Comparison aspects

Industry

CPC
G01R31/31703

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31703Comparison aspects

Industries

Patents Grantslast 30 patents

Information Patent Grant
Classifying comparators based on comparator offsets
- Patent number 12,134,713
- Issue date Nov 5, 2024
- Microchip Technology Incorporated
- Zhi-Yuan Zou
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 12,130,328
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Comparison circuit and memory chip
- Patent number 12,119,067
- Issue date Oct 15, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Lei Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Machine learning for syncing multiple FPGA ports in a quantum system
- Patent number 12,111,352
- Issue date Oct 8, 2024
- Quantum Machines
- Avishai Ziv
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus to identify faults in processors
- Patent number 12,085,610
- Issue date Sep 10, 2024
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic scan obfuscation for integrated circuit protections
- Patent number 12,072,379
- Issue date Aug 27, 2024
- Duke University
- Krishnendu Chakrabarty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device interface board compliance testing using impedance response...
- Patent number 12,061,231
- Issue date Aug 13, 2024
- Celerint, LLC
- Howard H. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Chip and chip test method
- Patent number 12,019,117
- Issue date Jun 25, 2024
- Shanghai Biren Technology Co., Ltd
- Kai Lei
- G01 - MEASURING TESTING
Information Patent Grant
Processing system, related integrated circuit, device and method
- Patent number 12,019,118
- Issue date Jun 25, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Roberto Colombo
- G01 - MEASURING TESTING
Information Patent Grant
System, apparatus and method for identifying functionality of integ...
- Patent number 11,982,710
- Issue date May 14, 2024
- Silicon Laboratories Inc.
- Eugenio Carey
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for detecting glitch at high sampling rate
- Patent number 11,965,929
- Issue date Apr 23, 2024
- UESTC (Shenzhen) Advanced Research Institute
- Zhijian Dai
- G01 - MEASURING TESTING
Information Patent Grant
Mask fingerprint using mask sensitive circuit
- Patent number 11,934,094
- Issue date Mar 19, 2024
- International Business Machines Corporation
- Effendi Leobandung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test method and apparatus of communication chip, device and medium
- Patent number 11,927,631
- Issue date Mar 12, 2024
- MORNINGCORE TECHNOLOGY CO., CHINA
- Shanzhi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan architecture for interconnect testing in 3D integrated circuits
- Patent number 11,899,064
- Issue date Feb 13, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Grant
Offset detector circuit for differential signal generator, receiver...
- Patent number 11,888,654
- Issue date Jan 30, 2024
- Samsung Electronics Co., Ltd.
- Jueon Kim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Scan chain self-testing of lockstep cores on reset
- Patent number 11,852,683
- Issue date Dec 26, 2023
- Texas Instruments Incorporated
- Prakash Narayanan
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with reference sub-system for testing and replac...
- Patent number 11,852,676
- Issue date Dec 26, 2023
- STMicroelectronics S.r.l.
- Carlo Caimi
- G01 - MEASURING TESTING
Information Patent Grant
Memory device detecting defect by measuring line resistance of word...
- Patent number 11,835,579
- Issue date Dec 5, 2023
- Samsung Electronics Co., Ltd.
- Hwangju Song
- G11 - INFORMATION STORAGE
Information Patent Grant
Electrical circuit for testing primary internal signals of an ASIC
- Patent number 11,808,809
- Issue date Nov 7, 2023
- Robert Bosch GmbH
- Carsten Hermann
- G01 - MEASURING TESTING
Information Patent Grant
Fault tolerant synchronizer
- Patent number 11,796,592
- Issue date Oct 24, 2023
- Texas Instruments Incorporated
- Denis Roland Beaudoin
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device and operating method thereof
- Patent number 11,740,285
