contacting one object by grazing incidence

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CPC
G01B9/02022

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

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G01B9/02022contacting one object by grazing incidence

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Metrology and profilometry using light field generator
- Patent number 11,092,427
- Issue date Aug 17, 2021
- The Charles Stark Draper Laboratory, Inc.
- Steven J. Byrnes
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and method for measurements of samples
- Patent number 10,739,277
- Issue date Aug 11, 2020
- Nova Measuring Instruments Ltd.
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Grant
Optical interferometer
- Patent number 10,670,461
- Issue date Jun 2, 2020
- Hamamatsu Photonics K.K.
- Yoshihisa Warashina
- G01 - MEASURING TESTING
Information Patent Grant
Method for phase resolved heterodyne shearographic measurements
- Patent number 10,473,452
- Issue date Nov 12, 2019
- UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF THE ARMY
- James D. Perea
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring three-dimensional shape using prism
- Patent number 10,180,315
- Issue date Jan 15, 2019
- Koh Young Technology Inc.
- Jong Kyu Hong
- G02 - OPTICS
Information Patent Grant
Precision surface measurement in a vacuum
- Patent number 10,151,574
- Issue date Dec 11, 2018
- UChicago Argonne, LLC
- Raymond P. Conley
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for phase resolved heterodyne shearographic me...
- Patent number 10,088,292
- Issue date Oct 2, 2018
- The United States of America, as represented by the Secretary of the Army
- James D. Perea
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measuring device with detectors set at different an...
- Patent number 10,018,460
- Issue date Jul 10, 2018
- Polytec GmbH
- Matthias Schussler
- G01 - MEASURING TESTING
Information Patent Grant
Three-DOF heterodyne grating interferometer displacement measuremen...
- Patent number 9,903,704
- Issue date Feb 27, 2018
- Tsinghua University
- Yu Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous refractive index and thickness measurements with a mon...
- Patent number 9,696,138
- Issue date Jul 4, 2017
- University of Florida Research Foundation, Inc.
- Xiaoke Wan
- G01 - MEASURING TESTING
Information Patent Grant
Grazing-incidence interferometer with dual-side measurement capabil...
- Patent number 9,651,358
- Issue date May 16, 2017
- Corning Incorporated
- Joshua Monroe Cobb
- G01 - MEASURING TESTING
Information Patent Grant
Grazing incidence interferometer
- Patent number 9,644,941
- Issue date May 9, 2017
- Mitutoyo Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Displacement detecting device
- Patent number 9,612,104
- Issue date Apr 4, 2017
- DMG MORI SEIKI CO., LTD.
- Hideaki Tamiya
- G01 - MEASURING TESTING
Information Patent Grant
Device for distance measurement
- Patent number 9,400,168
- Issue date Jul 26, 2016
- Dr. Johannes Heidenhain GmbH
- Walter Huber
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus for calculation of substrate tilt, exposure a...
- Patent number 9,164,405
- Issue date Oct 20, 2015
- Canon Kabushiki Kaisha
- Ryo Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Displacement detecting device
- Patent number 9,074,861
- Issue date Jul 7, 2015
- DMG MORI SEIKI CO., LTD.
- Hideaki Tamiya
- G01 - MEASURING TESTING
Information Patent Grant
Device for determining distance interferometrically
- Patent number 9,068,811
- Issue date Jun 30, 2015
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Grazing incidence interferometer
- Patent number 8,913,250
- Issue date Dec 16, 2014
- Mitutoyo Corporation
- Reiya Ootao
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and exposure device
- Patent number 8,902,430
- Issue date Dec 2, 2014
- Canon Kabushiki Kaisha
- Wataru Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Height measurement apparatus, exposure apparatus, and device fabric...
- Patent number 8,593,615
- Issue date Nov 26, 2013
- Canon Kabushiki Kaisha
- Ryo Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Optical imaging for optical device inspection
- Patent number 8,537,367
- Issue date Sep 17, 2013
- Luna Innovations Incorporated
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus, exposure apparatus, and device fabrication m...
- Patent number 8,514,406
- Issue date Aug 20, 2013
- Canon Kabushiki Kaisha
- Hideki Matsuda
- G01 - MEASURING TESTING
Information Patent Grant
Optical imaging apparatus and method
- Patent number 8,493,568
- Issue date Jul 23, 2013
- NATIONAL TAIWAN UNIVERSITY
- Yu-Ta Wang
- G01 - MEASURING TESTING
Information Patent Grant
Grazing incidence interferometer
- Patent number 8,441,650
- Issue date May 14, 2013
- Mitutoyo Corporation
- Yutaka Kuriyama
- G01 - MEASURING TESTING
Information Patent Grant
Reticle inspection systems and method
- Patent number 8,189,203
- Issue date May 29, 2012
- ASML Holding N.V.
- Yevgeniy Konstantinovich Shmarev
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for interferometric analysis of surfaces and re...
- Patent number 8,107,085
- Issue date Jan 31, 2012
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Linear-carrier phase-mask interferometer
- Patent number 7,777,895
- Issue date Aug 17, 2010
- 4D Technology Corporation
- Brian S. Medower
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Position sensing apparatus, and position sensing method
- Patent number 7,701,587
- Issue date Apr 20, 2010
- Canon Kabushiki Kaisha
- Michinori Shioda
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry method and system including spectral decomposition
- Patent number 7,636,168
- Issue date Dec 22, 2009
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for interferometric analysis of surfaces and re...
- Patent number 7,586,620
- Issue date Sep 8, 2009
