contacting two or more objects

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

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G01B9/02016contacting two or more objects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Optical systems with controlled mirror arrangements
- Patent number 11,841,223
- Issue date Dec 12, 2023
- Lockheed Martin Corporation
- Brian James Howley
- G01 - MEASURING TESTING
Information Patent Grant
Method of collimating atomic beam, apparatus for collimating atomic...
- Patent number 11,614,318
- Issue date Mar 28, 2023
- Japan Aviation Electronics Industry, Limited
- Mikio Kozuma
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Measurement system based on optical interference and measuring meth...
- Patent number 11,313,789
- Issue date Apr 26, 2022
- Hon Hai Precision Industry Co., Ltd.
- Li-Shing Hou
- G02 - OPTICS
Information Patent Grant
Interferometric waviness detection systems
- Patent number 11,143,503
- Issue date Oct 12, 2021
- Kimball Electronics Indiana, Inc.
- Sangtaek Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method for defect inspection of transparent substrate by integratin...
- Patent number 10,976,152
- Issue date Apr 13, 2021
- National Taiwan Normal University
- Chau-Jern Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a substrate, metrology apparatus, and lithogra...
- Patent number 10,534,274
- Issue date Jan 14, 2020
- ASML Netherlands B.V.
- Teunis Willem Tukker
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer measurement device and control method therefor
- Patent number 10,393,507
- Issue date Aug 27, 2019
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Xin Shen
- G01 - MEASURING TESTING
Information Patent Grant
Homodyne optical sensor system incorporating a multi-phase beam com...
- Patent number 10,094,648
- Issue date Oct 9, 2018
- Keysight Technologies, Inc.
- Kenneth Alan Fesler
- G02 - OPTICS
Information Patent Grant
Detection device and detection method
- Patent number 10,094,653
- Issue date Oct 9, 2018
- BOE Technology Group Co., Ltd.
- Yangkun Jing
- G01 - MEASURING TESTING
Information Patent Grant
Multi-pass optical system to improve resolution of interferometers
- Patent number 10,041,781
- Issue date Aug 7, 2018
- Southern Research Institute
- James Richard Tucker
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system and measuring method
- Patent number 9,874,435
- Issue date Jan 23, 2018
- Samsung Electronics Co., Ltd.
- Sangwook Park
- G01 - MEASURING TESTING
Information Patent Grant
Gradiometer and method of changing an optical path length to direct...
- Patent number 9,547,103
- Issue date Jan 17, 2017
- Micro-g Lacoste, Inc.
- Timothy M. Niebauer
- G01 - MEASURING TESTING
Information Patent Grant
Error measurement method and machine tool
- Patent number 9,506,745
- Issue date Nov 29, 2016
- Makino Milling Machine Co., Ltd.
- Tadashi Kasahara
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Interferometric gravimeter apparatus and method
- Patent number 9,500,766
- Issue date Nov 22, 2016
- Micro-g Lacoste, Inc.
- Timothy M. Niebauer
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric gradiometer apparatus and method
- Patent number 8,978,465
- Issue date Mar 17, 2015
- Micro-g Lacoste, Inc.
- Fred J. Klopping
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography with multiple sample arms
- Patent number 8,711,364
- Issue date Apr 29, 2014
- oProbe, LLC
- Jeffrey Brennan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Methods and systems for measuring target movement with an interfero...
- Patent number 8,223,342
- Issue date Jul 17, 2012
- Alliant Techsystems Inc.
- James R. Tucker
- G01 - MEASURING TESTING
Information Patent Grant
Vibration detection device and vibration detector
- Patent number 7,880,894
- Issue date Feb 1, 2011
- Sony Corporation
- Shoji Hirata
- G01 - MEASURING TESTING
Information Patent Grant
Motion measurement and synchronization using a scanning interferome...
- Patent number 7,787,107
- Issue date Aug 31, 2010
- AllView Research LLC
- Pierre St. Hilaire
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for measuring perpendicular translations
- Patent number 7,355,719
- Issue date Apr 8, 2008
- Agilent Technologies, Inc.
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer calibration methods and apparatus
- Patent number 7,212,292
- Issue date May 1, 2007
- Hewlett-Packard Development Company, L.P.
- Andrew L. Van Brocklin
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Interferometer calibration methods and apparatus
- Patent number 7,110,122
- Issue date Sep 19, 2006
- Hewlett-Packard Development Company, L.P.
- Andrew L. Van Brocklin
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Interferometer system for displacement and straightness measurements
- Patent number 6,519,042
