comprising voltage or current generators

Industry

CPC
G11C29/12005

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/12005comprising voltage or current generators

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System and method for testing memory device
- Patent number 12,272,415
- Issue date Apr 8, 2025
- NANYA TECHNOLOGY CORPORATION
- Yaochang Chiu
- G11 - INFORMATION STORAGE
Information Patent Grant
Vera detection method to catch erase fail
- Patent number 12,272,417
- Issue date Apr 8, 2025
- SanDisk Technologies, Inc.
- Parth Amin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and test method of memory device
- Patent number 12,266,414
- Issue date Apr 1, 2025
- Samsung Electronics Co., Ltd.
- Jaewon Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile memory device and method of operating nonvolatile memory
- Patent number 12,260,923
- Issue date Mar 25, 2025
- Samsung Electronics Co., Ltd.
- Hyunee Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit, test method and memory
- Patent number 12,254,941
- Issue date Mar 18, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jianyong Qin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interface circuit, memory controller and method for calibrating sig...
- Patent number 12,249,385
- Issue date Mar 11, 2025
- Silicon Motion, Inc.
- Fu-Jen Shih
- G11 - INFORMATION STORAGE
Information Patent Grant
Indicating a status of a memory built-in self-test
- Patent number 12,243,607
- Issue date Mar 4, 2025
- Micron Technology, Inc.
- Scott E. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Grant
Word line layer dependent stress and screen voltage
- Patent number 12,230,344
- Issue date Feb 18, 2025
- SanDisk Technologies, Inc.
- Yidan Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Cross-point memory read technique to mitigate drift errors
- Patent number 12,230,346
- Issue date Feb 18, 2025
- Intel Corporation
- Hemant P. Rao
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory testing system and memory testing method
- Patent number 12,217,815
- Issue date Feb 4, 2025
- NANYA TECHNOLOGY CORPORATION
- Chien Yu Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Burst indicator systems and methods
- Patent number 12,211,573
- Issue date Jan 28, 2025
- Micron Technology, Inc.
- Kai Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device sideband systems and methods
- Patent number 12,198,774
- Issue date Jan 14, 2025
- Micron Technology, Inc.
- Joshua E. Alzheimer
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device performing sensing operation and method of operating...
- Patent number 12,190,973
- Issue date Jan 7, 2025
- SK Hynix Inc.
- Se Chun Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Adaptive DSP generation of read thresholds for gaussian and non-gau...
- Patent number 12,190,975
- Issue date Jan 7, 2025
- Beijing Tenafe Electronic Technology Co., Ltd.
- Yingquan Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Data coding device, memory controller, and storage device
- Patent number 12,190,988
- Issue date Jan 7, 2025
- SK Hynix Inc.
- Ie Ryung Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Word line dependent pass voltage ramp rate to improve performance o...
- Patent number 12,176,032
- Issue date Dec 24, 2024
- SANDISK TECHNOLOGIES LLC
- Abu Naser Zainuddin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory system and method
- Patent number 12,165,725
- Issue date Dec 10, 2024
- Kioxia Corporation
- Ryo Yamaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory control method, memory storage device and memory control cir...
- Patent number 12,147,674
- Issue date Nov 19, 2024
- Hefei Core Storage Electronic Limited
- Chih-Ling Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Early detection of programming failure for non-volatile memory
- Patent number 12,148,489
- Issue date Nov 19, 2024
- SANDISK TECHNOLOGIES LLC
- Yi Song
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory controller and operating method thereof
- Patent number 12,142,331
- Issue date Nov 12, 2024
- SK hynix Inc.
- Seung Yeol Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor storage device and control method of semiconductor st...
