containing electro-optic elements

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G01R1/071

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

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G01R1/071containing electro-optic elements

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electro-optical circuit board for contacting photonic integrated ci...
- Patent number 11,946,950
- Issue date Apr 2, 2024
- Carl Zeiss SMT GmbH
- Philipp Huebner
- G01 - MEASURING TESTING
Information Patent Grant
Current sensor
- Patent number 11,899,044
- Issue date Feb 13, 2024
- Denso Corporation
- Tomohiro Nezuka
- G01 - MEASURING TESTING
Information Patent Grant
Current sensor
- Patent number 11,815,531
- Issue date Nov 14, 2023
- Denso Corporation
- Tomohiro Nezuka
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Optical probe for optoelectronic integrated circuits
- Patent number 11,803,015
- Issue date Oct 31, 2023
- FOCI Fiber Optic Communications, Inc.
- Ting-Ta Hu
- G01 - MEASURING TESTING
Information Patent Grant
Multi-angle sample holder with integrated micromanipulator
- Patent number 11,604,212
- Issue date Mar 14, 2023
- Meta Platforms, Inc.
- Pradip Sairam Pichumani
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method, analysis device, analysis program, and recording m...
- Patent number 11,579,184
- Issue date Feb 14, 2023
- Hamamatsu Photonics K.K.
- Akira Shimase
- G01 - MEASURING TESTING
Information Patent Grant
Test socket and method of manufacturing the same
- Patent number 11,467,185
- Issue date Oct 11, 2022
- Sharp Kabushiki Kaisha
- Kazuo Tamaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical Pockels voltage sensor assembly device and methods of use t...
- Patent number 11,402,410
- Issue date Aug 2, 2022
- Micatu Inc.
- Atul Pradhan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing a device-under-test
- Patent number 11,255,898
- Issue date Feb 22, 2022
- Rohde & Schwarz GmbH & Co. KG
- Thomas Winkler
- G01 - MEASURING TESTING
Information Patent Grant
Test probe assembly with fiber optic leads and photodetectors
- Patent number 11,125,780
- Issue date Sep 21, 2021
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Grant
Providing subscriber specific content in a network
- Patent number RE48682
- Issue date Aug 10, 2021
- Personalized Media Communications LLC
- John Christopher Harvey
Information Patent Grant
Method of testing an interconnection substrate and apparatus for pe...
- Patent number 11,047,901
- Issue date Jun 29, 2021
- Samsung Electronics Co., Ltd.
- Mee-Hyun Lim
- G01 - MEASURING TESTING
Information Patent Grant
Providing a subscriber specific solution in a computer network
- Patent number RE48565
- Issue date May 18, 2021
- Personalized Media Communications LLC
- John Christopher Harvey
Information Patent Grant
Apparatus and method for testing an interconnect circuit and method...
- Patent number 10,942,216
- Issue date Mar 9, 2021
- Samsung Electronics Co., Ltd.
- Sung-Yeol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Integrated optical probe card and system for batch testing of optic...
- Patent number 10,782,342
- Issue date Sep 22, 2020
- Si-Ware Systems
- Bassam Saadany
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor device inspection device and semiconductor device ins...
- Patent number 10,705,139
- Issue date Jul 7, 2020
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Optical Pockels voltage sensor assembly device and methods of use t...
- Patent number 10,663,494
- Issue date May 26, 2020
- MICATU, INC.
- Atul Pradhan
- G01 - MEASURING TESTING
Information Patent Grant
Optical modulator and electric field sensor
- Patent number 10,641,807
- Issue date May 5, 2020
- JX Nippon Mining & Metals Corporation
- Mitsuru Shinagawa
- G02 - OPTICS
Information Patent Grant
Optical pockels voltage sensor assembly device and methods of use t...
- Patent number 10,634,704
- Issue date Apr 28, 2020
- MICATU, INC.
- Atul Pradhan
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing apparatus and methods
- Patent number RE47867
- Issue date Feb 18, 2020
- Personalized Media Communications LLC
