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Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
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G01R29/00
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
Current Industry
G01R29/00
Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
Sub Industries
G01R29/02
Measuring characteristics of individual pulses
G01R29/023
Measuring pulse width
G01R29/027
Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
G01R29/0273
the pulse characteristic being duration
G01R29/0276
the pulse characteristic being rise time
G01R29/033
giving an indication of the number of times this occurs
G01R29/04
Measuring form factor
G01R29/06
Measuring depth of modulation
G01R29/08
Measuring electromagnetic field characteristics
G01R29/0807
characterised by the application
G01R29/0814
Field measurements related to measuring influence on or from apparatus, components or humans
G01R29/0821
rooms and test sites therefor
G01R29/0828
TEM-cells
G01R29/0835
Testing shielding
G01R29/0842
Measurements related to lightning
G01R29/085
for detecting presence or location of electric lines or cables
G01R29/0857
Dosimetry
G01R29/0864
characterised by constructional or functional features
G01R29/0871
Complete apparatus or systems; circuits
G01R29/0878
Sensors; antennas; probes; detectors
G01R29/0885
using optical probes
G01R29/0892
Details related to signal analysis or treatment; presenting results
G01R29/10
Radiation diagrams of aerials; Antenna testing in general
G01R29/105
using anechoic chambers; Chambers or open field sites used therefor
G01R29/12
Measuring electrostatic fields or voltage-potential
G01R29/14
Measuring field distribution
G01R29/16
Measuring asymmetry of polyphase networks
G01R29/18
Indicating phase sequence Indicating synchronism
G01R29/20
Measuring number of turns Measuring transformation ratio or coupling factor of windings
G01R29/22
Measuring piezo-electric properties
G01R29/24
Arrangements for measuring quantities of charge
G01R29/26
Measuring noise figure Measuring signal-to-noise ratio Measuring jitter
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Patents Grants
last 30 patents
Information
Patent Grant
Near-field testing apparatus for testing antenna array and related...
Patent number
12,188,970
Issue date
Jan 7, 2025
TRON FUTURE TECH INC.
Yu-Jiu Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Providing positional awareness information and increasing power qua...
Patent number
12,191,657
Issue date
Jan 7, 2025
Solaredge Technologies Ltd.
Omer Aloni
G01 - MEASURING TESTING
Information
Patent Grant
Photonic Rydberg atom radio frequency receiver and measuring a radi...
Patent number
12,188,969
Issue date
Jan 7, 2025
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Vladimir Anatolyevich Aksyuk
G01 - MEASURING TESTING
Information
Patent Grant
Rydberg atom-based vector and polarization sensor
Patent number
12,188,971
Issue date
Jan 7, 2025
The Mitre Corporation
Bonnie Lee Marlow
G01 - MEASURING TESTING
Information
Patent Grant
Clock duty cycle measurement
Patent number
12,184,286
Issue date
Dec 31, 2024
Cadence Design Systems, Inc.
Prakash Kumar Lenka
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Using vapor cell sensors to perform over-the-air testing of cellula...
Patent number
12,181,507
Issue date
Dec 31, 2024
WaveRyde Instruments Inc.
Reza Majidi-Ahy
G01 - MEASURING TESTING
Information
Patent Grant
Systems, methods, and devices for unmanned vehicle detection
Patent number
12,184,963
Issue date
Dec 31, 2024
DIGITAL GLOBAL SYSTEMS, INC.
David William Kleinbeck
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radio frequency signals detection systems
Patent number
12,183,968
Issue date
Dec 31, 2024
The United States of America, as represented by the Secretary of the Navy
Zachary A Sechrist
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for measuring the transfer function on a path from a feed an...
Patent number
12,181,505
Issue date
Dec 31, 2024
dSPACE GmbH
Fabian Happ
G01 - MEASURING TESTING
Information
Patent Grant
Using vapor cell sensors to perform over-the-air testing of cellula...
Patent number
12,181,506
Issue date
Dec 31, 2024
WaveRyde Instruments Inc.
Reza Majidi-Ahy
G01 - MEASURING TESTING
Information
Patent Grant
Terminal device and RF power supply device
Patent number
12,175,569
Issue date
Dec 24, 2024
Hitachi Kokusai Electric Inc.
Naoto Takahashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus, method, system and medium for measuring pulse signal width
Patent number
12,174,232
Issue date
Dec 24, 2024
Lemon Inc.
Junmou Zhang
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Electronic devices and methods for addressing external electromagne...
Patent number
12,174,233
Issue date
Dec 24, 2024
Boston Scientific Scimed, Inc.
Russell P. Dresher
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Electromagnetic leakage red and black signal identification method...
Patent number
12,177,668
Issue date
Dec 24, 2024
Beihang University
Fei Dai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System and method for determining corrected total radiated power (T...
Patent number
12,176,961
Issue date
Dec 24, 2024
Keysight Technologies, Inc.