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A S...
- Publication number 20230168082
- Publication date Jun 1, 2023
- COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN
- BASTIEN GRIMALDI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A S...
- Publication number 20230168083
- Publication date Jun 1, 2023
- COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN
- BASTIEN GRIMALDI
- G01 - MEASURING TESTING
Information Patent Application
WIDE FIELD-OF-VIEW MICHELSON FOR SHEAROGRAPHY
- Publication number 20220011089
- Publication date Jan 13, 2022
- BAE SYSTEMS Information and Electronic Systems Integration Inc.
- Jacob D. Garan
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY AND PROFILOMETRY USING LIGHT FIELD GENERATOR
- Publication number 20200096315
- Publication date Mar 26, 2020
- The Charles Stark Draper Laboratory, Inc.
- Steven J. Byrnes
- G01 - MEASURING TESTING
Information Patent Application
Method for Phase Resolved Heterodyne Shearographic Measurements
- Publication number 20190011247
- Publication date Jan 10, 2019
- UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF THE ARMY
- James D. Perea
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Phase Resolved Heterodyne Shearographic Me...
- Publication number 20180224266
- Publication date Aug 9, 2018
- UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF THE ARMY
- James D. Perea
- G01 - MEASURING TESTING
Information Patent Application
PRECISION SURFACE MEASUREMENT IN A VACUUM
- Publication number 20180017372
- Publication date Jan 18, 2018
- UChicago Argonne, LLC
- Raymond P. CONLEY
- G01 - MEASURING TESTING
Information Patent Application
GRAZING INCIDENCE INTERFEROMETER
- Publication number 20150241201
- Publication date Aug 27, 2015
- MITUTOYO CORPORATION
- Yoshimasa SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
GRAZING INCIDENCE INTERFEROMETER
- Publication number 20150226538
- Publication date Aug 13, 2015
- MITUTOYO CORPORATION
- Reiya OTAO
- G01 - MEASURING TESTING
Information Patent Application
GRAZING-INCIDENCE INTERFEROMETER WITH DUAL-SIDE MEASUREMENT CAPABILITY
- Publication number 20150049337
- Publication date Feb 19, 2015
- Corning Incorporated
- Joshua Monroe Cobb
- G01 - MEASURING TESTING
Information Patent Application
SIMULTANEOUS REFRACTIVE INDEX AND THICKNESS MEASUREMENTS WITH A MON...
- Publication number 20140168637
- Publication date Jun 19, 2014
- University of Florida Research Foundation, Inc.
- Xiaoke Wan
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR DISTANCE MEASUREMENT
- Publication number 20130335746
- Publication date Dec 19, 2013
- Walter Huber
- G01 - MEASURING TESTING
Information Patent Application
Displacement Detecting Device
- Publication number 20130250307
- Publication date Sep 26, 2013
- MORI SEIKI CO., LTD.
- Hideaki TAMIYA
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-MODE OPTICAL FIBER-BASED ANGLE-RESOLVED LOW COHERENCE INTERF...
- Publication number 20130128264
- Publication date May 23, 2013
- DUKE UNIVERSITY
- Adam Wax
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR INTERFEROMETRIC MEASURING OF AN OBJECT
- Publication number 20130107276
- Publication date May 2, 2013
- Polytec GmbH
- Matthias Schussler
- G01 - MEASURING TESTING
Information Patent Application
Device for Determining Distance Interferometrically
- Publication number 20130057872
- Publication date Mar 7, 2013
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY-BASED STRESS ANALYSIS
- Publication number 20130003152
- Publication date Jan 3, 2013
- United Technologies Corporation
- Igor V. Belousov
- G01 - MEASURING TESTING
Information Patent Application
GRAZING INCIDENCE INTERFEROMETER
- Publication number 20120327425
- Publication date Dec 27, 2012
- Mitutoyo Corporation
- Reiya Ootao
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL IMAGING FOR OPTICAL DEVICE INSPECTION
- Publication number 20110273719
- Publication date Nov 10, 2011
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND EXPOSURE DEVICE
- Publication number 20110176139
- Publication date Jul 21, 2011
- Canon Kabushiki Kaisha
- Wataru Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
GRAZING INCIDENCE INTERFEROMETER
- Publication number 20110032536
- Publication date Feb 10, 2011
- Mitutoyo Corporation
- Yutaka Kuriyama
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION M...
- Publication number 20110032503
- Publication date Feb 10, 2011
- Canon Kabushiki Kaisha
- Ryo Sasaki
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION M...
- Publication number 20110032504
- Publication date Feb 10, 2011
- Canon Kabushiki Kaisha
- Ryo Sasaki
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL IMAGING APPARATUS AND METHOD
- Publication number 20110001982
- Publication date Jan 6, 2011
- Yu-Ta Wang
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION M...
- Publication number 20100209832
- Publication date Aug 19, 2010
- Canon Kabushiki Kaisha
- Hideki Matsuda
- G01 - MEASURING TESTING
Information Patent Application
Reticle Inspection Systems and Method
- Publication number 20100149548
- Publication date Jun 17, 2010
- ASML Holding N.V.
- YEVGENIY KONSTANTINOVICH SHMAREV
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR INTERFEROMETRIC ANALYSIS OF SURFACES AND RE...
- Publication number 20100060898
- Publication date Mar 11, 2010
- PETER J. DE GROOT
- G01 - MEASURING TESTING
Information Patent Application
Oblique incidence interferometer
- Publication number 20100027028
- Publication date Feb 4, 2010
- Mitutoyo Corporation
- Yutaka Kuriyama
- G01 - MEASURING TESTING
Information Patent Application
Oblique incidence interferometer
- Publication number 20100014098
- Publication date Jan 21, 2010
- Mitutoyo Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING...
- Publication number 20090262323
- Publication date Oct 22, 2009
- Canon Kabushiki Kaisha
- Ryo Sasaki
- G01 - MEASURING TESTING