- John Christopher Harvey
Information Patent Grant
Arrangement for spatially resolved determination of the specific el...
- Patent number 10,466,274
- Issue date Nov 5, 2019
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Philipp Wollmann
- G01 - MEASURING TESTING
Information Patent Grant
Active noise suppression for optical voltage sensor
- Patent number 10,234,501
- Issue date Mar 19, 2019
- Tektronix, Inc.
- Michael J. Mende
- G02 - OPTICS
Information Patent Grant
Measurement apparatus and method
- Patent number 10,185,230
- Issue date Jan 22, 2019
- ASML Netherlands B.V.
- Willem Jakobus Cornelis Koppert
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level electrical probe system with multiple wavelength and in...
- Patent number 10,175,266
- Issue date Jan 8, 2019
- The United States of America as represented by the Secretary of the Army
- Jeffrey J. Siddiqui
- G01 - MEASURING TESTING
Information Patent Grant
Visible laser circuit fault isolation
- Patent number 10,132,861
- Issue date Nov 20, 2018
- QUALCOMM Incorporated
- Rama Rao Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspection device and semiconductor device ins...
- Patent number 10,060,975
- Issue date Aug 28, 2018
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic current sensor with high dynamic range and accuracy
- Patent number 10,006,944
- Issue date Jun 26, 2018
- GRIDVIEW OPTICAL SOLUTIONS, LLC.
- Philip B. Davis
- G01 - MEASURING TESTING
Information Patent Grant
Dual-phase interferometry for charge modulation mapping in ICS
- Patent number 9,983,260
- Issue date May 29, 2018
- The United States of America as represented by the Secretary of the Air Force
- Abdulkadir Yurt
- G01 - MEASURING TESTING
Information Patent Grant
Switching apparatus for electrical contact testing
- Patent number 9,958,478
- Issue date May 1, 2018
- ASMAG-Holding GmbH
- Klaus Schroeter
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic probe with multiple sensitivity ranges
- Patent number 9,933,456
- Issue date Apr 3, 2018
- Tektronix, Inc.
- Michael J. Mende
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
ROTATING BODY INSPECTION DEVICE FOR ELECTRIFICATION COMPONENT
- Publication number 20240393365
- Publication date Nov 28, 2024
- VIEWON CO., LTD.
- Young Wook YOON
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE
- Publication number 20240369599
- Publication date Nov 7, 2024
- Silicon Future Manufacturing Company Ltd.
- TIEN-CHIA LEE
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS
- Publication number 20240230718
- Publication date Jul 11, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Hal Robert Paver
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENA...
- Publication number 20240219452
- Publication date Jul 4, 2024
- Intel Corporation
- Prasoon JOSHI
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS
- Publication number 20240133921
- Publication date Apr 25, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Hal Robert Paver
- G01 - MEASURING TESTING
Information Patent Application
INGESTIBLE IMPLANTABLE DEVICE TO MEASURE INTERNAL TTFIELD INTENSITY
- Publication number 20240103041
- Publication date Mar 28, 2024
- Novocure GmbH
- Yoram Wasserman
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE PROBE FOR MICROLED DEFECT DETECTION AND MANUFACTURING METH...
- Publication number 20240085493
- Publication date Mar 14, 2024
- INSTITUTE OF FLEXIBLE ELECTRONICS TECHNOLOGY OF THU, ZHEJIANG
- Xian Huang
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PROBE FOR OPTOELECTRONIC INTEGRATED CIRCUITS
- Publication number 20230314721
- Publication date Oct 5, 2023
- FOCI FIBER OPTIC COMMUNICATIONS, INC.
- Ting-Ta Hu
- G02 - OPTICS
Information Patent Application
CONTACTING MODULE FOR CONTACTING OPTOELECTRONIC CHIPS
- Publication number 20230296668
- Publication date Sep 21, 2023
- JENOPTIK OPTICAL SYSTEMS GMBH
- Robert BUETTNER
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS
- Publication number 20230168278
- Publication date Jun 1, 2023
- Samsung Electronics Co., Ltd.
- Daesung Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL PROBE, PROBE CARD, MEASURING SYSTEM, AND MEASURING METHOD
