Connection or disconnection of sub-entities or redundant parts of a device in response to a measurement

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HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements

Current Industry

H01L22/22Connection or disconnection of sub-entities or redundant parts of a device in response to a measurement

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Display panel and test method thereof
- Patent number 12,322,664
- Issue date Jun 3, 2025
- Samsung Display Co., Ltd.
- Hae Kwan Seo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device and manufacturing method thereof
- Patent number 12,308,296
- Issue date May 20, 2025
- Innolux Corporation
- Cheng-Chi Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light-emitting diode testing circuit, light-emitting diode testing...
- Patent number 12,288,831
- Issue date Apr 29, 2025
- Epistar Corporation
- Chia-Chen Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of repairing through-electrodes, repair device performing th...
- Patent number 12,283,529
- Issue date Apr 22, 2025
- Samsung Electronics Co., Ltd.
- Sungho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked semiconductor device test circuits and methods of use
- Patent number 12,283,531
- Issue date Apr 22, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jen-Yuan Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing display device and display device manufact...
- Patent number 12,278,223
- Issue date Apr 15, 2025
- Semiconductor Energy Laboratory Co., Ltd.
- Yosuke Tsukamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tandem micro-light emitting diode redundancy architecture
- Patent number 12,254,799
- Issue date Mar 18, 2025
- Apple Inc.
- Thomas Charisoulis
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
TSV check circuit with replica path
- Patent number 12,224,275
- Issue date Feb 11, 2025
- Micron Technology, Inc.
- Harutaka Makabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for welding cell strings and series welding machine
- Patent number 12,199,208
- Issue date Jan 14, 2025
- ZHEJIANG JINKO SOLAR CO., LTD
- Hao Jin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for detecting resistance of side trace of display substrate...
- Patent number 12,198,989
- Issue date Jan 14, 2025
- BOE Technology Group Co., Ltd.
- Li Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer manufacturing method and laminated device chip manufacturing...
- Patent number 12,198,990
- Issue date Jan 14, 2025
- Disco Corporation
- Youngsuk Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device and manufacturing method thereof
- Patent number 12,183,721
- Issue date Dec 31, 2024
- INNOLUX CORPORATION
- Jian-Jung Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor chip integrated device manufacturing method, semicond...
- Patent number 12,176,463
- Issue date Dec 24, 2024
- ULDTEC CO., LTD.
- Motonobu Takeya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for processing memory device
- Patent number 12,174,737
- Issue date Dec 24, 2024
- ESSENCORE LIMITED
- Chan Ho Sohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for manufacturing electronic device
- Patent number 12,148,630
- Issue date Nov 19, 2024
- Innolux Corporation
- Yeong-E Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of electronic element module
- Patent number 12,132,144
- Issue date Oct 29, 2024
- PlayNitride Display Co., Ltd.
- Bo-Wei Wu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Adhesion device, micro device optical inspection and repairing equi...
- Patent number 12,131,961
- Issue date Oct 29, 2024
- PlayNitride Display Co., Ltd.
- Cheng-Cian Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System on wafer assembly structure and assembly method thereof
- Patent number 12,112,991
- Issue date Oct 8, 2024
- ZHEJIANG LAB
- Qingwen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selectable-repairing micro light emitting diode display and repairi...
- Patent number 12,094,999
- Issue date Sep 17, 2024
- PlayNitride Display Co., Ltd.
- Kuan-Yung Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-dispersion component in an electronic chip
- Patent number 12,087,683
- Issue date Sep 10, 2024
- STMicroelectronics (Rousset) SAS
- François Tailliet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Module for removing mis-assembled semiconductor light-emitting elem...
- Patent number 12,046,484
- Issue date Jul 23, 2024
- LG Electronics Inc.
- Juchan Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for suppressing material warpage by increasing gas density
- Patent number 12,040,239
- Issue date Jul 16, 2024
- ABLEPRINT TECHNOLOGY CO., LTD.
- Chih-Horng Horng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Mid-manufacturing semiconductor wafer layer testing
- Patent number 12,033,902
- Issue date Jul 9, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Feng-Chien Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mounting substrate and electronic apparatus
- Patent number 12,027,429
- Issue date Jul 2, 2024
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Akiyoshi Aoyagi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Methods of forming semiconductor device packages having alignment m...
- Patent number 12,020,997
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chen-Hua Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display device, substrate for display device and method for repairi...
- Patent number 11,978,823
- Issue date May 7, 2024
- Seoul Semiconductor Co., Ltd.
- Motonobu Takeya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display substrate and method for detecting broken fanout wire of di...
- Patent number 11,972,989
- Issue date Apr 30, 2024
- BOE Technology Group Co., Ltd.
- Li Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display device, and tiled display device including the display device
- Patent number 11,961,822
- Issue date Apr 16, 2024
- Samsung Display Co., Ltd.
- Hyun Joon Kim
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method for welding cell strings and series welding machine
- Patent number 11,949,033
- Issue date Apr 2, 2024
- JINKO SOLAR CO., LTD.
