Semiconductor integrated circuit device and operating method thereof

Method and apparatus for testing artificial intelligence chip, devi...

Systems and methods for ground fault detection

Speaker load diagnostics

Voltage spike detector and system for detecting voltage spikes in s...

Built-in self-test circuits and related methods

Detection of performance degradation in integrated circuits

Fault detection

Semiconductor device, semiconductor system, and control method of s...

Protocol analysis and visualization during simulation

Automatic device detection and connection verification

Semiconductor device, semiconductor system, and control method of s...

Method for making a semiconductor device including threshold voltag...

Comparison device and method for comparing test pattern files of a...

Semiconductor test system and method

System and method for scan-testing of idle functional units in oper...

Automated test system with event detection capability

Semiconductor test system and method

Apparatuses and methods for compressing data received over multiple...

Test apparatus

Measurement circuit and test apparatus

Semiconductor test system and method

IC test circuitry with tri-state buffer, comparator, and scan cell

Methods and systems for testing electronic circuits

Semiconductor test system and method

Patents Applicationslast 30 patents

FAULT DETECTION CIRCUIT

TEST TIME REDUCTION IN CIRCUITS WITH REDUNDANCY FLIP-FLOPS

MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL...

INTEGRATED CIRCUIT WITH TIMING CORRECTION CIRCUITRY

TEST LOAD CIRCUIT

DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE

METHOD AND APPARATUS FOR INTEGRATED CIRCUIT TESTING

SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE

DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE

POWER CONSUMPTION MEASUREMENT ASSEMBLY AND METHOD, AND CHIP POWER C...

SYSTEMS AND METHODS FOR GROUND FAULT DETECTION

BUILT-IN SELF-TEST CIRCUITS AND RELATED METHODS

DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS

SPEAKER LOAD DIAGNOSTICS

SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND CONTROL METHOD OF S...

FAULT DETECTION

SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND CONTROL METHOD OF S...

METHOD FOR MAKING A SEMICONDUCTOR DEVICE INCLUDING THRESHOLD VOLTAG...

APPARATUSES AND METHODS FOR COMPRESSING DATA RECEIVED OVER MULTIPLE...

METHODS AND SYSTEMS FOR TESTING ELECTRONIC CIRCUITS

SEMICONDUCTOR TEST SYSTEM AND METHOD

SEMICONDUCTOR TEST SYSTEM AND METHOD

INSPECTION APPARATUS, INSPECTION SYSTEM AND INSPECTION METHOD

TEST APPARATUS

SEMICONDUCTOR TEST SYSTEM AND METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS

SEMICONDUCTOR TEST SYSTEM AND METHOD

High Speed Test Circuit and Method

MEASUREMENT CIRCUIT AND TEST APPARATUS