Contact-mode AFM

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CPC
G01Q60/363

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/363Contact-mode AFM

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope and a method for operating thereof
- Patent number 11,402,404
- Issue date Aug 2, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Jan Jacobus Benjamin Biemond
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring the absorption of a laser emission by a sample
- Patent number 11,237,105
- Issue date Feb 1, 2022
- Centre National de la Recherche Scientifique
- Alexandre Dazzi
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy tips for interconnection
- Patent number 10,989,735
- Issue date Apr 27, 2021
- Facebook Technologies, LLC
- Ali Sengül
- G01 - MEASURING TESTING
Information Patent Grant
Method for in-line measurement of quality of microarray
- Patent number 10,732,166
- Issue date Aug 4, 2020
- Centrillion Technologies Taiwan Co. LTD.
- Tzu-Kun Ku
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,712,363
- Issue date Jul 14, 2020
- Hitachi High-Tech Science Corporation
- Masayuki Iwasa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for the volumetric analysis of an organic or inorganic sample
- Patent number 10,598,692
- Issue date Mar 24, 2020
- Universite de Bourgogne
- Eric Bourillot
- G01 - MEASURING TESTING
Information Patent Grant
Wear-less operation of a material surface with a scanning probe mic...
- Patent number 9,977,050
- Issue date May 22, 2018
- SWISSLITHO AG
- Urs T. Duerig
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Automatic gain tuning in atomic force microscopy
- Patent number 9,689,891
- Issue date Jun 27, 2017
- Keysight Technologies, Inc.
- Christopher Ryan Moon
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy controller and method
- Patent number 9,229,027
- Issue date Jan 5, 2016
- Keysight Technologies, Inc.
- Christopher Ryan Moon
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic actuation and thermal cantilevers for temperature and freq...
- Patent number 8,914,911
- Issue date Dec 16, 2014
- The Board of Trustees of the University of Illinois
- William P. King
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic actuation and thermal cantilevers for temperature and freq...
- Patent number 8,533,861
- Issue date Sep 10, 2013
- The Board of Trustees of the University of Illinois
- William P. King
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Mode synthesizing atomic force microscopy and mode-synthesizing sen...
- Patent number 8,448,261
- Issue date May 21, 2013
- University of Tennessee Research Foundation
- Ali Passian
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope apparatus
- Patent number 8,069,493
- Issue date Nov 29, 2011
- Yokohama National University
- Hiroshi Fujimoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for evaluating semiconductor wafer, apparatus for evaluating...
- Patent number 7,810,383
- Issue date Oct 12, 2010
- Shin-Etsu Handotai Co., Ltd.
- Keiichi Okabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscopy apparatus and techniques
- Patent number 7,093,509
- Issue date Aug 22, 2006
- The Trustees of the University of Pennsylvania
- Rui Shao
- G01 - MEASURING TESTING
Information Patent Grant
Dual cantilever scanning probe microscope
- Patent number 6,028,305
- Issue date Feb 22, 2000
- Board of Trustees of the Leland Stanford Jr. University
- Stephen C. Minne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Two dimensional profiling with a contact force atomic force microscope
- Patent number 5,347,854
- Issue date Sep 20, 1994
- International Business Machines Corporation
- Yves Martin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope
- Patent number 5,329,808
- Issue date Jul 19, 1994
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope
- Patent number 5,237,859
- Issue date Aug 24, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope
- Patent number 5,224,376
- Issue date Jul 6, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION
- Publication number 20220163559
- Publication date May 26, 2022
- attocube systems AG
- Alexander A. GOVYADINOV
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR MEASURING THE ABSORPTION OF A LASER EMISSION BY A SAMPLE
- Publication number 20210341385
- Publication date Nov 4, 2021
- Centre National de la Recherche Scientifique
- Alexandre DAZZI
- G01 - MEASURING TESTING
Information Patent Application
A SCANNING PROBE MICROSCOPE AND A METHOD FOR OPERATING THEREOF
- Publication number 20210311090
- Publication date Oct 7, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Jan Jacobus Benjamin BIEMOND
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY TIPS FOR INTERCONNECTION
- Publication number 20210055327
- Publication date Feb 25, 2021
- Facebook Technologies, LLC
- Ali Sengül
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190234992
- Publication date Aug 1, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masayuki IWASA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR THE VOLUMETRIC ANALYSIS OF AN ORGANIC OR INORGANIC SAMPLE
- Publication number 20190227098
- Publication date Jul 25, 2019
- UNIVERSITE DE BOURGOGNE
- Eric Bourillot
- G01 - MEASURING TESTING
Information Patent Application
MODE-SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SEN...
- Publication number 20140020141
- Publication date Jan 16, 2014
- University of Tennessee Research Foundation
- Ali Passian
- B82 - NANO-TECHNOLOGY
Information Patent Application
ATOMIC FORCE MICROSCOPY CONTROLLER AND METHOD
- Publication number 20130333076
- Publication date Dec 12, 2013
- AGILENT TECHNOLOGIES ,INC.
- Christopher Ryan Moon
- B82 - NANO-TECHNOLOGY
Information Patent Application
Magnetic Actuation and Thermal Cantilevers for Temperature and Freq...
- Publication number 20130276175
- Publication date Oct 17, 2013
- William P. King
- B82 - NANO-TECHNOLOGY
Information Patent Application
Magnetic Actuation and Thermal Cantilevers for Temperature and Freq...
- Publication number 20130047303
- Publication date Feb 21, 2013
- William P. King
- B82 - NANO-TECHNOLOGY
Information Patent Application
AUTOMATIC GAIN TUNING IN ATOMIC FORCE MICROSCOPY
- Publication number 20120304343
- Publication date Nov 29, 2012
- AGILENT TECHNOLOGIES, INC.
- Christopher Ryan MOON
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR AUTOMATIC ADJUSTMENT OF THE APPLIED FORCE AND CONTROL OF...
- Publication number 20110314577
- Publication date Dec 22, 2011
- Simon Scheuring
- G01 - MEASURING TESTING
Information Patent Application
MODE SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SEN...
- Publication number 20110231965
- Publication date Sep 22, 2011
- Ali Passian
- G01 - MEASURING TESTING
Information Patent Application
WEAR-LESS OPERATION OF A MATERIAL SURFACE WITH A SCANNING PROBE MIC...
- Publication number 20110113517
- Publication date May 12, 2011
- International Business Machines Corporation
- Urs T. Duerig
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE APPARATUS
- Publication number 20100115674
- Publication date May 6, 2010
- YOKOHAMA NATIONAL UNIVERSITY
- Hiroshi Fujimoto
- G01 - MEASURING TESTING
Information Patent Application
Method for Evaluating Semiconductor Wafer, Apparatus for Evaluating...
- Publication number 20080166823
- Publication date Jul 10, 2008
- Keiichi Okabe
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy apparatus and techniques
- Publication number 20050262930
- Publication date Dec 1, 2005
- Rui Shao
- G01 - MEASURING TESTING

