Contactless testing

Industry

CPC
G01R31/302

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/302Contactless testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Near field wireless communication system for mother to package and...
- Patent number 12,196,807
- Issue date Jan 14, 2025
- Intel Corporation
- Zhen Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 12,130,328
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Test equipment for testing a device under test having an antenna
- Patent number 12,099,088
- Issue date Sep 24, 2024
- Advantest Corporation
- Jan Hesselbarth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testbenches for electronic systems with automatic insertion of veri...
- Patent number 12,055,588
- Issue date Aug 6, 2024
- ARTERIS, INC.
- Benoit Lafage
- G01 - MEASURING TESTING
Information Patent Grant
Systems, devices, and methods for performing a non-contact electric...
- Patent number 12,038,476
- Issue date Jul 16, 2024
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
System for testing antenna-in-package modules and method for using...
- Patent number 12,025,657
- Issue date Jul 2, 2024
- Ohmplus Technology Inc.
- Hsi-Tseng Chou
- G01 - MEASURING TESTING
Information Patent Grant
Module and method for initializing and calibrating a product during...
- Patent number 11,953,551
- Issue date Apr 9, 2024
- Continental Automotive Technologies GmbH
- Eduardo Lopez Arce Vivas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement system for characterizing a device under test
- Patent number 11,933,848
- Issue date Mar 19, 2024
- National Instruments Ireland Resources Limited
- Marc Vanden Bossche
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for providing wireless FPGA programming download...
- Patent number 11,923,847
- Issue date Mar 5, 2024
- Gowin Semiconductor Corporation
- Jinghui Zhu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test circuit and method
- Patent number 11,852,672
- Issue date Dec 26, 2023
- TAIWAN SEMICONDUCTORMANUFACTURING COMPANY LIMITED
- Mill-Jer Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method of over-the-air testing of a device under test
- Patent number 11,828,801
- Issue date Nov 28, 2023
- Rohde & Schwarz GmbH & Co. KG
- Mert Celik
- G01 - MEASURING TESTING
Information Patent Grant
Optical systems and methods of characterizing high-k dielectrics
- Patent number 11,808,706
- Issue date Nov 7, 2023
- California Institute of Technology
- Philippe C. Adell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antenna assembly, test system and method of establishing a test system
- Patent number 11,789,068
- Issue date Oct 17, 2023
- Rohde & Schwarz GmbH & Co. KG
- Corbett Rowell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wirelessly loaded impedance sensor for self-test
- Patent number 11,733,546
- Issue date Aug 22, 2023
- Verily Life Sciences LLC
- Shungneng Lee
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Test and measurement probe having a touchscreen
- Patent number 11,719,721
- Issue date Aug 8, 2023
- Tektronix, Inc.
- Karl A. Rinder
- G01 - MEASURING TESTING
Information Patent Grant
Systems, devices, and methods for performing a non-contact electric...
- Patent number 11,668,746
- Issue date Jun 6, 2023
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system for characterizing a device under test
- Patent number 11,644,505
- Issue date May 9, 2023
- National Instruments Ireland Resources Limited
- Marc Vanden Bossche
- G01 - MEASURING TESTING
Information Patent Grant
In-situ monitoring method and apparatus for power electronic device...
- Patent number 11,630,144
- Issue date Apr 18, 2023
- WUHAN UNIVERSITY
- Sheng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 11,630,151
- Issue date Apr 18, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
System and method for compensating for power loss due to a radio fr...
- Patent number 11,598,803
- Issue date Mar 7, 2023
- LITEPOINT CORPORATION
- Chen Cao
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Antenna in package production test
- Patent number 11,592,479
- Issue date Feb 28, 2023
- Infineon Technologies AG
- Saverio Trotta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafter, wafer testing system, and method thereof
- Patent number 11,567,124
- Issue date Jan 31, 2023
- PlayNitride Display Co., Ltd.
- Jyun-De Wu
- G01 - MEASURING TESTING
Information Patent Grant
Testing device, testing system, and testing method
- Patent number 11,536,760
- Issue date Dec 27, 2022
- ASE TEST, INC.
- Hung-Jen Huang
- G01 - MEASURING TESTING
Information Patent Grant
Side-channel signature based PCB authentication using JTAG architec...
- Patent number 11,480,614
- Issue date Oct 25, 2022
- University of Florida Research Foundation, Inc.
- Swarup Bhunia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit and method
- Patent number 11,467,203
- Issue date Oct 11, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mill-Jer Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Counterfeit device detection using EMI fingerprints
- Patent number 11,460,500
- Issue date Oct 4, 2022
- Oracle International Corporation
- Edward R. Wetherbee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for testing a tractor trailer
- Patent number 11,448,679
- Issue date Sep 20, 2022
- Allan Gendelman
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Composite integrated circuits and methods for wireless interactions...
- Patent number 11,387,683
- Issue date Jul 12, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Min-Jer Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit board and method for delivering program to plurality of cir...
- Patent number 11,379,210
- Issue date Jul 5, 2022
- FUJIFILM Business Innovation Corp.
- Masaaki Takei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for performing a non-contact electrical measurement on a ce...
- Patent number 11,340,293
- Issue date May 24, 2022
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...
- Publication number 20250004047
- Publication date Jan 2, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE COMPENSATION OF OPTICALLY ISOLATED PROBE
- Publication number 20240337685
- Publication date Oct 10, 2024
- Teledyne LeCroy, Inc.
- Matthew Weinstein
- G01 - MEASURING TESTING
Information Patent Application
RADIATION EVALUATION FOR SEMICONDUCTOR DEVICE
- Publication number 20240337689
- Publication date Oct 10, 2024
- QRT Co., Ltd.
- Young Boo KIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20240329128
- Publication date Oct 3, 2024
- PDF Solutions, Inc.
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS
- Publication number 20240230718
- Publication date Jul 11, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Hal Robert Paver
- G01 - MEASURING TESTING
Information Patent Application
SAVING AND RESTORING SCAN STATES
- Publication number 20240230758
- Publication date Jul 11, 2024
- Atmosic Technologies, Inc.
- Mohsen Shaaban
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS
- Publication number 20240133921
- Publication date Apr 25, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Hal Robert Paver
- G01 - MEASURING TESTING
Information Patent Application
TESTING A SEMICONDUCTOR DEVICE USING X-RAYS
- Publication number 20240103072
- Publication date Mar 28, 2024
- Intel Corporation
- Patrick PARDY
- G01 - MEASURING TESTING
Information Patent Application
GRPC-Based Chip Test Method, GRPC-Based Chip Test Apparatus, and St...
- Publication number 20240103075
- Publication date Mar 28, 2024
- Beijing ESWIN Computing Technology Co., Ltd.
- Zeliang Xie
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20230358804
- Publication date Nov 9, 2023
- PDF Solutions, Inc.
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF OVER-THE-AIR TESTING OF A DEVICE UNDER TEST
- Publication number 20230305056
- Publication date Sep 28, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Mert Celik
- G01 - MEASURING TESTING
Information Patent Application
Over the air test chamber with optimized air circulation
- Publication number 20230266383
- Publication date Aug 24, 2023
- Rohde& Schwarz GmbH & Co. KG
- Ralf Meissner
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20230251309
- Publication date Aug 10, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
Measurement System for Characterizing a Device Under Test
- Publication number 20230251312
- Publication date Aug 10, 2023
- National Instruments Ireland Resources Limited
- Marc Vanden Bossche
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR TESTING OF FAR-FIELD WIRELESS CHARGING
- Publication number 20230168299
- Publication date Jun 1, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Daniela RADDINO
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SYSTEM FOR TESTING ANTENNA-IN-PACKAGE MODULES AND METHOD FOR USING...
- Publication number 20230160955
- Publication date May 25, 2023
- OHMPLUS TECHNOLOGY INC.
- HSI-TSENG CHOU
- G01 - MEASURING TESTING
Information Patent Application
TESTBENCHES FOR ELECTRONIC SYSTEMS WITH AUTOMATIC INSERTION OF VERI...
- Publication number 20230111938
- Publication date Apr 13, 2023
- Arteris, Inc
- Benoit LAFAGE
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU MONITORING METHOD AND APPARATUS FOR POWER ELECTRONIC DEVICE...
- Publication number 20230029364
- Publication date Jan 26, 2023
- WUHAN UNIVERSITY
- Sheng LIU
- G01 - MEASURING TESTING
Information Patent Application
USAGE-AWARE COMPRESSION FOR STREAMING DATA FROM A TEST AND MEASUREM...
- Publication number 20230012393
- Publication date Jan 12, 2023
- Tektronix, Inc.
- Keith D. Rule
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE INTELLIGENT WORKSTATION DETECTION SYSTEM
- Publication number 20220397594
- Publication date Dec 15, 2022
- Espressif Systems (Shanghai) Co., Ltd.
- Yu XIONG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20220365134
- Publication date Nov 17, 2022
- PDF SOLUTIONS, INC.
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT AND METHOD
- Publication number 20220357389
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Mill-Jer WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD AND APPARATUS FOR DETECTION OF COUNTERFEIT PARTS, COMPROMI...
- Publication number 20220341990
- Publication date Oct 27, 2022
- PALITRONICA INC.
- CARLOS MORENO
- G01 - MEASURING TESTING
Information Patent Application
MODULE AND METHOD FOR INITIALIZING AND CALIBRATING A PRODUCT DURING...
- Publication number 20220317183
- Publication date Oct 6, 2022
- Continental Teves AG & Co. OHG
- Eduardo Lopez Arce Vivas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST EQUIPMENT FOR TESTING A DEVICE UNDER TEST HAVING AN ANTENNA
- Publication number 20220308107
- Publication date Sep 29, 2022
- ADVANTEST CORPORATION
- Jan Hesselbarth
- G01 - MEASURING TESTING
Information Patent Application
Measurement System for Characterizing a Device Under Test
- Publication number 20220229110
- Publication date Jul 21, 2022
- National Instruments Ireland Resources Limited
- Marc Vanden Bossche
- G01 - MEASURING TESTING
Information Patent Application
NEAR FIELD WIRELESS COMMUNICATION SYSTEM FOR MOTHER TO PACKAGE AND...
- Publication number 20220206064
- Publication date Jun 30, 2022
- Intel Corporation
- Zhen ZHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTENNA ASSEMBLY, TEST SYSTEM AND METHOD OF ESTABLISHING A TEST SYSTEM
- Publication number 20220034961
- Publication date Feb 3, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Corbett Rowell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL SYSTEMS AND METHODS OF CHARACTERIZING HIGH-K DIELECTRICS
- Publication number 20220003678
- Publication date Jan 6, 2022
- California Institute of Technology
- Philippe C. Adell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ALIGNING A MEASUREMENT ANTENNA SUITABLE FOR R...
- Publication number 20210356516
- Publication date Nov 18, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Steffen Neidhardt
- H01 - BASIC ELECTRIC ELEMENTS