Ya Jing
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
RF voltage and current (V-I) sensors and measurement methods
Patent number
12,176,183
Issue date
Dec 24, 2024
Tokyo Electron Limited
Barton Lane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electromagnetic radiation detection method
Patent number
12,176,361
Issue date
Dec 24, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Kun-Huei Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measurement device and measurement method
Patent number
12,174,231
Issue date
Dec 24, 2024
Yokogawa Electric Corporation
Jun Katsuyama
G01 - MEASURING TESTING
Information
Patent Grant
System and method for measuring resonance frequencies of quantum se...
Patent number
12,174,234
Issue date
Dec 24, 2024
Guangdong Provincial institute of Metrology
Xinrong Shi
G01 - MEASURING TESTING
Information
Patent Grant
Optical fiber sensing system having glass distributed diamond parti...
Patent number
12,174,274
Issue date
Dec 24, 2024
Eagle Technology, LLC
Evan Villafranca
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for noninvasive determination of utilization
Patent number
12,169,214
Issue date
Dec 17, 2024
Elemental Machines, Inc.
Alex Nichols
G01 - MEASURING TESTING
Information
Patent Grant
Permeability measuring probe and permeability measuring device
Patent number
12,163,990
Issue date
Dec 10, 2024
Tohoku University
Shin Yabukami
G01 - MEASURING TESTING
Information
Patent Grant
Charge detection sensor and potential measurement system
Patent number
12,163,992
Issue date
Dec 10, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Jun Ogi
G01 - MEASURING TESTING
Information
Patent Grant
Bag detection using an electrostatic charge sensor
Patent number
12,164,357
Issue date
Dec 10, 2024
STMicroelectronics S.r.l.
Stefano Paolo Rivolta
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measurement individual difference correction system in ground volta...
Patent number
12,163,987
Issue date
Dec 10, 2024
Nippon Telegraph and Telephone Corporation
Naruto Arai
G01 - MEASURING TESTING
Information
Patent Grant
Contactless microstrip to waveguide transition
Patent number
12,163,991
Issue date
Dec 10, 2024
GAPWAVES AB
Hanna Karlsson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for detecting abnormalities in electrical and e...
Patent number
12,158,505
Issue date
Dec 3, 2024
California Institute of Technology
Farshid Roumi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Phased-array antenna device
Patent number
12,160,050
Issue date
Dec 3, 2024
Japan Aerospace Exploration Agency
Takashi Maeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Robust signal path plausibility check for functional safety of a se...
Patent number
12,146,895
Issue date
Nov 19, 2024
Infineon Technologies AG
Johannes Guettinger
G01 - MEASURING TESTING
Information
Patent Grant
System for supplying chemical solution
Patent number
12,146,483
Issue date
Nov 19, 2024
Taiwan Semiconductor Manufacturing Company Ltd.
Chih-Chiang Tseng
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
PHANTOM DEVICE AND ELECTROMAGNETIC DOSIMETRY SYSTEM ASSOCIATED
Publication number
20250004027
Publication date
Jan 2, 2025
UNIVERSITE DE RENNES
Maxim ZHADOBOV
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC FIELD MEASURING APPARATUS AND METHOD OF MEASURING ELECTRIC...
Publication number
20250004028
Publication date
Jan 2, 2025
Samsung Electronics Co., Ltd.
Jinyeong Yun
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED CIRCUIT DEVICE FOR A SATELLITE RECEIVER AND SATELLITE RE...
Publication number
20250007551
Publication date
Jan 2, 2025
U-BLOX AG
Benjamin MARTIN
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SYSTEM AND METHOD FOR REDUCING ELECTROMAGNETIC RADIATION INSIDE A V...
Publication number
20250008713
Publication date
Jan 2, 2025
V-HOLA LABS LTD.
Benjamin MAY
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND RADIATION DETECTOR FOR AUTOMOTIVE RADAR TESTS
Publication number
20250004026
Publication date
Jan 2, 2025
ROHDE &SCHWARZ GMBH & CO. KG
Gerhard HAMBERGER
G01 - MEASURING TESTING
Information
Patent Application
Metallic waveguide antenna
Publication number
20240429615
Publication date
Dec 26, 2024
Rohde& Schwarz GmbH & Co. KG
Adam Tankielun
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IN-SITU ELECTRIC FIELD DETECTION METHOD AND APPARATUS
Publication number
20240426888
Publication date
Dec 26, 2024
Applied Materials, Inc.
Yue GUO
G01 - MEASURING TESTING
Information
Patent Application
WAVEGUIDE PROBE STRUCTURE, CALIBRATION DEVICE AND CALIBRATION METHO...
Publication number
20240426889
Publication date
Dec 26, 2024
BOE TECHNOLOGY GROUP CO., LTD.
