Confocal imaging

Industry

CPC
G01B9/02042

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02042Confocal imaging

Industries

Patents Grantslast 30 patents

Information Patent Grant
Wafer carrier thickness measuring device
- Patent number 11,371,829
- Issue date Jun 28, 2022
- SK SILTRON CO., LTD.
- Suk Jin Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor head
- Patent number 11,340,059
- Issue date May 24, 2022
- Omron Corporation
- Shinya Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for optimizing focus for imaging-based overlay...
- Patent number 11,313,669
- Issue date Apr 26, 2022
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Method and assembly for chromatic confocal spectral interferometry...
- Patent number 11,248,900
- Issue date Feb 15, 2022
- Universitat Stuttgart
- Klaus Körner
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device
- Patent number 11,231,270
- Issue date Jan 25, 2022
- Omron Corporation
- Takahiro Okuda
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring lens contour based on laser wave nu...
- Patent number 11,092,511
- Issue date Aug 17, 2021
- GUANGDONG UNIVERSITY OF TECHNOLOGY
- Shengli Xie
- G01 - MEASURING TESTING
Information Patent Grant
Sub-resolution defect detection
- Patent number 10,935,501
- Issue date Mar 2, 2021
- Onto Innovation Inc.
- Nigel P. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Sample shape measuring apparatus for calculating a shape of a sampl...
- Patent number 10,697,764
- Issue date Jun 30, 2020
- Olympus Corporation
- Mayumi Odaira
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for optimizing focus for imaging-based overlay...
- Patent number 10,663,281
- Issue date May 26, 2020
- KLA-Tencor Corporation
- Amnon Manassen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Confocal microscope for determination of a layer thickness and micr...
- Patent number 10,436,571
- Issue date Oct 8, 2019
- Carl Zeiss Microscopy GmbH
- Matthias Vaupel
- G01 - MEASURING TESTING
Information Patent Grant
Interference observation device and interference observation method
- Patent number 10,393,500
- Issue date Aug 27, 2019
- Hamamatsu Photonics K.K.
- Toyohiko Yamauchi
- G01 - MEASURING TESTING
Information Patent Grant
Interference observation device and interference observation method
- Patent number 10,359,270
- Issue date Jul 23, 2019
- Hamamatsu Photonics K.K.
- Toyohiko Yamauchi
- G02 - OPTICS
Information Patent Grant
Hybrid telescope for optical beam delivery and related systems
- Patent number 10,271,725
- Issue date Apr 30, 2019
- Bioptigen, Inc.
- Eric L. Buckland
- G02 - OPTICS
Information Patent Grant
Light microscope and method for image recording using a light micro...
- Patent number 10,261,300
- Issue date Apr 16, 2019
- Carl Zeiss Microscopy GmbH
- Helmut Lippert
- G02 - OPTICS
Information Patent Grant
Interference observation device
- Patent number 10,209,056
- Issue date Feb 19, 2019
- Hamamatsu Photonics K.K.
- Toyohiko Yamauchi
- G02 - OPTICS
Information Patent Grant
Differential filtering chromatic confocal microscopic system
- Patent number 10,082,655
- Issue date Sep 25, 2018
- NATIONAL TAIWAN UNIVERSITY
- Liang-Chia Chen
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid telescope for optical beam delivery and related systems and...
- Patent number 9,949,634
- Issue date Apr 24, 2018
- Bioptigen, Inc.
- Eric L. Buckland
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Portable interferometric device
- Patent number 9,910,256
- Issue date Mar 6, 2018
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi Shaked
- G02 - OPTICS
Information Patent Grant
Multi-functioned optical measurement device and method for opticall...
- Patent number 9,395,173
- Issue date Jul 19, 2016
- National Applied Research Laboratories
- Ming-Hsing Shen
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for acquiring position with a confocal Fabry-Pero...
- Patent number 8,773,666
- Issue date Jul 8, 2014
- attocube Systems AG
- Khaled Karrai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for interferometry
- Patent number 8,605,289
- Issue date Dec 10, 2013
- Universitaet Stuttgart
- Klaus Koerner
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional optical coherence tomography confocal imaging app...
- Patent number 8,553,209
- Issue date Oct 8, 2013
- NATIONAL TAIWAN UNIVERSITY
- Chien-Chung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Optical object measurement apparatus
- Patent number 7,973,940
- Issue date Jul 5, 2011
- Kowa Company Ltd.
- Koji Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography apparatus
- Patent number 7,952,723
- Issue date May 31, 2011
- Kowa Company Ltd.
- Koji Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method and assembly for confocal, chromatic, interferometric and sp...
- Patent number 7,876,446
- Issue date Jan 25, 2011
- Universitat Stuttgart
- Klaus Körner
- G11 - INFORMATION STORAGE
Information Patent Grant
Heterodyne interferometer device for optically measuring an object
- Patent number 7,852,487
- Issue date Dec 14, 2010
- Polytec GmbH
- Christian Rembe
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for the non-invasive detection and measurement of...
- Patent number 7,710,573
- Issue date May 4, 2010
- Ecole Normale Superieure de Cachan
- Timothée Pol Jean Toury
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for joint measurements of conjugated quadratur...
- Patent number 7,495,769
- Issue date Feb 24, 2009
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for overlay, alignment mark, and critical dim...
- Patent number 7,298,496
- Issue date Nov 20, 2007
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for joint measurement of fields of scattered/r...
- Patent number 7,099,014
- Issue date Aug 29, 2006
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND METHOD OF MEASURING AN AXIAL LENGTH
- Publication number 20240271922
- Publication date Aug 15, 2024