- Patent number 12,119,081
- Issue date Oct 15, 2024
- Fujitsu Limited
- Hiroshi Nakadai
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for determining memory cell data states
- Patent number 12,112,819
- Issue date Oct 8, 2024
- Micron Technology, Inc.
- Sheyang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Flash memory scheme capable of controlling flash memory device auto...
- Patent number 12,112,816
- Issue date Oct 8, 2024
- Silicon Motion, Inc.
- Tsu-Han Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Fast search for leaky word line
- Patent number 12,094,550
- Issue date Sep 17, 2024
- SanDisk Technologies, Inc.
- Xingyan Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and test method for the same
- Patent number 12,073,900
- Issue date Aug 27, 2024
- Renesas Electronics Corporation
- Haruyuki Okuda
- G11 - INFORMATION STORAGE
Information Patent Grant
Track charge loss based on signal and noise characteristics of memo...
- Patent number 12,073,899
- Issue date Aug 27, 2024
- Micron Technology, Inc.
- Sivagnanam Parthasarathy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Techniques for detecting a state of a bus
- Patent number 12,046,316
- Issue date Jul 23, 2024
- Micron Technology, Inc.
- Scott E. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Grant
NAND memory with different pass voltage ramp rates for binary and m...
- Patent number 12,046,314
- Issue date Jul 23, 2024
- SanDisk Technologies, Inc.
- Abu Naser Zainuddin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Magnetic memory device
- Patent number 12,040,036
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Hsiang Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Monitoring and adjusting access operations at a memory device
- Patent number 12,014,792
- Issue date Jun 18, 2024
- Micron Technology, Inc.
- Mark D. Ingram
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEMORY SYSTEM AND AN OPERATING METHOD THEREOF
- Publication number 20250104788
- Publication date Mar 27, 2025
- Yangtze Memory Technologies Co., Ltd.
- Shuai ZHANG
- G11 - INFORMATION STORAGE
Information Patent Application
DUAL-READ DATA INTEGRITY SCAN IN A MEMORY SUB-SYSTEM
- Publication number 20250104789
- Publication date Mar 27, 2025
- Micron Technology, Inc.
- Zhongguang Xu
- G11 - INFORMATION STORAGE
Information Patent Application
DATA CODING DEVICE, MEMORY CONTROLLER, AND STORAGE DEVICE
- Publication number 20250104743
- Publication date Mar 27, 2025
- SK HYNIX INC.
- Ie Ryung PARK
- G11 - INFORMATION STORAGE
Information Patent Application
ADAPTIVE DSP GENERATION OF READ THRESHOLDS FOR GAUSSIAN AND NON-GAU...
- Publication number 20250087288
- Publication date Mar 13, 2025
- Beijing Tenafe Electronic Technology Co., Ltd.
- Yingquan Wu
- G11 - INFORMATION STORAGE
Information Patent Application
WORDLINE RAMP RATE MONITOR FOR EARLY DETECTION OF DEFECT ACTIVATION
- Publication number 20250046390
- Publication date Feb 6, 2025
- Micron Technology, Inc.
- Fulvio Rori
- G11 - INFORMATION STORAGE
Information Patent Application
HEAT GENERATION CONTROL FOR MEMORY SYSTEM EVALUATION
- Publication number 20250022528
- Publication date Jan 16, 2025
- Micron Technology, Inc.
- Natalia Tarazona Cordoba
- G01 - MEASURING TESTING
Information Patent Application
STORAGE DEVICE AND OPERATING METHOD OF CONTROLLER OF STORAGE DEVICE
- Publication number 20250022525
- Publication date Jan 16, 2025
- SK HYNIX INC.
- Young Gyun KIM
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE DETERMINING DETERIORATION WORDLINE, AND METHOD OF OP...
- Publication number 20250014664
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Minji Cho
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY WITH NEIGHBOR PLANE PROGRAM DISTURB AVOIDANCE
- Publication number 20250006288
- Publication date Jan 2, 2025
- Western Digital Technologies, Inc.
- Jiahui Yuan
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY WITH LAYOUT ADAPTIVE PROBLEMATIC WORD LINE DETE...
- Publication number 20250006287
- Publication date Jan 2, 2025
- Western Digital Technologies, Inc.
- Xuan Tian
- G11 - INFORMATION STORAGE
Information Patent Application