- Issue date Feb 11, 2003
- Industrial Technology Research Institute
- Chien-Ming Wu
- G01 - MEASURING TESTING
Information Patent Grant
Differential displacement measuring interferometer
- Patent number 5,187,543
- Issue date Feb 16, 1993
- Zygo Corporation
- Earl W. Ebert
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MEASUREMENT SYSTEM
- Publication number 20240035801
- Publication date Feb 1, 2024
- National Cheng Kung University
- Chien-Sheng Liu
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT APPARATUS FOR MEASURING THICKNES...
- Publication number 20230349688
- Publication date Nov 2, 2023
- SANTEC CORPORATION
- Hiroyuki ITOH
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS WITH CONTROLLED MIRROR ARRANGEMENTS
- Publication number 20230266116
- Publication date Aug 24, 2023
- Lockheed Martin Corporation
- Brian James HOWLEY
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR COLLIMATING ATOMIC BEAM, ATOMIC INTERFEROMETER, AND A...
- Publication number 20230160683
- Publication date May 25, 2023
- Japan Aviation Electronics Industry, Limited
- Mikio KOZUMA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD OF COLLIMATING ATOMIC BEAM, APPARATUS FOR COLLIMATING ATOMIC...
- Publication number 20210389114
- Publication date Dec 16, 2021
- Japan Aviation Electronics Industry, Limited
- Mikio KOZUMA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
MEASUREMENT SYSTEM BASED ON OPTICAL INTERFERENCE AND MEASURING METH...
- Publication number 20210247298
- Publication date Aug 12, 2021
- HON HAI PRECISION INDUSTRY CO., LTD.
- LI-SHING HOU
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC WAVINESS DETECTION SYSTEMS
- Publication number 20200049492
- Publication date Feb 13, 2020
- Kimball Electronics Indiana, Inc.
- Sangtaek Kim
- G02 - OPTICS
Information Patent Application
Method and Apparatus for Defect Inspection of Transparent Substrate
- Publication number 20180188016
- Publication date Jul 5, 2018
- National Taiwan Normal University
- Chau-Jern Cheng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
HOMODYNE OPTICAL SENSOR SYSTEM INCORPORATING A MULTI-PHASE BEAM COM...
- Publication number 20180003480
- Publication date Jan 4, 2018
- Keysight Technologies, Inc.
- Kenneth Alan Fesler
- G02 - OPTICS
Information Patent Application
ERROR MEASUREMENT METHOD AND MACHINE TOOL
- Publication number 20140355002
- Publication date Dec 4, 2014
- MAKINO MILLING MACHINE CO., LTD.
- Tadashi Kasahara
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Interferometric Gravimeter Apparatus and Method
- Publication number 20140318239
- Publication date Oct 30, 2014
- MICRO-G LACOSTE, INC.
- Timothy M. Niebauer
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY WITH MULTIPLE SAMPLE ARMS
- Publication number 20140285811
- Publication date Sep 25, 2014
- Jeffrey Brennan
- G01 - MEASURING TESTING
Information Patent Application
Interferometric Gradiometer Apparatus and Method
- Publication number 20140224012
- Publication date Aug 14, 2014
- MICRO-G LACOSTE, INC.
- Fred J. Klopping
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY FOR NEURAL-SIGNAL APPLICATIONS
- Publication number 20110282191
- Publication date Nov 17, 2011
- oProbe, LLC
- Jeffrey Brennan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY WITH MULTIPLE IMAGING INSTRUMENTS
- Publication number 20110282331
- Publication date Nov 17, 2011
- oProbe, LLC
- Jeffrey Brennan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY WITH MULTIPLE SAMPLE ARMS
- Publication number 20110279821
- Publication date Nov 17, 2011
- oProbe, LLC
- Jeffrey Brennan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING TARGET MOVEMENT WITH AN INTERFERO...
- Publication number 20100231921
- Publication date Sep 16, 2010
- ALLIANT TECHSYSTEMS INC.
- James R. Tucker
- G01 - MEASURING TESTING
Information Patent Application
Motion measurement and synchronication using a scanning interferome...
- Publication number 20080304045
- Publication date Dec 11, 2008
- AllView Research LLC
- Pierre St. Hilaire
- G01 - MEASURING TESTING
Information Patent Application
Vibration detection device
- Publication number 20080198386
- Publication date Aug 21, 2008
- SONY CORPORATION
- Shoji Hirata
- G01 - MEASURING TESTING
Information Patent Application
Interferometer for measuring perpendicular translations
- Publication number 20070041022
- Publication date Feb 22, 2007
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Application
Interferometer Calibration Methods and Apparatus
- Publication number 20060244975
- Publication date Nov 2, 2006
- Andrew L VanBrocklin
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Interferometer calibration methods and apparatus
- Publication number 20060017934
- Publication date Jan 26, 2006
- Andrew L. Van Brocklin
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