- Occuity Limited
- James REYNOLDS
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND METHOD OF RAPID MEASUREMENT
- Publication number 20240230312
- Publication date Jul 11, 2024
- Occuity Limited
- James REYNOLDS
- G01 - MEASURING TESTING
Information Patent Application
BROADBAND INTERFEROMETRIC CONFOCAL MICROSCOPE
- Publication number 20240068797
- Publication date Feb 29, 2024
- University of Rochester
- Arturo Alejandro Canales Benavides
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND ASSEMBLY FOR CHROMATIC CONFOCAL SPECTRAL INTERFEROMETRY...
- Publication number 20200378743
- Publication date Dec 3, 2020
- UNIVERSITAT STUTTGART
- Klaus KÖRNER
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Optimizing Focus for Imaging-Based Overlay...
- Publication number 20200240765
- Publication date Jul 30, 2020
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE
- Publication number 20190277621
- Publication date Sep 12, 2019
- Omron Corporation
- Takahiro OKUDA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS
- Publication number 20190265024
- Publication date Aug 29, 2019
- OLYMPUS CORPORATION
- Mayumi ODAIRA
- G01 - MEASURING TESTING
Information Patent Application
Confocal microscope for determination of a layer thickness and micr...
- Publication number 20190033054
- Publication date Jan 31, 2019
- CARL ZEISS MICROSCOPY GMBH
- Matthias Vaupel
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Optimizing Focus for Imaging-Based Overlay...
- Publication number 20180292198
- Publication date Oct 11, 2018
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
Hybrid Telescope for Optical Beam Delivery and Related Systems
- Publication number 20180084993
- Publication date Mar 29, 2018
- Bioptigen, Inc.
- Eric L. Buckland
- G02 - OPTICS
Information Patent Application
INTERFERENCE OBSERVATION DEVICE AND INTERFERENCE OBSERVATION METHOD
- Publication number 20180017371
- Publication date Jan 18, 2018
- Hamamatsu Photonics K.K.
- Toyohiko YAMAUCHI
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE INTERFEROMETRIC DEVICE
- Publication number 20170153434
- Publication date Jun 1, 2017
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi Shaked
- G02 - OPTICS
Information Patent Application
MULTI-FUNCTIONED OPTICAL MEASUREMENT DEVICE AND METHOD FOR OPTICALL...
- Publication number 20160116271
- Publication date Apr 28, 2016
- NATIONAL APPLIED RESEARCH LABORATORIES
- Ming-Hsing SHEN
- G01 - MEASURING TESTING
Information Patent Application
Light microscope and method for image recording using a light micro...
- Publication number 20150054937
- Publication date Feb 26, 2015
- CARL ZEISS MICROSCOPY GMBH
- Helmut Lippert
- G02 - OPTICS
Information Patent Application
Hybrid Telescope for Optical Beam Delivery and Related Systems and...
- Publication number 20140354950
- Publication date Dec 4, 2014
- Eric L. Buckland
- G02 - OPTICS
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20140300904
- Publication date Oct 9, 2014
- Canon Kabushiki Kaisha
- Hiroyuki Yuki
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL OPTICAL COHERENCE TOMOGRAPHY CONFOCAL IMAGING APP...
- Publication number 20110310395
- Publication date Dec 22, 2011
- National Taiwan University
- CHIEN-CHUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INTERFEROMETRY
- Publication number 20110235045
- Publication date Sep 29, 2011
- UNIVERSITAET STUTTGART
- Klaus Koerner
- G02 - OPTICS
Information Patent Application
DEVICE AND METHOD FOR ACQUIRING POSITION WITH A CONFOCAL FABRY-PERO...
- Publication number 20110211199
- Publication date Sep 1, 2011
- ATTOCUBE SYSTEMS AG
- Khaled KARRAI
- G01 - MEASURING TESTING
Information Patent Application
Optical object measurement apparatus
- Publication number 20100149546
- Publication date Jun 17, 2010
- Kowa Company Ltd.
- Koji Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Optical coherence tomography apparatus
- Publication number 20100141954
- Publication date Jun 10, 2010
- Kowa Company Ltd.
- Koji Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR OPTICALLY MEASURING AN OBJECT
- Publication number 20080285049
- Publication date Nov 20, 2008
- Polytec GmbH
- Christian Rembe
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR JOINT MEASUREMENTS OF CONJUGATED QUADRATUR...
- Publication number 20080180682
- Publication date Jul 31, 2008
- Zetetic Institute
- Henry Allen HILL
- A45 - HAND OR TRAVELLING ARTICLES
Information Patent Application
Method and Assembly for Confocal, Chromatic, Interferometric and Sp...
- Publication number 20080151253
- Publication date Jun 26, 2008
- Universitat Stuttgart
- Klaus Korner
- G02 - OPTICS
Information Patent Application
Device and method for the non-invasive detection and measurement of...
- Publication number 20070070352
- Publication date Mar 29, 2007
- Centre National De La Recherche Scientifque-CNRS
- Timothee, Pol, Jean Toury
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for overlay, alignment mark, and critical dim...
- Publication number 20050275848
- Publication date Dec 15, 2005
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for joint measurements of conjugated quadratur...
- Publication number 20040257577
- Publication date Dec 23, 2004
- Zetetic Institute
- Henry Allen Hill
- A45 - HAND OR TRAVELLING ARTICLES
Information Patent Application
Apparatus and method for measurement of fields of backscattered and...
- Publication number 20040227950
- Publication date Nov 18, 2004
- Zetetic Institute
- Henry Allen Hill
- G02 - OPTICS
Information Patent Application
Apparatus and method for joint measurement of fields of scattered/r...
- Publication number 20040227951
- Publication date Nov 18, 2004
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Application
Two-wavelength confocal interferometer for measuring multiple surfaces
- Publication number 20040075842
- Publication date Apr 22, 2004
- Thomas J. Dunn
- G01 - MEASURING TESTING