Zhihao JIANG
G01 - MEASURING TESTING
Information
Patent Application
SENSOR SYSTEM AND METHOD FOR CALIBRATING A SENSOR SYSTEM
Publication number
20240426886
Publication date
Dec 26, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Thomas RUSTER
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC PROPAGATION INTERFERENCE MONITORING APPARATUS
Publication number
20240426885
Publication date
Dec 26, 2024
The United States of America, as represented by the Secretary of the Navy
Timothy P. Ringwald
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC WAVE DETECTOR AND ELECTROMAGNETIC WAVE DETECTOR ARRAY
Publication number
20240426887
Publication date
Dec 26, 2024
Mitsubishi Electric Corporation
Shimpei OGAWA
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION DEVICE, SETUP, AND METHOD FOR MEASURING A RADIO FREQUEN...
Publication number
20240426957
Publication date
Dec 26, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Pedro RODRIGUEZ
G01 - MEASURING TESTING
Information
Patent Application
MATERIALS AND METHODS OF PATHOGEN INACTIVATION
Publication number
20240425722
Publication date
Dec 26, 2024
C-POLAR TECHNOLOGIES, INC.
Jianliang GONG
D06 - TREATMENT OF TEXTILES OR THE LIKE LAUNDERING FLEXIBLE MATERIALS NOT OTH...
Information
Patent Application
Quantum Modulation Classifier System and Method
Publication number
20240428113
Publication date
Dec 26, 2024
Qoherent Inc.
Adrian Kaczmarczyk
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE FOR ELECTROMAGNETIC EXPOSURE ASSESSMENT COMPRISING A FIELD E...
Publication number
20240418759
Publication date
Dec 19, 2024
UNIVERSITE DE RENNES
Maxim ZHADOBOV
G01 - MEASURING TESTING
Information
Patent Application
CHARGE MONITORING CIRCUIT
Publication number
20240418761
Publication date
Dec 19, 2024
ams-OSRAM AG
Dominik RUCK
G01 - MEASURING TESTING
Information
Patent Application
TRANSFORMER TURNS NUMBER TESTING CIRCUIT
Publication number
20240418760
Publication date
Dec 19, 2024
Sumida Corporation
Hiroyuki MIYAZAKI
G01 - MEASURING TESTING
Information
Patent Application
Diagnostic Circuit
Publication number
20240418762
Publication date
Dec 19, 2024
The Boeing Company
Ian M. Dayton
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MEASUREMENT OF RADIO FREQUENCY SIGNAL PATTERN...
Publication number
20240410924
Publication date
Dec 12, 2024
FANG-YAO KUO
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR TESTING COMPUTING DEVICE WIRELESS FUNCTIO...
Publication number
20240410925
Publication date
Dec 12, 2024
Communications Test Design, Inc.
Yifei Xu
G01 - MEASURING TESTING
Information
Patent Application
QUANTUM SENSOR SYSTEM FOR SENSING ELECTROMAGNETIC RADIATION
Publication number
20240402230
Publication date
Dec 5, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Thomas RUSTER
G01 - MEASURING TESTING
Information
Patent Application
LOW POWER PHASE DETECTOR
Publication number
20240402231
Publication date
Dec 5, 2024
Northrop Grumman Systems Corporation
Bouchaib Cherif
G01 - MEASURING TESTING
Information
Patent Application
Sensing Radio Frequency Electromagnetic Fields
Publication number
20240393379
Publication date
Nov 28, 2024
Quantum Valley Ideas Laboratories
Mohammad Noaman
G01 - MEASURING TESTING
Information
Patent Application
TEST SYSTEM AND MAXIMUM DOPPLER FREQUENCY CALCULATION METHOD
Publication number
20240393380
Publication date
Nov 28, 2024
Anritsu Corporation
Takeshi KOBAYASHI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
CONTACT DETECTION APPARATUS
Publication number
20240393382
Publication date
Nov 28, 2024
SUMITOMO RIKO COMPANY LIMITED
Satoshi Yoshida
G01 - MEASURING TESTING
Information
Patent Application
ON-CHIP REFLECTION COEFFICIENT MEASUREMENT SYSTEM
Publication number
20240393429
Publication date
Nov 28, 2024
INFINEON TECHNOLOGIES AG
Thomas OBERMUELLER
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND METHOD FOR A MULTI-ELEMENT ANTENNA ARRAY
Publication number
20240393381
Publication date
Nov 28, 2024
Cambium Networks Ltd
Deepu Vasudevan NAIR
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL DISPLAYS USING ELECTROMAGNETIC FIELD COMPUTATIONS
Publication number
20240394977
Publication date
Nov 28, 2024
Pacific Light & Hologram, Inc.
Jonathan Seamus Blackley
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SELF-LOCKED RYDBERG ATOM ELECTRIC FIELD SENSOR
Publication number
20240385232
Publication date
Nov 21, 2024
The MITRE Corporation
Charlie FANCHER
G01 - MEASURING TESTING
Information
Patent Application
FACILITATING SEPARATELY-SOURCED REDUNDANT POWER FEEDS TO A SYSTEM
Publication number
20240385233
Publication date
Nov 21, 2024
International Business Machines Corporation
Brian Charles TUCKER
G06 - COMPUTING CALCULATING COUNTING