Complete testing stations; systems; procedures; software aspects

Industry

CPC
G01R31/2868

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2868Complete testing stations; systems; procedures; software aspects

Industries

Patents Grantslast 30 patents

Information Patent Grant
Probe station capable of maintaining stable and accurate contact to...
- Patent number 11,940,486
- Issue date Mar 26, 2024
- NANYA TECHNOLOGY CORPORATION
- Yi-Kai Chao
- G01 - MEASURING TESTING
Information Patent Grant
Mobile terminal testing device and mobile terminal testing method
- Patent number 11,874,321
- Issue date Jan 16, 2024
- Anritsu Corporation
- Takumi Nakamura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test device for electrical lines
- Patent number 11,867,743
- Issue date Jan 9, 2024
- ADAPTRONIC PRÜFTECHNIK GMBH
- Hans-Peter Hieser
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cooling unit, objective lens module, semiconductor inspection devic...
- Patent number 11,841,393
- Issue date Dec 12, 2023
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System level test device for memory
- Patent number 11,802,905
- Issue date Oct 31, 2023
- ATECO INC.
- Taek Seon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Multiple circuit board tester
- Patent number 11,703,538
- Issue date Jul 18, 2023
- LAT Enterprises, Inc.
- Laura Thiel
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for data storage devices
- Patent number 11,698,408
- Issue date Jul 11, 2023
- Western Digital Technologies, Inc.
- Ba Duong Phan
- G01 - MEASURING TESTING
Information Patent Grant
Test system with a thermal head comprising a plurality of adapters...
- Patent number 11,656,272
- Issue date May 23, 2023
- AEM Holdings Ltd.
- Thomas P. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for testing semiconductor devices
- Patent number 11,594,435
- Issue date Feb 28, 2023
- Testmetrix, Inc.
- Christian O. Cojocneanu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor package test system and semiconductor package fabrica...
- Patent number 11,592,478
- Issue date Feb 28, 2023
- Samsung Electronics Co., Ltd.
- Jaehong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Kit-less pick and place handler system for thermal testing
- Patent number 11,474,147
- Issue date Oct 18, 2022
- Boston Semi Equipment LLC
- Larry Stuckey
- G01 - MEASURING TESTING
Information Patent Grant
Testing system
- Patent number 11,454,664
- Issue date Sep 27, 2022
- Tokyo Electron Limited
- Kentaro Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Kit-less pick and place handler system for thermal testing
- Patent number 11,442,101
- Issue date Sep 13, 2022
- Boston Semi Equipment LLC
- Larry Stuckey
- G01 - MEASURING TESTING
Information Patent Grant
Chip test device and method
- Patent number 11,385,279
- Issue date Jul 12, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chia-Chi Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,255,903
- Issue date Feb 22, 2022
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test chamber for memory device, test system for memory device havin...
- Patent number 11,255,904
- Issue date Feb 22, 2022
- Samsung Electronics Co., Ltd.
- Min-Woo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Multiple circuit board tester
- Patent number 11,221,360
- Issue date Jan 11, 2022
- LAT Enterprises, Inc.
- Laura Thiel
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and cleaning method of inspection apparatus
- Patent number 11,181,573
- Issue date Nov 23, 2021
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Grant
System and method of automated burn-in testing on integrated circui...
- Patent number 11,175,336
- Issue date Nov 16, 2021
- King Tiger Technology (Canada) Inc.
- Sunny Lai-Ming Chang
- G01 - MEASURING TESTING
Information Patent Grant
Automated handling of different form factor devices under test in t...
- Patent number 11,143,697
- Issue date Oct 12, 2021
- Advantest Corporation
- Roland Wolff
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
IC tray and test jig
- Patent number 11,112,452
- Issue date Sep 7, 2021
- Kabushiki Kaisha Toshiba
- Akihiro Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Adjustment method of inspection system and auxiliary element therefor
- Patent number 11,016,142
- Issue date May 25, 2021
- Tokyo Electron Limited
- Minoru Uchida
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 10,852,347
- Issue date Dec 1, 2020
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test chamber for memory device, test system for memory device havin...
- Patent number 10,816,596
- Issue date Oct 27, 2020
- Samsung Electronics Co., Ltd.
- Min-Woo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically configurable remote instrument interface
- Patent number 10,746,761
- Issue date Aug 18, 2020
- Keithley Intstruments, LLC
- Michael D. Rayman
- G01 - MEASURING TESTING
Information Patent Grant
Automated test system having multiple stages
- Patent number 10,725,091
- Issue date Jul 28, 2020
- Teradyne, Inc.
- David Paul Bowyer
- G01 - MEASURING TESTING
Information Patent Grant
History management pad of semiconductor test socket, manufacturing...
- Patent number 10,718,809
- Issue date Jul 21, 2020
- TSE CO., LTD
- Bo Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for loading and unloading devices under test into...
- Patent number 10,613,138
- Issue date Apr 7, 2020
- RASCO GmbH
- Christian Wammetsberger
- G01 - MEASURING TESTING
Information Patent Grant
Prober
- Patent number 10,510,574
- Issue date Dec 17, 2019