Contact-mode AFM

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Scanning probe microscope and a method for operating thereof

System for measuring the absorption of a laser emission by a sample

Atomic force microscopy tips for interconnection

Method for in-line measurement of quality of microarray

Scanning probe microscope

Device for the volumetric analysis of an organic or inorganic sample

Wear-less operation of a material surface with a scanning probe mic...

Automatic gain tuning in atomic force microscopy

Atomic force microscopy controller and method

Magnetic actuation and thermal cantilevers for temperature and freq...

Magnetic actuation and thermal cantilevers for temperature and freq...

Mode synthesizing atomic force microscopy and mode-synthesizing sen...

Atomic force microscope apparatus

Method for evaluating semiconductor wafer, apparatus for evaluating...

Scanning probe microscopy apparatus and techniques

Dual cantilever scanning probe microscope

Two dimensional profiling with a contact force atomic force microscope

Atomic force microscope

Atomic force microscope

Atomic force microscope

Patents Applicationslast 30 patents

ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION

SYSTEM FOR MEASURING THE ABSORPTION OF A LASER EMISSION BY A SAMPLE

A SCANNING PROBE MICROSCOPE AND A METHOD FOR OPERATING THEREOF

ATOMIC FORCE MICROSCOPY TIPS FOR INTERCONNECTION

SCANNING PROBE MICROSCOPE

DEVICE FOR THE VOLUMETRIC ANALYSIS OF AN ORGANIC OR INORGANIC SAMPLE

MODE-SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SEN...

ATOMIC FORCE MICROSCOPY CONTROLLER AND METHOD

Magnetic Actuation and Thermal Cantilevers for Temperature and Freq...

Magnetic Actuation and Thermal Cantilevers for Temperature and Freq...

AUTOMATIC GAIN TUNING IN ATOMIC FORCE MICROSCOPY

METHOD FOR AUTOMATIC ADJUSTMENT OF THE APPLIED FORCE AND CONTROL OF...

MODE SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SEN...

WEAR-LESS OPERATION OF A MATERIAL SURFACE WITH A SCANNING PROBE MIC...

ATOMIC FORCE MICROSCOPE APPARATUS

Method for Evaluating Semiconductor Wafer, Apparatus for Evaluating...

Scanning probe microscopy apparatus and techniques