- Publication number 20230038088
- Publication date Feb 9, 2023
- Kabushiki Kaisha Nihon Micronics
- Michitaka OKUTA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD, ANALYSIS DEVICE, ANALYSIS PROGRAM, AND RECORDING M...
- Publication number 20210373071
- Publication date Dec 2, 2021
- Hamamatsu Photonics K.K.
- Akira SHIMASE
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASUREMENT PROBE, ELECTROMAGNETIC WAVE MEASUR...
- Publication number 20210373061
- Publication date Dec 2, 2021
- NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH...
- Shintaro HISATAKE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING A DEVICE-UNDER-TEST
- Publication number 20210349142
- Publication date Nov 11, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Thomas WINKLER
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, PROBING SYSTEM AND PROBING METHOD
- Publication number 20210208182
- Publication date Jul 8, 2021
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTICAL CIRCUIT BOARD FOR CONTACTING PHOTONIC INTEGRATED CI...
- Publication number 20210033643
- Publication date Feb 4, 2021
- Carl Zeiss SMT GMBH
- Philipp Huebner
- G01 - MEASURING TESTING
Information Patent Application
WAVEFORM SEPARATION FOR RESOLUTION LIMITED OPTICAL PROBING TOOLS
- Publication number 20200333394
- Publication date Oct 22, 2020
- FEI Company
- Tenzile Berkin Cilingiroglu
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL POCKELS VOLTAGE SENSOR ASSEMBLY DEVICE AND METHODS OF USE T...
- Publication number 20200241053
- Publication date Jul 30, 2020
- Micatu Inc.
- Atul Pradhan
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ON-WAFER PROBING WITH V-GROOVE COUPLERS
- Publication number 20200192033
- Publication date Jun 18, 2020
- GLOBALFOUNDRIES INC.
- Hanyi Ding
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING AN INTERCONNECTION SUBSTRATE AND APPARATUS FOR PE...
- Publication number 20200166563
- Publication date May 28, 2020
- Samsung Electronics Co., Ltd.
- Mee-Hyun LIM
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHODOLOGY FOR DETERMINING TEST PAD INTEGRITY
- Publication number 20200124638
- Publication date Apr 23, 2020
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL POCKELS VOLTAGE SENSOR ASSEMBLY DEVICE AND METHODS OF USE T...
- Publication number 20190339308
- Publication date Nov 7, 2019
- Micatu Inc.
- Atul Pradhan
- G01 - MEASURING TESTING
Information Patent Application
Large Dynamic Range Electro-Optic Probe
- Publication number 20190204356
- Publication date Jul 4, 2019
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TESTING AN INTERCONNECT CIRCUIT AND METHOD...
- Publication number 20190113565
- Publication date Apr 18, 2019
- Samsung Electronics Co., Ltd.
- Sung-Yeol Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR RECONSTRUCTING A USEFUL SIGNAL FROM A NOISY A...
- Publication number 20180336162
- Publication date Nov 22, 2018
- CENTRE NATIONAL D'ETUDES SPATIALES
- Anthony BOSCARO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL MODULATOR AND ELECTRIC FIELD SENSOR
- Publication number 20180238949
- Publication date Aug 23, 2018
- JX NIPPON MINING & METALS CORPORATION
- Mitsuru Shinagawa
- G02 - OPTICS
Information Patent Application
INTEGRATED OPTICAL PROBE CARD AND SYSTEM FOR BATCH TESTING OF OPTIC...
- Publication number 20180143245
- Publication date May 24, 2018
- SI-WARE SYSTEMS
- Bassam Saadany
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Measurement Apparatus and Method
- Publication number 20180081279
- Publication date Mar 22, 2018
- ASML NETHERLANDS B.V.
- Willem Jakobus Cornelis KOPPERT
- G01 - MEASURING TESTING
Information Patent Application
VISIBLE LASER CIRCUIT FAULT ISOLATION
- Publication number 20180080983
- Publication date Mar 22, 2018
- QUALCOMM Incorporated
- Rama Rao Goruganthu
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTIC CURRENT SENSOR WITH HIGH DYNAMIC RANGE AND ACCURACY
- Publication number 20180059144
- Publication date Mar 1, 2018
- GRIDVIEW OPTICAL SOLUTIONS, LLC.
- Philip B. Davis
- G01 - MEASURING TESTING