- Tokyo Seimitsu Co., Ltd.
- Hiroo Tamura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANS...
- Publication number 20240077530
- Publication date Mar 7, 2024
- KIOXIA Corporation
- Tetsuharu KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR TESTING OF THROUGH SILICON VIAS
- Publication number 20230417825
- Publication date Dec 28, 2023
- Shanghai United Imaging Microelectronics Technology Co., Ltd.
- Changzhi SHI
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION
- Publication number 20230393191
- Publication date Dec 7, 2023
- NANYA TECHNOLOGY CORPORATION
- Yi-Kai CHAO
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE CIRCUIT BOARD TESTER
- Publication number 20230349966
- Publication date Nov 2, 2023
- LAT Enterprises Inc., d/b/a MediPak Energy Systems
- Laura Thiel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TESTING APPARATUS FOR DATA STORAGE DEVICES
- Publication number 20230060313
- Publication date Mar 2, 2023
- Western Digital Technologies, Inc.
- Ba Duong Phan
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR RF BUILT-IN TEST SYSTEM
- Publication number 20220365133
- Publication date Nov 17, 2022
- Metawave Corporation
- Andrew John BONTHRON
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE FOR ELECTRICAL LINES
- Publication number 20220291274
- Publication date Sep 15, 2022
- ADAPTRONIC PRÜFTECHNIK GMBH
- Hans-Peter Hieser
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM LEVEL TEST DEVICE FOR MEMORY
- Publication number 20220236320
- Publication date Jul 28, 2022
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
MOBILE TERMINAL TESTING DEVICE AND MOBILE TERMINAL TESTING METHOD
- Publication number 20220236316
- Publication date Jul 28, 2022
- Anritsu Corporation
- Takumi NAKAMURA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
LASER-INDUCED THERMAL STRESSING OF INTEGRATED CIRCUITS
- Publication number 20220221510
- Publication date Jul 14, 2022
- Intel Corporation
- Ricardo Ascazubi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20220137121
- Publication date May 5, 2022
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE CIRCUIT BOARD TESTER
- Publication number 20220128618
- Publication date Apr 28, 2022
- LAT Enterprises Inc., d/b/a MediPak Energy Systems
- Laura Thiel
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN BOARD SEATING
- Publication number 20220120808
- Publication date Apr 21, 2022
- Micro Control Company
- Aidan Michael Fawcett
- G05 - CONTROLLING REGULATING
Information Patent Application
COOLING UNIT, OBJECTIVE LENS MODULE, SEMICONDUCTOR INSPECTION DEVIC...
- Publication number 20220091182
- Publication date Mar 24, 2022
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGE TEST SYSTEM AND SEMICONDUCTOR PACKAGE FABRICA...
- Publication number 20220026488
- Publication date Jan 27, 2022
- Samsung Electronics Co., Ltd.
- Jaehong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING SYSTEM AND TESTING METHOD
- Publication number 20210364550
- Publication date Nov 25, 2021
- TOKYO ELECTRON LIMITED
- Tetsuya KAGAMI
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM
- Publication number 20210333319
- Publication date Oct 28, 2021
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PROCESSING DEVICES
- Publication number 20210255240
- Publication date Aug 19, 2021
- Brightpoint, Inc.
- Timothy McGrath
- G01 - MEASURING TESTING
Information Patent Application
WET LEAKAGE CURRENT TEST SYSTEM FOR PHOTOVOLTAIC COMPONENT
- Publication number 20210175848
- Publication date Jun 10, 2021
- Miasolé Equipment Integration (Fujian) Co., Ltd.
- Shengtao MA
- G01 - MEASURING TESTING
Information Patent Application
CHIP TEST DEVICE AND METHOD
- Publication number 20210102995
- Publication date Apr 8, 2021
- Changxin Memory Technologies, Inc.
- Chia-Chi HSU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20210025935
- Publication date Jan 28, 2021
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
TEST CHAMBER FOR MEMORY DEVICE, TEST SYSTEM FOR MEMORY DEVICE HAVIN...
- Publication number 20210003632
- Publication date Jan 7, 2021
- Samsung Electronics Co., Ltd.
- Min-Woo Kim
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF AUTOMATED BURN-IN TESTING ON INTEGRATED CIRCUI...
- Publication number 20200379033
- Publication date Dec 3, 2020
- KINGTIGER TECHNOLOGY (CANADA) INC.
- Sunny Lai-Ming Chang
- G01 - MEASURING TESTING
Information Patent Application
KIT-LESS PICK AND PLACE HANDLER
- Publication number 20200341054
- Publication date Oct 29, 2020
- Boston Semi Equipment, LLC
- Larry Stuckey
- G01 - MEASURING TESTING
Information Patent Application
IC TRAY AND TEST JIG
- Publication number 20200284833
- Publication date Sep 10, 2020
- Kabushiki Kaisha Toshiba
- Akihiro Hayashida
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Methods for Testing Semiconductor Devices
- Publication number 20200273733
- Publication date Aug 27, 2020
- Testmetrix, Inc.
- Christian O. Cojocneanu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HISTORY MANAGEMENT PAD OF SEMICONDUCTOR TEST SOCKET, MANUFACTURING...
- Publication number 20200233029
- Publication date Jul 23, 2020
- TSE CO.,LTD
- Bo Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TESTING AND HANDLING MECHANISM
- Publication number 20200116781
- Publication date Apr 16, 2020
- RASCO GMBH
- Andreas Wiesböck
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND CLEANING METHOD OF INSPECTION APPARATUS
- Publication number 20200018791
- Publication date Jan 16, 2020
- TOKYO ELECTRON LIMITED
- Tomoya Endo
- G01 - MEASURING TESTING