- Issue date Aug 29, 2023
- Kioxia Corporation
- Yuusuke Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for testing artificial intelligence chip, devi...
- Patent number 11,714,128
- Issue date Aug 1, 2023
- KUNLUNXIN TECHNOLOGY (BEIJING) COMPANY LIMITED
- Ziyu Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error rate measuring apparatus and error distribution display method
- Patent number 11,714,130
- Issue date Aug 1, 2023
- Anritsu Corporation
- Hiroyuki Onuma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interfaces for wireless debugging
- Patent number 11,709,202
- Issue date Jul 25, 2023
- Intel Corporation
- Sankaran M. Menon
- G01 - MEASURING TESTING
Information Patent Grant
Input device, control apparatus and method for operation of an inpu...
- Patent number 11,703,847
- Issue date Jul 18, 2023
- FESTO SE & CO. KG
- Roland Kälberer
- G01 - MEASURING TESTING
Information Patent Grant
Interconnect retimer enhancements
- Patent number 11,675,003
- Issue date Jun 13, 2023
- Intel Corporation
- Daniel S. Froelich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 11,630,151
- Issue date Apr 18, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Controller structural testing with automated test vectors
- Patent number 11,598,808
- Issue date Mar 7, 2023
- Micron Technology, Inc.
- Michael Richard Spica
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan channel slicing for compression-mode testing of scan chains
- Patent number 11,592,482
- Issue date Feb 28, 2023
- Cadence Design Systems, Inc.
- Sameer Chakravarthy Chillarige
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain self-testing of lockstep cores on reset
- Patent number 11,555,853
- Issue date Jan 17, 2023
- Texas Instruments Incorporated
- Prakash Narayanan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS TO IDENTIFY FAULTS IN PROCESSORS
- Publication number 20240345160
- Publication date Oct 17, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan Varadarajan
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT SORT
- Publication number 20240302431
- Publication date Sep 12, 2024
- INFINEON TECHNOLOGIES AG
- David Addison
- G01 - MEASURING TESTING
Information Patent Application
CONTROL CIRCUITRY OF A MICROCONTROLLER OF A PHOTOVOLTAIC SYSTEM WIT...
- Publication number 20240213378
- Publication date Jun 27, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Mark VERVAART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-TO-DIGTIAL CONVERTER CIRCUIT WITH SELF-TESTING FUNCTION
- Publication number 20240201255
- Publication date Jun 20, 2024
- STMicroelectronics International N.V.
- John Kevin Moore
- G04 - HOROLOGY
Information Patent Application
Selecting an Output as a System Output Responsive to an Indication...
- Publication number 20240142518
- Publication date May 2, 2024
- SiFive, Inc.
- Cameron Mcnairy
- G01 - MEASURING TESTING
Information Patent Application
SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS
- Publication number 20240133951
- Publication date Apr 25, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Sandeep Kumar GOEL
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC COMPONENT COMPARISON APPARATUS, SYSTEM, AND RELATED METHODS
- Publication number 20240125869
- Publication date Apr 18, 2024
- COILCRAFT, INCORPORATED
- Leonard Crane
- G01 - MEASURING TESTING
Information Patent Application
FAULT TOLERANT SYNCHRONIZER
- Publication number 20230400512
- Publication date Dec 14, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Denis Roland BEAUDOIN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD, SYSTEM, AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR VER...
- Publication number 20230384370
- Publication date Nov 30, 2023
- Fulian Precision Electronics (Tianjin) Co., LTD.
- SHUN-FU TUNG
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTING SYSTEM OF AUTOMOTIVE APPARATUS
- Publication number 20230375606
- Publication date Nov 23, 2023
- Samsung Electronics Co., Ltd.
- Hyun Seok NAM
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PROCESSING SYSTEM, RELATED INTEGRATED CIRCUIT, DEVICE AND METHOD
- Publication number 20230349969
- Publication date Nov 2, 2023