Contactless testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Near field wireless communication system for mother to package and...

Interface to full and reduced pin JTAG devices

Test equipment for testing a device under test having an antenna

Testbenches for electronic systems with automatic insertion of veri...

Systems, devices, and methods for performing a non-contact electric...

System for testing antenna-in-package modules and method for using...

Module and method for initializing and calibrating a product during...

Measurement system for characterizing a device under test

Method and system for providing wireless FPGA programming download...

Test circuit and method

System and method of over-the-air testing of a device under test

Optical systems and methods of characterizing high-k dielectrics

Antenna assembly, test system and method of establishing a test system

Wirelessly loaded impedance sensor for self-test

Test and measurement probe having a touchscreen

Systems, devices, and methods for performing a non-contact electric...

Measurement system for characterizing a device under test

In-situ monitoring method and apparatus for power electronic device...

Interface to full and reduced pin JTAG devices

System and method for compensating for power loss due to a radio fr...

Antenna in package production test

Wafter, wafer testing system, and method thereof

Testing device, testing system, and testing method

Side-channel signature based PCB authentication using JTAG architec...

Test circuit and method

Counterfeit device detection using EMI fingerprints

System and method for testing a tractor trailer

Composite integrated circuits and methods for wireless interactions...

Circuit board and method for delivering program to plurality of cir...

Methods for performing a non-contact electrical measurement on a ce...

Patents Applicationslast 30 patents

METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...

TEMPERATURE COMPENSATION OF OPTICALLY ISOLATED PROBE

RADIATION EVALUATION FOR SEMICONDUCTOR DEVICE

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS

SAVING AND RESTORING SCAN STATES

VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS

TESTING A SEMICONDUCTOR DEVICE USING X-RAYS

GRPC-Based Chip Test Method, GRPC-Based Chip Test Apparatus, and St...

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

SYSTEM AND METHOD OF OVER-THE-AIR TESTING OF A DEVICE UNDER TEST

Over the air test chamber with optimized air circulation

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

Measurement System for Characterizing a Device Under Test

DEVICES AND METHODS FOR TESTING OF FAR-FIELD WIRELESS CHARGING

SYSTEM FOR TESTING ANTENNA-IN-PACKAGE MODULES AND METHOD FOR USING...

TESTBENCHES FOR ELECTRONIC SYSTEMS WITH AUTOMATIC INSERTION OF VERI...

IN-SITU MONITORING METHOD AND APPARATUS FOR POWER ELECTRONIC DEVICE...

USAGE-AWARE COMPRESSION FOR STREAMING DATA FROM A TEST AND MEASUREM...

CAPACITIVE INTELLIGENT WORKSTATION DETECTION SYSTEM

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

TEST CIRCUIT AND METHOD

A METHOD AND APPARATUS FOR DETECTION OF COUNTERFEIT PARTS, COMPROMI...

MODULE AND METHOD FOR INITIALIZING AND CALIBRATING A PRODUCT DURING...

TEST EQUIPMENT FOR TESTING A DEVICE UNDER TEST HAVING AN ANTENNA

Measurement System for Characterizing a Device Under Test

NEAR FIELD WIRELESS COMMUNICATION SYSTEM FOR MOTHER TO PACKAGE AND...

ANTENNA ASSEMBLY, TEST SYSTEM AND METHOD OF ESTABLISHING A TEST SYSTEM

OPTICAL SYSTEMS AND METHODS OF CHARACTERIZING HIGH-K DIELECTRICS

SYSTEM AND METHOD FOR ALIGNING A MEASUREMENT ANTENNA SUITABLE FOR R...