Complete testing stations; systems; procedures; software aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Probe station capable of maintaining stable and accurate contact to...

Mobile terminal testing device and mobile terminal testing method

Test device for electrical lines

Apparatus for testing electronic devices

Cooling unit, objective lens module, semiconductor inspection devic...

System level test device for memory

Multiple circuit board tester

Testing apparatus for data storage devices

Test system with a thermal head comprising a plurality of adapters...

Apparatus and methods for testing semiconductor devices

Semiconductor package test system and semiconductor package fabrica...

Kit-less pick and place handler system for thermal testing

Testing system

Kit-less pick and place handler system for thermal testing

Chip test device and method

Apparatus for testing electronic devices

Test chamber for memory device, test system for memory device havin...

Multiple circuit board tester

Inspection apparatus and cleaning method of inspection apparatus

System and method of automated burn-in testing on integrated circui...

Automated handling of different form factor devices under test in t...

IC tray and test jig

Adjustment method of inspection system and auxiliary element therefor

Apparatus for testing electronic devices

Test chamber for memory device, test system for memory device havin...

Dynamically configurable remote instrument interface

Automated test system having multiple stages

History management pad of semiconductor test socket, manufacturing...

Method and device for loading and unloading devices under test into...

Prober

Patents Applicationslast 30 patents

APPARATUS FOR TESTING ELECTRONIC DEVICES

TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANS...

DEVICES AND METHODS FOR TESTING OF THROUGH SILICON VIAS

PROBE STATION

MULTIPLE CIRCUIT BOARD TESTER

TESTING APPARATUS FOR DATA STORAGE DEVICES

METHOD AND APPARATUS FOR RF BUILT-IN TEST SYSTEM

TEST DEVICE FOR ELECTRICAL LINES

SYSTEM LEVEL TEST DEVICE FOR MEMORY

MOBILE TERMINAL TESTING DEVICE AND MOBILE TERMINAL TESTING METHOD

LASER-INDUCED THERMAL STRESSING OF INTEGRATED CIRCUITS

APPARATUS FOR TESTING ELECTRONIC DEVICES

MULTIPLE CIRCUIT BOARD TESTER

BURN-IN BOARD SEATING

COOLING UNIT, OBJECTIVE LENS MODULE, SEMICONDUCTOR INSPECTION DEVIC...

SEMICONDUCTOR PACKAGE TEST SYSTEM AND SEMICONDUCTOR PACKAGE FABRICA...

TESTING SYSTEM AND TESTING METHOD

TESTING SYSTEM

SYSTEMS AND METHODS FOR PROCESSING DEVICES

WET LEAKAGE CURRENT TEST SYSTEM FOR PHOTOVOLTAIC COMPONENT

CHIP TEST DEVICE AND METHOD

APPARATUS FOR TESTING ELECTRONIC DEVICES

TEST CHAMBER FOR MEMORY DEVICE, TEST SYSTEM FOR MEMORY DEVICE HAVIN...

SYSTEM AND METHOD OF AUTOMATED BURN-IN TESTING ON INTEGRATED CIRCUI...

KIT-LESS PICK AND PLACE HANDLER

IC TRAY AND TEST JIG

Apparatus and Methods for Testing Semiconductor Devices

HISTORY MANAGEMENT PAD OF SEMICONDUCTOR TEST SOCKET, MANUFACTURING...

INTEGRATED TESTING AND HANDLING MECHANISM

INSPECTION APPARATUS AND CLEANING METHOD OF INSPECTION APPARATUS