- Hao Jin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Stacked semiconductor device test circuits and methods of use
- Patent number 11,935,798
- Issue date Mar 19, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jen-Yuan Chang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE PERFORMING TH...
- Publication number 20250226268
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Sungho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPONENT PROCESSING APPARATUS
- Publication number 20250218830
- Publication date Jul 3, 2025
- PlayNitride Display Co., Ltd.
- Yen-Mu Chen
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
STACKED SEMICONDUCTOR DEVICE TEST CIRCUITS AND METHODS OF USE
- Publication number 20250218876
- Publication date Jul 3, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jen-Yuan CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE FOR MONITORING HYBRID BONDS IN A SEMICONDUCTOR CHIP PACKAGE
- Publication number 20250201638
- Publication date Jun 19, 2025
- International Business Machines Corporation
- Nicholas Alexander POLOMOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method For Manufacturing Display Device and Display Device Manufact...
- Publication number 20250158000
- Publication date May 15, 2025
- SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Yosuke TSUKAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR SUBSTRATE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20250107171
- Publication date Mar 27, 2025
- Proterial, Ltd.
- Sadahiko KONDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20250079412
- Publication date Mar 6, 2025
- Innolux Corporation
- Jian-Jung Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING ELECTRONIC DEVICE
- Publication number 20250046623
- Publication date Feb 6, 2025
- InnoLux Corporation
- Yeong-E CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MID-MANUFACTURING SEMICONDUCTOR WAFER LAYER TESTING
- Publication number 20240395638
- Publication date Nov 28, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Feng-Chien Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOUNTING DEVICE AND MOUNTING METHOD
- Publication number 20240371657
- Publication date Nov 7, 2024
- TORAY ENGINEERING CO., LTD.
- Shimpei AOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROLED DEFECT MANAGEMENT
- Publication number 20240347398
- Publication date Oct 17, 2024
- VueReal Inc.
- Gholamreza CHAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PROCESSING MEMORY DEVICE
- Publication number 20240338313
- Publication date Oct 10, 2024
- ESSENCORE Limited
- Chan Ho SOHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHT EMITTING DEVICE AND METHOD OF MANUFACTURING SAME
- Publication number 20240332247
- Publication date Oct 3, 2024
- Nichia Corporation.
- Hiroaki KAGEYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE, AND TILED DISPLAY DEVICE INCLUDING THE DISPLAY DEVICE
- Publication number 20240290753
- Publication date Aug 29, 2024
- SAMSUNG DISPLAY CO., LTD.
- Hyun Joon KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER MARKING METHOD, METHOD OF PRODUCING NITRIDE SEMICONDUCTOR DEV...
- Publication number 20240274452
- Publication date Aug 15, 2024
- Shin-Etsu Handotai Co., Ltd.
- Kazunori HAGIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE FOR DETECTING DEFECT IN SEMICONDUCTOR PACKAGE AND...
- Publication number 20240274480
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- HYEON JOON KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TRANSFERRING MICRO SEMICONDUCTOR CHIP AND TRANSFERRING ST...
- Publication number 20240234219
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Youngtek OH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MANUFACTURING APPARATUS AND METHOD FOR CONTROLLING OP...
- Publication number 20240203768
- Publication date Jun 20, 2024
- EBARA CORPORATION
- Kazuma IDEGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGE STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20240186193
- Publication date Jun 6, 2024
- Advanced Semiconductor Engineering, Inc.
- Chen-Chao WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20240178076
- Publication date May 30, 2024
- InnoLux Corporation
- Chia-Hsiung Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STACKED SEMICONDUCTOR DEVICE TEST CIRCUITS AND METHODS OF USE
- Publication number 20240178078
- Publication date May 30, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jen-Yuan CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH PIXEL DENSITY STRUCTURES AND METHODS OF MAKING
- Publication number 20240154070
- Publication date May 9, 2024
- Applied Materials, Inc.
- Lisong Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT-EMITTING DIODE TESTING CIRCUIT, LIGHT-EMITTING DIODE TESTING...
- Publication number 20240120437
- Publication date Apr 11, 2024
- EPISTAR CORPORATION
- Chia-Chen TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF ELECTRONIC ELEMENT MODULE
- Publication number 20240097067
- Publication date Mar 21, 2024
- PlayNitride Display Co., Ltd.
- Bo-Wei Wu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
SEMICONDUCTOR CHIP AND METHOD FOR PRODUCING SEMICONDUCTOR PACKAGE I...
- Publication number 20240096714
- Publication date Mar 21, 2024
- Samsung Electronics Co., Ltd.
- Kyungsoo LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20240096857
- Publication date Mar 21, 2024
- Innolux Corporation
- Jian-Jung Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE, SUBSTRATE FOR DISPLAY DEVICE AND METHOD FOR REPAIRI...
- Publication number 20240088324
- Publication date Mar 14, 2024
- SEOUL SEMICONDUCTOR CO., LTD.
- Motonobu TAKEYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER SEMICONDUCTOR MODULE, METHOD FOR MANUFACTURING THE SAME AND E...
- Publication number 20240079279
- Publication date Mar 7, 2024
- Hitachi Energy Switzerland AG
- Slavo KICIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR TRIMMING MICRO ELECTRONIC ELEMENT
- Publication number 20240071992
- Publication date Feb 29, 2024
- PlayNitride Display Co., Ltd.
- Yen-Mu Chen
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SACRIFICIAL LAYER FOR SUBSTRATE ANALYSIS
- Publication number 20240055305
- Publication date Feb 15, 2024
- Intel Corporation
- Santosh TRIPATHI
- H01 - BASIC ELECTRIC ELEMENTS

