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Testing or measuring during manufacture or treatment; Reliability measurements
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Industry
CPC
H01L22/00
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
H
ELECTRICITY
H01
Electric elements
H01L
SEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
Current Industry
H01L22/00
Testing or measuring during manufacture or treatment; Reliability measurements
Sub Industries
H01L22/10
Measuring as part of the manufacturing process
H01L22/12
for structural parameters
H01L22/14
for electrical parameters
H01L22/20
Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
H01L22/22
Connection or disconnection of sub-entities or redundant parts of a device in response to a measurement
H01L22/24
Optical enhancement of defects or not directly visible states
H01L22/26
Acting in response to an ongoing measurement without interruption of processing
H01L22/30
Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
H01L22/32
Additional lead-in metallisation on a device or substrate
H01L22/34
Circuits for electrically characterising or monitoring manufacturing processes
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