Confocal imaging

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Wafer carrier thickness measuring device

Sensor head

Systems and methods for optimizing focus for imaging-based overlay...

Method and assembly for chromatic confocal spectral interferometry...

Optical measuring device

Device and method for measuring lens contour based on laser wave nu...

Sub-resolution defect detection

Sample shape measuring apparatus for calculating a shape of a sampl...

Systems and methods for optimizing focus for imaging-based overlay...

Confocal microscope for determination of a layer thickness and micr...

Interference observation device and interference observation method

Interference observation device and interference observation method

Hybrid telescope for optical beam delivery and related systems

Light microscope and method for image recording using a light micro...

Interference observation device

Differential filtering chromatic confocal microscopic system

Hybrid telescope for optical beam delivery and related systems and...

Portable interferometric device

Multi-functioned optical measurement device and method for opticall...

Device and method for acquiring position with a confocal Fabry-Pero...

Method and apparatus for interferometry

Three-dimensional optical coherence tomography confocal imaging app...

Optical object measurement apparatus

Optical coherence tomography apparatus

Method and assembly for confocal, chromatic, interferometric and sp...

Heterodyne interferometer device for optically measuring an object

Device and method for the non-invasive detection and measurement of...

Apparatus and method for joint measurements of conjugated quadratur...

Apparatus and methods for overlay, alignment mark, and critical dim...

Apparatus and method for joint measurement of fields of scattered/r...

Patents Applicationslast 30 patents

OPTICAL MEASUREMENT APPARATUS AND METHOD OF MEASURING AN AXIAL LENGTH

OPTICAL MEASUREMENT APPARATUS AND METHOD OF RAPID MEASUREMENT

BROADBAND INTERFEROMETRIC CONFOCAL MICROSCOPE

METHOD AND ASSEMBLY FOR CHROMATIC CONFOCAL SPECTRAL INTERFEROMETRY...

Systems and Methods for Optimizing Focus for Imaging-Based Overlay...

OPTICAL MEASURING DEVICE

SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS

Confocal microscope for determination of a layer thickness and micr...

Systems and Methods for Optimizing Focus for Imaging-Based Overlay...

Hybrid Telescope for Optical Beam Delivery and Related Systems

INTERFERENCE OBSERVATION DEVICE AND INTERFERENCE OBSERVATION METHOD

PORTABLE INTERFEROMETRIC DEVICE

MULTI-FUNCTIONED OPTICAL MEASUREMENT DEVICE AND METHOD FOR OPTICALL...

Light microscope and method for image recording using a light micro...

Hybrid Telescope for Optical Beam Delivery and Related Systems and...

MEASUREMENT APPARATUS

THREE-DIMENSIONAL OPTICAL COHERENCE TOMOGRAPHY CONFOCAL IMAGING APP...

METHOD AND APPARATUS FOR INTERFEROMETRY

DEVICE AND METHOD FOR ACQUIRING POSITION WITH A CONFOCAL FABRY-PERO...

Optical object measurement apparatus

Optical coherence tomography apparatus

DEVICE FOR OPTICALLY MEASURING AN OBJECT

APPARATUS AND METHOD FOR JOINT MEASUREMENTS OF CONJUGATED QUADRATUR...

Method and Assembly for Confocal, Chromatic, Interferometric and Sp...

Device and method for the non-invasive detection and measurement of...

Apparatus and methods for overlay, alignment mark, and critical dim...

Apparatus and method for joint measurements of conjugated quadratur...

Apparatus and method for measurement of fields of backscattered and...

Apparatus and method for joint measurement of fields of scattered/r...

Two-wavelength confocal interferometer for measuring multiple surfaces