TEST CIRCUIT AND SEMICONDUCTOR MEMORY SYSTEM INCLUDING THE TEST CIR...
- Publication number 20250006291
- Publication date Jan 2, 2025
- SK HYNIX INC.
- Jong Seok JUNG
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR TESTING MEMORY DEVICE
- Publication number 20240420788
- Publication date Dec 19, 2024
- NANYA TECHNOLOGY CORPORATION
- Yaochang CHIU
- G11 - INFORMATION STORAGE
Information Patent Application
SELF-CALIBRATION IN A MEMORY DEVICE
- Publication number 20240420790
- Publication date Dec 19, 2024
- Micron Technology, Inc.
- Jennifer E. Taylor
- G11 - INFORMATION STORAGE
Information Patent Application
TRACK CHARGE LOSS BASED ON SIGNAL AND NOISE CHARACTERISTICS OF MEMO...
- Publication number 20240412795
- Publication date Dec 12, 2024
- Micron Technology, Inc.
- Sivagnanam Parthasarathy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING MEMORY DEVICE
- Publication number 20240412800
- Publication date Dec 12, 2024
- NANYA TECHNOLOGY CORPORATION
- Jui-Chung HSU
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNIQUES FOR DETECTING A STATE OF A BUS
- Publication number 20240412801
- Publication date Dec 12, 2024
- Micron Technology, Inc.
- Scott E. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Application
REDUCING PARTIAL BLOCK PROGRAMMING USING DYNAMIC TRIM SETTINGS
- Publication number 20240412803
- Publication date Dec 12, 2024
- Micron Technology, Inc.
- Qun Su
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY FAILURE ANALYSIS BASED ON BITLINE THRESHOLD VOLTAGE DISTRIBU...
- Publication number 20240395348
- Publication date Nov 28, 2024
- Micron Technology, Inc.
- Kyle B. Brock-Petersen
- G11 - INFORMATION STORAGE
Information Patent Application
Interface circuit, memory controller and method for calibrating sig...
- Publication number 20240363183
- Publication date Oct 31, 2024
- SILICON MOTION, INC.
- Fu-Jen Shih
- G11 - INFORMATION STORAGE
Information Patent Application
RADIATION INDUCED ERROR DETECTION IN SOLID-STATE DEVICES
- Publication number 20240362112
- Publication date Oct 31, 2024
- The Boeing Company
- Mark Joseph Clemen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Magnetic Memory Device
- Publication number 20240331796
- Publication date Oct 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Hsiang CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE, CONTROL METHOD, AND CONTROL DEVICE
- Publication number 20240331789
- Publication date Oct 3, 2024
- WINBOND ELECTRONICS CORP.
- Takahiko SATO
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY WITH SLOW VOLTAGE RAMP COMPENSATION
- Publication number 20240321379
- Publication date Sep 26, 2024
- SANDISK TECHNOLOGIES LLC
- Sai Gautham Thoppa
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE AND DRIVING METHOD OF STORAGE DEVICE
- Publication number 20240321334
- Publication date Sep 26, 2024
- KIOXIA Corporation
- Kosuke HATSUDA
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTRONIC DEVICES RELATED TO COMPENSATION OF MONITORING SIGNALS
- Publication number 20240304272
- Publication date Sep 12, 2024
- SK HYNIX INC.
- Yoon Jae SHIN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE DETECTING DEFECT OF WORD LINE PATH AND OPERATING METH...
- Publication number 20240296898
- Publication date Sep 5, 2024
- Samsung Electronics Co., Ltd.
- Taehong KWON
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY WITH FASTER POST-ERASE DEFECT TESTING
- Publication number 20240290412
- Publication date Aug 29, 2024
- SANDISK TECHNOLOGIES LLC
- Sai Gautham Thoppa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE GENERATION CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUDIN...
- Publication number 20240274212
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- Yumin Kim
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE, CONTROLLER, MEMORY SYSTEM AND METHOD O...
- Publication number 20240274217
- Publication date Aug 15, 2024
- SK HYNIX INC.
- Jin Sub KIM
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR EXTENDING LIFETIME OF MEMORY DEVICE
- Publication number 20240249792
- Publication date Jul 25, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Yung-Huei Lee
- G11 - INFORMATION STORAGE