- STMicroelectronics International N.V.
- Roberto Colombo
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS TO IDENTIFY FAULTS IN PROCESSORS
- Publication number 20230324456
- Publication date Oct 12, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan Varadarajan
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC SCAN OBFUSCATION FOR INTEGRATED CIRCUIT PROTECTIONS
- Publication number 20230288477
- Publication date Sep 14, 2023
- DUKE UNIVERSITY
- Krishnendu CHAKRABARTY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OSCILLATION HANDLING METHOD, APPARATUS USING THE SAME, AND STORAGE...
- Publication number 20230280397
- Publication date Sep 7, 2023
- SHENZHEN HUAPTEC CO., LTD.
- Chuanzhen OU
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH RESILIENT SYSTEM
- Publication number 20230258709
- Publication date Aug 17, 2023
- STMicroelectronics S.r.l.
- Carlo CAIMI
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20230251309
- Publication date Aug 10, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
Machine Learning for Syncing Multiple FPGA Ports in a Quantum System
- Publication number 20230236244
- Publication date Jul 27, 2023
- Quantum Machines
- Avishai Zvi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM ON CHIP INCLUDING A PVT SENSOR AND CORRESPONDING PVT SENSING...
- Publication number 20230213578
- Publication date Jul 6, 2023
- STMicroelectronics S.r.l
- Riccardo CONDORELLI
- G01 - MEASURING TESTING
Information Patent Application
CHIP AND CHIP TEST METHOD
- Publication number 20230176118
- Publication date Jun 8, 2023
- Shanghai Biren Technology Co.,Ltd
- Kai LEI
- G01 - MEASURING TESTING
Information Patent Application
OFFSET DETECTOR CIRCUIT FOR DIFFERENTIAL SIGNAL GENERATOR, RECEIVER...
- Publication number 20230171132
- Publication date Jun 1, 2023
- Samsung Electronics Co., Ltd.
- Jueon Kim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SCAN CHAIN SELF-TESTING OF LOCKSTEP CORES ON RESET
- Publication number 20230152373
- Publication date May 18, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Prakash NARAYANAN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC CIRCUIT PERFORMING ANALOG BUILT-IN SELF TEST AND OPERATI...
- Publication number 20230137979
- Publication date May 4, 2023
- Samsung Electronics Co., Ltd.
- HYUNSEOK NAM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, APPARATUS AND METHOD FOR IDENTIFYING FUNCTIONALITY OF INTEG...
- Publication number 20230133848
- Publication date May 4, 2023
- Silicon Laboratories Inc.
- Eugenio Carey
- G01 - MEASURING TESTING
Information Patent Application
SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS
- Publication number 20230113905
- Publication date Apr 13, 2023
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Sandeep Kumar GOEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETECTING GLITCH AT HIGH SAMPLING RATE
- Publication number 20230061075
- Publication date Mar 2, 2023
- UESTC (Shenzhen) Advanced Research Institute
- Zhijian DAI
- G01 - MEASURING TESTING
Information Patent Application
TROJAN DETECTION VIA DISTORTIONS, NITROGEN-VACANCY DIAMOND (NVD) SE...
- Publication number 20230019995
- Publication date Jan 19, 2023
- SRI International
- Michael Locasto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPARISON CIRCUIT AND MEMORY CHIP
- Publication number 20220383959
- Publication date Dec 1, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Lei ZHU
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR TESTING A CIRCUIT SYSTEM AND A CIRCUIT SYSTEM THEREOF
- Publication number 20220349940
- Publication date Nov 3, 2022
- REALTEK SEMICONDUCTOR CORPORATION
- Yen-Ju LU
- G01 - MEASURING TESTING
Information Patent Application
MASK FINGERPRINT USING MASK SENSITIVE CIRCUIT
- Publication number 20220308441
- Publication date Sep 29, 2022
- International Business Machines Corporation
- Effendi Leobandung
- G01 - MEASURING TESTING
Information Patent Application
ERROR RATE MEASURING APPARATUS AND ERROR DISTRIBUTION DISPLAY METHOD
- Publication number 20220283223
- Publication date Sep 8, 2022
- Anritsu Corporation
- Hiroyuki ONUMA
- G06 - COMPUTING CALCULATING COUNTING