contacting one object by grazing incidence

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Metrology and profilometry using light field generator

Optical system and method for measurements of samples

Optical interferometer

Method for phase resolved heterodyne shearographic measurements

Apparatus for measuring three-dimensional shape using prism

Precision surface measurement in a vacuum

Method and apparatus for phase resolved heterodyne shearographic me...

Interferometric measuring device with detectors set at different an...

Three-DOF heterodyne grating interferometer displacement measuremen...

Simultaneous refractive index and thickness measurements with a mon...

Grazing-incidence interferometer with dual-side measurement capabil...

Grazing incidence interferometer

Displacement detecting device

Device for distance measurement

Measurement apparatus for calculation of substrate tilt, exposure a...

Displacement detecting device

Device for determining distance interferometrically

Grazing incidence interferometer

Measuring apparatus and exposure device

Height measurement apparatus, exposure apparatus, and device fabric...

Optical imaging for optical device inspection

Measurement apparatus, exposure apparatus, and device fabrication m...

Optical imaging apparatus and method

Grazing incidence interferometer

Reticle inspection systems and method

Methods and systems for interferometric analysis of surfaces and re...

Linear-carrier phase-mask interferometer

Position sensing apparatus, and position sensing method

Interferometry method and system including spectral decomposition

Methods and systems for interferometric analysis of surfaces and re...

Patents Applicationslast 30 patents

SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A S...

SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A S...

WIDE FIELD-OF-VIEW MICHELSON FOR SHEAROGRAPHY

METROLOGY AND PROFILOMETRY USING LIGHT FIELD GENERATOR

Method for Phase Resolved Heterodyne Shearographic Measurements

Method and Apparatus for Phase Resolved Heterodyne Shearographic Me...

PRECISION SURFACE MEASUREMENT IN A VACUUM

GRAZING INCIDENCE INTERFEROMETER

GRAZING INCIDENCE INTERFEROMETER

GRAZING-INCIDENCE INTERFEROMETER WITH DUAL-SIDE MEASUREMENT CAPABILITY

SIMULTANEOUS REFRACTIVE INDEX AND THICKNESS MEASUREMENTS WITH A MON...

DEVICE FOR DISTANCE MEASUREMENT

Displacement Detecting Device

SINGLE-MODE OPTICAL FIBER-BASED ANGLE-RESOLVED LOW COHERENCE INTERF...

DEVICE AND METHOD FOR INTERFEROMETRIC MEASURING OF AN OBJECT

Device for Determining Distance Interferometrically

INTERFEROMETRY-BASED STRESS ANALYSIS

GRAZING INCIDENCE INTERFEROMETER

OPTICAL IMAGING FOR OPTICAL DEVICE INSPECTION

MEASURING APPARATUS AND EXPOSURE DEVICE

GRAZING INCIDENCE INTERFEROMETER

MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION M...

MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION M...

OPTICAL IMAGING APPARATUS AND METHOD

MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION M...

Reticle Inspection Systems and Method

METHODS AND SYSTEMS FOR INTERFEROMETRIC ANALYSIS OF SURFACES AND RE...

Oblique incidence interferometer

Oblique incidence interferometer

MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING...