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Constructional arrangements for compensating for fluctuations caused by humidity, pressure or electromagnetic waves; Controlling the atmosphere inside a pyrometer
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G01J5/0285
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PHYSICS
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Measuring instruments
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MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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Radiation pyrometry
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G01J5/0285
Constructional arrangements for compensating for fluctuations caused by humidity, pressure or electromagnetic waves; Controlling the atmosphere inside a pyrometer
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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Issue date
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H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Issue date
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H01 - BASIC ELECTRIC ELEMENTS
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Patent number
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Issue date
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B81 - MICRO-STRUCTURAL TECHNOLOGY
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Substrate holder, lithographic apparatus, device manufacturing meth...
Patent number
10,018,924
Issue date
Jul 10, 2018
ASML Netherlands B.V.
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G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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IR sensor for IR sensing based on power control
Patent number
9,989,409
Issue date
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Melexis Technologies NV
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G01 - MEASURING TESTING
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Method for monitoring and control of torrefaction temperature
Patent number
9,926,507
Issue date
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BIOENDEV AB
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G05 - CONTROLLING REGULATING
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Patent number
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Issue date
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G01 - MEASURING TESTING
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Bolometric detector with a compensation bolometer having an enhance...
Patent number
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Issue date
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Commissariat a l'Energie Atomique et aux Energies Alternatives
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G01 - MEASURING TESTING
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Issue date
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G01 - MEASURING TESTING
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Patent number
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H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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G01 - MEASURING TESTING
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Issue date
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B81 - MICRO-STRUCTURAL TECHNOLOGY
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G01 - MEASURING TESTING
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Issue date
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Issue date
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Commissariat a l'Energie Atomique et Aux Energies Alternatives
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G01 - MEASURING TESTING
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Issue date
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G01 - MEASURING TESTING
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Issue date
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G01 - MEASURING TESTING
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Emmissivity test instrument for overhead electrical transmission an...
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Issue date
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G01 - MEASURING TESTING
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Issue date
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Publication date
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G01 - MEASURING TESTING
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Publication date
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Publication date
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Publication date
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Publication date
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TURBOCHEF TECHNOLOGIES, INC.
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G01 - MEASURING TESTING
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Publication number
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Publication date
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Commissariat A L'Energie Atomique et Aux Energies Alternatives
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Patent Application
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Publication number
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Publication date
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BIOENDEV AB
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G01 - MEASURING TESTING
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Patent Application
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Publication number
20140175590
Publication date
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Raytheon Company
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B81 - MICRO-STRUCTURAL TECHNOLOGY
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Publication number
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Publication date
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EXCELITAS TECHNOLOGIES SINGAPORE PTE. LTD.
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G01 - MEASURING TESTING
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Publication number
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Publication date
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NEC Tokin Corporation
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G01 - MEASURING TESTING
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Publication number
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Publication date
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G01 - MEASURING TESTING
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Publication number
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Publication date
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G01 - MEASURING TESTING
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Publication number
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Publication date
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G01 - MEASURING TESTING
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Publication date
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Commissariat A L'Energie Atomique et Aux Energies Alternatives
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G01 - MEASURING TESTING
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Patent Application
ELECTROMAGNETIC INTERFERENCE PROTECTION STRUCTURE
Publication number
20130221219
Publication date
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Raytheon Company
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G01 - MEASURING TESTING
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Patent Application
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Publication number
20130112876
Publication date
May 9, 2013
Samsung Electronics Co., Ltd.
Sung-hyun NAM
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Application
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Publication number
20130028286
Publication date
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Mattson Technology, Inc.
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G01 - MEASURING TESTING
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Patent Application
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Publication number
20120212725
Publication date
Aug 23, 2012
ASML NETHERLANDS B.V.
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G01 - MEASURING TESTING
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Patent Application
PYROELECTRIC DETECTOR, PYROELECTRIC DETECTION DEVICE, AND ELECTRONI...
Publication number
20120211857
Publication date
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SEIKO EPSON CORPORATION
Takafumi NODA
G01 - MEASURING TESTING
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Patent Application
DEVICE FOR DETECTING ELECTROMAGNETIC RADIATION
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20120097853
Publication date
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Commissariat A L'Energie Atomique et Aux Energies Alternatives
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G01 - MEASURING TESTING
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Patent Application
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SEIKO EPSON CORPORATION
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G01 - MEASURING TESTING
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Patent Application
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Publication number
20110216803
Publication date
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MATTSON TECHNOLOGY, INC.
Paul Janis Timans
G01 - MEASURING TESTING
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Patent Application
ELECTRONIC DEVICE
Publication number
20110061449
Publication date
Mar 17, 2011
Kabushiki Kaisha Toshiba
Hitoshi YAGI
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Application
APPARATUS HAVING A SCREENED STRUCTURE FOR DETECTING THERMAL RADIATION
Publication number
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Publication date
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G01 - MEASURING TESTING
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Patent Application
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G01 - MEASURING TESTING
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Patent Application
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Publication date
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G01 - MEASURING TESTING
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Patent Application
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G01 - MEASURING TESTING
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Patent Application
Heat Detector
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G08 - SIGNALLING
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Patent Application
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20080251722
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