Connection or disconnection of sub-entities or redundant parts of a device in response to a measurement

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Display panel and test method thereof

Electronic device and manufacturing method thereof

Light-emitting diode testing circuit, light-emitting diode testing...

Method of repairing through-electrodes, repair device performing th...

Stacked semiconductor device test circuits and methods of use

Method for manufacturing display device and display device manufact...

Tandem micro-light emitting diode redundancy architecture

TSV check circuit with replica path

Method for welding cell strings and series welding machine

Method for detecting resistance of side trace of display substrate...

Wafer manufacturing method and laminated device chip manufacturing...

Electronic device and manufacturing method thereof

Semiconductor chip integrated device manufacturing method, semicond...

Method for processing memory device

Method for manufacturing electronic device

Manufacturing method of electronic element module

Adhesion device, micro device optical inspection and repairing equi...

System on wafer assembly structure and assembly method thereof

Selectable-repairing micro light emitting diode display and repairi...

Low-dispersion component in an electronic chip

Module for removing mis-assembled semiconductor light-emitting elem...

Method for suppressing material warpage by increasing gas density

Mid-manufacturing semiconductor wafer layer testing

Mounting substrate and electronic apparatus

Methods of forming semiconductor device packages having alignment m...

Display device, substrate for display device and method for repairi...

Display substrate and method for detecting broken fanout wire of di...

Display device, and tiled display device including the display device

Method for welding cell strings and series welding machine

Stacked semiconductor device test circuits and methods of use

Patents Applicationslast 30 patents

METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE PERFORMING TH...

COMPONENT PROCESSING APPARATUS

STACKED SEMICONDUCTOR DEVICE TEST CIRCUITS AND METHODS OF USE

STRUCTURE FOR MONITORING HYBRID BONDS IN A SEMICONDUCTOR CHIP PACKAGE

Method For Manufacturing Display Device and Display Device Manufact...

SEMICONDUCTOR SUBSTRATE AND METHOD OF MANUFACTURING THE SAME

ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF

METHOD FOR MANUFACTURING ELECTRONIC DEVICE

MID-MANUFACTURING SEMICONDUCTOR WAFER LAYER TESTING

MOUNTING DEVICE AND MOUNTING METHOD

MICROLED DEFECT MANAGEMENT

METHOD FOR PROCESSING MEMORY DEVICE

LIGHT EMITTING DEVICE AND METHOD OF MANUFACTURING SAME

DISPLAY DEVICE, AND TILED DISPLAY DEVICE INCLUDING THE DISPLAY DEVICE

WAFER MARKING METHOD, METHOD OF PRODUCING NITRIDE SEMICONDUCTOR DEV...

ELECTRONIC DEVICE FOR DETECTING DEFECT IN SEMICONDUCTOR PACKAGE AND...

METHOD OF TRANSFERRING MICRO SEMICONDUCTOR CHIP AND TRANSFERRING ST...

SEMICONDUCTOR MANUFACTURING APPARATUS AND METHOD FOR CONTROLLING OP...

SEMICONDUCTOR PACKAGE STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING THE SAME

STACKED SEMICONDUCTOR DEVICE TEST CIRCUITS AND METHODS OF USE

HIGH PIXEL DENSITY STRUCTURES AND METHODS OF MAKING

LIGHT-EMITTING DIODE TESTING CIRCUIT, LIGHT-EMITTING DIODE TESTING...

MANUFACTURING METHOD OF ELECTRONIC ELEMENT MODULE

SEMICONDUCTOR CHIP AND METHOD FOR PRODUCING SEMICONDUCTOR PACKAGE I...

ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF

DISPLAY DEVICE, SUBSTRATE FOR DISPLAY DEVICE AND METHOD FOR REPAIRI...

POWER SEMICONDUCTOR MODULE, METHOD FOR MANUFACTURING THE SAME AND E...

METHOD AND APPARATUS FOR TRIMMING MICRO ELECTRONIC ELEMENT

SACRIFICIAL LAYER FOR SUBSTRATE ANALYSIS