contacting two or more objects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical systems with controlled mirror arrangements

Method of collimating atomic beam, apparatus for collimating atomic...

Measurement system based on optical interference and measuring meth...

Interferometric waviness detection systems

Method for defect inspection of transparent substrate by integratin...

Method of inspecting a substrate, metrology apparatus, and lithogra...

Interferometer measurement device and control method therefor

Homodyne optical sensor system incorporating a multi-phase beam com...

Detection device and detection method

Multi-pass optical system to improve resolution of interferometers

Measuring system and measuring method

Gradiometer and method of changing an optical path length to direct...

Error measurement method and machine tool

Interferometric gravimeter apparatus and method

Interferometric gradiometer apparatus and method

Optical coherence tomography with multiple sample arms

Methods and systems for measuring target movement with an interfero...

Vibration detection device and vibration detector

Motion measurement and synchronization using a scanning interferome...

Interferometer for measuring perpendicular translations

Interferometer calibration methods and apparatus

Interferometer calibration methods and apparatus

Interferometer system for displacement and straightness measurements

Differential displacement measuring interferometer

Patents Applicationslast 30 patents

OPTICAL MEASUREMENT SYSTEM

MEASUREMENT METHOD AND MEASUREMENT APPARATUS FOR MEASURING THICKNES...

OPTICAL SYSTEMS WITH CONTROLLED MIRROR ARRANGEMENTS

APPARATUS FOR COLLIMATING ATOMIC BEAM, ATOMIC INTERFEROMETER, AND A...

METHOD OF COLLIMATING ATOMIC BEAM, APPARATUS FOR COLLIMATING ATOMIC...

MEASUREMENT SYSTEM BASED ON OPTICAL INTERFERENCE AND MEASURING METH...

INTERFEROMETRIC WAVINESS DETECTION SYSTEMS

Method and Apparatus for Defect Inspection of Transparent Substrate

HOMODYNE OPTICAL SENSOR SYSTEM INCORPORATING A MULTI-PHASE BEAM COM...

ERROR MEASUREMENT METHOD AND MACHINE TOOL

Interferometric Gravimeter Apparatus and Method

OPTICAL COHERENCE TOMOGRAPHY WITH MULTIPLE SAMPLE ARMS

Interferometric Gradiometer Apparatus and Method

OPTICAL COHERENCE TOMOGRAPHY FOR NEURAL-SIGNAL APPLICATIONS

OPTICAL COHERENCE TOMOGRAPHY WITH MULTIPLE IMAGING INSTRUMENTS

OPTICAL COHERENCE TOMOGRAPHY WITH MULTIPLE SAMPLE ARMS

METHODS AND SYSTEMS FOR MEASURING TARGET MOVEMENT WITH AN INTERFERO...

Motion measurement and synchronication using a scanning interferome...

Vibration detection device

Interferometer for measuring perpendicular translations

Interferometer Calibration Methods and Apparatus

Interferometer calibration methods and apparatus