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G01R29/0871
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R29/00
Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
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G01R29/0871
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Patents Grants
last 30 patents
Information
Patent Grant
System for measuring the transfer function on a path from a feed an...
Patent number
12,181,505
Issue date
Dec 31, 2024
dSPACE GmbH
Fabian Happ
G01 - MEASURING TESTING
Information
Patent Grant
Electronic devices and methods for addressing external electromagne...
Patent number
12,174,233
Issue date
Dec 24, 2024
Boston Scientific Scimed, Inc.
Russell P. Dresher
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and apparatus for noninvasive determination of utilization
Patent number
12,169,214
Issue date
Dec 17, 2024
Elemental Machines, Inc.
Alex Nichols
G01 - MEASURING TESTING
Information
Patent Grant
Over-the-air product verification test using antenna and reflector...
Patent number
12,130,380
Issue date
Oct 29, 2024
Jabil Inc.
Lin Lin
G01 - MEASURING TESTING
Information
Patent Grant
Over the air calibration of an advanced antenna system
Patent number
12,130,317
Issue date
Oct 29, 2024
Telefonaktiebolaget LM Ericsson (publ)
Henrik Jidhage
G01 - MEASURING TESTING
Information
Patent Grant
Method and measurement environment, apparatus to be tested
Patent number
12,092,674
Issue date
Sep 17, 2024
Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
Thomas Haustein
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Evaluation device of radio communication module
Patent number
12,092,675
Issue date
Sep 17, 2024
Fujikura Ltd.
Yuki Suto
G01 - MEASURING TESTING
Information
Patent Grant
Systems, apparatuses, and methods for automated robotic tuning
Patent number
12,085,596
Issue date
Sep 10, 2024
CAES SYSTEMS LLC
James Scott Sacks
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Electromagnetic wave spatial analysis method based on multi-level m...
Patent number
12,055,573
Issue date
Aug 6, 2024
Huazhong University of Science & Technology
Tianxu Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Radome measuring system and method
Patent number
12,050,240
Issue date
Jul 30, 2024
Perisens GmbH
Florian Pfeiffer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wireless power transmission device and power transmission system to...
Patent number
12,025,644
Issue date
Jul 2, 2024
Mitsubishi Electric Corporation
Yukihiro Homma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Related interference wave presentation device and method
Patent number
11,988,699
Issue date
May 21, 2024
Toyo Corporation
Kentaro Suetsugu
G01 - MEASURING TESTING
Information
Patent Grant
Over-the-air testing of millimeter wave antenna receiver arrays
Patent number
11,982,699
Issue date
May 14, 2024
National Instruments Corporation
Martin Obermaier
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for testing the function of an antenna system for...
Patent number
11,970,069
Issue date
Apr 30, 2024
Vitesco Technologies GmbH
Christoph Haggenmiller
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Power amplifiers testing system and related testing method
Patent number
11,906,598
Issue date
Feb 20, 2024
Taiwan Semiconductor Manufacturing Company Ltd.
Hsieh-Hung Hsieh
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Multi-axis test equipment
Patent number
11,892,492
Issue date
Feb 6, 2024
Milliwave Silicon Solutions, Inc.
JeanMarc Laurent
G01 - MEASURING TESTING
Information
Patent Grant
Frequency debugging board, frequency debugging system, and method f...
Patent number
11,892,486
Issue date
Feb 6, 2024
BOE Technology Group Co., Ltd.
Xiangxiang Zou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Read-out circuit for a capacitive sensor
Patent number
11,892,327
Issue date
Feb 6, 2024
Seoul National University R&DB Foundation
Minsung Kim
G01 - MEASURING TESTING
Information
Patent Grant
Simple coaxial load pull tuner
Patent number
11,879,921
Issue date
Jan 23, 2024
Christos Tsironis
G01 - MEASURING TESTING
Information
Patent Grant
Phase compensation method and apparatus for measuring array antenna
Patent number
11,876,302
Issue date
Jan 16, 2024
Kuang-Chi Institute of Advanced Technology
RuoPeng Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for electronic device fault diagnoses
Patent number
11,791,910
Issue date
Oct 17, 2023
Lenovo (Singapore) Pte. Ltd.
Philip J. Jakes
G08 - SIGNALLING
Information
Patent Grant
Systems, apparatuses, and methods for automated robotic tuning
Patent number
11,774,480
Issue date
Oct 3, 2023
CAES SYSTEMS LLC
James Scott Sacks
G01 - MEASURING TESTING
Information
Patent Grant
Method for identifying external device by registering features of E...
Patent number
11,768,233
Issue date
Sep 26, 2023
Samsung Electronics Co., Ltd.
Yuwon Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems, apparatuses, and methods for automated robotic tuning
Patent number
11,761,999
Issue date
Sep 19, 2023
CAES SYSTEMS LLC
James Scott Sacks
G01 - MEASURING TESTING
Information
Patent Grant
Storage medium, EMI calculation method, and EMI calculation apparatus
Patent number
11,719,733
Issue date
Aug 8, 2023
Fujitsu Limited
Shohei Yamane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems, apparatuses, and methods for automated robotic tuning
Patent number
11,719,734
Issue date
Aug 8, 2023
CAES SYSTEMS LLC
James Scott Sacks
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Compact antenna test range system and method for calibrating a comp...
Patent number
11,709,191
Issue date
Jul 25, 2023
Rohde & Schwarz GmbH & Co. KG
Corbett Rowell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for measuring environmental electromagnetic field
Patent number
11,693,037
Issue date
Jul 4, 2023
National Taiwan University of Science and Technology
Che-Peng Chao
G01 - MEASURING TESTING
Information
Patent Grant
Electric potential and electric field mapping system
Patent number
11,680,973
Issue date
Jun 20, 2023
Jack Braun
G01 - MEASURING TESTING
Information
Patent Grant
System and method of measuring the frequency of a radio frequency s...
Patent number
11,656,259
Issue date
May 23, 2023
North University of China
Jun Liu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTROMAGNETIC PROPAGATION INTERFERENCE MONITORING APPARATUS
Publication number
20240426885
Publication date
Dec 26, 2024
The United States of America, as represented by the Secretary of the Navy
Timothy P. Ringwald
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MEASUREMENT OF RADIO FREQUENCY SIGNAL PATTERN...
Publication number
20240410924
Publication date
Dec 12, 2024
FANG-YAO KUO
G01 - MEASURING TESTING
Information
Patent Application
MODULAR ANTENNA ARRAY
Publication number
20240377443
Publication date
Nov 14, 2024
Sykno GmbH
Benedict SCHEINER
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLEXED READOUT OF QUANTUM DEVICES
Publication number
20240377444
Publication date
Nov 14, 2024
FERMI RESEARCH ALLIANCE, LLC
Mohamed Hamed Awida HASSAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Apparatus and a method for testing radio-frequency tags
Publication number
20240369607
Publication date
Nov 7, 2024
Voyantic Oy
Jesse Tuominen
G01 - MEASURING TESTING
Information
Patent Application
Combining Signals Received from Multiple Probe Antennas in Over-the...
Publication number
20240369608
Publication date
Nov 7, 2024
National Instruments Corporation
Thomas Deckert
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR MEASURING THE TRANSFER FUNCTION ON A PATH FROM A FEED AN...
Publication number
20240337679
Publication date
Oct 10, 2024
dSPACE GmbH
Fabian Happ
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DETERMINING A SETTING FOR PERFORMING A SPURIOUS EMISSION...
Publication number
20240329109
Publication date
Oct 3, 2024
ROHDE &SCHWARZ GMBH & CO. KG
Benjamin HAEHLKE
G01 - MEASURING TESTING
Information
Patent Application
UWB ANTENNA AND BLE ANTENNA PERFORMANCE TEST SYSTEM
Publication number
20240248126
Publication date
Jul 25, 2024
AMOSENSE CO., LTD.
Jungryul KIM
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD FOR TESTING AN OBJECT
Publication number
20240241165
Publication date
Jul 18, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Corbett Rowell
G01 - MEASURING TESTING
Information
Patent Application
EMULATOR SYSTEM AND EMULATING METHOD FOR SATELLITE COMMUNICATION
Publication number
20240210456
Publication date
Jun 27, 2024
TMY Technology Inc.
Su-Wei Chang
G01 - MEASURING TESTING
Information
Patent Application
OVER-THE-AIR TEST SYSTEM AND OVER-THE-AIR TEST METHOD
Publication number
20240210460
Publication date
Jun 27, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Benoit Derat
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT ARRANGEMENT, MEASUREMENT SETUP, MEASUREMENT SYSTEM AND...
Publication number
20240201241
Publication date
Jun 20, 2024
Advantest Corporation
José MOREIRA
G01 - MEASURING TESTING
Information
Patent Application
Testing system and method for testing devices under test
Publication number
20240192258
Publication date
Jun 13, 2024
Rohde& Schwarz GmbH & Co. KG
Samuel Reiter
G01 - MEASURING TESTING
Information
Patent Application
SATELLITE FEED ANTENNA TESTING
Publication number
20240168072
Publication date
May 23, 2024
The Boeing Company
Amanuel Haile
G01 - MEASURING TESTING
Information
Patent Application
MULTI-AXIS TEST EQUIPMENT
Publication number
20240159810
Publication date
May 16, 2024
MILLIWAVE SILICON SOLUTIONS, INC.
JeanMarc Laurent
G01 - MEASURING TESTING
Information
Patent Application
POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD
Publication number
20240142544
Publication date
May 2, 2024
Taiwan Semiconductor Manufacturing company Ltd.
HSIEH-HUNG HSIEH
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ELECTROMAGNETIC WAVE DETECTION APPARATUS AND ELECTROMAGNETIC WAVE D...
Publication number
20240133935
Publication date
Apr 25, 2024
Kyocera Corporation
Hiroki OKADA
G01 - MEASURING TESTING
Information
Patent Application
WIDEBAND VARIABLE IMPEDANCE LOAD FOR HIGH VOLUME MANUFACTURING QUAL...
Publication number
20240094273
Publication date
Mar 21, 2024
Applied Materials, Inc.
Yue GUO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEST SYSTEM AND APPARATUS FOR OVER-THE-AIR TESTING OF DEVICES AND A...
Publication number
20240077525
Publication date
Mar 7, 2024
UL, LLC
Maan Ghanma
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR EVALUATING RADIO PERFORMANCE
Publication number
20240056201
Publication date
Feb 15, 2024
MEDIATEK INC.
Shih-Wei HSIEH
G01 - MEASURING TESTING
Information
Patent Application
SMART 3D ENERGY PROBES FOR STOCHASTIC FIELDS
Publication number
20240027506
Publication date
Jan 25, 2024
EV-TECHNOLOGIES
Sidina WANE
G01 - MEASURING TESTING
Information
Patent Application
CORRELATION-BASED ENTROPY EXTRACTION SOLUTION FOR MIMO SYSTEMS
Publication number
20240012040
Publication date
Jan 11, 2024
EV-TECHNOLOGIES
Sidina WANE
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR TESTING PHASED ARRAY ANTENNA WITH INDEPENDENT...
Publication number
20230417811
Publication date
Dec 28, 2023
TRON FUTURE TECH INC.
LI HAN CHANG
G01 - MEASURING TESTING
Information
Patent Application
ULTRAFAST DETECTOR OF RYDBERG ATOMS
Publication number
20230400492
Publication date
Dec 14, 2023
President and Fellows of Harvard College
Wenchao Xu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
POWER DETECTION IN RADIO FREQUENCY SYSTEMS
Publication number
20230400491
Publication date
Dec 14, 2023
Skyworks Solutions, Inc.
Florinel G. Balteanu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
ANTENNA TEST SYSTEM
Publication number
20230366918
Publication date
Nov 16, 2023
Agera Precison Co.
Meng-Hua TSAI
G01 - MEASURING TESTING
Information
Patent Application
HIGH-FREQUENCY ANTENNA MEASUREMENT SYSTEM
Publication number
20230358796
Publication date
Nov 9, 2023
Nippon Telegraph and Telephone Corporation
Go Itami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR MODELING DEVICE UNDER TEST HAVING MULTIPLE AN...
Publication number
20230324445
Publication date
Oct 12, 2023
KEYSIGHT TECHNOLOGIES, INC.
Huaizhi Yang
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR TESTING ANTENNAS, APPARATUS FOR TESTING ANTENNAS, AND ST...
Publication number
20230299859
Publication date
Sep 21, 2023
Spreadtrum Communications (Shanghai) CO., Ltd.
Yongsheng ZHANG
H04 - ELECTRIC COMMUNICATION TECHNIQUE