Comparison aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Classifying comparators based on comparator offsets

Interface to full and reduced pin JTAG devices

Comparison circuit and memory chip

Machine learning for syncing multiple FPGA ports in a quantum system

Methods and apparatus to identify faults in processors

Dynamic scan obfuscation for integrated circuit protections

Device interface board compliance testing using impedance response...

Chip and chip test method

Processing system, related integrated circuit, device and method

System, apparatus and method for identifying functionality of integ...

Method and system for detecting glitch at high sampling rate

Mask fingerprint using mask sensitive circuit

Test method and apparatus of communication chip, device and medium

Scan architecture for interconnect testing in 3D integrated circuits

Offset detector circuit for differential signal generator, receiver...

Scan chain self-testing of lockstep cores on reset

Integrated circuit with reference sub-system for testing and replac...

Memory device detecting defect by measuring line resistance of word...

Electrical circuit for testing primary internal signals of an ASIC

Fault tolerant synchronizer

Semiconductor integrated circuit device and operating method thereof

Method and apparatus for testing artificial intelligence chip, devi...

Error rate measuring apparatus and error distribution display method

Interfaces for wireless debugging

Input device, control apparatus and method for operation of an inpu...

Interconnect retimer enhancements

Interface to full and reduced pin JTAG devices

Controller structural testing with automated test vectors

Scan channel slicing for compression-mode testing of scan chains

Scan chain self-testing of lockstep cores on reset

Patents Applicationslast 30 patents

METHODS AND APPARATUS TO IDENTIFY FAULTS IN PROCESSORS

HIGH THROUGHPUT SORT

CONTROL CIRCUITRY OF A MICROCONTROLLER OF A PHOTOVOLTAIC SYSTEM WIT...

TIME-TO-DIGTIAL CONVERTER CIRCUIT WITH SELF-TESTING FUNCTION

Selecting an Output as a System Output Responsive to an Indication...

SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS

ELECTRIC COMPONENT COMPARISON APPARATUS, SYSTEM, AND RELATED METHODS

FAULT TOLERANT SYNCHRONIZER

METHOD, SYSTEM, AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR VER...

DEFECT DETECTING SYSTEM OF AUTOMOTIVE APPARATUS

PROCESSING SYSTEM, RELATED INTEGRATED CIRCUIT, DEVICE AND METHOD

METHODS AND APPARATUS TO IDENTIFY FAULTS IN PROCESSORS

DYNAMIC SCAN OBFUSCATION FOR INTEGRATED CIRCUIT PROTECTIONS

OSCILLATION HANDLING METHOD, APPARATUS USING THE SAME, AND STORAGE...

INTEGRATED CIRCUIT WITH RESILIENT SYSTEM

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

Machine Learning for Syncing Multiple FPGA Ports in a Quantum System

SYSTEM ON CHIP INCLUDING A PVT SENSOR AND CORRESPONDING PVT SENSING...

CHIP AND CHIP TEST METHOD

OFFSET DETECTOR CIRCUIT FOR DIFFERENTIAL SIGNAL GENERATOR, RECEIVER...

SCAN CHAIN SELF-TESTING OF LOCKSTEP CORES ON RESET

ELECTRONIC CIRCUIT PERFORMING ANALOG BUILT-IN SELF TEST AND OPERATI...

SYSTEM, APPARATUS AND METHOD FOR IDENTIFYING FUNCTIONALITY OF INTEG...

SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS

METHOD AND SYSTEM FOR DETECTING GLITCH AT HIGH SAMPLING RATE

TROJAN DETECTION VIA DISTORTIONS, NITROGEN-VACANCY DIAMOND (NVD) SE...

COMPARISON CIRCUIT AND MEMORY CHIP

METHOD FOR TESTING A CIRCUIT SYSTEM AND A CIRCUIT SYSTEM THEREOF

MASK FINGERPRINT USING MASK SENSITIVE CIRCUIT

ERROR RATE MEASURING APPARATUS AND ERROR DISTRIBUTION DISPLAY METHOD