comprising voltage or current generators

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for testing memory device

Vera detection method to catch erase fail

Memory device and test method of memory device

Nonvolatile memory device and method of operating nonvolatile memory

Test circuit, test method and memory

Interface circuit, memory controller and method for calibrating sig...

Indicating a status of a memory built-in self-test

Word line layer dependent stress and screen voltage

Cross-point memory read technique to mitigate drift errors

Memory testing system and memory testing method

Burst indicator systems and methods

Memory device sideband systems and methods

Memory device performing sensing operation and method of operating...

Adaptive DSP generation of read thresholds for gaussian and non-gau...

Data coding device, memory controller, and storage device

Word line dependent pass voltage ramp rate to improve performance o...

Memory system and method

Memory control method, memory storage device and memory control cir...

Early detection of programming failure for non-volatile memory

Memory controller and operating method thereof

Semiconductor storage device and control method of semiconductor st...

Apparatus for determining memory cell data states

Flash memory scheme capable of controlling flash memory device auto...

Fast search for leaky word line

Semiconductor memory device and test method for the same

Track charge loss based on signal and noise characteristics of memo...

Techniques for detecting a state of a bus

NAND memory with different pass voltage ramp rates for binary and m...

Magnetic memory device

Monitoring and adjusting access operations at a memory device

Patents Applicationslast 30 patents

MEMORY SYSTEM AND AN OPERATING METHOD THEREOF

DUAL-READ DATA INTEGRITY SCAN IN A MEMORY SUB-SYSTEM

DATA CODING DEVICE, MEMORY CONTROLLER, AND STORAGE DEVICE

ADAPTIVE DSP GENERATION OF READ THRESHOLDS FOR GAUSSIAN AND NON-GAU...

WORDLINE RAMP RATE MONITOR FOR EARLY DETECTION OF DEFECT ACTIVATION

HEAT GENERATION CONTROL FOR MEMORY SYSTEM EVALUATION

STORAGE DEVICE AND OPERATING METHOD OF CONTROLLER OF STORAGE DEVICE

STORAGE DEVICE DETERMINING DETERIORATION WORDLINE, AND METHOD OF OP...

NON-VOLATILE MEMORY WITH NEIGHBOR PLANE PROGRAM DISTURB AVOIDANCE

NON-VOLATILE MEMORY WITH LAYOUT ADAPTIVE PROBLEMATIC WORD LINE DETE...

TEST CIRCUIT AND SEMICONDUCTOR MEMORY SYSTEM INCLUDING THE TEST CIR...

SYSTEM AND METHOD FOR TESTING MEMORY DEVICE

SELF-CALIBRATION IN A MEMORY DEVICE

TRACK CHARGE LOSS BASED ON SIGNAL AND NOISE CHARACTERISTICS OF MEMO...

SYSTEM AND METHOD FOR TESTING MEMORY DEVICE

TECHNIQUES FOR DETECTING A STATE OF A BUS

REDUCING PARTIAL BLOCK PROGRAMMING USING DYNAMIC TRIM SETTINGS

MEMORY FAILURE ANALYSIS BASED ON BITLINE THRESHOLD VOLTAGE DISTRIBU...

Interface circuit, memory controller and method for calibrating sig...

RADIATION INDUCED ERROR DETECTION IN SOLID-STATE DEVICES

Magnetic Memory Device

SEMICONDUCTOR MEMORY DEVICE, CONTROL METHOD, AND CONTROL DEVICE

NON-VOLATILE MEMORY WITH SLOW VOLTAGE RAMP COMPENSATION

STORAGE DEVICE AND DRIVING METHOD OF STORAGE DEVICE

ELECTRONIC DEVICES RELATED TO COMPENSATION OF MONITORING SIGNALS

MEMORY DEVICE DETECTING DEFECT OF WORD LINE PATH AND OPERATING METH...

NON-VOLATILE MEMORY WITH FASTER POST-ERASE DEFECT TESTING

VOLTAGE GENERATION CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUDIN...

SEMICONDUCTOR MEMORY DEVICE, CONTROLLER, MEMORY SYSTEM AND METHOD O...

SYSTEM AND METHOD FOR EXTENDING LIFETIME OF MEMORY DEVICE