containing electro-optic elements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electro-optical circuit board for contacting photonic integrated ci...

Current sensor

Current sensor

Optical probe for optoelectronic integrated circuits

Multi-angle sample holder with integrated micromanipulator

Analysis method, analysis device, analysis program, and recording m...

Test socket and method of manufacturing the same

Optical Pockels voltage sensor assembly device and methods of use t...

System and method for testing a device-under-test

Test probe assembly with fiber optic leads and photodetectors

Providing subscriber specific content in a network

Method of testing an interconnection substrate and apparatus for pe...

Providing a subscriber specific solution in a computer network

Apparatus and method for testing an interconnect circuit and method...

Integrated optical probe card and system for batch testing of optic...

Semiconductor device inspection device and semiconductor device ins...

Optical Pockels voltage sensor assembly device and methods of use t...

Optical modulator and electric field sensor

Optical pockels voltage sensor assembly device and methods of use t...

Signal processing apparatus and methods

Arrangement for spatially resolved determination of the specific el...

Active noise suppression for optical voltage sensor

Measurement apparatus and method

Wafer level electrical probe system with multiple wavelength and in...

Visible laser circuit fault isolation

Semiconductor device inspection device and semiconductor device ins...

Electro-optic current sensor with high dynamic range and accuracy

Dual-phase interferometry for charge modulation mapping in ICS

Switching apparatus for electrical contact testing

Electro-optic probe with multiple sensitivity ranges

Patents Applicationslast 30 patents

ROTATING BODY INSPECTION DEVICE FOR ELECTRIFICATION COMPONENT

PROBE CARD DEVICE

VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS

METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENA...

VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS

INGESTIBLE IMPLANTABLE DEVICE TO MEASURE INTERNAL TTFIELD INTENSITY

FLEXIBLE PROBE FOR MICROLED DEFECT DETECTION AND MANUFACTURING METH...

OPTICAL PROBE FOR OPTOELECTRONIC INTEGRATED CIRCUITS

CONTACTING MODULE FOR CONTACTING OPTOELECTRONIC CHIPS

SUBSTRATE PROCESSING APPARATUS

OPTICAL PROBE, PROBE CARD, MEASURING SYSTEM, AND MEASURING METHOD

ANALYSIS METHOD, ANALYSIS DEVICE, ANALYSIS PROGRAM, AND RECORDING M...

ELECTROMAGNETIC WAVE MEASUREMENT PROBE, ELECTROMAGNETIC WAVE MEASUR...

SYSTEM AND METHOD FOR TESTING A DEVICE-UNDER-TEST

PROBE CARD, PROBING SYSTEM AND PROBING METHOD

ELECTRO-OPTICAL CIRCUIT BOARD FOR CONTACTING PHOTONIC INTEGRATED CI...

WAVEFORM SEPARATION FOR RESOLUTION LIMITED OPTICAL PROBING TOOLS

OPTICAL POCKELS VOLTAGE SENSOR ASSEMBLY DEVICE AND METHODS OF USE T...

OPTICAL ON-WAFER PROBING WITH V-GROOVE COUPLERS

METHOD OF TESTING AN INTERCONNECTION SUBSTRATE AND APPARATUS FOR PE...

STRUCTURE AND METHODOLOGY FOR DETERMINING TEST PAD INTEGRITY

OPTICAL POCKELS VOLTAGE SENSOR ASSEMBLY DEVICE AND METHODS OF USE T...

Large Dynamic Range Electro-Optic Probe

APPARATUS AND METHOD FOR TESTING AN INTERCONNECT CIRCUIT AND METHOD...

METHOD AND DEVICE FOR RECONSTRUCTING A USEFUL SIGNAL FROM A NOISY A...

OPTICAL MODULATOR AND ELECTRIC FIELD SENSOR

INTEGRATED OPTICAL PROBE CARD AND SYSTEM FOR BATCH TESTING OF OPTIC...

Measurement Apparatus and Method

VISIBLE LASER CIRCUIT FAULT ISOLATION

ELECTRO-OPTIC CURRENT SENSOR WITH HIGH DYNAMIC RANGE AND ACCURACY